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Product
Utel Capture
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Utel Capture is a complete telecoms network monitoring platform based on virtual (or physical probes for legacy interfaces) that enables data acquisition from control and user planes. It captures real-time data to provide valuable insights into network performance.
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Product
Kelvin Probe Systems
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Kelvin probe measures the work function difference between the tip and the sample when in thermoequilibrium state (a), and measures the electrical potential when the sample is illuminated (b), which is the sum of the difference in workfunction and internal/external-applied voltages.
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2D-2
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Optical Probe
1038
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TESCO’s Optical Probe provides easy, two-way communication between a PC and a meter.
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Product
Eddy Current Test System
CIRCOGRAPH® Product Family
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Foerster Instruments, Incorporated
The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.
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Product
Probe Based Systems
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The integration of additional measurement technology in probers enables you to flexibly expand the analysis options in the ongoing production process. With the introduction of our Automation Assistant software platform, we have therefore equipped a large number of probers with a wide variety of analysis tools.
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Product
USB Reusable Temperature and Humidity Data Logger
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This reusable logger can monitor temperature and humidity in facilities, storage and processing areas, clean rooms, labs, and during transport. It is equipped with an external sharp tip probe, providing the option to monitor internal core temperature. Data is available in PDF or spreadsheet format and used for various purposes, such as process or equipment verification and validation, thermal mapping, and documenting environmental conditions to meet GMP, GDP and regulatory compliance. Reports are analyzed to identify trends and patterns, and management decisions can be made to improve practices in areas such as processing and cold chain logistics. Data is easy to archive for record keeping, audits, and compliance with FDA, CDC, HACCP, FSMA and other regulatory requirements.
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Product
Integrated Balun Probes
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This is an example of a 900 MHz Integrated Balun Probe. It incorporates a 50 ohm unbalanced to 200 ohm balanced differential transformer. The probe can be built with or without a center tapped ground needle and may also incorporate DC bias through the differential pair or via separate needle contacts.
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Product
Soft Carrying Case And Front Panel Cover For 2000 And 3000 X-Series Oscilloscope
N6457A
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The N6457A Soft carrying case is the perfect way to travel with or store your 2000 or 3000 X-Series oscilloscope. The case is designed for convenience with padded sides and bottom, as well as a storage pouch for your probes and additional accessories.
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Product
Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3F
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1T-8
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Multi-Stage In-Circuit Test Fixtures
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Circuit Check’s bi-level and multi-stage fixtures combine multiple test levels in a single fixture using controlled actuation and selected probe travels for powered and unpowered tests.
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Product
Manual Tuners / Impedance Tuners
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Maury manual tuners are based on precision slide screw technology that utilizes broadband slab line transmission structure and passive probes to create impedances for devices. The probes are designed to be very close to onequarter wavelength in the linear dimension at the mid-band of each range. Since each tuner has two probes, this results in improved matching characteristics for each unit. Another key feature of this series of tuners is the inclusion of a LCD position readout of the carriage position on those units operating below 18 GHz. Higher frequency tuners utilize a micrometer carriage drive. The positional repeatability and high matching range of these tuners make them ideally suited for use as a variable impedance source in applications like device characterization. Such measurements depend upon the ability of the tuner to establish impedances out near the edge of the Smith chart and to reproduce the electrical characteristics as a function of mechanical position. The tuners in this series are also easy to use due to the nearly independent electrical results of the mechanical motions. The depth of penetration of the probe into the transmission line determines the magnitude of the reflection, while the position of the probe along the line determines the phase. While there is some interaction, the effects are almost independent of each other. https://www.maurymw.com/images/mw-rf/mst982e35.jpg
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Product
Passive Probe, 20:1, 500 MHz, 1.3 M
N2875A
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A compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the N2870A Series ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Product
Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25L36-10
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
PCB Connectors
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Smiths Interconnect offers a broad range PCB connectors for harsh environments. A wide choice of configurations and terminations of signal, power, high speed, RF contacts and spring probes solutions.
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Product
4-channel Anemometer
1570
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The Kanomax 4-channel Research-grade Anemometer is an airflow measuring instrument designed for high performance and precision. When coupled with our highly accurate probes this four-channel anemometer provides highly accurate and reliable data readings. It features a LCD display that displays the data from each channel.
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Product
Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3J-1
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
PCIe 2.0 Test Platform
PXP-100B
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The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
CAM/GATE Test Kits
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The Camgate ™ series test fixtures provide ‘Z’ axis motion and, with the optional floating top plate, makes this series ideal for top side probing. The floating push plate is accurately registered with two tooling/guide pins. The top plate mounting frame is adjustable in .500″ (12.7mm) increments to accommodate top side probing in the lower position, or clearance for PCA’s with tall components in the middle or top position, without the need for riser blocks. Camgate fixtures are available with the most widely used interfaces in the test industry.
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Product
Test Probe Leads, With 19-mm Tips And 4-mm Tips
U1169A
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The U1169A consists of one pair (red and black) of insulated test leads, one pair of test probes with 19-mm tips and another pair of test probes with 4-mm tips. Recommended for use with Keysight handheld digital multimeters. Rated at CAT III 1000V, CAT IV 600V, 15A.
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Product
Flexible Implantable Microprobe
IT-21
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IT-121 Flexible Implantable Microprobe - Implantable in semi-solids and tissue with 21 gauge needle (supplied). Ideal for subcutaneous and cranial temperatures in small animals. Also for immersion in various solutions. Totally sheathed in chemical resistant Teflon™. Maximum Temperature 150°C . Isolated. Probe diameter .016" (21 gauge represents the needle gauge that the probe can be inserted through). Time constant 0.08 seconds.
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Product
Device Parameter Analysis
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bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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Product
High Quality UCI - And Leeb-measuring Technology
SONODUR Product Family
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Foerster Instruments, Incorporated
The non-destructive UCI test method (Ultrasonic Contact Impedance) as well as the Leeb test method enable fast and mobile measurement as a supplement to the classical hardness test. Due to the compact measuring probes and sensors of the SONO series, the devices can also be used in difficult test positions and with complex component geometries. Fields of application are e.g. incoming goods inspection, mix-up testing, production control, quality assurance, weld seam testing, cut edge testing, maintenance on installed components as well as the replacement of dynamic hardness testers for small material thicknesses (below 50 mm, e.g. boilers, tubes).
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Product
Alternate 2.54 (72.00) - 6.20 (176.00) General Purpose Probe
HPA-52B-1
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
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Product
Standard Probe Station Chucks & Accessories
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In this test solutions section of our website we describe the expanding line of Abet PV IV probe stations for the growing variety of solar cell types and sizes being developed around the world. This page describes a line of vacuum chucks and accessories for top/bottom, top/top, and bottom/bottom solar cells from 3 x 3 mm to 300 x 300 mm. Probe stations for multiple device on a single substrate and multifunction probe stations are described further in the sections highlighted to the left of this page.
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Product
Wide-Aperture Fiber-Optic Probes
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Wide-aperture Fiber-optic Probes and Very Wide-aperture Fiber-optic Probes are used to test dim or misaligned LEDs.
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Product
High Impedance Active Probes
28 AND 29
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Designed to serve the needs of integrated circuit engineers working in the most advanced high speed, submicron, MOS technology. These high frequency instruments include the attractive features of the Models 18C and 19 including full dc capability, negligible dc current drain, and extremely low input capacitance. In addition the frequency range of the Models 28 and 29 has been extended to a full 1 GHz.
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Product
Standard 0.39 (11.00) - 1.39 (39.00) Replaceable General Purpose Probe
MEP-30J
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Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 30Test Center (mm): 0.76Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 690Overall Length (mm): 17.53
