System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Product
Modulation Distortion Up To 125 GHz
S930712B
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S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Battery Fault Insertion Unit
Fault Insertion Unit
The Battery Fault Insertion Unit (FIU) provides intelligent switching of cell-simulation channels for the Battery Simulator 1200. The switching capability enables simulation of open-circuit and short-to-rail fault conditions on any cell channel for the purposes of battery management system (BMS) testing. Additionally, a four-wire auxiliary input allows you to connect an external digital multimeter (DMM) instrument to any cell channel for very high-accuracy bypass current and cell voltage measurements. Each FIU provides 24 independently-programmable cell-switching channels for one or two 12-cell Battery Simulator 1200 units. Additional Battery Simulator 1200 and FIU instruments can extend functionality up to 120 series-connected cell channels.
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Product
Computer-controlled Torque Testing System
Torque Testing System,
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Our top-of-the-range Vortex-i torque testing system gives optimum testing performance and evaluation options, enabling you to get the most from your test measurements.
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Product
PXI/PXIe MEMS RF Multiplexer, Dual 4-Channel, 4GHz, 50Ω, SMB
42-878-221
Multiplexer Module
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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In-Circuit Testers
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SPEA’s Bed of Nails Board Testers are scalable In-Circuit Test platforms that deliver the shortest test time, superior diagnostic accuracy, and extended test coverage for the most comprehensive range of electronic products.SPEA’s In-Circuit Board Testers are designed to increase yield, shorten the testing time, and cut the cost-of-test. Thanks to their unique Multi-Tester and Multi-Core Architecture, the SPEA’s Board Testers provide up to ten times greater throughput than conventional ICT test systems.
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Cloud Security Testing
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RedWolf is the premium cloud-DDoS testing provider globally. We offer an easy-to-use testing system that is either self-serve or guided by RedWolf experts with years of experience helping secure the worlds largest and most complex enterprise networks.
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Test Engineering Projects
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Precision Development Consulting Inc
Fiber Optics Test System, Data Collection, Trident Missle Components, PC Board Functional Test and Bearing Tester
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Product
Engine Emission Test System
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By adding transient operation functions (self-learning/predictive driving + each test mode performing) to measurement•control panel, Ono Sokki can build up engine test system that can perform transient mode tests supporting worldwide gas emission controls including TRIAS, FTP, EURO, and ISO. (e.g. WHDC, NRTC).This system provides good reproducibility for Transient mode test. Delay compensation and rotation inertia compensation function have greatly improved as well as self-learning / predictive driving function.Automatically processes from measurement to data output of test result, in conjunction with gas emission analyzer, tunnels, gas emission particle measurement system, smoke meter, etc.
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Product
Mixed signal LSI test system
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Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system.This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
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Product
Walking Test System Kit
PGA-710
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The PGA-710 Walking Test System is a complete kit designed to perform the walking test per ANSI/ESD STM97.2 and IEC 61340-4-5. The system consist of several devices designed for portability and to perform several different tests which includes measuring the voltage on a person in combination with floor materials and footwear.The kit includes the PGA-710B Data Logger, the PFM-711B Field Meter, CPM-720B Charge Plate Monitor, the PCS-730B Electrostatic Charger, Hand Held Electrode and the Prostat Autoanalysis Software version 2.0.
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Product
Motor Driven Actuator
NJ-SERVO Series
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The NJ-SERVO electric motor driven actuator utilizes an electric motor drive system. High accuracy test control is enabled by a special servo motor and stroke displacement measurement sensor. In addition, the system configuration is simpler in comparison to hydraulic actuators, so it is easy to maintain, and achieves power savings and space savings. This system accommodates a wide range of tests with a high degree of expandability. This includes everything from endurance evaluations of the main body and assemblies of automobiles, aircrafts, and other transportation equipment to endurance evaluations of stand-alone parts; from multi-axis tests combining multiple actuators to uniaxial tests; and from sine waves to working waveform simulation tests.
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Pneumatic Subsystem
OTP2-Modul-Nr050
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With the pneumatic subsystem, a roller terminal, a maintenance unit, a main vent, a pressure reducer and 8 2/3-way vents are installed in the system. The extension of the module can create new possibilities for your test system.
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Macro-Vickers Hardness Testing System
LV Series
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LECO's LV Series Macro-Vickers Hardness Testing Systems offer an affordable testing system suitable for larger, heavier samples used in welding and other demanding applications. Models include analog and digital, with options to upgrade to automatic configurations.
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Disintegration Testing
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Agilent offers innovative dissolution testing systems to accurately measure the disintegration of dosage forms into particles under standard conditions. The Agilent 100 Automated Disintegration Apparatus is a fully programmable solution delivering reliable disintegration testing results. Our disintegration testing systems are compact and easy to manage, featuring precise temperature control and meeting regulatory compliance requirements.
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Product
Integrating Sphere Spectroradiometer System for LED
LPCE-2(LMS-8000)
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LPCE-2(LMS-8000) is an Integrating Sphere Spectroradiometer LED Testing System for identifying the performance of single LEDs and LED lamps. LED’s quality should be tested by checking its photometric, colorimetric and electrical parameters. According to CIE 127-1997 and IES LM 79-08 standards, it recommends using an array spectroradiometer with integrating sphere and photometer head to test SSL products. LISUN GROUP developed LPCE-2 test system for LED products.
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Product
PXI High Density Precision Resistor Module, 3-Channel, 4Ω to 5.82MΩ
40-298-152
Programmable Resistor Module
The 40-298-152 is a high density programmable resistor module with 3 channels which can be set between 4Ω and 5.82MΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PXI High Density Precision Resistor Module, 3-Channel, 3.5Ω to 773kΩ
40-298-143
Programmable Resistor Module
The 40-298-143 is a high density programmable resistor module with 3 channels which can be set between 3.5Ω and 773kΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PCI Programmable Resistor Card 2-Channel 3 Ohm To 16.3k Ohm - SPST
50-294-131
Programmable Resistor Module
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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PCI Precision Resistor Card 9-Channel, 1Ω To 239Ω
50-297-113
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Automatic Test System
Star-Rec
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Test entire HDI panel at once, or step & repeat in the "feed" direction. Fastest BGA Strip test system available. Star-Rec comes standard with: * loader * board cleaner * CCD Camera Alignment * electrical test section * fail and pass re-stackers * Board Marker
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PCI Precision Resistor Card 4-Channel, 1.5Ω To 925Ω
50-297-121
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD E-Series
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The world’s most comprehensive test systems to completely characterize augmented reality, virtual reality, mixed reality, and heads-up displays (AR, VR, MR and HUDs) by truly emulating the human eye and conforming to the latest standards being developed by the IEC and SID.
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Product
FET Solid State Switch, 300 kHz to 18 GHz, SPDT
U9397C
Solid-State Relay
The Keysight U9397C solid state switch maximizes your frequency range from 300 kHz up to 18 GHz, offering excellent performance with high isolation, low SWR and fast switching speed. Applications include instrumentation, communications, radar, and many other test systems that require high speed RF and microwave SPDT switching.
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Product
Radar Cross Section (RCS) Measurement and Evaluation System
XRC
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KEYCOM develops various radars for versatile applications based on its knowledge and expertise on millimeter wave and microwave technologies. KEYCOM’s product line of radars includes Radar Test Systems (RTS) to evaluate distance accuracy or output, Radar Alignment Systems (RAS) to help you adjust the alignment of radars, and Radar Cross Section (RCS) measurement systems to measure RCS of such radar targets as aircraft, ships and automobiles.
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PXI Precision Resistor Module 9-Channel, 1 to 470
40-297-114
Programmable Resistor Module
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Load Cell Measurement
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Designed specifically as a single-board solution for material testing system (MTS) applications, the PCI-9524 combines a high 24-bit resolution with 1/200,000 count accuracy to provide the most precise load cell measurement PCI board available in the market today.
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PXI Precision Resistor Module 9-Channel, 1 to 239
40-297-113
Programmable Resistor Module
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
PXI 10W Programmable Resistor Module, 2-Channel, 1Ω to 31.5Ω
40-253-010
Programmable Resistor Module
The 40-253-010 is a programmable resistor module with 2 channels which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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EQE/Photon-Electron Conversion Testing
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Enlitech offers different solutions for incident photon-electron conversion testing systems. The available systems include IPCE, PV External quantum efficiency (PV-EQE), Internal Quantum Efficiency, Spectral Response (SR), Highly-sensitive EL-EQE. There are over 1,000 SCI papers cited Enlitech‘s systems to provide reliable experimental data for significant scientific publication. The Highest PV-EQE sensitivity and EL-EQE both reach 10-5 % (7 orders). They can be utilized to PV conversion efficiency, HJT/ PERC/TOP-CON current-loss analysis, Organic PV charge-transfer-state and Perovskite PV trap state measuring, and Organic PV and Perovskite PV Voc loss analysis.
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Product
Vacuum Inspection
INDEC
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INDEC vacuum test systems monitor a wide range of containers during the production process, including bottles, jars and cans, by measuring the cap panel concavity of their closures which is dependent on the vacuum inside. This non-contact inspection reliably identifies defective containers for automatic rejection.
