Wafer Thickness
See Also: Wafer, Wafer Failure Analysis, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection, Four Point Probes
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Thickness Measurement Testing
DRK3011B
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Shandong Drick Instruments Co., Ltd.
It is used for the durability test of children's mattress surface rolling and the test of the height of the cushion surface.
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Thickness Gauges for Plastic films & Paper
CHY-CA
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CHY-CA is a highly precise thickness gauge with mechanical contact method, which can be used to measure the thickness of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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Product
ITA, G10, 10 Module, 0.5" Standard thickness
410104123
ITA
ITA, G10, 10 Module, 0.5" Standard ThicknessUses VPC 90 Series Modules.
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Leather Thickness Gauge
UI-FT43
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Leather Thickness Gauge is used to measure the thickness of leather. Place the sample in a thickness meter under a specified load for a certain time and them read the thickness. Unuo Instruments supply film thickness gauge, film thickness gauge, rubber thickness gauge and etc. Shore Durometer for rubber is also available.
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Thick Film Passive Element
GBR-403
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GBR-403 series high voltage resistors are made in a thick film technology on ceramic substrates (Al2O3 96%). These elements are used in high voltage applications requiring high stability and resistance.
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EHC-09 Ultrasonic Corrosion Thickness Gage - Color
EHC-09C
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Danatronics offers our EHC-09 Color Wave series as the top of the line gages for corrosion applications. The EHC-09 Color Wave offers many standard and practical features including a sunlight readable color display with live A-Scan, echo to echo to ignore coatings, B-Scan, 100K thickness reading datalogger with interface to Microsoft excel. The Color Wave is available in 4 models including the EHC-09C, EHC-09DLC, EHC-09CW and EHC-09DLCW. The vibrate on alarm is a world’s first and is great for loud environments!
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Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
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Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
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Wafer Inspection Products
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Sonix provides manual and automated wafer inspection and metrology systems for wafers ranging from 100mm to 300mm, with extensive analysis capabilities at both the wafer and device level. These industry-leading automated wafer inspection systems are used by the world’s top manufacturers to ensure quality from development through production.
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Product
Surveyor Thickness Gauge
Multigauge 5650
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The Multigauge 5650 Surveyor Thickness Gauge is a simple, robust ultrasonic thickness gauge designed specifically for ship and small craft surveyors, but can also be used in applications where different measurement modes are required. The user has a choice of Multiple Echo, Echo to Echo or Single Echo to cover all requirements. The gauge can be used for metal, GRP or plastic measurement and it automatically switches modes and settings depending on the type of probe fitted. The easy to use keypad on the Surveyor Thickness Gauge allows operator interface whilst the bright LCD display can be used in all light conditions. All probes have Intelligent Probe Recognition (IPR), which automatically adjusts settings in the gauge at the same time as transmitting recognition data the result is a perfectly matched probe and gauge for enhanced performance. Additionally, the Automatic Measurement Verification System (AMVS) used with multiple echo ensures only true measurements are displayed, even on the most heavily corroded metals.
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Product
Layer Thickness Gauges
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PeakTech Prüf- und Messtechnik GmbH
Coating thickness gauges are used for the non-destructive measurement of coatings such as paint or plastic on metallic surfaces.
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Flaw Detector & Thickness Gauge
DFX-8
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Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms
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Product
Wafer Back Side Cooling System
GR-300 Series
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The GR-300 Series can control gases used to cool the back side of wafers that are fixed in position by an electrostatic chuck system.The stability and accuracy of the GR-300 makes it ideal for controlling the flow of Helium and Argon in wafer cooling systems.
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Ultrasonic Thickness Gauge w/A & B Scan and Thru Coating Capability
UTG-4000
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Utilizing color waveform A-scan and time based B-scan for absolute correctness, this new state of the art ultrasonic thickness gauge is packed with useful features allowing users to be confident of the displayed values on the most critical of applications. This multi-functional ultrasonic thickness gauge offers everything from basic measurement, Scan mode with Min/Max viewing, GO/NO GO display, Adjustable Sound Velocity and Thru-Coating Capabilities.
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Bond Tester for Wafers 2 - 12 inch
Sigma W12
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Bondtester for wafers or at wafer level 2” – 12” (up to 300 mm)Precise testing and Cold Bump Pull (CBP) testingLarge X/Y stages X: 600mm, Y: 370 mmForce range from 1gf – 10 kgfBump pitch down to 20 µm
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Inline OEM High Resolution Thickness & Resistivity Module for PV / Solar Sorters
MX 152
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To allow three thickness scans during belt transport at different wafer sizes, two measuring bars, one from top and one from bottom, hold 3 sensors each.
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Product
Wall Thickness Measurement Gauges
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ElektroPhysik Dr. Steingroever GmbH & Co. KG
Portable wall thickness measuring device for non-destructive measurement of up to 24 mm. Thickness measurement of all non-magnetic materials such as glass, synthetic materials, stainless steel and composites; can also be used for objects with complex geometries.
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Die-To-Wafer Bonding Systems
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Several different D2W bonding methods are available and selected depending upon the application and customer requirements. In direct placement D2W (DP-D2W) bonding, the singulated dies are bonded to the target wafer one by one using a pick-and-place flip-chip bonder. Plasma activation and cleaning of the surfaces of the dies on the handler wafer are essential steps for establishing a high-yielding bond and electrical interface between the dies and target wafer. This is where the EVG320 D2W activation system comes in.
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Wafer Lifetime Measurement with Photoluminescence Detector
WCT-120PL
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Measure the calibrated carrier-recombination lifetime of a silicon wafer using both the standard method and the photoluminescence meth
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Product
Wafer Mapping Sensor
M-DW1
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Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Flatness, Bow, Warp, Curvature, Glass Thickness
FLATSCAN 650 3D
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Optik Elektronik Gerätetechnik GmbH
High accurate flatness & thickness measuring system for large substrates.
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Automotive Paint Thickness Meters
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Shenzhen Linshang Technology Co., Ltd.
Linshang automotive paint meter, also named paint thickness meter, is a painting thickness gauge used to test car paint thickness. Linshang automotive paint meter can identify the substrate automatically. If you devote to find a cost effective paint thickness meter, you can view the digital coating thickness gauges listed below.
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Thickness Measurement
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Thickness Tester is a high precision mechanical contact method thickness tester, which can be used to thickness measurement of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
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Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
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Product
Production Wafer Level Burn-in
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TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
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Wafer Prober Networking System
PN-300
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The Wafer Prober Networking System PN-300 utilizes a database to facilitate data access from other systems and provides an environment that enables the user to edit data and handle processing. The system achieves wide-ranging compatibility by adopting standard hardware and operating system. In addition, it is equipped with an N-PAF (Network-based Prober Advanced Function) to provide robust support for wafer prober operation and maintenance.
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Coating Thickness Gauge
456
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The Elcometer 456 dry film thickness gauge is available in four different models. Each thickness gauge provides the user with increasing functionality - from the entry level Elcometer 456 Model E, to the top of the range Elcometer 456 Model T.
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Silicon & Compound Wafers
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Compound semiconductors are undergoing a major expansion addressing many new applications and using various materials such as SiC, GaN, GaAs and others, to improve the performance of new devices in several segments such as Power and Face Recognition.
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Ultrasonic Thickness Meters
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Used for measuring thickness and corrosion of pressure vessels, chemical equipment, boilers, oil storage tanks, etc. in industries of petroleum, shipbuilding, power station, and machine manufacturing. Applicable to measure the thickness of many materials, e.g. Steel, Cast iron, Aluminum, Red copper, Brass, Zinc, Quartz glass, Polyethylene, PVC, Gray cast iron, Nodular cast iron
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Coating & Material Thickness Gauges
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GAOTek’s coating thickness gauges are designed for measuring the thickness of a material and are for sale to the United States, Canada and globally. Our products utilize non-destructive testing techniques that do not permanently affect the material they are testing. They are reliable, high quality, and affordable pieces of equipment that can provide an accurate measurement and offering an efficient and quick means of inspection or testing. Our products emphasize compactness and portability to allow the user to work in complex conditions.
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EHC-09 Ultrasonic Corrosion Thickness Gage - Monochrome
EHC-09
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Danatronics most popular thickness gages are those in our EHC-09 series. With thousands of units in the field, our durable, custom molded case with raise rubber keypad is IP54 rated and has proven it can handle your toughest jobs (this is bad help fix). The EHC-09 series is available in 6 models to suit every budget and application. What’s best is our simple upgrade path where all gages are capable of quickly and easily (directly from the keypad) adding any software options. Features include a graphic display with multiple languages, vibrate on alarm, fast minimum, echo to echo to ignore coatings, 100K reading Datalogger with export to excel, B-scan and live A-scan with waveform adjust.
