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Product
Snap-on RF Current Monitoring Probe
TBCP2-250
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The TBCP2-250 is a snap-on RF current monitoring probe. The probe has a very flat response with a 3dB bandwidth of 250 MHz and is characterized over the frequency range from 30kHz to 300 MHz. Upon request, it can also be supplied with a test protocol covering the frequency range 1 kHz to 350 MHz. The aperture of the RF current monitoring probe is 32 mm. Its transfer impedance is > 12 dB Ohm in the range from 700 kHz to 300 MHz.
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Product
Static Multiple Light Scattering (SMLS)
TURBISCAN
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Static Multiple Light Scattering (SMLS) is an optical method that allows for the direct characterization of native concentrated liquid dispersions. Microtrac’s TURBISCAN range uses this technology to provide accurate and rapid results. TURBISCAN was the first patented technology to provide tools that allow accelerated aging tests on unstressed products, thus becoming a reference for direct stability characterization technology.
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Product
Generators and Sources
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For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional. The integration of source and measurement into a single unit greatly simplifies the test process. Semiconductor devices, sensors, displays or batteries etc can therefore be quickly and easily characterized.
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Product
Software
Electrochemistry Tests
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Materials Development Corporation
CyclicVoltammetry and Galvanostatic Charging are tests used throughout the industrial and scientific communities to study chemical reactions and behavior of electronic structures. They are extremely helpful in the monitoring of nano based dielectrics, used in super /ultra capacitors or self-assembled monolayers (SAMs). The Cyclic Voltammetry test applies a ramping voltage to a device and measures the resulting current. In acapacitor-like structure the current reveals loss in the dielectric as well as degradation over time. CyclicVoltammetry is used to characterize the performance of supercapacitors and ultracapacitors formed using various nano-technologies. It is also useful in the studies of self-assembled monolayers used for sensors.
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Product
Absolute Contamination Standards (ACS)
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The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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Product
LXI Microwave Matrix, 10GHz, Single 3x3
60-750-133
Matrix Switch Module
The 60-750-133 is a single 3x3 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Science-Grade MWIR InSb Camera
FLIR A6700 MWIR
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Designed for electronics inspections, manufacturing monitoring, scientific research, and non-destructive testing, the FLIR A6700 MWIR camera is ideal for high-speed thermal events and fast-moving targets. Short exposure times allow users to freeze motion and achieve accurate temperature measurements. In fact, the camera’s image output can be windowed to increase frame rates to 480 frames per second to accurately characterize even higher speed thermal events, helping ensure critical data doesn’t get missed during testing.
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Product
Wood Moisture Meters
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PeakTech Prüf- und Messtechnik GmbH
High quality wood and material moisture meter, which is characterized by its ease of use and universal applicability. The device has an LCD display, in which measured values of humidity and ambient temperature are displayed. In addition, it is equipped with an LED display, which enables a quick good-bad assessment of the measured values. When burning wood in a wood-burning stove with a high moisture content, the efficiency of the stove decreases, while at the same time the emission of pollutants, such as soot and fine dust, increases. In addition, there is a build-up of soot in the chimney, which can lead to a fire. Therefore, this device is ideal for wood storage, control during the heating season or use in construction.
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Product
In-situ Gas Analyzers
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Real-time gas analysis directly within the processInnovative measurement technology that allows the devices to be mounted directly at the measurement site: In-situ gas analyzers take measurements directly within the process under system conditions. These analyzers are primarily characterized by their minimal maintenance requirements and extremely short response times. SICK's in-situ gas analyzers are available in two different versions:The cross-duct version for representative measurement results across the entire duct diameterThe measuring probe version, optimized for single-sided gas duct installation
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Product
PXI Digital Pattern Instrument
Digital Pattern
The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.
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Product
SHSLab Wavefront Sensors
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The SHSLab wavefront sensor system is a powerful and comprehensive measurement solution for a multitude of optical applications, such as:*alignment of optical systems *measurement of imaging quality*surface shape measurement*laser beam characterization
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Product
Sample Analysis Services
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Postnova Analytics offers a variety of unique sample analysis services for the characterization of biopolymers, proteins, liposomes and nanoparticles. Our European Application Laboratory Center EAC and our American Application Laboratory Center AAC represent the worldwide biggest and most advanced labs offering sample analysis services based on Field-Flow Fractionation and Light Scattering.
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Product
High Speed PXIe Digital IO Card - 32 Channels, Extendable up to 256 Channels in One Chassis
Model 33010
Digital I/O Module
Chroma 33010 is a high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO Card consists of a Sequencer Pattern Generator (SQPG) and 32 Channels of fill ATE-like features. The 33010 IO card is expandable up to 356 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Tactical Grade Inertial Measurement Unit (IMU)
ADIS16490 iSensor
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The ADIS16490 iSensor® device is a complete inertial system that includes a triaxial gyroscope and a triaxial accelerometer. Each inertial sensor in the ADIS16490 combines industry-leading iMEMS® technology with signal conditioning that optimizes dynamic performance. The factory calibration characterizes each sensor for sensitivity, bias, alignment, and linear acceleration (gyroscope bias). As a result, each sensor has its own dynamic compensation formulas that provide accurate sensor measurements. The ADIS16490 provides a simple, cost-effective method for integrating accurate, multiaxis inertial sensing into industrial systems, especially when compared with the complexity and investment associated with discrete designs. All necessary motion testing and calibration are part of the production process at the factory, greatly reducing system integration time. Tight orthogonal alignment simplifies inertial frame alignment in navigation systems. The SPI and register structure provide a simple interface for data collection and configuration control.
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Product
NanoSpectralyzer
NS MiniTracer
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The NS MiniTracer is the latest addition to the innovative line of NanoSpectralyzer instruments from Applied NanoFluorescence, LLC. Its design is optimized for fast, easy, and highly sensitive analytical measurements on a variety of samples containing single-walled carbon nanotubes. The MiniTracer is ideal for quantitating SWCNTs in environmental and biological specimens and is also perfect for routine sample characterization in any SWCNT research lab.
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Product
Pulser / Sampler Core
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Furaxa has researched, developed, and characterized a novel monolithic arrayable pulse and sample aperture generation technology. Recent results include demonstration of sub-10ps pulse/aperture generation at repetition rates up to 3 Billion Pulses/Samples Per Second (BPPS) with jitter that is estimated at sub-10fs. Further, simulations in a number of InP DHBT processes exhibit sub-3ps 20BPPS performance. The IP is process-independent, and has been achieved in CMOS SOI, InP HBT, SiGe and GaAs so far. Please contact us regarding your specific foundry and technical requirements: The company currently licenses the sampler/pulser technology for use by application and market, and is interested in discussing how the technology can enable our partners' applications. A short list of characterized Pulser/Sampler Cores is given below.
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Product
50 µs Pulse Medium Current Source/Measure Unit (MCSMU)
B1514A
Source Measure Unit
The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
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Product
PCI Express 4 U.2 Receiver Test Automation
N5991PU4A
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The N5991PU4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express U.2 devices and hosts at 8 GT/s.
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Product
IV-curve Software
Tracer
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In Tracer you will find your all-in-one solution for the measurement and elaboration of IV-curve measurements. Tracer is the core application developed by ReRa that will help you to characterize your solar cells and compare the results.Tracer natively supports the control of Keithley 24xx and 26xx sourcemeters.These instruments have proven their strength over time for the measurement of solar cells.
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Product
Thermal Test Vehicles
TTV
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Thermal Engineering Associates, Inc.
Using the TTC-1002 Thermal Test Chip as a basis, TEA offers TTVs in flip-chip, bare die, BGA packages for a variety of thermal simulation, reliability, qualification, heat sink characterization, and TIM characterization activities. Selective unused balls are sequentially connected together for daisy-chain applications.
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Product
Dimensional Metrology
Stand-Alone Metrology Family
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Nova’s stand-alone metrology platforms are utilized to characterize critical dimensions such as width, shape and profile with high precision and accuracy and are used in multiple areas of the fab such as photolithography, etch, CMP and deposition in the most advanced technology nodes, across all semiconductor leading customers.
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Product
Displacement and Encoders
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INCREMENTAL digital Transducers are mainly designed for displacement measurement in machine tools and other industrial applications. The sensors are characterized by high precision and are absolutely dust and waterproof. The used materials permit applications in heavy industrial environments.DISPLACEMENT Transducers are suitable for measurements of small distances up to 50mm. They are characterized by high accuracy and repeatability, reliability and fast response. Digital ENCODERS operate on optical or magnetical principal and are offered with incremental or absolute coded outputs. They are suitable for precision industrial applications.
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Product
PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
783126-02
Signal Module
PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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Product
ATCA 5U 16 Slot Mesh
1900001495-0000
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The 5U 16-slot ATCA backplane is a Mesh, compliant to the PICMG 3.0 Rev 3.0 specification. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Product
ATCA 5U 6 Slot replicated Mesh 40G - with bused IPMB
109ATCA506-3003R
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The 5U 6 slot ATCA backplane is a 6 slot replicated Mesh with bused IPMB, designed to meet 40Gbps ( 4 x 10G ports) data rates. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Product
ThermalAir Desktop Series Temperature Forcing System
ThermalAir TA-1000A Desktop System
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The ThermalAir TA-1000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
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Product
CMOS Image Sensor
CIS
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CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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Product
Bit Error Ratio Testers
M8000 Series
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Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
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Product
LXI Microwave Matrix, 10GHz, Dual 3x3
60-750-233-B
Matrix Switch Module
The 60-750-233-B is a dual 3x3 10GHz microwave matrix with internal termination. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Gross Alpha/Beta Measurement Systems
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Gross alpha/beta measurement is one of the simplest radioanalytical procedures which are applied widely as a screening technique in the field of radioecology, environmental monitoring and industrial applications. This procedure has been developed to determine whether radionuclide specific analysis is required to further characterize the water. Regular measurements of gross alpha and gross beta activity in water may be invaluable for early detection of radioactive contamination and indicate the need for supplemental data on concentrations of more hazardous radionuclides.





























