Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Product
IC Test Probes
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C.C.P. Contact Probes Co., LTD.
Our IC Test Probes are suitable for pitches of less than 0.012mm.
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Product
Fine Tip Test Probes
U1164A
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Compatible with test leads shipped with U1210, U1240B, U1250, U1270 series of handheld clamp meter and multimeters
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Product
SMD Test Probes
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The Parrot Clip, model PCM W1 or PCS-MB W1 invention can be connected to resistance’s, diodes, integrated circuits (SOIC, SO) etcThe advantage of the Parrot Clip is given by the double metal connection made between the new metal tip and the steel hooked rod, spring loaded. This connection, being made by metal parts is electrical and mechanical reliable, even if the contact point are small. Connections are resistant even at high temperatures.
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Product
Test Probes and Pins
Probes
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Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
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Product
Test Probes
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Our innovative Test Probes are the upgrade version of Auto Multi Meter. It can perform multiple circuit system test such as power supply feed, voltage and resistance measurement, continuity test, ground test, polarity check and components activation.
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Product
Single Ended Test Probes
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Single ended probes ranging from 0.4mm to 1.27mm pitchWide selection of plating options to optimize contact challenges and maximize probe lifeVarious length option to provide drop-in replacement capabilityTri-temp applications – 55°C to 155°C
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Product
Test Probes / Test Fixtures
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INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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Test Probes
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Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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Test Fingers & Probes
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Test Fingers and Probes are used in most standards to check accessibility to moving parts or hazardous live parts. They comes in many forms, such as test fingers, test rods, test balls etc.
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Product
Test Probes
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Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Product
Semi-Rigid Test Probes Up to 6 GHz
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Fairview Microwave’s semi-rigid test probe assemblies come in multiple cable diameters to help when attaching the unterminated end of the probe to a circuit board trace. There are two versions including straight-cut probe ends for those that would like to customize the dimensions of the center conductor and dielectric dimensions, as well as pre-stripped probe ends that are ready for immediate use. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, simple sampling measurements can be made without having to create a separate subassembly circuit board or add a connector to the circuit layout which can take up valuable real estate. Fairview provides 3 diameters of semi-rigid coax and 3 different lengths from 3 inches to 12 inches to fit a variety of trace widths and applications. All test probes are 100% RF tested to ensure the cable assemblies operate to 6 GHz and also to make sure that the SMA connector interface meets the 1.35:1 VSWR specification prior to shipping. To protect the small diameter coax from damage, each part is shipped in a clear protective tube that can also be used for storing the probes for future use.
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Product
ATE Test Probes
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For contacting loaded PCBs in automatic test equipment (ATE) with vacuum, pneumatic or mechanically operated fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
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Accessibility Test Probes
TF-24 Series
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Accessibility Test Probes are designed to perform tests specified in many standards to determine compliance with safety requirements.
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Product
General Purpose Test Probes
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Low profile, short travel test probes for restricted space applicationsApplications where long travel is not required such as thin film/hybrid circuits or bareboard PCB testingReplaceable test probe by use of a receptacle
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Product
Fused Test Probes with Silicone Test Leads
AL-57FL
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Standard Electric Works Co., Ltd
● AL-57FL is an ideal tool which shows the indication of live voltage even with blown fuse.● 2 replaceable fast-acting fuses are built-in. The specs of the fuses are 1000V, 11A with internal rating of 20kA AC/DC.● Provide additional testing protection.● Help to prevent a possible mis-indication when there is voltage present.● CAT III 1000V, CAT IV 600V, 10A with protective cover.● 2mm probe tips, removable 4mm brass caged banana probe tips are also included.● Include High-quality silicone test leads, 1.5 meter long.● Wipe the fused test probes and silicone test leads periodically with a damp cloth and detergent. Do not use abrasives or solvents.● Operating temperature: -20 °C to +50 °C (-5 °F to 120 °F)● One year warranty● Can't be used on current mode with blown fuse.● Rating : EN 61010-031 CAT Ⅲ 1kV 10A / CAT Ⅳ 600V 10A
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Product
MPI SiPH Probe Systems
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MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
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Product
2.5mm Test Rod Test Probe Needle
CX-4C
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Shenzhen Chuangxin Instruments Co., Ltd.
2.5mm test rod test probe needle Used to verify the protection of persons against access to hazardous parts.
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Product
MANIA TEST PROBE
SERIES 76
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ElectricalMAXIMUM CURRENT: 3 amps continuousat working travel, non - inductiveRESISTANCE: At 35 mA test current,50 mOHMS meanMaterial and FinishesPLUNGER: Heat treated berylliumcopper, FINISH: -2E / -2P Hard nickel plated-2D / -2E138 24 Kt gold plated,BARREL: Phosphor bronze, nickel platedSPRING: Stainless steel, silver platedPIN: Music wire, hard nickel plated
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IPTV Testing Probe
H & M-Probe
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*Stand alone low bandwidth IPTV monitoring probe*Rugged packaging and industrial reliability*Web based appliance generates automatically service quality alarms*Provides basic metrics for quality of MPEG2 TS video transport*Stores alarm history and provides graphical histograms*Accepts streams bandwidth
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Product
Universal Manipulator
LS
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Manage the rapidly changing production environment and achieve the lowest cost of test, converting between probe, final, engineering and service positions with ease. Rapid advancements in semiconductor test technology have resulted in highly efficient test cells, capable of device test throughputs far greater than ever before.
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CAMGATE Test Kits
Series 453
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LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
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High Voltage Probe Meters
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Shanghai Beha Electronics Co., Ltd.
*High voltage test probe *is a high voltage probe that is used with Oscilloscope● Attenuation Ratio: 1000:1*Measuring range: AC 20KV/DC 30KV
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Product
CAM/GATE Test Kits
Series 45
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The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components
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Environmental Test Probe, Temperature
72-8366
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Simple thermocouple junction at the end of a 1m wire provides effective low cost ambient temperature measurement. It is suitable for measuring air temperature and may be placed in direct contact with hard surfaces. Type K thermocouple temperature probes are commonly used with all types of industrial temperature controls and measurement equipment, and are compatible with Tenma handheld thermometers and digital multimeters that include temperature function. All are terminated with standard Type K plugs.
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Product
Hook Test Clip
PCM
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The PCM Parrot hook Test Clip model is a small size hook test clip with a length of 70 mm, including the metal tip and the button.Due to this smaller size it is aimed to be used for many applications as oscilloscope ground, spectrum analyzers, data lodgers multimeter test leads and probes.
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Product
2.5mm Test Wire Test Probe Pin
CX-3C
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Shenzhen Chuangxin Instruments Co., Ltd.
2.5mm test wire test probe pin 1.Application: Used to verify the protection of persons against access to hazardous parts. Also used to verify the protection against access with a tool.
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Product
Exchangeable Test Fixture
2112/D/H/S-7/HG/Pylon
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 13,50 kg
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Auto-ranging Digital Clamp Meter
DCM402
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Expert Quality, auto and manual ranging clamp meter capable of voltage, current, resistance, diode, continuity, capacitance, frequency, duty cycle and temperature testing. Maximum jaw - opening diameter of 36mm, backlit LCD screen, auto power off, linear bar graph functions and a useful inspection light. Supplied with test leads, temp probe, case and 3 x AAA batteries.
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Product
Stand-Alone Test Fixture
MA 2013/D/H/Pylon
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 24,00 kg
