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Product
Broadband Isotropic Field Strength Probes
PI-01, PI-01E, PI-03, PI-05
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Modern design probes meeting the requirements of most EMC and RF safety standards for RF safety, industrial, military and radar communication applications: 0.2-1000 V/m, 10 KHz-40 GHz.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1L-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Ultra High 4.18 (119.00) 11.70 (332.00) General Purpose Probe
EPA-3C-2
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Pin-Mapping for Custom Connectors, Test Fixtures, UUTs | Cable & Harness Testers
PinMap™
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Check out this fast and super-easy pin-mapping process enabled by our optional CableEye® PinMap™ software. Map as fast as you can move the probe from one pin to the next. Use on your custom connectors, test fixtures, specially-built connector panels, or pigtail adapters to your CableEye tester.
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Product
Standard 6.13 (174.00) - 16.00 (456.00) General Purpose Probe
EPA-5A
General Purpose Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,420Overall Length (mm): 36.07
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Product
DIMM Interposer Probe
FS2361
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The FS2361 is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154/64 Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 DIMMs.
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Product
Probe Card Solutions
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Advanced engineering solutions are required to meet increasing challenges for wafer test, driven by today’s rapid technology acceleration. Translarity offers probe card solutions for the global semiconductor and packaging test industries, tailored to customer specifications. The company’s IP portfolio, design capabilities, innovative products, and reputation for quality, reliability and customer support ensure the right solution for your testing requirements.
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Product
Thermal Microclimate Data Logger
HD32.1
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The HD32.1 Thermal Microclimate is a data logger multifunction instrument to measure the microclimate in moderate, hot, severe hot, cold environments and the measure of physical quantities. It is provided with 8 inputs for probes equipped with SICRAM module and a back-lighted graphic display. It has been designed for microclimate analysis in the workplace; the instrument is used to detect the necessary parameters to establish if a certain workspace is suitable to perform certain activities.
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Product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T75
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
Geomagnetometer w/Hall Probe
IDR-321
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Integrity Design and Reseach Corp.
Typical applications: Earth's field vector measurement, air shipment inspection, mapping & recording field perturbations, etc.
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Product
Flying Probe Tester Substrate
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Substrates with structures down to 10µm and several hundred thousand test points per panel require specific solutions forscanningcapacitance measurementhigh accuracy and temperature Management
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1V-10-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Compact TLP/VF-TLP/HMM Probearm Set for Temperature Measurements
PHD-4001A
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High Power Pulse Instruments GmbH
*Electrically isolated probearm kit for VF-TLP, TLP, HMM, HBM force and sense probingbased on the GGB Picoprobe Model 10 replacement probe tips*Buried coaxial cable channel for thermo-chuck in isolated chamber temperature measurements*Compatible with GGB Picoprobe Model 10 replacement probetips*Compatible with all standard micropositioner interfaces*High precision rotation of the probearm by backlash-free 80:1 gear*Rugged stainless steel design*SMA connectors
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Product
MultiBeam System
FIB
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An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Product
High Current Calibrator
MC151
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MC151 Current calibrator is an accurate current source capable of 120 A. Typical uses include calibration of current sensors, current probes, current transformers, shunts, ammeters, DMMs or as stable current source for test and development applications. The calibrator is equipped with a built-in multimeter that can be used for simulation of programmable transconductance or current amplifier.
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Product
BMP-3 Board Marker Probe
BMP-3
ICT/FCT Probe
Current Rating (Amps): .05Voltage Rating (VDC): 15Recommended Duty Cycle: 1 sec. On (min.), 5 sec. OffTest Center (mil): 1,300Test Center (mm): 33.02Full Travel (mil): 62Full Travel (mm): 1.57Recommended Travel (mil): 50Recommended Travel (mm): 1.27Full Marker Travel (mil): 62Full Marker Travel (mm): 1.57Direction of Rotation: CCWScribed Diameter (mil): 50Scribed Diameter (mm): 1.27Rec. Mounting Hole Size (mil): 610Rec. Mounting Hole Size (mm): 15.50Recommended Drill Size: 39/64 (in) or 15.50 mm
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Product
High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Product
Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2C40-1
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Differenzial Probe
BumbleBee®
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PMK Mess- und Kommunikationstechnik GmbH
BumbleBee® is a 400 MHz, 1 kV CAT III high-voltage, differential probe, that can be used with anyoscilloscope or device providing 50 Ω termination.
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Product
High Quality UCI - And Leeb-measuring Technology
SONODUR Product Family
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Foerster Instruments, Incorporated
The non-destructive UCI test method (Ultrasonic Contact Impedance) as well as the Leeb test method enable fast and mobile measurement as a supplement to the classical hardness test. Due to the compact measuring probes and sensors of the SONO series, the devices can also be used in difficult test positions and with complex component geometries. Fields of application are e.g. incoming goods inspection, mix-up testing, production control, quality assurance, weld seam testing, cut edge testing, maintenance on installed components as well as the replacement of dynamic hardness testers for small material thicknesses (below 50 mm, e.g. boilers, tubes).
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Product
Flying Probe Tester
Condor MTS 505
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Primarily the Flying Probe Tester was developed to enable In-Circuit testing (ICT) of prototype PCBs. For testing a new design an existing fixture has to be changed or a new fixture has to be procured. The fixtureless design of the MTS 505 Condor is one of its most attractive properties, where the unnecessary and costly time delays incurred for fixture build or changes can be avoided. It is the ideal platform for testing prototypes.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T1-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Current Probes
XQ13
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Beijing GFUVE Electronics Co.,Ltd.
The model XQ13 ac micro amp clamp on current probe is suitable for 10A-100A cable online measurement, it belongs to high performance current sensor field.
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Product
Ultra High 6.70 (190.00) - 11.80 (335.00) General Purpose Probe
EPA-4B-2
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
Relative Humidity Kelvin Probe
RHC
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The Relative Humidity Kelvin Probe (RHC) systems are the ideal solution for monitoring samples in a controlled atmosphere for contact potential difference (CPD)/work function (Φ) measurements.
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Product
Building Inspection System with Moisture Hygrometer & MSX® IR Camera
FLIR MR277
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The MR277 is the first FLIR building inspection system to combine the advantages of Infrared Guided Measurement (IGM) and our patented Multi-Spectral Dynamic Imaging (MSX) with advanced environmental sensors to help you quickly locate, clearly identify, and easily document problems. IGM technology and a laser pointer isolate the area where you can use the integrated pinless moisture sensor for non-invasive readings or external pin probe for invasive measurements. With automatically calculated environmental readings and a field-replaceable humidity/temperature sensor, the MR277 lets you finish the job and minimize downtime. Connect to external devices with METERLiNK® and use FLIR Tools® to enhance troubleshooting and reports.
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1A-10
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
USB Reusable Temperature and Humidity Data Logger
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This reusable logger can monitor temperature and humidity in facilities, storage and processing areas, clean rooms, labs, and during transport. It is equipped with an external sharp tip probe, providing the option to monitor internal core temperature. Data is available in PDF or spreadsheet format and used for various purposes, such as process or equipment verification and validation, thermal mapping, and documenting environmental conditions to meet GMP, GDP and regulatory compliance. Reports are analyzed to identify trends and patterns, and management decisions can be made to improve practices in areas such as processing and cold chain logistics. Data is easy to archive for record keeping, audits, and compliance with FDA, CDC, HACCP, FSMA and other regulatory requirements.
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Product
Instrument Systems General Accessories
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Konica Minolta Sensing Americas, Inc
Instrument Systems General Accessories current range of optical probes and measurement adapters using fiber optics as a means to transport light in the spectrometer was a primary goal sought by Instrument Systems from the beginning of their product development.
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Product
Continuity Tester
TE6-0711
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Hangzhou Tonny Electric & Tools Co., Ltd.
*Designed to test circuits while power is off*2 AAA batteries included*Durable ABS housing*36" Test lead with insulated alligator clip*Sharp tip for probing circuits





























