-
Product
Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
-
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
-
Product
ENA Vector Network Analyzer
E5080B
Vector Network Analyzer
As devices become highly integrated, complete characterization requires a complete RF and microwave measurement solution. The E5080B provides R&D performance up to 53 GHz and advanced test flexibility. Best-in-class dynamic range, trace noise, and temperature stability guarantee reliability and repeatability.
-
Product
The CryoLab
-
The CryoLab is designed to perform rapid material or circuit characterization measurements from room temperature down to cryogenics in a fully automated manner. Doing measurements doesn’t require any experience or know-how on cryogenics, vacuum technology or thermodynamics from the user.
-
Product
EMC & RF Solutions
-
Microwave Absorbing Material Characterization System that measures the signal loss through a material sample in a frequency range of 5 15GHz (with the option of extension to lower frequencies).
-
Product
Custom Systems
-
With our custom VNA your ATE works as one software system running on a single computer. We can customize the analyzer module to fit in your system, provide extra frequency range coverage as compared to our standard VNA models should you need it in your specific application or characterize the expected performance outside the frequency limits of our standard VNAs.
-
Product
Scatterometers / Thin Film Metrology Systems
OptiPrime Series
-
The n&k OptiPrime series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
-
Product
Spectroscopic Ellipsometer
PH-SE
-
The spectroscopic ellipsometer is used for thin film and material characterization in R & D. The spectroscopic ellipsometer is designed to meet the requirements in modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
-
Product
LXI Microwave Matrix, 20GHz, Single 4x4, Terminated
60-751-144-B
Matrix Switch Module
The 60-751-144-B is a single4x4 20GHz microwave matrix with internal termination. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
-
Product
Basic Spectrum Analyzer
N9322C
Spectrum Analyzer
Quickly uncover key insights through fast, value-priced, general-purpose performance up to 7 GHz with -152 dBm DANL and 0.6 dB overall amplitude accuracy Streamlined for straightforward and efficient operation with marker demodulation, one-button optimization, and user-definable soft keys Robust measurement features for easily characterizing your product Automation and communication interface with industry standard SCPI language support and USB and LAN connectivity choices
-
Product
Dynamic Image Analysis (DIA)
CAMSIZER
-
Dynamic Image Analysis (DIA) is a modern particle characterization method for the determination of size distributions and shape parameters. It allows quick analyses with excellent accuracy and reproducibility over an extremely wide measuring range. With the renowned CAMSIZER system, Microtrac introduced its first Dynamic Image Analyzer over 20 years ago and has pushed technological innovation ever since.
-
Product
Analytical Instrument
LabSpec 4 Hi-Res
-
Analytical Spectral Devices, Inc.
The LabSpec 4 Hi-Res analytical spectrometer is designed for analysis of materials that are characterized by sharp spectral features that may require more resolute spectral data for accurate detection and identification.
-
Product
Scienlab Battery Test System – Cell Level
SL113XA | SL100XA Series
-
The cell is the basis of any battery system and directly influences its function, performance and safety. Therefore, it is essential to test and characterize the cell at an early development stage. For this purpose, Keysight offers reliable test systems for precise and reproducible measurement results. The Cell Level Series (SL1002A, SL1004A, SL1007A, SL1132A and SL1133A) — also known as Battery Cell Tester — emulates sink and source for battery cells for automotive and industrial applications.
-
Product
Compact Imaging Modules
-
The Opto compact M imaging modules are characterized by the only 40mm wide 90° angled all-aluminum housing.
-
Product
Dynamic Light Scattering (DLS)
NANOTRAC
-
Dynamic Light Scattering (DLS) is an established and precise measurement technique for the characterization of particle sizes in suspensions and emulsions. Microtrac is a pioneer of particle analysis technology and has been developing optical systems based on Dynamic Light Scattering for over 30 years.
-
Product
Magnet Testing
m-axis
-
m-axis is a measurement system that can be used to characterize permanent magnets in terms of their magnetic specifications (magnetic moment and magnetization angle) with high precision. In addition to the four standard measuring ranges, the modular design allows the system to be adapted to customer-specific requirements. The measurement systems can be used for 100% in-line quality control via our m-axis I/O module.
-
Product
Multiplexer 2:1 With De-Emphasis 32 Gb/s
M8062A
Multiplexer Module
R&D and test engineers who need to characterize serial interfaces of up to 32.0 Gb/s can use the M8061A 2:1 Multiplexer with optional de-emphasis to extend the rate of J-BERT M8020A and J-BERT N4903B pattern generator. For the most accurate receiver characterization results, the M8061A provides four calibrated de-emphasis taps, which can be extended to eight taps, built-in superposition of level interference and Clock/2 jitter injection. The M8061A is a 2-slot AXIe module that can be controlled via USB from the user interface of J-BERT M8020A as well as N4903B.
-
Product
Manual Tuners
-
Manual tuners are used both in the laboratory and as system components to establish or transform impedances for a number of applications. They can be used to establish optimum source or load terminations for device characterization, normalize a source or load for precision laboratory measurements and/or calibrations (noise, power, etc.), and can act as a matching transformer between a mismatched source and a mismatched load.
-
Product
Rheometer longitudinal
DT-600
-
Characterizes visco-elastic longitudinal properties of Newtonian and non-Newtonian liquids of any composition.
-
Product
Active Device Characterization Solution Up To 43.5 GHz For 5G
N5244BM
-
The N5244BM provides the N5244B 43.5 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 43.5 GHz for 5G applications.
-
Product
Diffuse Reflectance Sphere
DRS100
-
Mobile displays are used in a variety of ambient lighting environments. The evaluation of mobile displays under diffuse illumination conditions is critical to the understanding of display performance in the real world, as mobile displays are used in a wide range of ambient lighting environments. The DRS100 is purpose-made to completely characterize the diffuse reflectance properties of mobile displays, providing uniform hemispherical illumination.
-
Product
Optical Spectrum Analyzers
FTBx-5245/5255
-
Robust In-service Pol-Mux OSNR for 100G/200G/400G (FTBx-5255). Industry’s only all-in-one OSA covering all applications: high speed (100G+ In-service OSNR, etc.), CWDM, O and L-band testing, etc.Portable solution for spectral characterization of DWDM/CWDM networks. Industry’s smallest OSA/transport solution in a single platform (FTB-4 Pro). Pol-Mux OSNR option compliant with IEC 61282-12 standard.
-
Product
PXI Vector Component Analyzer, 100 kHz to 32 GHz
M9816AS
Vector Component Analyzer
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
-
Product
Oil-In-Water Analyzer
RTG100
-
The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique which is a direct measurement on individual acoustic echoes that are characterized using advanced signal processing.
-
Product
Battery Capacity Analyzer
600B
-
The 600B Battery Capacity Analyzer addresses the need to test and maintain sealed lead acid (SLA) batteries used in backup power UPS, emergency lighting, fire alarms, security systems, and many other electrical systems. By quickly characterizing a battery's response to a load resistance, the meter displays the remaining battery capacity as an indicator of the battery's health.
-
Product
ThermalAir Series Temperature Forcing System
ThermalAir TA-1000B Rack Mount Test System
-
The ThermalAir TA-1000B high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
-
Product
Photonics Test Solutions
-
Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
-
Product
Stress-Test Platform
Litos
-
Litos is an advanced Solar Cell and LED stability lifetime measurement system, operated via Fluxim’s Characterization Suite (CS) software for complete control, data acquisition, and analysis. It has 16, or 32 parallel stressing channels distributed over 4 chambers, each with individual temperature and illumination control.
-
Product
Frequency Response Analyzers
-
Frequency Response Analysis (also referred to as Transfer Function Analysis) measures the output spectrum of a system relative to a stimulus, and is used to characterize the dynamics of the system under test. The technique measures the magnitude and phase relationship between output and input waveforms as a function of frequency. The input signals may be from a wide range of sensors including acoustic (microphones/sonar), mechanical (accelerometers/displacement transducers), optical (photodetectors), and electrical (amplifiers).
-
Product
Off-Air Testing Products
-
Understanding the challenges of the Electromagnetic Spectrum is paramount for Engineers that are charged with the design, characterization, validation of modern RF systems such as Communications Systems, RADAR Systems, and Electronic Warfare Systems.
-
Product
DisplayPort 2.0 Receiver Test
N5991DP2A
-
Use the Keysight N5991DP2A DisplayPort 2.0 Receiver Test Software to test, debug and characterize your DisplayPort Sink products maximizing the usage of your test instruments.
