Test Adapters
See Also: Interface Test Adapters
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Product
Interactive Benchtop Test
test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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Product
PXI Pull-Thru Adapter, Double Slot, 6.75"
510109566
Pull-Thru Adapter
The PXI Pull-Thru Adapter can house discrete wiring that connects from a VPC i2 MX Receiver module to a PXI card. The Adapter has a removable side plate and thumb tabs for easy removal from the Receiver frame. Accepts all i2 MX Receiver modules.
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Product
6TL22 Off-Line Testing Platform
H71002200
Test Platform
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Pull-Thru Adapter, Wired, TriPaddle/Mini Coax, 90 Series, for PXIe-5172
510140248
Pull-Thru Adapter
Pull-Thru Adapter, Wired, TriPaddle/Mini Coax, 90 Series, for PXIe-5172.
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Product
EVSE Test Platform
Test Platform
To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
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Product
Pull-Thru Adapter, Wired, TriPaddle, f/ NI PXIe-5423
510140249
Pull-Thru Adapter
Pull-Thru Adapter, Wired, TriPaddle, f/ NI PXIe-5423.
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Product
Coaxial Waveguide Adapter, 1.0 mm (m), 50 to 75 GHz
V281D
Coax Adapter
The Keysight V281D is a 1-mm male to V-band waveguide adapter with a frequency range of 50 GHz to 75 GHz. The Keysight V281D is used with the Keysight 8510XF systems.
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Product
Test Platforms
Test Platform
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Product
Digital Test Instrumentation
EDigital-Series™
Test Instrument
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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Product
EOL/Functional Testing
Functional Test
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
Test Fixture
Stopper kit includedYAVCANCON2 for fixture identification not included
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Product
Pull-Thru Adapter, PCB, TriPaddle
510140338
Pull-Thru Adapter
Pull-Thru Adapter, PCB, TriPaddle
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Product
Coaxial Waveguide Adapter, 2.4 mm (f), 26.5 to 40 GHz
R281A
Coax Adapter
The Keysight R281A adapter transforms waveguide transmission line into 50-ohm coaxial line. Power can transmitted in either direction, and each adapter covers the full frequency range of its waveguide band with SWR less than 1.3.
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Product
NI-6583, 200 MHz, 32 Single-Ended and 16 LVDS Channels, Digital I/O Adapter Module for FlexRIO
781320-02
Digital I/O Adapter
200 MHz, 32 Single-Ended and 16 LVDS Channels, Digital I/O Adapter Module for FlexRIO—The NI-6583 is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO, creates a digital instrument for interfacing with 32 single-ended and 16 low-voltage differential signaling (LVDS) digital pins. A digital I/O adapter module for FlexRIO can be used to do real-time interfacing of standard protocols and implement customized protocols. The NI-6583 can sample digital waveforms at up to 200 MHz. It includes support for selectable single-ended voltages from 1.2 to 3.3 Volts with 10 bit resolution and common LVDS voltages.
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Adapter, 2.4 mm (m) to APC-7, DC to 18 GHz
11902A
Coax Adapter
The Keysight 11902A is a 2.4 mm male to APC-7, metrology grade adapter with dc to 18 GHz operation.
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Product
PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
510140125-2
Pull-Thru Adapter
PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
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Product
Pull-Thru Adapter, Wired, TriPaddle, 68 Pin ML VHDCI, f/ AIT PXI-C1553
510140197
Pull-Thru Adapter
Pull-Thru Adapter, Wired, TriPaddle, 68 Pin ML VHDCI, f/ AIT PXI-C1553.
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Product
Interconnect Adapter, C-Size, Double Slot, 4 Module Positions
510109118
VXI Adapter
Interconnect Adapters funnel wiring from modules to a VXI card. The adapter has removable side, top and bottom plates. Connector cover plates and cable clamps are ordered separately.
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to 2x68 Female VHDCI Connectors
510150126
PCB Adapter
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Female VHDCI Connectors
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Product
Lens Module Test Platform
Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
Adapter, 50 Ohm Type-N (f) to 75 Ohm Type-N (m), DC to 3 GHz
11852B
Coax Adapter
The Keysight 11852B is an instrument-grade, 50-ohm type-N female to 75-ohm type-N male adapter. This product is also available in a 50-ohm type-N male to 75-ohm type-N female configuration. The 11852B Option 004 has a 50 Ohm Type-N (m) and 75 Ohm Type-N (f) connector.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
Fastest In-Circuit Test Platform
TestStation
Test Platform
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
PCB Adapter, ITA, SIM, VTAC, 16 Pos, 5 Slot, to (1) USB 5 Gbps (USB 3.0, USB 3.1 Gen 1, USB 3.2 Gen 1)
510171104
PCB Adapter (ITA)
A small, modular PCB board that connects high speed data inserts (VTAC) to a single USB 5 Gbps (USB 3.0, USB 3.1 Gen 1, USB 3.2 Gen 1) connector. Great for COTS cable configurations. Compatible with all VTAC/SIM ITA modules.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
