Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Seismic Analysis and Monitoring
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Seismic analysis and monitoring have been designed on the base of the contemporary seismic studies. We can offer you a wide range of tools for geophysical surveys, seismic tomography, automated monitoring of bearing structures (structural health monitoring), seismic monitoring of oil piping systems.
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PoE LLDP Emulation (PD) & Analysis for 802.3at & 802.3bt
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The optional LLDP Emulation feature allows a PSA-3000, PSL-3424L, or PSL-3000 test port to behave just like an 802.3at or 802.3bt PD that uses LLDP to convey its power demands. 802.3 PoE LLDP is a special variant of LLDP protocol that involves handshakes and protocol timing between a PSE and a PD.
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Spectrum Analysis For P50xxB Up To 9 GHz
S970902B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Liquid Crystal Thermographic Analysis Tool
thermVIEW
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Advanced Thermal Solutions, Inc.
thermVIEW is a high resolution liquid crystal thermography system for cost effective temperature measurement of electronic circuit boards, micro circuits, hybrid components and integrated circuits. One micron level* thermal mapping of electronic devices.
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Cable Pulling Analysis
CABLE
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CABLE quickly solves complex three-dimensional cable pulling tension and sidewall pressure calculations, allowing you to make rapid and accurate design decisions.Don't leave installation to chance.
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Die-To-Wafer Bonding Systems
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Several different D2W bonding methods are available and selected depending upon the application and customer requirements. In direct placement D2W (DP-D2W) bonding, the singulated dies are bonded to the target wafer one by one using a pick-and-place flip-chip bonder. Plasma activation and cleaning of the surfaces of the dies on the handler wafer are essential steps for establishing a high-yielding bond and electrical interface between the dies and target wafer. This is where the EVG320 D2W activation system comes in.
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NRZ Analysis for Signal Integrity Studio, WavePulser 40iX High-Speed Interconnect Analyzer
WAVEPULSER-SI-STUDIO-NRZ
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Signal Integrity (SI) Studio uses SDA Expert (SDAX) serial data analysis software options to simplify NRZ or PAM serial data jitter, eye diagram, noise and crosstalk measurement and analysis setup.
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Failure Analysis Services
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Innovative Circuits Engineering, inc
Innovative circuits engineerin's failure analysis group performs root cause analysis on a wide variety of integrated circuit devices.
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Light Analysis
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Welcome to Thorlabs; below you will find links to detectors and instrumentation that measure the various properties of light, a subset of our entire line of photonics products. Thorlabs offers an extensive selection of instruments that measure the properties of light. Our versatile power and energy meters can be used with over 25 different sensors in order to make NIST-traceable power and energy measurements. If the convenience of a meter is not desired, our selection of detectors includes basic photodiodes (uncalibrated and calibrated), photodetectors (biased, amplified, and avalanche), CCD and CMOS arrays, position detectors, integrating spheres, and photomultiplier tubes. The Beam Characterization category contains beam profilers (camera and scanning slit), a wavefront sensor, spectrometers, and interferometers, while the Polarimetery link leads to a selection of instruments used to measure and control the polarization of light.
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Data Collection And Analysis Software
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The MESUR™ software series expands the functionality of Mark-10 force and torque gauges, indicators, testers, and test stands. MESUR™ Lite is a basic data acquisition program included free with all Mark-10 products, while MESUR™gauge is a more advanced software package which also plots, calculates statistics, generates reports, and provides other analysis tools. MESUR™gauge Plus adds motion control of certain test stand models.
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Wafer Lifetime Measurement with Photoluminescence Detector
WCT-120PL
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Measure the calibrated carrier-recombination lifetime of a silicon wafer using both the standard method and the photoluminescence meth
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Wafer Mapping Sensor
M-DW1
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Panasonic Industrial Devices Sales Company of America
To provide better safety and improved sensing accuracy, Panasonic studied the requirements for future Wafer Mapping Sensors to ultimately develop the LED Beam Reflective Type Wafer Mapping Sensor, M-DW1. This Sensor uses LEDs as a light source for safe operation and a 2-segment receiving element for higher accuracy in wafer detection.
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Signal Integrity Studio, Analysis & Simulation SW for WAVEPULSER High-Speed Interconnect Analyzer
WavePulser-Signal Integrity (SI) Studio
Analyzer
WavePulser Signal Integrity (SI) Studio is included as a single license in the WavePulser 40iX-BUNDLE or can be purchased as an additional license for offline access to additional users. WavePulser Signal Integrity (SI) Studio combines S-parameter, Impedance profiling and de-embedding measurements, channel and equalizer modeling, eye diagrams and jitter analysis in a single affordable software package for emulating the complete serial data channel.
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Chemical Analysis and Corrosion Testing
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Performing chemical analysis of metal alloys including both ferrous and non-ferrous alloys.Chemical analysis involves determining the chemical constituents of metals and related materials.An industry leader and co-operating laboratory for qualifying Calibration Standards for Chemical Analysis.Our chemical laboratory processes include Spectroscopy – Optical Emission Inductively Coupled Plasma, gas analysers, wet chemical, Intercrystalline/ Intergranular Corrosion (including G28, G48 etc).
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Sound and Vibration Analysis
Compact Analysis
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Compact Analysis is an ArtemiS SUITE module which is focused on the basic functions and the ideal tool for tasks that only require a few clicks.
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Satellite Carrier Reconnaissance and Analysis System
SCL-SACRAS
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Shoghi’s Satellite Carrier Reconnaissance and Analysis System (SCL-SACRAS) is capable of detecting Point-to-Point satellite links, which work for international Voice networks, GSM Abis backhaul links, IP links and VSAT networks of major VSAT manufacturers including iDirect, Hughes, Gilat, Eastar Romantis, Comtech; including the various types of proprietary protocols and services running on them.SCL-SACRAS can be utilized for the carrying out the detailed reconnaissance of satellite carrier frequencies running on various target satellites, for identification of target carriers for regular monitoring which are of the customer’s interest. Military or intelligence agency customers can utilize this system to identify the target links on respective satellites for continuous monitoring, using the Shoghi VSAT Monitoring System.
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Gas Analysis
HPR-20 S1000
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The Hiden HPR-20 S1000 gas analysis system configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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Venable Stability Analysis Software
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In 1983, Venable launched the renowned K-Factor Technique, still in use by many instrument manufacturers today. Venable has elevated the original software with its innovative Stability Analysis program. Go straight from measurement to design using Stability Analysis as its dynamic functionality eliminates lengthy manual value calculations and guesswork. Compensation amplifier synthesis capability, or coefficients for digital power supplies, enables user to achieve exact feedback loop bandwidth and phase margin desired on the first try.
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Gas Analysis
HPR-20 EGA
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The Hiden HPR-20 EGA gas analysis system is configured for continuous analysis of evolved gases and vapours from thermogravimetric analysers, TGA.
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Finite Element Analysis
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Response Dynamics Vibration Engineering, Inc.
An understanding of structural dynamics is very important to sound Finite Element Analysis (FEA). We have been performing FEA analysis for over 30 years and in most cases we have used experimental data to guide our modeling. While our engineers have had undergraduate and graduate courses in FEA, it is the years of modeling and analysis of existing structures that has taught us the most by forcing a thoughtful analysis of the key structural dynamics and then going though the process of making adjustments to boundary conditions, expanding the dynamics of the model in places, and making simplifications and approximations where possible.
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E-Band Signal Analysis Reference Solution
Reference Module
The E-band signal analysis reference solution provides an effective measurement solution for today’s wideband signals as well as emerging communications standards. With the M1971E waveguide harmonic mixer, which provides a 55 to 90 GHz input; Keysight oscilloscopes, which provide excellent signal integrity; and the powerful 89600 VSA software, you have a high-quality wideband measurement solution. A simple user interface also provides integrated mixer setup, correction and LO optimization, allowing for accurate measurements.
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Compact System for Chemical Analysis Technology
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Small test system based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of measuring instruments for chemical analysis in a high mix / medium volume environment.
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Signal Analysis Synthetic Instrument
SASI
Synthetic Instrument
Textron Systems’ SASI 240 is a Signal Analysis Synthetic Instrument that combines the capabilities of six distinct measurement systems into a single device. Our dual-channel architecture enables two independent radio frequency (RF) measurements to be run simultaneously. Whether used as a benchtop device or an integrated automated test equipment (ATE) RF subsystem, our SASI’s simple and intuitive graphical user interface (GUI) ensures easy, out-of-the box functionality.
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Metallurgy Analysis
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The metallurgical group is well equipped and staffed (9 full-time metallurgists and technicians) to evaluate materials ranging from cast iron to superalloys to composites. They are experienced in classical metallographic techniques, as well as the latest preparation methods.
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Quality Measurement Tools for Voice, Audio/Visual and Data Payload analysis
PEXQ
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PEXQ is OPTICOM’s latest product for Windows offering a complete portfolio of quality measurement tools for voice, audio/visual and data payload analysis based on human perception. PEXQ provides mandatory features in the area of R&D for the development of new multimedia codecs as well as for multimedia equipment manufacturers. Besides lab testing PEXQ is also ideal for network operators and carriers to measure quality of service. PEXQ is founded on well established internationally standardized measurement algorithms such as PESQ (ITU-T Rec. P.862, P.862.1 (narrow band), P.862.2 (wide band); Perceptual Evaluation of Speech Quality) and completely new metrics for video quality testing like PEVQ (Perceptual Evaluation of Video Quality).
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Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
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Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
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Spectrally Controlled Interferometry For Measurement And Analysis
SCI
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Directly measure all surfaces and angles in one setup, for an ROI of < 1 year.
