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Product
Thermal/Mechanical Testing
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Accolade Engineering Solutions
As new products employ advanced materials and processes, the need to measure and characterize those material properties becomes increasingly important. DSC is used to measure heat flow in to or out of a material. Some DSC applications include measurement of melting temperature, polymorphic transitions, crystallization temperature, thermal stability, heat of fusion and degree of cure. TMA is used to measure dimensional changes of a material as a function of temperature.
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Product
Semiconductor Package Wind Tunnel
WT-100
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Thermal Engineering Associates, Inc.
The WT-100 Forced Convection (Moving Air) Wind Tunnel is designed in accordance with the EIA/JEDEC JESD51-6 standard for thermal characterization of semiconductor packages and devices. The vertical design minimizes laboratory floor space requiements. Air is drawn in at the bottom and exhausts at the top. The test section is large enough to accommodate the largest JEDEC and SEMI thermal test boards. Air velocity can be adjusted over the range of 0.5 to 5 m/s; air velocity is monitored with an included hot-wire anemometer connected to a digital display. A Type-T thermocouple is mounted in the test section for monitoring the moving air temperature.
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Product
Antenna, Ridged Guide
EM-6960 | 200 MHz – 2 GHz
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The EM-6960 operates over the 200 MHz to 2 GHz frequency range and is characterized by relatively high gain and low VSWR over this wide range.
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Product
Pulse Pattern Generator, 3.35 GHz, single channel
81133A
Pulse Generator
The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.
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Product
Bit Error Ratio Testers
M8000 Series
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Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
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Product
Vector Signal Analyzers
Vector Signal Analyzer
Vector signal analyzers combine superheterodyne technology with high speed ADCs and other DSP technologies to provide fast FFT-based, high-resolution in-channel spectrum measurements, demodulation, and advanced time-domain analysis. A vector signal analyzer is especially useful for characterizing complex burst, transient, or modulated signals in aerospace & defense, radar, wireless communications, and avionics.
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Product
Active Device Characterization Solution Up To 50 GHz For 5G
N5245BM
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The N5245BM provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 50 GHz for 5G applications.
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Product
Modulation Distortion For E5081A Up To 20 GHz
S960704B
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The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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Product
Laser Source
TW3109
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Techwin(China) Industry Co., Ltd
can provide 1 to 4 output wavelengths to meet specific requirements, including the 650nm red source and the 1310/1550nm wavelengths for single mode fiber or the 850/1300nm wavelengths for multimode fiber, as well as other wavelengths according to customer needs. Together with the TW3208 optical power meter, it is a perfect solution for the fiber optic network characterization.
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Product
Heat Deflection Tester
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Apparatus is used to determine the Heat Deflection Temperature or the Vi cat Softening Point. All the specimens are charged with a constant load and immersed in a bath, where temperature is increased at a standard velocity. The attained heat resistance rate of plastic materials is a widely required parameter for product characterization, for quality control, as well as for evaluating their conformity to the previewed applications.
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Product
Continuous Time Interval Analyzer - PXI
GT668PXI-40
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A true breakthrough in high-speed Time Measurement and test technology, GuideTech’s GT668PXI-40 leverages the power of its CTIA continuous time-stamping technology, eliminating the need for supplemental triggers, pattern markers or clock recovery circuits.GuideTech’s CTIAs enables serial interfaces pattern verification and full jitter analysis in milliseconds for fast, automated characterization and high-throughput production test on all ATE platforms, including low-cost and in-house testers.GT668PXI-40 cards can be expanded up to 36 Channels Single Ended Input in a single 3U PXI chassis.
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Product
Field Comm Analyzer
S5800H
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S5800H Series Field Comm Analyzer is an 8.4 inch large touch screen instrument which is designed specifically for wireless communications field engineers and technicians. S5800H series provide all necessary measurement functions and performance to accurately characterize the signal environment in addition to clearing, detecting, identifying and locating signal interferenc.
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Product
SEM Dual-Purpose Glassy Carbon Electrode
DP-1-3
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Dual-purpose glassy carbon working electrode for electrochemical measurements and SEM analysis. Available in 2-6 mm diameters with PTFE or PEEK housing, plus magnetic or detachable electrode configurations for surface characterization workflows.
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Product
Test Handler
M4872
Test Handler
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
ENA-X Vector Network Analyzer
E5081A
Vector Network Analyzer
Our spectral correlation technique directly analyzes the modulated input and output signals in the frequency domain on the network analyzer. Current solutions on the market require a network and spectrum analyzer to characterize components fully. With the new ENA-X, you can ensure test accuracy and repeatability with a single test setup using full vector correction at the DUT plane. Avoid manually reconfiguring setups or automating complex switch-based systems — verify device performance faster and with less error potential with the ENA-X network analyzer.
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Product
Light Analysis
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Welcome to Thorlabs; below you will find links to detectors and instrumentation that measure the various properties of light, a subset of our entire line of photonics products. Thorlabs offers an extensive selection of instruments that measure the properties of light. Our versatile power and energy meters can be used with over 25 different sensors in order to make NIST-traceable power and energy measurements. If the convenience of a meter is not desired, our selection of detectors includes basic photodiodes (uncalibrated and calibrated), photodetectors (biased, amplified, and avalanche), CCD and CMOS arrays, position detectors, integrating spheres, and photomultiplier tubes. The Beam Characterization category contains beam profilers (camera and scanning slit), a wavefront sensor, spectrometers, and interferometers, while the Polarimetery link leads to a selection of instruments used to measure and control the polarization of light.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783124-03
Signal Module
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
Nanomechanical Test System
Hysitron TI Premier
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Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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Product
CXA Signal Analyzer, Multi-touch, 9 kHz to 26.5 GHz
N9000B
Signal Analyzer
Master the essentials in signal characterization with the leading low-cost tool in signal analysis Perform cost-effective stimulus response measurements with the optional built-in tracking generator Add crucial functionality with X-Series measurement applications Enhance theory with practical skills when used with a training kit in your RF & microwave education lab
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Product
Vibration Test Technology
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These vibration exciters (also called shakers) use permanent magnets and are available as portable and stationary systems for simulating ambient vibration conditions. Robust design ensures a long service life, and typical applications include structure analysis and testing smaller subassemblies. These shakers are characterized by high lateral and axial stiffness and come in lightweight construction as specified by industrial users.
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Product
TLP Tester
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Tokyo Electronics Trading Co., Ltd.
A method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures.
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Product
Time Domain Reflectometers
HL1100 Series
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HYPERLABS HL1100 Series TDR instruments provide high-performance test and measurement capabilities for use in the field or in the lab. These instruments are used for applications such as fault detection in cables and interconnects, impedance characterization, time of flight analysis, water level measurement, and more.
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Product
LXI Microwave Matrix, 10GHz, Dual 3x3, Terminated With Loop-Thru
60-750-233-C
Matrix Switch Module
The 60-750-233-C is a dual 3x3 10GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Development Test Stands for Electric Motors
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Development test stands from imc are characterized by high flexibility in electric motor trials. A comprehensive variety of motor types can be tested and a complete range of tests carried out. The mechanical configuration consists of a test bed with a load machine and a torque measuring shaft. The load machine and torque sensor shaft are mounted on a linear guide and precisely aligned axially by means of laser. It can be moved towards the test object on ball bearings, as a complete unit. Especially time-saving: no need to realign the load machine assembly when changing the torque sensor.
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Product
Low Voltage Power Supplies
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We offer low-voltage power supplies in the power range up to 100,000W (customer-specifically even higher). , They are designed for maximum output voltages of 6.5V to 350V and are continuously adjustable from zero to maximum. Our low-voltage power supplies can be operated in constant voltage mode as well as in constant current mode. This enables unlimited operation at any time with the maximum current that can be supplied (even in the event of a short circuit). They are suitable for ohmic loads as well as inductive or capacitive loads and are characterized by a service-friendly design,
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Product
Combination Measurement Workstation
WS500
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The WS500 is a combination measurement workstation that incorporates several different measurement types that can be included in a single characterization sequence.
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Product
Power Dividers/Combiners
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Macom Technology Solutions Holdings Inc.
MACOM’s power combiners and dividers are used in aerospace and defense, wireless, and wireline communications applications. These devices can also be used for broadband CATV applications. They are available in a variety of connectorized and surface mount packages. Available in subsets operating between the 400 kHz to 26 GHz frequency range, our dividers and combiners are characterized as both 50 and 75 ohm devices
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Product
Signal Generator Frequency Extenders
FES
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These frequency extension modules easily connect to the output of your signal generator so you have high-performance source for your DUT characterization activities. Characterize your DUT with the confidence that the superior performance in terms of output power, spurious and harmonic will provide product accurate results.
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Product
Multi-Fabric Switch
PEX431
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Designed to enable the development of complex, scalable, high performance 3U VPX systems in today’s increasingly-connected military/aerospace world, the PEX431 is characterized by significant flexibility. The PEX431 Multi-Fabric Switch and XMC Carrier Card allow designers to build complex VPX systems with multiple single board computers and multiple I/O modules. PEX431 supports PCIe switching, GigE switching and the ability to host a XMC mezzanine.
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Product
Signal Analysis
Histograph
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The Histograph software is used for statistical signal analysis: finding the statistical values characterizing the signal and building the theoretic histograms based on the data obtained.
