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Product
In-Process Test OTDR
8000i
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The 8000i In-Process Test OTDR is the most recent addition to Photon Kinetics' family of innovative solutions for optical fiber cable testing. The 8000i's "cable test optimization" provides the balance of OTDR dynamic range and dead zone performance that's proven to be most effective for accurate characterization of typical fiber cable lengths. Dynamic range has been maximized to reduce measurement time, while resolution has been tuned to ensure that typical cabled fiber defects are detected. The 8000i delivers this optimized measurement capability at a more economical price than our full featured, final QC 8000 OTDR, which makes it a perfect fit for "in-process" testing on ribbonizing or loose tube production lines.
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Product
Open Loop Current Sensor
C03 30A
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The C03 offers efficient and precise sensor solutions for direct, alternating and pulsed currents in industrial, commercial and communication systems. It consists of three main components: an accurate, linear Hall sensor with low temperature drift, a flux collector and a transformer. It is characterized by a very low resistance and thus lowers power loss and temperature drift - for optimal performance.
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Product
Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
Analyzer
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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Product
Four Slot PXI/PXIe Full Hybrid ABex Chassis with up to PXIe x4 Connectivity on Each Slot
ABex PXIe Rack 04
Chassis
Ultra-Compact 2U ABex chassis with 4 slots. This variant is characterized by outstanding compactness and due to the directly integrated PXIe full hybrid backplane one achieves maximum performance at an attractive price. The first slot is reserved for a single slot PXIe controller. Either Konrad PXIe embedded controllers or MXI interfaces are supported.
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Product
High Power Devices
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SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed).
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Product
PNA Microwave Network Analyzer
N5227B
Network Analyzer
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
SparkFun Spectral Sensor Breakout
AS7262 Visible (Qwiic)
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The SparkFun AS7262 Visible Spectral Sensor Breakout brings spectroscopy to the palm of your hand, making it easier than ever to measure and characterize how different materials absorb and reflect different wavelengths of light. The AS7262 Breakout is unique in its ability to communicate by both an I2C interface and serial interface using AT commands. Hookup is easy, thanks to the Qwiic connectors attached to the board --- simply plug one end of the Qwiic cable into the breakout and the other into one of the Qwiic Shields, then stack the board on a development board. You’ll be ready to upload a sketch to start taking spectroscopy measurements in no time.
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Product
Semiconductor Device Parameter Analyzer and Measurement Modules
B1500A Series
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Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
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Product
Controlled Impedance Analyzers
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HYPERLABS Controlled Impedance Analyzers can be used with various probes and adapters to quickly and reliably characterize impedance on PCB test coupons. These Test Systems are designed to comply with IPC-2141A standards for PCB coupon testing, and can be customized to meet specific customer needs.
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Product
Beam Diagnostics Systems
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Characterize the spatial intensity distribution and size of laser beams, and visualize beam shape, with speed and accuracy.
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Product
Two-Pole Voltage Tester
P-5
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SONEL P-5 has all the features that characterize the P-4 Voltage Tester. In addition, the P-5 model has the ability to take resistance measurements up to 2 kΩ and has an LCD display that allows you to display the voltage and resistance values accurately.
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Product
CMP Tester
CP-6
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The state of the art Rtec CMP tester CP-6 allows to study and characterize CMP process like never before. In addition to polishing wafers & substrates the tester comes with inline surface profilometer. This combinations sheds information on why and how the surface, friction, wear etc. changed. Tester also measures several inline parameters such as friction, surface roughness, wear volume etc. to understand the process in detail.
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Product
Syscal Pro
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The Syscal Pro is an all-in-one multinode resistivity and induce polarization sounding and profiling system for environmental and engineering geophysical studies. The Syscal Pro gathers a 10 channels receiver and a 250 W internal transmitter which make it the more powerful system of the Syscal range. Compact, easy-to-use and field proof, the Syscal Pro measures both resistivity and chargeability. It is ideal for environmental and civil engineering applications such as depth-to-rock determination, weathered bedrock mapping. With a maximal output voltage of 2000Vpp, the Syscal Pro is very adapted to detect deep fault in fractured aquifers or to characterize the depths and thickness of the groundwater aquifers.
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Product
Inductive Heater
BD-1.01
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The device is assigned to heat the bars to the state, which allows upsetting. The DB-1.01 heater characterizes especially high watt-hour efficiency (bigger than 98%) thanks to suitable concentration of electromagnetic field in the heating zone of inductor (the solution secured by patent). It is possible to addapt the nductive heater BD-1.01 for heating any others bars.
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Product
Optical Communication Analysis
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In lab and manufacturing environments, R&D engineers require scalable and optimized test solutions to enable them to properly characterize new advanced modulation scheme signals for next-generation, ultra-high-speed telecom networks. Through EXFO’s optical communication analyzers, R&D engineers and manufacturing operations involved in the development or production of transmitters or systems based on new high-speed technology will find the right tools for their advanced technology needs.
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Product
Diffuse Reflectance Sphere
DRS100
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Mobile displays are used in a variety of ambient lighting environments. The evaluation of mobile displays under diffuse illumination conditions is critical to the understanding of display performance in the real world, as mobile displays are used in a wide range of ambient lighting environments. The DRS100 is purpose-made to completely characterize the diffuse reflectance properties of mobile displays, providing uniform hemispherical illumination.
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Product
Chromatography Detectors
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Brookhaven Instruments Corporation
Detailed size or molar mass distribution information is useful in many areas such as investigating protein aggregation and understanding (or predicting) polymer properties. Since chromatography fractionates a sample before analysis, it is an ideal tool for characterizing these distributions.
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Product
PNA-X Microwave Network Analyzer, 26.5 GHz
N5242B
Network Analyzer
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Digital Surface Resistance Test Kit
PAS-853BRM
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- Surface Resistance Kit from 0.01 ohm to 9.99x1012 ohms- Nominal Full Range Tolerance Averages <±5%- Fully Automatic Resistance Range, Test Voltage and Electrification Period control- Determines if a surface is Dissipative, Conductive, or Insulative- Measures resistance point-to-point(Rtt) and point-to-ground (Rtg)- Measures resistance of Static Control Floors, ESD Work Surfaces and Packaging Material- Conforms to all ESD Association Standards for Resistive Characterization- Includes 2 each Conductive Rubber Electrodes- Packaged in a hard shell Carrying Case- Certificate of Calibration Traceable to NIST included
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Product
PXIe-4139, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit
782856-02
Source Measure Unit
PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 20 W of DC power. This module features analog-to-digital … converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Product
Opticle Encoder Tester
Endeavour
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Evolusys Technologies Sdn. Bhd.
The Endeavour test system is a complete solution for testing optical digital and analog encoders for electrical and functional test with high accuracy and high speed. It provides high precision, research-grade electrical and functional testing and signal characterization suitable for encoder development. For quality assurance in encoder production, the Endeavour can be easily combined with a handling system for automated, high-end testing and qualification in the production of encoders.
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Product
Telurometer
AMRU-10
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AMRU-10 is a simple meter that allows to perform measurements by the technical method, as well as the measurement of the resistance of the grounding by the bipolar method. The device is characterized by its ease of operation, high resistance to disturbances and high accuracy.
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Product
Nanomechanical Test System
Hysitron TI Premier
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Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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Product
Oil-Free HDT & Vicat Tester
HV500
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The Instron® CEAST HV500 is the latest instrument design to perform HDT and VICAT tests at high temperatures, up to 500°C, making this instrument ideal for research and quality control applications as it is ensuring the capability to test the new generations of techno-polymers, characterized by their excellent properties at high temperature.
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Product
Nanomechanical Test Instruments
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Product
Modulation Distortion Up To 50 GHz
S930705B
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S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Particle Metrology System
Archimedes
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Archimedes is an innovative instrument which uses the technique of resonant mass measurement to detect and accurately size and count particles in the size range 50nm to 5um*. Archimedes can distinguish different species from their buoyant mass is particularly useful when characterizing proteinaceous aggregates from contaminating silicon oil in biopharmaceutical preparations, in distinguishing bubbles from lipid micelles and contaminants in ultrasound contrast agents or protein from fat in dairy products.
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Product
Field Comm Analyzer
S5800E
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S5800E Series Field Comm Analyzer is an economic instrument which is designed specifically for wireless communications field engineers and technicians. S5800E series provide all necessary measurement functions and performance to accurately characterize the signal environment in addition to clearing, detecting, identifying and locating signal interference.
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Product
Temperature Calibration Software v5.1
MET/TEMP II
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MET/TEMP II software allows you to easily automate the calibration of a wide range of temperature sensors. It provides a comprehensive temperature calibration solution that allows you to test large quantities of sensors, calculate characterization coefficients, and print calibration reports. You can standardize comparison or fixed point calibrations and use multiple temperature sources or references in one test.
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Product
Test bench for Infrared Focal Plane Array detectors
BIRD
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The BIRD bench enables characterization of any types of Infrared Focal Plane Array (IRFPA) detectors.
