Systems
are interconnected groups of purpose.
See Also: Equipment, Test Systems, System Integrators, System Test
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Mobile Systems
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Advanced vehicle-based platforms for real-time detection and identification of CBRN threats in complex and variable urban environments.
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Telemetry Systems
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For Automotive, Aerospace, Marine, Motor & Generator Health, Energy, Power Plant, and Industrial Applications.
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Product
Measuring Systems For Night Vision Systems
Visual Resolution Test Of Image Intensifiers
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Optik Elektronik Gerätetechnik GmbH
Visual evaluation of image intensifier tubes with regard to resolution and image quality.
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Product
Resolver Systems and Resolver Sub Systems
TDSM
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Computer Conversions Corporation
The TDSM Series are low cost absolute encoders consisting of a size 11 electromagnetic transducer and a 2.6 x 3.1 x .6 conversion module. The outputs available are 12 to 16 bit binary format representing 0 to 359.99 degrees of absolute shaft angle input. The transducer reference supply is also included in the module which is designed for printed circuit mounting. A data transfer and data hold line are provided for simple computer or microprocessor interfacing. These features in addition to the latest digital circuitry techniques, make these encoders the best selection in today's applications where resolutions greater than 10 bits are required with ultra high reliability assured.
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Product
UV-VIS Systems
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The tec5 UV systems offer fast and reliable measurements starting from 190 nm. The modular system platform enables multiple integration options for easy and efficient handling of various measurement tasks in research and production applications. Due to the system’s dedicated design for industrial processes, even applications in harsh environments are possible without any difficulties, including simple and safe connection to process control systems utilizing common interface concepts established on the market.
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Metrology & Inspection Systems
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Our optical and e-beam wafer metrology and inspection products quickly and accurately measure pattern quality before and during high-volume chip manufacturing.
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Product
F9 Systems CalBlade
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The CalBlade backplane calibration fixture isdesigned to permit accurate and convenient impedance and transmission measurements of a HM-Zd backplane. The CalBlade is used to calibratethe logic card connector interface to the backplane rather than to the usual far-end of the coaxial measurement cables. Very accurate impedance, skew and propagation delay measurements are possible since parasitic fixturing effects are removed.
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Digital Map Systems
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Elbit Systems of America’s Global Digital Map Unit is built on a proven design that accommodates multiple data formats and provides unmatched situational awareness to aircrews. The GDMU displays detailed map, flight plan, and threat information to aircrews. Each system performs interactive functions with the mission computers and generates digital video map data for head down displays.
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Product
VPX Development Systems
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development system with Backplane Profile BKP6-CEN06-11.2.5-n. Specifically supports OpenVPX and VPX REDI 6U convection or conduction cooled boards and modules.
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Product
Tool Support Systems
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New AIMCO FRLs--the supply of clean, dry air is essential to the operation of pneumatic tools. Ensure longer life with proper maintenance for your valuable tools. Ask about our extended warranty on Uryu tools.
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Product
Deposition Systems
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When a thin film requires the most stringent structural or compositional properties consistently across every layer, Veeco’s Ion Beam Deposition (IBD) technology is often the answer. Using a focused beam of ions to sputter material from a target, this physical vapor deposition technique builds dense, uniform films with standout adhesion and stability.
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Product
Complete Systems
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Micma GmbH specializes in individual hardware solutions. According to customer requirements, a team of hardware developers, software developers and IT specialists plan, develop and manufacture.
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Product
MOCVD Systems
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For growing high-quality compound semiconductor films, few techniques match the precision of Metal-Organic Chemical Vapor Deposition (MOCVD). They give engineers tight control over film composition and thickness, making them essential for optoelectronics and advanced power transistors.
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Product
Industrial Weighing Systems
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Micro Edge Electronics Private Limited
These are fabricated using the best quality raw material and latest technology in accordance with the set industry standards. Well-known for their high durability, optimum performance and resistant to adverse conditions, these can also be customized as per the varied requirements of clients. Our team of quality controllers rigorously check these systems on various specific parameters to ensure their flawlessness.
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Product
Semiconductor Switching Systems
Keithley 700 Series
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The high speeds and low currents of semiconductor devices demand high quality, high performance switching of I-V and C-V signals. We offer switching solutions for both semiconductor R&D and production test applications with mainframes that can support up to 2,880 channels and a family of matrix cards designed specifically for semiconductor applications.
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Product
Sensortech Systems
PMT-330 Portable
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Hand-held RF moisture tester for manufacturing of board, wood, plastic, and paper products.
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Video Quality Analysis Systems
ClearView Extreme 8K and 4K Systems
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Highest Resolution Video and Audio Quality Analyzers with 12G-SDI Interfaces and ST 2110 Networking Option
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Laser Warnings Systems
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Elbit Systems of America’s laser warning systems use both coherent and non-coherent laser sources. We understand the full scope of issues associated with each laser threat and have the systems engineering expertise necessary to accurately and reliably detect, locate and categorize these threats. Each LWS is equipped with a direction indicator and provides complete threat coverage in a high dynamic range with audio and visual warnings.
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Product
Sputtering Systems
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Known for precision and cleanliness, Veeco Ion Beam Sputtering (IBS) systems are ideal when engineers need tight control over film thickness, composition, and optical performance. Using a focused ion beam, IBS dislodges atoms from a target, depositing them onto a surface in smooth, ultra-uniform layers.
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Product
Optics Test Systems
F Number Meter
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Optik Elektronik Gerätetechnik GmbH
The f-number of a camera lens is defined as the quotient of the focal length f' and the diameter of the entrance pupil. The f-number measuring device is a simple structure for the automatic, software-controlled measurement of the f-number of optical systems.
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Solar simulation systems
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Whatever your application, from an environmental chamber for small components to an extensive array for a complete automobile or aircraft test, EYE / Iwasaki has the experience to provide a solar lighting system customized for your requirements.
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Product
Instrument Systems Goniophotometers
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Konica Minolta Sensing Americas, Inc
If you need assistance measuring angle dependent spectral measurements, Instrument Systems has developed a comprehensive line of goniophotometers to meet your needs. Instrument Systems Goniophotometers are used to analyze angle dependent spatial radiation properties of SSL lamps and LED modules.
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Product
Video Quality Analysis Systems
ClearView Shuttle 4K and IP Systems
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4K, HD, and SD Video and Audio Quality Analyzers Portable, Desktop, and 2RU Rackmountable
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Automotive Test Systems
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Ono Sokki Automotive Test Systems - flow meter, non-contact speedometer, engine tachometer, crank angle detector, and more
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Dry Systems
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Chips are made up of many layers stacked on top of one another, and it’s not necessarily the latest and greatest immersion lithography machines that are used to produce these layers. In a given chip, there may be one or two more complicated layers that are made using an EUV lithography machine, but the rest can often be printed using ‘older’ technology such as dry lithography systems. This is certainly more cost-effective for customers, since these older machines are less expensive to purchase and maintain. Read about how dry lithography systems are enabling progress.
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Ion Beam Milling Systems
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When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
