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Product
Ultra-High Vacuum Scanning Kelvin Probe
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Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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Product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74C
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
Standard 1.53 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-72I15-4
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Godzilla High Current Probes, 150 Amp
HC500
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Current Rating (Amps): 150Average Probe Resistance (mOhm): 25Test Center (mil): For more details, please contact us.Test Center (mm): For more details, please contact us.Full Travel (mil): 260Full Travel (mm): 6.60Recommended Travel (mil): 250Recommended Travel (mm): 6.35Overall Length (mil): 3,215Overall Length (mm): 81.66
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Product
RF Voltmeter
9240
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The 9240 series is the latest addition to Boonton’s popular 9200 series of RF voltmeters. It combines accuracy, smart probes, and operator features that have never before been available in its price range. It is simple to use on the bench, and comprehensive enough to integrate into an ATE system.
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Product
Ultrasonic Hardness Tester
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Sinowon Innovation Metrology Manufacture Ltd.
◆ Perfect Accuracy——±3% HV, ±1.5HR, ±3%HB.◆ Microscopic Indentation—— Only high-power microscope can observe the indentation.◆ Quick Measurement——Result in 2 seconds.◆ Large LCD Display——Directly display measurement result, times count, maximum, minimal, average and deviation.◆ Friendly Operation——Operate well after short training.◆ Promised Warranty——2-Year warranty for main unit (Excludes Probe).◆ Mass Storage——Save 1000 groups measurement data.◆ Simple Calibration——Save 20 groups calibration data for invoking, improve calibration efficiency.
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Product
RF Capacitance Level Switches
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ABB's RF Capacitance level switches feature one-step external calibration, immunity to material build-up, and a wide selection of probes for even the most challenging applications from low dielectric bulk solids to sticky slurries.
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3C
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Infiniium V-Series Oscilloscope: 8 GHz, 4 Analog Channels
DSAV084A
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8 GHz analog bandwidth (upgradable)4 analog channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.04 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Improve your testing with the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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Product
Near Field Probes 30 MHz up to 3 GHz
RF2 set
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The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Product
Microwave Testing
500B
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The Model 500B Picoprobe sets new® standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 500B Picoprobe achieves an insertion loss of less than 4.0 db and a return loss of greater than 15 db over its frequency range (see accompanying data).
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Product
IPTV Qos/QoE Software Solution
Net-MetriXs
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Net-MetriXs analyzer probe is a software based application an integral part of the NET-xTVMS system, the real-time monitoring system of IPTV services. Intended for installation on customer appliance (CPU, PC, server, etc) at the customer selected site ( example: headend ), Net-MetriXs can be optioned with monitoring of DVB-C/S/T/H, analog PAL and OTT streams. This Linux based IPTV probe is highly expandable to monitor actively from very few to several hundred multicast streams.
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Product
Combined Temperature – RH probe
HP474ACR
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Combined Pt100 temperature and %RH probe, complete with SICRAM module.
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Product
ATE Test Probes
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For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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Product
Semicon Test Probes
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Fine pitch, 0.20 mm [8 Mil] - single & double ended - non-rotating - kelvin - RF - high performance.
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Product
Temperature and humidity outdoor, indoor probe
T3110
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Programmable temperature and humidity transmitter is equipped with temperature and relative humidity sensors. Measured values are also converted to other humidity interpretation - dew point temperature, absolute humidity, specific humidity, mixing ratio or specific enthalpy. Degrees Celsius and Fahrenheit are user selectable. Transmitter contains a microprocessor based control circuitry in a durable plastic case with connection terminals and sensors in a filter with stainless steel mesh. Humidity transmitters is equipped with two galvanic isolated 4-20mA outputs. Configuration of outputs and output range are user adjustable. Large dual line LCD for simultaneous display of T+RH or other humidity interpretation is an advantage. Display is possible to switch off. Computerized design ensures temperature compensation of the humidity sensor and fail indication. State-of-the-art capacitive polymer sensor ensures excellent calibration long term stability, inertia against water and condensation. Transmitters are designed for use in non-aggressive environment.
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Product
Group3 controllers
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The Group3 controllers - the CNA and DNA - have a built-in PID algorithm, that allows them to perform local closed loop control. A controller, combined with a Group3 analog Hall probe forms a compact, inexpensive way to implement closed loop magnet control.
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Product
Multi-Interface TDM, Optical, And Packet/IP Rackmount & Probe Test Platforms
mTOP™
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Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1Z-10-S
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Miniature Probes with Cords
Stat MP-1234
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This optional probe is used with the Ohm-Stat RT-1000 Standard Resistivity Tester. It accurately measures surface resistivity and conforms to the EOS/ESD 11.11 specifications.
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Product
Mixed Signal Oscilloscope: 25 GHz, 4 Analog Plus 16 Digital Channels
MSOV254A
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25 GHz analog bandwidth (upgradable)4 analog plus 16 digital channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.73 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Access the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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Product
Photolysis Rate Analyzer
PFS-100
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, HONO, HCHO etc.) are key indicators for identify status & extent of photochemical pollution.The analyzer is receiving solar radiation by quartz probe and transferring the radiation to spectrum via optical quartz fiber, the spectrum data will be evaluated and compared with reference data with mathematical approach and gives photolytic rate.
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3E
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
ATE Integration
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Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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Product
CMP Mechanical Kits (230x135mm)
230199 – CMP-240-HP
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The CMP Mechanical kits are an excellent option for manual tests of both low and high volumes. Now in a more rigid design with removable probe plate for easier maintenance. Integrated fixture down switch as an option. The kit is available in 4 standard sizes but can be adjusted to your demands.
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Product
Cantilever Probe Cards
Venture
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Nidec SV Probe’s VentureTM line of cantilever probe cards represents the finest epoxy technology on the market and are perfect for logic testing. The Venture line includes an extensive array of cantilever cards, single to multi-die for a variety of test systems. Other capabilities include: • 3K Points • Pad Pitches as Tight as 35µm • Up to 32 DUTsContact your Nidec SV Probe sales representative to determine which VentureTM product is right for your testing application.
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Product
Probes, Magnetic Field
EM-6880 | 9 KHz – 520 KHz
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The EM-6880, EM-6881 and EM-6882 Magnetic Field Probes operate in conjunction with any 50 ohm input impedance receivers.
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Product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25L18-16
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
CMP Mechanical Kits (280x138mm)
230198 – CMP-290-HP
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The CMP Mechanical kits are an excellent option for manual tests of both low and high volumes. Now in a more rigid design with removable probe plate for easier maintenance. Integrated fixture down switch as an option. The kit is available in 4 standard sizes but can be adjusted to your demands.
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Product
Eddy Current Probes and Drivers
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Proximity sensors work on the eddy current principle. A proximity system consists of an eddy current probe, extension cable and driver. A high-frequency RF signal is generated by the driver, sent through the extension and probe cables and radiated from the probe tip. The tip consists of a precision wound copper coil inside a chemical and temperature resistant PEEK case.
