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Product
Opticle Encoder Tester
Endeavour
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Evolusys Technologies Sdn. Bhd.
The Endeavour test system is a complete solution for testing optical digital and analog encoders for electrical and functional test with high accuracy and high speed. It provides high precision, research-grade electrical and functional testing and signal characterization suitable for encoder development. For quality assurance in encoder production, the Endeavour can be easily combined with a handling system for automated, high-end testing and qualification in the production of encoders.
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Product
Temperature Test
Series T
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The temperature test are characterized by high rates of temperature change, ease of programmability through our color touch panel, as well as extremely low noise levels
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Product
SignalShark® - Real-Time Outdoor Remote Analyzer
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Real-Time Outdoor Remote Analyzer for the Detection, Analysis, Classification and Localization of RF Signals between 8 kHz and 8 GHz. Supports automatic direction finding and localization via AoA and TDOA. For fixed installation or semi-static use on demand. Solves complex measurement and analysis tasks reliably and quickly with outstanding RF performance. Windows 10-based open platform for third-party applications. The "SignalShark 3330 Outdoor Unit" series is characterized by a robust and weatherproof die-cast aluminum housing with IP65 protection class, which is also used as a heat sink. The compact size allows the receiver to be mounted close to the antennas, keeping the antenna cables short and the resulting sensitivity high.
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Product
PNA-L Microwave Network Analyzer
N5232B
Network Analyzer
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to20 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
TF Analyzer
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The TF Analyzer platform is the heart of the modular and flexible measurement systems for the characterization of piezoelectric materials.
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Product
Ultra High Frequency Vibrometer
UHF-120
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Polytec?s New UHF-120 Vibrometer Laser-Doppler Vibrometers (LDV) can characterize the out-of-plane vibrations at ultra-high frequencies. Polytec?s UHF-120 extends the vibration frequency bandwidthup to 600 MHz.
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Product
PXIe-5652, 6.6 GHz RF Analog Signal Generator
781217-01
Signal Module
PXIe, 6.6 GHz, PXI RF Analog Signal Generator—The PXIe‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
Spectroscopic Ellipsometry
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Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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Product
Modulation Distortion Up To 90 GHz
S930709B
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S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
HV-Test System for Capacitor Packages
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The system is used to characterize the leakage currents of capacitor packages. LXinstruments implemented a project-specific PCBA for the required HV switching. The measurement technology consists of Keithley source meters and USB based devices. The DUT adaptation with safety technology was realized in cooperation with ATX.
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Product
NIR Spectrometer
NIRQuest Series
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The NIRQuest is a versatile NIR spectrometer for applications ranging from moisture detection and chemical analysis to high-resolution laser and optical fiber characterization. NIRQuest spectrometers cover the wavelength range from 900-2500 nm.
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Product
LXI Microwave Matrix, 10GHz, Dual 4x4, Terminated With Loop-Thru
60-750-244-C
Matrix Switch Module
The 60-750-244-C is a dual 4x4 10GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
LXI Microwave Matrix, 10GHz, Dual 3x3
60-750-233
Matrix Switch Module
The 60-750-233 is a dual 3x3 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
SATA 3 Receiver Test Automation Software
N5991ST3A
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The N5991ST3A is the latest receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize SATA devices and hosts.
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Product
Step Probes (F733SP) F73311B1042G150SP1
1008985
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The Step Probes (F733SP) F73311B1042G150SP1 is designed for high precision applications, exhibiting an impressive range of capabilities and specifications tailored for optimal performance. This model, with an operational temperature range from -45°C to +100°C, is crafted to meet diverse environmental conditions, ensuring reliability in various settings. Characterized by a pitch of 4.00 mm or 157 mil, it provides the necessary support for enhanced contact with targeted surfaces, making it an excellent choice for any demanding project.
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Product
Spray Particle Size Analyzer
Spraytec
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Malvern Panalytical's Spraytec laser diffraction system allows measurement of spray particle and spray droplet size distributions in real-time for more efficient product development of sprays and aerosols. It has been specifically designed to address the unique requirements for spray characterization and deliver robust, reproducible droplet size data.
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Product
Microspectrophotometer
MSP Series
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Angstrom Sun Technologies, Inc.
Microspectrophotometer (MSP) is an advanced optical system. The key difference with typical low cost reflectometer is in its capability to characterize optical properties of thin films over a micron region area. With unique design by Angstrom's professionals, user can enjoy digital imaging capability in Microspectrophotometers (MSP series) by live video, powerful digital editing, measurement tools for reflection, transmission, absorption spectra. Data acquisition only takes milliseconds.
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Product
PXIe-5651, 3.3 GHz RF Signal Generator
PXIe-5651 / 781216-01
RF Signal Generator
PXIe, 3.3 GHz, PXI RF Analog Signal Generator—The PXIe‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
Basic Threaded Probes (F720, F730) F73012B075G110
1020310
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The Basic Threaded Probes F73012B075G110 are precision-engineered contact probes designed to meet the demanding needs of various applications. With a robust operational temperature range of -45°C to +100°C, these probes are well-suited for environments where reliability and accuracy are paramount. The F730 series offers a basic contact design characterized by a pitch of 1.27 mm. They are built to handle continuous currents of up to 3.00 A while maintaining a typical contact resistance of just 50 mOhm, making them an ideal choice for high-performance electrical connections.
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Product
High Voltage Optically Isolated Probes
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High Voltage Optically Isolated Probes are designed to aid in device characterization measurements. Whether it is low or high voltage signals sitting on HV busses, high bandwidth, extreme precision, and optical isolation means floating measurements are easily made with minimal DUT loading.
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Product
PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-01
Source Measure Unit
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Product
Booster and In-line Amplifier
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Amonics' EDFA range adopts unique design to produce maximum signal gain and saturated output power while maintaining low noise figure, enabling test capabilities in system or component level manufacturing and characterizing processes, as well as facilitating highly demanding R&D applications. The compact turnkey benchtop or 19" rackmount unit incorporates a user-friendly front panel housing with a LCD monitor display, key switch, power control knob and optical connectors. An integrated RS232 computer interface enables easy control, diagnostic functions and data acquisition.
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Product
PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
784777-02
Signal Module
PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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Product
Test Data Investment Services
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PDF Solutions Professional Services offerings cover every major project phase. Available for a specific phase of your project needing a custom solution, or an end-to-end implementation, PDF Solutions Professional Services produces results fast.Realize quicker ROI from your semiconductor test data investmentOffering a broad range of planning, education, design engineering, implementation and support, our team of highly trained semiconductor data integration engineers and analytics consultants can help you build your solution with confidence. These experts can assist your team with:Business Practices AssessmentsBest Practices ImplementationYield AnalysisProduct Characterization SetupSystem DeploymentSite PlanningFlow AnalysisCustom Parser Development
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Product
PXI Vector Component Analyzer, 100 kHz to 44 GHz
M9817AS
Vector Component Analyzer
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Product
Benchtop Research System
XENON X-1100
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The XENON X-1100 is the only low-cost benchtop Pulsed Light system that enables researchers to more easily characterize new processes using XENON’s proven technology.
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Product
Micro Smart Sensor
MISS
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The Micro Smart System is one of the many autonomous systems with very low consumption designed by BioAge. The system is characterized by autonomous operation with very low energy consumption thanks to its operation in "Energy Harvesting" which allows to exploit the power supply from a micro solar panel with which each sensor is equipped.
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Product
2 Channel IV Analyzer / Source Monitor Unit
E5263A
Source Measure Unit
Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5262A and E5263A the best solutions for characterization and evaluation of two or three terminal devices such as materials and active/passive components with uncompromised measurement reliability and efficiency.
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Product
Probe Card
VC43™/VC43EAF™
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VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Product
Modulation Distortion Up To 50 GHz
S930705B
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S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
