Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Proactive Downstream Spectrum Analysis
SpectraVizion
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SpectraVizion is an innovative, software-based diagnostics tool that leverages new advancements in remote spectrum capture, allowing cable operators to address downstream spectrum impairments proactively, before subscribers call in with service complaints. “Troubleshooting downstream spectrum issues has always been a reactive process for cable operators,” said Arthur Skinner, Vice President of Worldwide Sales for ZCorum. “Often they’re not aware they have an issue until a customer calls, and that’s when they then send a technician to the home with a hand-held meter to start a search for the problem.” SpectraVizion takes the guesswork out of problem identification and location by presenting on a simple dashboard a list of devices that are experiencing common downstream issues like Standing Waves, FM Noise, Suck-outs, Roll-off and Tilt. The tool leverages the spectrum data available from cable modems and set-top boxes that support full band capture, and advanced detection algorithms automatically identify devices experiencing downstream impairments. The operator can click on any device in the list to view a capture of the full spectrum from that day, or up to 30 days in the past.
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Product
In-Process Wafer Inspection System
7945
System
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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Product
Analog Waveform Development and Analysis Software
WaveEasy
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WaveEasy is an interactive analog waveform editor software tool for creating and editing analog waveforms. To view or edit existing waveforms, you can open or save files using various file formats including WaveEasy, ASCII or text (txt, csv, prn), or the NI-HWS (hws) format which is used by many instrument drivers.
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Product
Dynamic Mechanical Analysis
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The DMA systems from Anton Paar perform dynamic mechanical analysis in torsion, tension, bending and compression at unprecedented precision. Whatever your DMA requirements are, the DMA systems from Anton Paar are efficiently and comfortably adapted to meet your needs. Use the systems for the dynamic mechanical analysis of solutions, melts, solid bars, films, foils, or reactive resins.
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Product
True Dual-Channel Analysis on iOS
IOScope
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With IOScope, measure loudspeaker impedance, frequency response, and sensitivity. Measure a room impulse response. Tune a large sound reinforcement system, time-align a set of surround sound speakers, or optimize your home stereo. Determine the actual cutoff frequencies of your latest speaker crossover circuit, or teach your students the fundamentals of Fourier analysis of dynamic systems.
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Product
Tracking Analysis Software
DS-0322
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This software enables tracking analysis with high-speed (calculation speed: approx. at 20ms/4-ch), high-resolution (1000 blocks max.) and high-accuracy (more than 100dB dynamic range). It can plot rotation-tracking diagram during calculation, and also can set and plot the diagram of intended order or frequency after the calculation. *DS-0321 series FFT analysis software is required.
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Product
Signal Analysis
Histograph
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The Histograph software is used for statistical signal analysis: finding the statistical values characterizing the signal and building the theoretic histograms based on the data obtained.
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Product
Digital Wideband Transceiver Analysis
S94610B
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Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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Product
Auto Macro Wafer Defect Inspection
EagleView
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EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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Product
Wafer Thickness Measuring System
WT-425
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Contact type can measure any materials within 0.2 µm (2 σ at 20℃ ±1℃). The wafer floats positions while measurement points change and it does not damage even thin wafers. Best for the process control of compound wafers and oxide wafers. (SiC, GaN, LT, Sapphire and Bonded Wafers)
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Product
Wafer Prober
Prexa MS
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The latest fully automated 300mm wafer prober for memory devices. Featuring high rigidity and exceptional thermal control, the system enables full-wafer contact testing.
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Product
Mass Spectrometry Imaging Data Analysis Software
IMAGEREVEAL MS
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Simplifying Routine Analysis Are you worried about wasting time or valuable data? Automatically uncover important information from large amounts of data with IMAGEREVEAL MS.
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Product
Recording and Analysis Software
DataVu-PC
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DataVu-PC analysis software is specifically designed for record and playback applications and makes short work of searching through large datasets for any signal of interest. You can use triggers to start recording, minimize storage requirements using windowing, and automate your signal search with tools like frequency mask, pulse descriptor words and smart markets.
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Product
DDR4 Protocol Debug And Analysis Solution
U4972A
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The U4972A DDR4 DRAM bundle provides software applications, probing, and hardware options for DDR4 DRAM debug, compliance validation, and analysis. The U4972A bundle includes systemization of hardware (modules installed into chassis) and software loaded onto the M9537A controller.
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Product
RF And Microwave Signal Generation And Analysis
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The need for microwave test and measurement technology is even more urgent than the need for microwave equipment itself. Therefore, Shengbo Technology is relying on its own research and development capabilities to strive to become one of the comprehensive microwave test and measurement equipment suppliers. We provide a wide range of RF microwave test products, including a good-quality full-band broadband up-down converter . You can provide 2GHz real-time bandwidth signal up-down conversion function in the frequency range of 0.1 ~ 40 + GHz. With our channel simulator , we Became the first company in the world to provide channel analog solutions in such a wide range of broadband signals. At the same time, we are also an innovativesupplier of noise sources and multi-channel microwave signal sources in the industry.
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Product
Spectrophotometers, Laboratory And Analysis Systems
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Instruments, accessories and calibration standards for in-situ and ex-situ optical transmission, reflection, absorption, and photoluminescence measurements
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Product
Multifunction Data Collection and Analysis System
9000
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The Model 9000 DME System is a high performance multifunction data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER), Digital Fault Recorder (DFR), Dynamic Disturbance Recorder (DDR), and Continuous Recorder data in conformance with PRC-002-1 and PRC-018-1. All data recorded by the DME system is stored in IEEE C37.111 format and named in conformance with IEEE C37.232. The system also has a software option to enable the Phasor Measurement Unit (PMU) feature to provide streaming data in conformance with IEEE C37.118.
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Product
IC Product Testing & Analysis Services
Integrated Service Technology
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Integrated Service Technology Inc.
iST (Integrated Service Technology Inc.) is a leading lab-service company, specializing in the development of IC product testing & analysis, failure analysis, debugging, reliability test, material analysis. Apart from developing testing technologies for the upstream IC design and semiconductor industries, iST also expanded to provide a full-spectrum of services for the mid and downstream companies in the electronics industry.
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Product
04 With Pins For PCB | 1 Wafer | 12 Positions
04-1xx4-20/70-xx
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Very robust, multi wafer selector with 30° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Product
PCIE GEN5 Analysis System
KODIAK
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PCIe Analysis Platform with Embedded Hardware, Calibration-Free SI-Fi™ Probing and Automatic Equalization, Internal SSD Storage, Touchscreen LCD, and Standard PCIe Cabling.
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Product
Occlusal Analysis with BiteForce DynamicsTM
T-Scan
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The T-Scan is a diagnostic device that measures relative biting forces, including occlusal force, timing and location and is an ideal complementor to articulating paper. The technology was invented by Dr. William Maness in 1987 at Tufts University and M.I.T.
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Product
Veracode Dynamic Analysis
DAST
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Identify and Fix Critical Runtime Vulnerabilities in Web Applications and APIs.* Identify Vulnerabilities in Runtime Environments. Simultaneously scan hundreds of web apps and APIs to find vulnerabilities quickly - including pre-production and staging environments behind a firewall.*Prioritize and Fix Flaws Quickly, A <5% false positive rate allows teams to focus on the vulnerabilities that matter. Detailed, actionable remediation guidance means flaws are fixed faster.*Contribute to a Successful DevSecOps ProgramDynamic scans can be viewed in the Veracode Platform alongside other application security tests, providing multi-faceted insights into the entire security program. Insights and analytics can be used to further improve your DevSecOps program.
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Product
Water Silica Analysis
Navigator AW641
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ABB's Navigator 600 Silica analyzer substantially cuts the costs and maintenance associated with silica monitoring in power generation and other large-scale steam and water dependent applications.
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Product
Silicon Test & Yield Analysis Solutions
Tessent®
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The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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Network Forensic Analysis
nChronos
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nChronos is a Network Forensic Analysis Application for high performance & critical enterprise networks. It combines nChronos Console and nChronos Server to deliver the capability of 7*24 continuous packet capturing, unlimited data storage, efficient data mining and in depth traffic analysis.
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Product
3D Sound Intensity Analysis Software
DS-0225A
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Finding out the position where the noise is occurring, and grasping the state of acoustic propagation are important ways to find effective noise countermeasure or improvement of acoustic environment.
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Product
Trace Viewer (Software Application For Trace Analysis)
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TraceViewer application provides you with a full range of options when analyzing traces (information on the condition of a fiber at any given point of its length, received from the optical time-domain reflectometer) - receiving, viewing, editing and labeling.
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Data Analysis Software
PV II
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Software to communicate and display data from PQPro™ Power Quality Analyzer.Can connect wirelessly (Bluetooth) to multiple instruments.View real time data numerically, vector diagrams and analog meter format.View downloaded data in graphical form.Multiple graphical pages can be open at the same time.Graphs can be annotated with data boxes and text bubbles.Graphs can be pasted in to Word or Excel files.Export data in CSV format.Export data in PQDIF format.Export section of data file to PV II format.Generate reports with both graphical and tabular data.
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Product
Vapor Sorption Analysis
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Vapor Sorption Analysis is a technique in which a sample is subjected to varying conditions of humidity and temperature, and the response of the sample is measured gravimetrically. Understanding the effects of water content on structure and properties is critical in the development, processing and end use of a broad spectrum of materials. TA Instruments offers the most sensitive, versatile, and productive moisture sorption analyzers on the market. The Discovery SA combines a high-sensitivity thermobalance, innovative humidity control chamber, and reliable autosampler. Innovative technology combined with our unparalleled reputation for service and support make TA Instruments the clear choice of scientists worldwide for vapor sorption studies.
