Wafer Thickness
See Also: Wafer, Wafer Failure Analysis, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Product
Radar solution for thickness measurememt of steel & metal
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Our radar sensor solution determines the thickness and the thickness profile of steel plates, steel strips or steel slabs (up to 1600 °C hot) with an accuracy of up to ±10 µm on the roller conveyor. Thanks to robust radar technology, sophisticated signal processing and intelligent radar algorithms, OndoSense radar sensors achieve this high level of precision in thickness measurement even under the difficult production conditions of the steel industry with smoke, steam, dirt, vibrations, fire and extreme temperatures.
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Thickness and Flaw Inspection
FOCUS PX / PC / SDK
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Olympus offers a complete advanced phased array integration solution that meets the requirements of your most demanding customers. The solution includes the FOCUS PX, a powerful and scalable acquisition unit; FocusPC, a powerful data acquisition and analysis software program; and three software development kits (SDK), FocusControl, FocusData, and OpenView SDK, to customize your software interface based on your application and control FocusPC for a fully automated inspection solution.
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Destructive Coating Thickness Gauges
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Designed for measuring on a non-metallic substrate or assessing the thickness of a multi-coat paint, Elcometer offer a range of destructive coating thickness gauges such as the Elcometer 121/4 and Elcometer 141 that are portable and easy to use.
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Coating Thickness Gauge
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Shenzhen Linshang Technology Co., Ltd.
Linshang coating thickness gauge, also named dry film thickness gauge, which can identify the substrate automatically. It can be used in various fields such as coating thickness measurement, plating thickness measurement, fireproof and anticorrosive coating thickness measurement, etc. The dual-use coating thickness gauge such as LS220H, LS221, LS223 are suitable for ferrous and non-ferrous substrates, LS225+F500 is special for ferrous substrates and LS225+N1500 is special for non-ferrous substrates.
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Product
Wafer Mapping Sensor
M-DW1
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Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Product
Thickness Gauges for Plastic films & Paper
CHY-CA
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CHY-CA is a highly precise thickness gauge with mechanical contact method, which can be used to measure the thickness of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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Product
Surveyor Datalogger Thickness Meter
Multigauge 5750
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Has a choice of Multiple Echo, Echo to Echo or Single Echo to cover all requirements. Measurements can be stored on the gauge and wirelessly transferred to the PC.
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Product
Wafer Prober Networking System
PN-300
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The Wafer Prober Networking System PN-300 utilizes a database to facilitate data access from other systems and provides an environment that enables the user to edit data and handle processing. The system achieves wide-ranging compatibility by adopting standard hardware and operating system. In addition, it is equipped with an N-PAF (Network-based Prober Advanced Function) to provide robust support for wafer prober operation and maintenance.
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Product
Precision Coating Thickness Gauge Probe Range
Elcometer 355
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Unique probe modules allow the Elcometer 355 Coating Thickness Gauge to be versatile and flexible for any coating thickness measurement application.
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Product
Concrete Coating Thickness Gauge
500
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The Elcometer 500 Coating Thickness Gauge accurately measures the thickness of coatings on concrete and other similar substrates* - non destructively.
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Product
Handheld Gauge for Nondestructive Coating Thickness Measurement
PHASCOPE PMP10
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The most experienced device in our tactile portfolio – reliably solves all special applications.
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Product
Ultrasonic Material Thickness Gauges
MTG
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The Elcometer Ultrasonic Material Thickness Gauges have all the features and functionality necessary for measuring material thickness and velocity on virtually any material - for a wide range of applications.
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Product
Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
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Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Product
Ultrasonic Thickness Gauge
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Is a widely used nondestructive test technique for measuring the thickness of a material from one side.
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Asphalt Layer Thickness Measurement Devices
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ElektroPhysik Dr. Steingroever GmbH & Co. KG
Non-destructive road layer thickness measuring gauge to measure bituminous road layers or other electrically insulating road layers.
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Surface Thickness Gauges
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The Cygnus range of ultrasonic surface thickness gauges are non-destructive testing (NDT) instruments that enable an accurate metal thickness measurement to be obtained from one side only, without the removal of protective coatings or damage to test materials.
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MultiSite Test sockets and Wafer Level
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multi-site sockets include anything from strip test sockets to test sockets for wafer test to multi-position, singulated devices. The advantages of these sockets can be enormous as test time can be decreased by a factor of ten over conventional one up testing. In most cases, the throughput is only limited by tester capabilities and/or handling capacity.
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Thickness Gauging
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There are two main types of thickness gauges; the Box Gauge for measuring on aluminium and clad aluminium strip, and the C-frame Gauge for measuring on any non-ferrous strip and foil.
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Product
High Precision Thick Film Chip Resistors
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Panasonic Industrial Devices Sales Company of America
An AEC-Q200 Compliant SeriesPanasonic components specified as AEC-Q200 Compliant are consistently designed into automotive systems. However, today’s Design Engineers are specifying AEC-Q200 components to meet the high-quality standards of devices beyond automotive applications.
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LED Type Wafer Alignment Sensor Controller
HD-T1
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Panasonic Industrial Devices Sales Company of America
The HD-T1 Series is a new Wafer Alignment Sensor that uses a safe red LED light beam, with a resolution of 30µm, to achieve the same high level performance as Laser Sensors. The HD-T1 Sensor is best suited to detect wafer eccentricity, notches and orientation flats. Using linear image Sensor methodology and high-speed sampling technology, a wide variety of objects can now be stably measured with great precision at ultra-high speeds. This CCD style Sensor is developed for use in almost all fields of industry, e.g. tire manufacturing or Semiconductor production (Wafer Printed Circuit Boards).
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Product
Dry Film Thickness
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Dry film thickness, coating thickness or paint thickness as it is often known, is probably the most critical measurement in the coatings industry. It provides vital information as to the expected life of the substrate, the product’s fitness for purpose, its appearance and ensures compliance with a host of International Standards. In 1947, Elcometer launched one of the world’s first non-destructive coating thickness gauges, the Elcometer 101 Coating Thickness Gauge. For more than 6 decades, the design and production qualities of this rugged and reliable instrument have been the watchwords for all our products and these philosophies are still held today. Elcometer has a comprehensive range of Dry Film Thickness gauges to meet all of your coating inspection requirements.
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Coating Thickness Measurement
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The Calotest instruments from Anton Paar provide quick, simple and inexpensive determination of coating thicknesses. Employing the simple ball-cratering method, the thickness of any kind of single or multi-layered coating stack is accurately checked in a short time, in full compliance with relevant international standards.
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System to Handle Wafer Levels
AMI AW Series
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Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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Product
Wafer Analysis Systems
Tropel®
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Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
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Ultrasonic Wall Thickness Measurement Meters
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The LaserLinc UltraGauge+™ series of ultrasonic meters and gauges measure wall thickness, layer thickness, and concentricity of plastic, rubber, glass, and metal products. Typical applications include tubing, hose, pipe, insulated wire, cable, and certain multi-layer products.
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Product
Anti-Surge High Power Thick Film Chip Resistors
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Panasonic Industrial Devices Sales Company of America
Anti-Surge High Power Thick Film Chip Resistors by Panasonic
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Product
Moisture / Thickness / Density Meters
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On-line multi IR wavelength analyzer utilizing infrared absorption technology for measuring product constituent and/or thickness.
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Ultrasonic Thickness Gauge
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High-precision ultrasonic thickness gauge, suitable for various materials high-precision measurement needs, can be applied to steel, cast iron, aluminum, copper, zinc, etc.
