Test Adapters
See Also: Interface Test Adapters
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Product
Pull-Thru Adapter, PCB, TriPaddle
510140338
Pull-Thru Adapter
Pull-Thru Adapter, PCB, TriPaddle
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Portable, Integrated O-Level Test Platform
Guardian™
Test Platform
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Product
Communications Interface PCB Adapter
YAV9COM6
PCB Adapter
6 x Sub D-91 x RJ451 x 2 terminal block
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Product
Test Fixture
16047E
Test Fixture
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M648
Test Platform
The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
NI Real-Time Test Cell Reference System
778820-35
test
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
PCB Adapter, Receiver, TriPaddle, 64 Position, To PCB-Mounted 2x34 Pin (BERG 65496-019) Connectors
510104128
PCB Adapter
The 64 Pin Signal Receiver Module is made from Ryton® R-7 and will withstand temperatures up to 220°C. The 64 Pin Signal ITA Module is made from engineered resin and will withstand temperatures up to 150°C. Both the ITA and Receiver Modules have molded nomenclature.
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Product
Adapter, 2.4 mm (m) to APC-7, DC to 18 GHz
11902A
Coax Adapter
The Keysight 11902A is a 2.4 mm male to APC-7, metrology grade adapter with dc to 18 GHz operation.
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Product
NI-5782, 100 MHz Bandwidth Transceiver Adapter Module for FlexRIO
782705-02
Transceiver Adapter Module
The NI‑5782 is ideal for applications that require the acquisition and generation of IF or baseband signals with in-line, real-time processing. You can analyze acquired signals in the PXI FPGA Module for FlexRIO to perform measurements and generate response signals. Application areas include RF modulation and demodulation, channel emulation, bit error rate testing (BERT), signal intelligence, radio frequency identification (RFID) and near-field communication (NFC) test, real-time spectrum analysis, and software defined radio (SDR).
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Product
Dsub25 To 5 SMB Adapter
PX0106A
Adapter Module
Keysight's PX0106A Adapter converts Dsub25 outputs to five SMB outputs with path through connection. It supports the Keysight M9614/15A.
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Product
PXI Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female DIN
510140141-2
Pull-Thru Adapter
PXI Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female DIN
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Product
Functional Test for Engineering Lab
Spectrum BT
Functional Test
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
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Product
SoC Test System
V93000 SoC / Smart Scale
Test System
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
Functional Test
cUTS
Functional Test
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
Test Platform
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Wired Adapter for PXI, for National Instruments PXI-4110
510109469
Pull-Thru Adapter
Wired adapter or pull-thru from a 64 position TriPaddle receiver module to one 6 position Mini-Combicon plug and one 2 position Mini-Combicon plug.
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Product
In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
PCB Adapter, Receiver, QuadraPaddle, 192 Position, To PCB-Mounted 6x32-Pin Ribbon Cable Headers
510150155
PCB Adapter
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 6x32-Pin Ribbon Cable Headers
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
In-Line Coaxial-to-Waveguide Adapter, 1.0 Mm (f) To WR-12, 60 To 90 GHz
E281CS
Coax Adapter
E281CS E281CS In-line 1.0 mm (f) - to- WR-12 waveguide adapter offers a simple way of measuring waveguide devices in E-band, 60 GHz to 90 GHz.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Attenuator Interconnect Kit, 2.4 mm
11716F
Interconnect Adapter
The 11716F attenuator interconnection kit provides the necessary parts to connect 84904/8M and 84904/6L programmable step attenuators in series.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
Multiple Module Serial Bus Test Instrument
Bi4-Series
Test Instrument
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
