Test Adapters
See Also: Interface Test Adapters
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Product
PXI Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female DIN
510140141-1
Pull-Thru Adapter
PXI Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female DIN
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Product
Passive Probe Interface Adapter
CX1151A
Digital I/O Adapter
The CX1151A is an adapter for passive probes for the voltage waveform measurements by the CX3300 series Device Current Waveform Analyzer.
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Product
Adapter, 2.4 mm (m) to 3.5 mm (f), DC to 26.5 GHz
11901C
Coax Adapter
The Keysight 11901C is a metrology grade, 2.4 mm male to 3.5 mm female adapter with dc to 26.5 GHz operation.
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Product
PXI Digital Test Instrument
PXIe-6943
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Product
EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
PXI Module Adapter, Pull Thru Adapter, Receiver, 1 Position
510109462
Adapter Module
PXI Module Adapter, Pull Thru Adapter, Receiver, 1 Position.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
Other Test Systems
Test System
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
EVSE Test Platform
Test Platform
To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
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Product
NI-5781 , 40 MHz Bandwidth, RF Adapter Module for FlexRIO
781267-01
RF Adapter Module
The NI‑5781 is an analog dual-input, dual-output FlexRIO adapter module optimized for interfacing with baseband to RF upconverters and downconverters. When you pair the NI‑5781 with a PXI FPGA Module for FlexRIO, the resulting NI‑5781R is an FPGA-enabled reconfigurable I/O (RIO) baseband transceiver that you can use to implement custom RF modulation and demodulation, channel emulation, bit error rate testing, or spectral monitoring and jamming. Additionally, you can use the low latency and high throughput of FPGA‑based processing for ultra‑high‑speed control and inline processing applications.
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Product
CATR Benchtop Antenna Test System
ATS800B
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
Coax, Contact, Receiver, 20/26 GHz, 3.5MM, w/ SMA Adapter, 90 Series Modules only
610102135
Contact Adapter (Receiver)
Primary mating contact 610102134. (May mate with other ITA contacts, as well.)
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to 2 PCB-Mounted 12X Male InfiniBand Connectors (LVDS)
510150210
PCB Adapter
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to 2 PCB-Mounted 12X Male InfiniBand Connectors (LVDS)
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Product
AC Power Adapter For Handheld Component Testers
U1780A
Power Adapter
The Keysight U1780A consists of an AC Power Adapter and power cord (according to country). The adapter is to be used with the U1700 Series Handheld Capacitor and LCR meters. This optional adapter enables users to power up their U1700 Series handhelds without using the meter´s supplied battery.
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
Test System
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female
510140255
Pull-Thru Adapter
Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female
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Product
PCB Adapter, Receiver, SIM, VTAC, 32 Pos, 6 Slot, to (1) DisplayPort
510170116
PCB Adapter (Receiver)
A small, modular PCB board that connects high speed digital inserts (VTAC) to a single DisplayPort connector. Great for COTS cable configurations. Compatible with all VTAC/SIM receiver modules.
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Product
OTP-Based Test System
Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Attenuator Interconnect Kit, SMA
11716C
Interconnect Adapter
The Keysight 11716C quickly and conveniently connects 1 dB step and 10 dB step attenuators together to achieve greater dynamic range with 1 dB steps. The Keysight 11716C can be utilized to connect any of the two Keysight 8494/95/96 attenuators in series.
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Product
Component Test Fixture For N1413 With B2980 Series
N1428A
Test Fixture
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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Product
PXI Pull-Thru Adapter, Wired, Excalibur EXC-4000cPCI/xx
510140129
Pull-Thru Adapter
PXI Pull-Thru Adapter, Wired, Excalibur EXC-4000cPCI/xx
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Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
Functional Test
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
Adapter, 1.0 mm (f) to 1.85 mm (m), DC to 67 GHz
11921H
Coax Adapter
The Keysight 11921H precision 1.85 millimeter coax-to-coax adapter offers a simple way of measuring coaxial devices at higher frequencies. It is designed for the measurement of components with 50 ohms impedance and frequency range from dc to 67 GHz.
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Product
Advanced SoC/Analog Test System
3650-EX
Test System
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
Test Fixture
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
