Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
IP Video Stream Analysis And Monitoring
TSM100
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The Mividi TSM100 is an MEPG transport stream analyzer and IP video monitoring system for monitoring the quality of digital video services (QoS) delivered via IP or ASI interfaces. It can simultaneously monitor up to 300 services and perform deep MPEG analysis and video quality check 24 x 7. The system can be used for analyzing MPEG-2, H.264 and HEVC programs delivered over the Internet, as well as head-end equipment that uses IP for video transmission. The TSM100 provides IP layer analysis, MPEG transport layer analysis, key frame decoding, audio loudness measurement and service profiling. The system receives IP encapsulated digital audio and video data via 1 Gbits or 10Gbits Network adaptor. It will monitor all media flows in the network, perform extensive tests on standard compliance and user profile matching, and generate alarms when TS, video or audio errors occur.
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Product
Multivariate Analysis and Experimental Design Software
The Unscrambler
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Analytical Spectral Devices, Inc.
The Unscrambler software from Camo Software is a complete Multivariate Analysis and Experimental Design software solution, equipped with powerful methods including PCA, Multivariate Curve Resolution (MCR), PLS Regression, 3-Way PLS Regression, Clustering (K-Means), SIMCA and PLSDA Classification etc.
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Product
DCA-M High-Accuracy, Low-Cost Solution for Optical Waveform Analysis
N1090A
Oscilloscope
The N1090A DCA-M builds on that legacy by using the high-performance elements of 86100 and 86105C. It can be configured to perform thorough optical transmitter compliance tests at a variety of standard data rates from 1.244 to 11.3 Gb/s and come with 20 GHz electrical channel in option.
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Product
Quality Measurement Tools for Voice, Audio/Visual and Data Payload analysis
PEXQ
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PEXQ is OPTICOM’s latest product for Windows offering a complete portfolio of quality measurement tools for voice, audio/visual and data payload analysis based on human perception. PEXQ provides mandatory features in the area of R&D for the development of new multimedia codecs as well as for multimedia equipment manufacturers. Besides lab testing PEXQ is also ideal for network operators and carriers to measure quality of service. PEXQ is founded on well established internationally standardized measurement algorithms such as PESQ (ITU-T Rec. P.862, P.862.1 (narrow band), P.862.2 (wide band); Perceptual Evaluation of Speech Quality) and completely new metrics for video quality testing like PEVQ (Perceptual Evaluation of Video Quality).
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Product
Embedded Serial Triggering and Analysis for InfiniiVision DSOX1000 Series Oscilloscopes
DSOX1EMBD
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The IC, SPI, and UART/RS-232 serial decode option for InfiniiVision 1000 X-Series oscilloscopes (DSO models) displays responsive, time-aligned, on-screen decode of Inter-Integrated Circuit (IC), 3-wire Serial Peripheral Interface (SPI), and UART/RS232 serial communication buses. Because it is hardware-based, this option provides the fastest throughput solution for triggering on and analyzing IC, SPI and UART/RS-232 serial buses found in a wide variety of embedded designs.
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Product
Spectrum Analysis For P50xxB Up To 26.5 GHz
S970905B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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System for Analysis and Jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32G) Fibre Channel
SierraNet M328Q
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The SierraNet M328Q™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32G) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with two QSFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328Q includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.
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Product
Sound and Vibration Real-Time Analysis System
DS-3200 series
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The DS-3000 series Data Station is a PC-based FFT Analyzer with high functions and high performance. This new FFT Analyzer has two times or more of real-time analysis capability compared to the existing model the DS-2000 series, having the high-speed calculation performance, reliability, and user-friendliness based on our accumulated experience.
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Product
Inspects MEMS and Wafer Level Devices
NorCom 2020-WL
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The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
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Product
Sensor Scene Modeling and Analysis Software
INSSITE
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INSSITE is a sensor scene modeling and analysis environment. Different sensor types and modalities, spanning radar (synthetic aperture radar [SAR], ground moving target indicator [GMTI], detection and ranging, radio frequency [RF] communications), visible/infrared (passive electro-optical/infrared [EO/IR], laser radar [ladar], thermal IR), can be evaluated against high fidelity scenarios constructed by the user.
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Product
DFT Testability Analysis Software
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Landrex Technologies Co., Ltd.
DFT Testability Analysis Software
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Product
Hybrid Worst-Case Timing Analysis
TimeWeaver
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AbsInt Angewandte Informatik GmbH
TimeWeaver combines static path analysis with timing measurements to provide worst-case execution time estimates.The tool estimates the worst-case execution time (WCET) of tasks based on the execution time of trace segments obtained from real-time instruction-level tracing. The computed time bounds are valuable for soft real-time systems and provide feedback for optimizing worst-case performance.
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Product
Stand Alone Wafer Sorter
MicroSORT
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The Microtronic MicroSORT semiconductor wafer sorter is designed to maximize throughput while minimizing wafer handling in a user-friendly operating environment. This stand-alone semiconductor wafer sorter enables sophisticated semiconductor wafer sorter routines for up to 4 wafer-cassette platforms. MicroSORT semiconductor wafer sorter reads OCR scribes from the top, bottom, or simultaneously, allowing for enhanced semiconductor wafer tracking and sorting. The MicroSORT semiconductor wafer sorter’s basic functions include the ability to move, compress, randomize, find, align, verify, and split semiconductor wafer lots. With our virtual tweezer mode, an operator can click on wafer icons to move wafers between cassettes, read semiconductor wafers, and swap wafer positions.
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Product
Solid-State Battery Test Cell For X-Ray & CT Analysis
SBT1
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Solid-state battery test cell designed for X-ray imaging, CT analysis, and electrochemical testing, featuring an X-ray-transparent structure for advanced battery materials characterization.
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Product
Wafer Sort
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TestEdge offers complete wafer sort solutions. Our range of wafer sort capabilities demonstrates our ability to handle a wide range of devices and device characteristics. State of the art Electroglas probers Sort experience with high probe count Less than 4 mil pitch on probes Experience with C4 Bump and Aluminum pad Experience on Bipolar, CMOS, GaAs, & SiGe Overhead sort or cable harness sort Microsite testing capability
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Product
Software Composition Analysis
SCA
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*Test Immediately in Your Development EnvironmentLaunch scans right from the command line for fast feedback in the pipeline and IDE. See and fix code errors earlier in the Software Development Life Cycle.*Reduce Fix Time From Hours to MinutesAuto-remediation capabilities prescribe intelligent fixes, generate auto-pull requests, and minimize disruption for higher accuracy and faster fix rates. *Automate Open-Source Policy and GovernanceEasily manage your open-source usage with continuous monitoring, extensive analytics, and flexible policies.
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Advanced Data Collection, Display and Analysis Software for WIndows & Mac
PASCO Capstone
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PASCO is pushing the limits of technology, so you can push your students to their potential. Working closely with educators, we continuously develop Capstone™, making improvements and enhancing the teaching features. Capstone is designed to handle large data sets, high-speed sampling, and customized preferences to fit the needs of your lab. A straightforward user interface is approachable for beginners, yet Capstone offers all the capabilities needed for even the most advanced users. Our generous site license allows students to install PASCO Capstone on their own computers so they may perform data analysis off campus.
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Enhanced Time Domain Analysis With TDR
S96011B
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Use S96011B to perform enhanced time domain analysis for high-speed data applications. Includes all functionality of the S96010B (TDR/TDT mode). In addition, the S96011B enables more detailed measurements and evaluations, such as eye diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S96011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, use mechanical calibration kits or ECal with DC option (i.e. N469xD or N4433D with Option 0DC).
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Product
Order Tracking Analysis
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Order Tracking is a general term describing a collection of measurement functions used for analyzing the dynamic behavior of rotating or reciprocating machinery for which the rotational speed can change over time.
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Spectrum Analysis
S96090B
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The spectrum analyzer (SA) application adds high-performance microwave spectrum analysis to the analyzer. With fast stepped-FFT sweeps, the SA application provides quick spurious searches over broad frequency ranges.
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Optical Communication Analysis
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In lab and manufacturing environments, R&D engineers require scalable and optimized test solutions to enable them to properly characterize new advanced modulation scheme signals for next-generation, ultra-high-speed telecom networks. Through EXFO’s optical communication analyzers, R&D engineers and manufacturing operations involved in the development or production of transmitters or systems based on new high-speed technology will find the right tools for their advanced technology needs.
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Product
Time Domain Analysis
S93010A
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The time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to the time domain or time domain data to the frequency domain.
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Product
Wafer Bonder
AML
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Wafer bonding has found many applications in the field of MST, MEMS and micro engineering. These include the fabrication of pressure sensors, accelerometers, micro-pumps and other fluid handling devices. The process is also used for first-order packaging of silicon microstructures to isolate package-induced stresses. The OAI AML Wafer Bonder facilitates both the alignment and bonding to be performed in-situ, in a high vacuum chamber. For anodic bonding the wafers are loaded cold and heated in the process chamber. For high accuracy alignment the wafers are aligned and brought into contact only after the process temperature has been reached, thus avoiding differential thermal expansion effects which can compromise alignment. The AML Wafer Bonder is excellent for anodic bonding, silicon direct and thermal compression bonding applications. These features enable the bonder to be used with virtually any processing tool.
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Fluid Analysis Information Management System
LubeTrak
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LubeTrak compiles individual MicroLab oil reports into a consolidated database of historical information. This allows fleet managers to view and manage their MicroLab oil analysis results across the entire fleet. This fleet-level view can be used to assess the health of the entire fleet to optimize maintenance program and practices.
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Product
Signal Analysis
Synchronous Accumulation (Order Analysis)
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Order analysis is one of the most convenient and efficient methods for diagnostics and balancing of rotating mechanisms and transmission gears. With an RPM sensor and a vibration sensor, it is possible to study the time characteristics of gear vibration signals. It is a well-known fact that a signal from a vibration sensor is affected by signals from other sources. To tune out from the disturbing signals, the synchronous signal accumulation method is used. For each shaft rotation, the RPM sensor provides a rotation mark. This signal serves as a triggering strobe for the vibration sensor signal sweeping. The obtained signal sweeps are combined. All the sources of the signals related to the shaft frequency (frequency of rotation) are accumulated and increased in the accumulator linearly proportionally to the N number of rotations. All other signals that are not correlated with the shaft frequency are accumulated proportionally to N1/2 and in case of a greater number of averagings, the useful signal exceeds the interference level.
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Spectroscopy & Scientific Analysis Systems
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Advancing Knowledge. Empowering Breakthroughs. Our spectroscopy instruments and software help advance knowledge and understanding of radioactive materials, empowering the next wave of breakthrough science and innovation.
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Product
Batch Wafer Transfer Tools
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises Batch Wafer Transfer Tools
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Product
8VSB/QAM And ASI Analysis Probe For USB-2
DTU-236A
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DekTec's USB-2 hardware-based analyzer for 8VSB and QAM. Equipped with advanced RF measurement options and designed to operate USB powered, this is a very convenient tool for analysis in the field.
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Product
Harmonic Analysis Software
HI_WAVE
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HI_WAVE simulates resonance and harmonic distortion in industrial, commercial, and utility power systems.
