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Product
High Temperature Test System
129620A
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Solartron Analytical, specialists in the design of precision impedance test equipment, has joined forces with high temperature Furnace specialists Carbolite, and sample holder specialists NorECS to produce a range of advanced high temperature materials characterization test systems.
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Product
Arbitrary Waveform Generators
M8100 Series
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The M8100 Series arbitrary waveform generators (AWGs) offer a level of versatility that enables you to set up complex real-world signals — whether you need precise signals to characterize the performance of a design or need to stress a device to its limits. From low-observable radar to high-density communications, testing is more realistic with our precision arbitrary waveform generators.
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Product
PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-02
Source Measure Unit
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
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Product
Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
Analyzer
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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Product
Two-Pole Voltage Tester
P-6
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SONEL P-6 has all the features that characterize the P-4 Voltage Tester and P-5 Voltage Tester. In addition, the P-6 model has the phase identification function which allows to verify the phase compatibility (and its overtaking or delay) against the phase at the reference object.
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Product
Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
System
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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Product
Chip Tester
TL2000
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ficonTEC’s series of testing machines is focused on automated electro-optical characterization ofsemiconductor chips. The ficonTEC TL2000 is a fully automated test and inspection system for unmountedlaser diode bars, single chips and chips on submounts.
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Product
Bench & Characterization Boards
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Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
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Product
Open Loop Current Sensor
C03 30A
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The C03 offers efficient and precise sensor solutions for direct, alternating and pulsed currents in industrial, commercial and communication systems. It consists of three main components: an accurate, linear Hall sensor with low temperature drift, a flux collector and a transformer. It is characterized by a very low resistance and thus lowers power loss and temperature drift - for optimal performance.
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Product
Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others. Combined with the most comprehensive suite of hybrid characterization techniques, the TI 990 TriboIndenter, TI 980 TriboIndenter, TI Premier Series, and TS 77 Select nanoindenters will keep your materials development at the forefront of technology.
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Product
Test Charts
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Image Engineering GmbH & Co. KG
Professional image‑quality testing starts with reliable, standards‑compliant test charts. Our portfolio covers more than 200 chart types designed for camera evaluation, low‑light testing, spectral analysis, resolution measurement, grayscale performance, color reproduction, and lens characterization.
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Product
Dual Blackbody Wide FOV
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Dual blackbody, all reflective background IR target projector is used to characterize WFOV IR sensor systems. It features a broadband, 3 to 14 micron range, reflective IR target technology for the most accurate and stable differential targets, controlled background radiance, a 5º FOV with 36º uniform background.
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Product
USB4 Version 2.0 Receiver Compliance Test Software
N5991U42A
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N5991U42A is the receiver compliance test automation software, allowing you to test and characterize USB4 Version 2.0 PAM3 designs.
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Product
Differential Scanning Calorimeters
MicroCal DSC Range
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The "Gold Standard" for structural stability analysis of biotherapeutics, biological macromolecules and polymers in solution. Are microcalorimeters are powerful tools which enable characterization of the thermal stability of proteins and other biomolecules, primarily for biopharmaceutical development and manufacture. They are used for general stability studies, for biosimilarity and batch-to-batch comparability assessment, and for the optimization of purification and manufacturing conditions. MicroCal PEAQ-DSC systems are simple to use, requiring little assay development, and no labelling or immobilization.
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Product
Optical Communication Analysis
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In lab and manufacturing environments, R&D engineers require scalable and optimized test solutions to enable them to properly characterize new advanced modulation scheme signals for next-generation, ultra-high-speed telecom networks. Through EXFO’s optical communication analyzers, R&D engineers and manufacturing operations involved in the development or production of transmitters or systems based on new high-speed technology will find the right tools for their advanced technology needs.
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Product
High Voltage Optically Isolated Probe, 700 MHz Bandwidth. Includes soft-carrying case.
DL07-ISO
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The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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Product
High-resolution Spectrometer
HR4000
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Our next-generation high-resolution spectrometer is a novel combination of optics and electronics that is ideal for applications such as characterizing lasers, measuring gas absorbance, and determining atomic emission lines.
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Product
Data Acquisition
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Data Acquisition used to monitor and record data that characterizes the physical integrity and performance of aircraft, engines, and other large structures, as well as automate the functional testing of complex electronic systems.
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Product
PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-03
Digital Waveform
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Product
Inductive Proximity Sensors
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Millions of inductive proximity sensors are currently in use in virtually all industries. They detect metal objects without contact, and are characterized by a long service life and extreme ruggedness. With the latest ASIC technology, SICK's sensors offer the ultimate in precision and reliability.
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Product
Portable Test Platform
FTB-4 Pro
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The FTB-4 Pro is the latest addition to EXFO’s test orchestration portfolio which transforms business as usual into smarter, scalable network testing that significantly increases operational efficiency and provides vital insights into field operations, network performance and service delivery. The 4 slot modular FTB-4 Pro platform enables a unique combination for 100G commissioning, turn-up and troubleshooting which includes the FTBx-88200NGE 100G Multiservice tester (with iOptics transceiver validation software) and the FTB-5240S-P optical spectrum analyzer. There is no need to carry additional platforms or swap modules for unmatched transport and spectral testing on a single platform that no one in the industry can offer. The versatile FTB-4 Pro platform supports a wide range of modules for field testing, data center interconnect, submarine testing, and lab applications for maximum flexibility and ROI across all phases of the service delivery chain: development, deployment, maintenance and troubleshooting. Module combinations on the FTB-4 Pro can also include iOLM/OTDRs, market leading OLTS for fiber characterization, dispersion solutions and other transport modules all with compatibility with EXFO’s market leading fiber inspection probes.
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Product
Nanomechanical Test Instruments
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Product
InfiniiVision Oscilloscopes
3000T X-Series
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100 MHz - 1 GHz, DSO and MSO models Speed testing with simplified operation and documentation enabled by the 8.5-inch capacitive touch screen Isolate signals in seconds with exclusive Zone Touch Triggering See the most signal detail with 1,000,000 wfms/s update rateQuickly modulate and characterize signals with built-in WaveGen 20 MHz ARB, 3-digit voltmeter and 8-digit frequency counter & totalizer options Decode serial busses faster with hardware-based serial analysis options Protect your investment with full upgradeability
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Product
Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Product
Dynamic Vapor Sorption Analyzer
IGAsorp
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The IGAsorp is a fully automated compact benchtop DVS analyzer, for fast and accurate vapor sorption measurements using the dynamic flow technique for water and organic solvents. Measured vapor uptake isotherms and kinetics are used to characterize, test and evaluate materials in precisely defined environmental conditions.
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Product
X-ray Diffraction (XRD) Instruments
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X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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Product
Antenna Test Chamber for Automotive Radar
ATS1500C
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The R&S®ATS1500C radar test chamber is a compact antenna test range (CATR), consisting of a gold-plated parabolic reflector and a two-axis positioner for 3D movements of the radar module. Combined with the R&S®AREG800A target simulator and other Rohde & Schwarz test and measuring instruments, it can be used for a variety of applications, including antenna characterization, module calibration, RF performance validation, interference testing or in-band compliance testing. The chamber is equipped with a universal feed antenna which gives access to both polarizations in parallel. Automated temperature testing over the range of -40 to 85°C is possible with an optional enclosure.
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Product
Connected Meteorology
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"Epi to Etch" - get full control of your frontend processes! The LayTec Connected Metrology® ecosystem enables improved process control characterizing complex layer stacks along the manufacturing chain. In a typical frontend production line, wafers are measured 3 or more times by LayTec products.
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Product
CMOS Image Sensor
CIS
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CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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Product
LXI Microwave Matrix, 10GHz, Single 8x4
60-750-184
Matrix Switch Module
The 60-750-184 is a single 8x4 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
