Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Mainframe Performance Monitoring & Analysis
Strobe
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Compuware Strobe is the industry-leading application performance monitoring and analysis solution for mainframe applications. With Strobe, IT departments can pinpoint application inefficiencies that cause excessive CPU consumption and reduce hardware and software costs while increasing customer satisfaction.
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Noise Analysis Software
noiseLAB
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noiseLAB is a professional software recording and analysis package for making Type 1 Precision measurements to international standards. Precision Recorder: noiseLAB makes high quality recordings of up to 8 channels of sound. Precision Analysis of: Sound Level (Fast, Slow, Impulse, Taktmak. Custom Time Constant, Leq). Statistical Values (L1, L5, L10, L50, L90, L95, L99). Octave Spectra (1/1, 1/3, 1/6, 1/12, and 1/24th octave).....
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Processing and Analysis Software
DATAVIEW
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The DataView® software is an essential tool for configuring and performing measurements, viewing data in real time, recovering recorded data and creating standard or customized measurement reports.
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Spectroscopy, Elemental & Isotope Analysis
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Research, production and analytical laboratories worldwide rely on us for rapid, efficient qualitative and quantitative analysis. Our innovative instruments and user-friendly software serve a range of industrial, educational, environmental and health markets. We offer a comprehensive portfolio for the quantification and identification of trace elemental species at ppm to sub-ppt levels in addition to isotopes. We also provide a wide range of lab-based and handheld instruments employing analytical techniques including XRF, FTIR, NIR, Raman spectroscopy, IRMS, ICP-MS and more.
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Enhanced Time Domain Analysis With TDR
S97011B
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This application enables the analyzer to perform enhanced time domain analysis for high-speed data applications.
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Product
Signal Analysis
Cross-Correlation Analysis
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The software is used for correlation analysis of signals coming from the input channels of FFT spectrum analyzers in real time or recorded time realization view mode, as well as for viewing various correlation characteristics of signals. Correlation analysis is a set of methods based on the mathematical correlation theory and is used for detecting the correlation dependence between two random attributes or factors. For solving a number of diagnostic tasks, cross-correlation analysis of signals in two or more control points distributed across space is often used.
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Product
Wafer Bonder
AML
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Wafer bonding has found many applications in the field of MST, MEMS and micro engineering. These include the fabrication of pressure sensors, accelerometers, micro-pumps and other fluid handling devices. The process is also used for first-order packaging of silicon microstructures to isolate package-induced stresses. The OAI AML Wafer Bonder facilitates both the alignment and bonding to be performed in-situ, in a high vacuum chamber. For anodic bonding the wafers are loaded cold and heated in the process chamber. For high accuracy alignment the wafers are aligned and brought into contact only after the process temperature has been reached, thus avoiding differential thermal expansion effects which can compromise alignment. The AML Wafer Bonder is excellent for anodic bonding, silicon direct and thermal compression bonding applications. These features enable the bonder to be used with virtually any processing tool.
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Enhanced Imagery Analysis
RVSAR™
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Textron Systems' RVSAR is an extension for our proven RemoteView™ software and provides capabilities to enhance the clarity of Synthetic-Aperture Radar (SAR) imagery. Users can employ an easy speckle suppression solution, allowing different filters to be applied either on a single page, or multiple polarization images on one page by using with MultiViews.
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Catalysis and Thermal Analysis
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A system for catalyst characterisation, reaction testing, kinetic and thermodynamic measurements.
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Testability analysis
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Using TestWay, ASTER provides advanced Testability report, Rules checking for In-Circuit Test, Functional Test and Boundary-Scan test. Test point optimization – Up to 70% of test points saved, automated backannotation to CAD system and CAD/CAM/CAT tools.
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Spectrum Analysis For P50xxB Up To 14 GHz
S970903B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Data Analysis & Graphing Software
Origin
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Origin is the data analysis and graphing software of choice for over half a million scientists and engineers in commercial industries, academia, and government laboratories worldwide. Origin offers an easy-to-use interface for beginners, combined with the ability to perform advanced customization as you become more familiar with the application.
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Product
Live-Cell Analysis System
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Analyze your cells for days, weeks or even months as they sit stationary in the stable environment of your tissue culture incubator.
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LC/MS/MS Method Package For Water Quality Analysis
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Shimadzu provides method files, including pre-registered MRM parameters with optimized quantitative and reference ions, LC separation parameters, and retention times and peak identification parameters for each compound, as well as report templates for outputting quantitation results, as a package. If retention times are adjusted when the system is introduced, based on the HPLC configuration delivered, the analysis process can be started as soon as the specified columns, mobile phases, and standard samples are supplied.
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Product
Easy CAN Analysis Tool
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Easy CAN of Peritec made, is CAN analysis tool low price using NI cRIO-CAN and ECU test systems Peritec, PCMCIA-CAN, the USB-CAN.
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Simulation & Analysis Solution for Automotive Audio Networks
A2B Analyzer System
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The A2B Analyzer System is designed specifically for development teams servicing automotive OEMs, Tier 1s, and audio connectivity equipment suppliers. The deterministic nature of the A2B technology makes it particularly well-suited for automotive audio devices (active speakers, microphones) and newer applications such as ANC. The A2B Analyzer System consists of a compact hardware device, an accompanying software development kit (SDK), and network configuration and simulation tools.. The hardware device includes a USB 2.0 interface for PC connectivity for audio data and command/control functions. The small form factor device also features a variety of popular audio and connectivity peripherals.
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Quantitative Analysis Software
Electron Probe X-Ray Analyzer (EPXA)
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The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
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Occlusal Analysis with BiteForce DynamicsTM
T-Scan
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The T-Scan is a diagnostic device that measures relative biting forces, including occlusal force, timing and location and is an ideal complementor to articulating paper. The technology was invented by Dr. William Maness in 1987 at Tufts University and M.I.T.
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Veracode Dynamic Analysis
DAST
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Identify and Fix Critical Runtime Vulnerabilities in Web Applications and APIs.* Identify Vulnerabilities in Runtime Environments. Simultaneously scan hundreds of web apps and APIs to find vulnerabilities quickly - including pre-production and staging environments behind a firewall.*Prioritize and Fix Flaws Quickly, A <5% false positive rate allows teams to focus on the vulnerabilities that matter. Detailed, actionable remediation guidance means flaws are fixed faster.*Contribute to a Successful DevSecOps ProgramDynamic scans can be viewed in the Veracode Platform alongside other application security tests, providing multi-faceted insights into the entire security program. Insights and analytics can be used to further improve your DevSecOps program.
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Chemical Testing and Analysis
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Chemical testing and analysis is vital for regulatory compliance and to understand the quality and composition of chemical substances and materials that are used in products, industrial processes and manufacturing. Specialist industry knowledge, and expertise in applying the most relevant methodology are the keys to successful chemical testing. Advanced analytical instrumentation or a combination of techniques is necessary to solve problems or determine composition.
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Software for Current & Water Quality Monitoring Data Analysis
DataStudio 3D
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Aanderaa, a Xylem brand, is a technology provider of oceanographic sensors, instruments and systems which are able to measure environmental parameters such as wave, current andwater quality (Dissolved Oxygen, Salinity, Temperature, Depth and Turbidity) over long deployments, several years.Data analysis is an important stage in all environmental monitoring campaigns. In many situations, users have to download and filter through large data quantities for analyses. DataStudio3D is a free data analysis software available to Aanderaa SeaGuard and SmartGuard users.To aid in data analysis, Aanderaa has developed their own propriety software, DataStudio3D which allows users to download field data and plot them on different graphical plots. This mode of data analysis can be carried out within minutes to help user to compare parameters, view trends, anomalies, and to control the data quality.
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Material Analysis Laboratory
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Trialon’s world class Material Analysis Laboratory consists of state-of-the-art equipment and experienced staff. Our specialty is to determine failure analysis of design, material, process and root cause in both current and future products across multiple industries.
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Product
Partial Load Failure
PLF Device
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The control device series “PLF” has been designed to monitor the partial and/ or total failure of the alternating current absorbed by loads driven by static switches and / or electromechanical relays.
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Spectrum Analysis For P50xxB Up To 32 GHz
S970906B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Comprehensive Analysis for MediaLB Data
MediaLB System
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A MediaLB system consists of several MediaLB devices and one MediaLB controller (typically an INIC chip). The INIC serves as a transceiver for the MOST network and as a controller for MediaLB, which assures synchronization to the MOST network.
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Product
Automotive Serial Triggering and Analysis (CAN, LIN) for DSOX1000 Series Oscilloscopes
DSOX1AUTO
Oscilloscope
The automotive serial triggering and analysis (CAN, LIN) option for InfiniiVision 1000 X-Series oscilloscopes allows you to trigger on either standard or extended CAN message IDs, including the message ID of a remote transfer request frame. It supports triggering on a data frame and allows you to specify message IDs, data and data length for filtering messages of interest. Triggering on active error frames also is supported. In addition, it supports triggering on LIN frame IDs and data, and it includes color-coded parity and check sums errors. You can easily isolate serial packets to find error sources due to hardware or software related problems.
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Java Testing, Static Analysis, Code Review
Jtest
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Parasoft Jtest is a complete Java developer's quality suite for static code analysis, code review, automated unit and component testing, coverage analysis, and regression testing ? on the desktop under leading IDEs and in batch processes.
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Silicon Test & Yield Analysis Solutions
Tessent®
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The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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Chemical Analysis
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The chemists at IMR have numerous analytical tools at their disposal, all geared toward providing accurate, NIST traceable analyses of metals and process solutions. The staff is experienced, professional, and knowledgeable in the latest analytical techniques.
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Non-contact Measurement Wafer Sorting System (Belt Drive Tranceportation)
NC-6800
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*Non-contact measurement of resistivity, thickness and conductivity (P/N)*Number of cassette station can be changed by customers request*Eddy current method for resistivity, Electric capacitance method for wafer thickness*Temperature correction for silicon wafer function





























