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Product
PNA-L Microwave Network Analyzer
N5239B
Network Analyzer
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to8.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
LXI Microwave Matrix, 20GHz, Single 3x3 With Loop-Thru
60-751-133-A
Matrix Switch Module
The 60-751-133-A is a single 3x3 20GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Nanomechanical Test Instruments for Microscopes
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Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Product
High-Channel Density Precision SMU
PZ2100 Series
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PZ2100 source measure unit (SMU) solution. Focus more on characterization and less on synchronization, with multiple SMU module options and up to 20 SMU channels within a 1U rack space. Speed time-to-market with less programming, simplified system integration, and application-specific measurement capabilities.
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Product
Fully Portable Stand-Alone OTDRs
LOR-200
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The LOR-200 is a family of fully portable stand-alone OTDRs. The instrument is integrated in a Windows XP based PC-platform with touchscreen interface.The LOR-200 is based on Luciol's novel scanning photon-counting technology (US patent #7,593,098). It achieves a superior dynamic range, and allows high resolution fiber characterization up to a total distance range of 160 km.
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Product
RF Coaxial Probes & Probe Positioner
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Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.
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Product
PathWave BenchVue Advanced Power Control And Analysis
BV9201B
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The BenchVue Advanced power control app helps characterize voltage and current measurements and generate arbitrary waveforms for single instrument support.
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Product
Materials Test Systems
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An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Product
Pulsed and CW lasers, 375 – 1700 nm, 1 kHz measurement rate
871 Series
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The 871 Laser Wavelength Meter from Bristol Instruments is the best way to measure the absolute wavelength of both pulsed and CW lasers and OPOs. By combining proven Fizeau etalon technology with automatic calibration, the reliable accuracy needed for the most meaningful experimental results is ensured. What’s more, a sustained measurement rate of 1 kHz enables the wavelength characterization of every single pulse for most lasers. And, the resulting time resolution of 1 ms provides the most detailed analysis of tunable lasers.
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Product
Precision Mechanical Calibration Kit, DC To 26.5 GHz, 3.5 Mm
85052C
Mechanical Calibration Kit
The Keysight 85052C precision mechanical calibration kit contains precision standard devices to characterize the systematic errors of Keysight network analyzers in the 3.5 mm interface. This kit also contains adapters to change the gender of the test port and a torque wrench for proper connection.
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Product
PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
Source Measure Unit
PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Laser Diode Characterization Testing
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The Yelo Laser Diode Characterization system performs automated characterization of a laser device. The system will allow the operator to load a single packaged Laser device into a TEC controlled fixture mount. Each test station (LIV, Spectrum, Far Field/Beam Divergence) will then automatically align with the Laser Device in a sequential order and perform the automated tests required of each station.
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Product
Inorganic Elemental Analysis
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Elementar Analysensysteme GmbH
The elemental composition of a material determines its properties. Elemental analysis is therefore essential for the characterization and quality control of materials that need to meet certain requirements.Elementar's user-friendly inductar® series for inorganic elmental analysis uses the high-temperature combustion method to determine elemental concentrations of carbon, sulfur, oxygen, nitrogen, and hydrogen and is the ideal solution for R&D, routine, and high-throughput laboratories.
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Product
PXIe Vector Network Analyzer
M937xA Series
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The Keysight M937xA vector network analyzer (VNA) performs fast, accurate, measurements and reduces your cost-of-test by giving you simultaneous characterizations for two-port or multiport devices with a single PXI chassis.
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Product
Modulation Distortion Up To 53 GHz
S95070B
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S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
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Product
PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
783127-01
Signal Module
PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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Product
Digital Instruments
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Digital Instruments generate and acquire high-speed digital waveforms for transmitting data, communicating with devices under test, or testing digital interfaces. These instruments are ideal for semiconductor characterization and production, interfacing to LVDS and TTL digital electronics, and testing the functionality of high-speed serial links.
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Product
PNA-X Microwave Network Analyzer, 8.5 GHz
N5249B
Network Analyzer
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
InfiniiVision Oscilloscopes
3000A X-Series
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100 MHz to 1 GHz, DSO and MSO modelsView time-correlated digital content with16 digital channels (MSO)Modulate signals within the scope with WaveGen, built-in 20 MHz function generator (optional)Quickly characterize signals with the built-in 3-digit voltmeter and 5-digit counter option Decode serial busses faster with hardware-based serial analysis options for CAN, LIN, IC, SPI, RS232 and more Protect your investment with full upgradability
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Product
Automated Calibration
ORION
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ORION automates the process of characterization and calibration of engines. It facilitates the calibration process by taking control of both the ECU calibration system and the test cell control system to run experiments as part of an automated calibration process. With connectivity to IAV’s EasyDOE, Mathworks’ MBC Toolbox and other DOE tools, ORION provides an extremely powerful environment for mapping an engine and generating the Engine Management System calibration tables. The modular design means the product can be configured to a users’ specific requirements and work practices, rather than having to adhere to rigid methodologies dictated by prescriptive software.
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Product
Accelerated Life Test Systems
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Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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Product
4-Channel Simultaneous Sampling Module for DAQ970A and DAQ973A
DAQM909A
Simultaneous Sampling Module
The Keysight DAQM909A module enables the DAQ970A and DAQ973A Data Acquisition System to perform dynamic data acquisition for applications such as harmonic and noise distortion, power analysis, and acoustic characterization of electromechanical devices.
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Product
NED-LMD Near-Eye Display Measurement Systems
NED-LMD E-Series
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The world’s most comprehensive test systems to completely characterize augmented reality, virtual reality, mixed reality, and heads-up displays (AR, VR, MR and HUDs) by truly emulating the human eye and conforming to the latest standards being developed by the IEC and SID.
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Product
LXI Microwave Matrix, 10GHz, Dual 4x4 With Loop-Thru
60-750-244-A
Matrix Switch Module
The 60-750-244-A is a dual 4x4 10GHz microwave matrix with loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
test
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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Product
DWDM High Power DFB Buttterfly Laser
CA1782-XXX-XX-BT
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The CA1782-XXX-XX-BT DWDM High Power DFB Buttterfly Laser component is characterized for use as a CW optical source in CATV and DWDM networks. The CA1782-XXX-XX-BT is dc-coupled with a built-in TEC, thermistor, and monitor photodiode. The device is mounted in a 14-pin, OC-48 pinout compatible butterfly package with the optical isolator mounted on the TEC. The CA1782-XXX-XX-BT incorporates a high efficiency coupling scheme to deliver 40 mW, 50 mW, 63 mW and 100 mW of CW optical power.
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Product
Amplified Spontaneous Emissions (ASE) Sources
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The AP505xA series, high power ASE sources provide stable output power up to + 23dBm and broad flat spectrum over C+L band or T band. They enable effective and efficient measurements for component characterization or optical sensing. Finally, these products are proposed in friendly-user stand alone benchtop instrument with touch sensitive screen, GPIB, ethernet, RS-232 or USB controls.
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Product
ALD Services
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Our ALD Services help engineers optimize, troubleshoot, and scale their processes, covering everything from custom process development to equipment calibration and advanced film characterization.
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Product
Thermal Testing And Analysis
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Response Dynamics Vibration Engineering, Inc.
We have consulted on thermal issues ranging from conduction issues in TECs, thermal radiation modeling, and countless air cooled system issues relating to system performance, vibration, and acoustics noise. We use a wide array of thermocouple instrumentation, thermal imaging, flow measurements, as well as finite element analysis and analytic modeling to measure, design, and debug thermal and related issues. We often work on customer products in our Response Dynamics lab where we characterize the system, engineer solution options, and prototype solutions. We then work with the customer to work the winning solution into their quality control and manufacturing process.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-01
Signal Module
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
