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Product
Ferroelectric Tester
Premier II
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The Precision Premier II, is one of Radiant's most advanced test systems. The Premier II has the large envelope in terms of frequency response, voltage range, and accuracy of any ferroelectric tester in the world. Vision Software is provided with the Premier II Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choice from.
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Product
Mass Spectrometry
SYNAPT G2-Si
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Information. Informatics. Impact. SYNAPT enables extensive characterization of complex mixtures and molecules with uncompromising qualitative and quantitative performance, streamlined workflows and unparalleled platform versatility.
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Product
Technical Software Engineering
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Technische Software Entwicklung Plazotta
TSEP is a system house that has specialized since 1988 in the development of system-related software in the fields of communications technology, telecommunications, instrumentation and automotive. Since 2005 TSEP also develops hardware solutions for its customers. Here TSEP offers not only the hardware solution (schematic, layout, production, etc.), but also the software technical integration of hardware into the operating system and the application. These solutions are characterized by the fact that both the hardware and the software are perfectly matched.
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Product
Intelligent Sensors
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Silicon Labs is a leading supplier of intelligent sensor solutions that are characterized by superb reliability, compact size, high levels of integration and unmatched ease of use for a variety of applications. Our diverse sensor product portfolio includes optical sensors, digital relative I2C humidity and temperature sensor ICs, biometric sensors and capacitive touch sense microcontroller devices.
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Product
XPS/ESCA Service
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X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Product
NED-LMD Near-Eye Display Measurement Systems
NED-LMD WG Series
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Gamma Scientific is introducing the NED-LMD Waveguide Tester as the world’s first specialized near-eye display measurement system that mimics human visual perception for fast, accurate and repeatable characterization of next generation optical waveguide-based Augmented/Mixed Reality displays and display components (light engine, waveguide, etc.). This comprehensive offering features a ‘robotic eye’ to help device manufacturers predict how the human eye would perceive their AR/MR displays, quantifying end user experience mapping the entire display field of view.
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Product
PXIe-4139 , ±60 V, ±3 A DC, ±10 A Pulsed, 40 W DC, 100 fA Precision System PXI Source Measure Unit
782856-03
Source Measure Unit
PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 40 W of DC power. This module features analog-to-digital converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Product
Scanning XPS Microprobe
PHI VersaProbe III
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The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
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Product
X-Series Measurement Applications for EXT
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A broad set of X-Series measurement applications for EXT enabling you to characterize, troubleshoot and rapidly create test code for the manufacture of your design.These applications are based on the library of over 25 X-Series measurement applications for benchtop signal analyzers.
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Product
Parameter And Device Analyzers, Curve Tracers
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Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Current Voltage Analyzers Series provides a wide selection of IV analyzers suitable to your specific current voltage measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
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Product
Solar Cell I-V Characterization System
VS6821
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Industrial Vision Technology Pte Ltd.
This system provides cell manufactures and laboratories a new way in testing and measuring photovoltaic cells. Integrated with Steady-State Solar Simulator, it provides complete coverage of testing parameters and measurement requirements by most international standards. Its test methods, procedure & equipment are IEC 60904 compliant. Calibration of reference cell is performed at Fraunhofer ISE in Germany, and is traceable to PTB.
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Product
Standard Products
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SBIR offers an extensive line of reliable, high performance test equipment used to characterize and calibrate IR, Visible and Laser systems. Products include blackbodies, visible sources, target wheels, targets, collimators, target projectors, laser test modules/systems and IRWindows™ software for automated testing. These modular, cost effective instruments are user-friendly and easily integrated into automated test systems. For more information, including printable data sheets, select a product from the list.
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Product
Particle Analyzers in Liquids and Gases
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Particle analyzers determine the size and distribution of particles in a material.Particle size analyzers work in many areas of research and development, product testing, manufacturing and quality control. Particle size analysis is important in characterizing a wide range of product performance factors.There are several many analytical techniques and approaches for particle size analysis.It depends on the range, the nature of the sample, the method of analysis and the sampling output.Particle size analysis is a very important test and is used for quality control in many different industries like Food and beverages,Pharmaceuticals,Aerosols and more.The tests should be adjusted according to the different materials.
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Product
PXI Vector Component Analyzer, 100 kHz to 26.5 GHz
M9815AS
Vector Component Analyzer
The PXI vector component analyzer (VCA) enables complex multiport device characterization with continuous wave (CW) and modulated signal measurements.
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Product
WavePulser 40iX High-speed Interconnect Analyzer
WavePulser 40iX Series
Analyzer
WavePulser 40iX is the ideal single measurement tool for high-speed hardware designers and test engineers. The combination of S-parameters (frequency domain) and Impedance Profiles (time domain) in a single acquisition with a deep toolbox provides unmatched characterization insight of high-speed interconnects.
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Product
Multiple Angle Laser Ellipsometer
PH-LE
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The multiple angle laser ellipsometer provides film thickness, refractive index and absorption index at the HeNe laser wavelength 632,8 nm with an extraordinary precision and accuracy. It can be utilized to characterize single films, multiple layer stacks and bulk materials.
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Product
PXI Vector Network Analyzers
Vector Network Analyzer
Our PXI vector network analyzers (VNAs) perform fast, accurate measurements and reduce your cost-of-test. Simultaneously characterize many devices — two-port or multiport — using a single PXI chassis. By combining independent, two-port network analyzer modules into one chassis your multisite, multi-DUT, and multiport test applications scale flexibly. Use all ports to simultaneously measure your devices with multiport error correction.
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Product
Signal Integrity Measurement Systems
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GigaTest Labs is a Keysight Technologies Solutions Partner, offering fully configured signal integrity measurement systems for high bandwidth signal integrity characterization. Our wealth of experience with Keysight's Vector Network Analyzer and Time Domain Resonance Oscilloscope tools will help you navigate and understand different instrument capabilities & configuration options that will benefit your engineering team.
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Product
Autocorrelators
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From material processing to scientific and medical base research, ultrafast laser systems are used in many areas of their high peak intensity and extremely short pulse width. One relevant area of application is time resolved spectroscopy. The pulse width is a critical factor for the adjustment of these laser systems and the characterization of experiments.
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Product
Time-Frequency Analysis, Time-Series Analysis and Wavelets
LabVIEW Advanced Signal Processing Toolkit
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Includes the LabVIEW Digital Filter Design Toolkit (also available separately)Time-series analysis -- statistical analysis for description, explanation, prediction, and controlTime-frequency analysis -- analytical, graphical tools for signals with evolving frequency contentWavelet and filter-bank design for short-duration signal characterization, noise reduction, and detrendingIncluded in all NI Software Suites
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Product
Ultra-Wideband (UWB) Test System
IQgig-UWB
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The IQgig-UWB is ideal for both R&D characterization, high-volume production, and certification. Making it the perfect platform to enable a cost-effective, seamless transition from the lab to the manufacturing floor.
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Product
Pulser / Sampler Core
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Furaxa has researched, developed, and characterized a novel monolithic arrayable pulse and sample aperture generation technology. Recent results include demonstration of sub-10ps pulse/aperture generation at repetition rates up to 3 Billion Pulses/Samples Per Second (BPPS) with jitter that is estimated at sub-10fs. Further, simulations in a number of InP DHBT processes exhibit sub-3ps 20BPPS performance. The IP is process-independent, and has been achieved in CMOS SOI, InP HBT, SiGe and GaAs so far. Please contact us regarding your specific foundry and technical requirements: The company currently licenses the sampler/pulser technology for use by application and market, and is interested in discussing how the technology can enable our partners' applications. A short list of characterized Pulser/Sampler Cores is given below.
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Product
PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
Source Measure Unit
PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Particle Metrology System
Archimedes
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Archimedes is an innovative instrument which uses the technique of resonant mass measurement to detect and accurately size and count particles in the size range 50nm to 5um*. Archimedes can distinguish different species from their buoyant mass is particularly useful when characterizing proteinaceous aggregates from contaminating silicon oil in biopharmaceutical preparations, in distinguishing bubbles from lipid micelles and contaminants in ultrasound contrast agents or protein from fat in dairy products.
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Product
Wood / Building Moisture Meter
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PeakTech Prüf- und Messtechnik GmbH
High quality wood and material moisture meter, which is characterized by its ease of use and universal applicability. The device has an LCD display, in which measured values of humidity and ambient temperature are displayed. In addition, it is equipped with an LED display, which enables a quick good-bad assessment of the measured values.
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Product
Digital Pattern Generators
DPG
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Active Technologies Digital Pattern Generators also known as DPG, allow digital stimuli generation to stimulate digital designs, providing the capability to emulate standard serial or parallel bus transactions or custom digital interfaces, for system or device debugging and characterization.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131H
Calibration Cable
The Keysight 85131H is a 62.2 cm (24.5 in) long1 flexible cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.25 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.5 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 3 inch radius. Stability1 of the Keysight 85131H is less than 0.12 dB and phase is 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
Scatterometer with Thin Film Measurement Capabilities
OptiPrime-X Series
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The n&k OptiPrime-X series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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Product
Adhesion Tester
Surf-2
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Rtec Adhesion Tester is a turn key solution to measure Pull up Adhesion force, Work of Adhesion and Shear Adhesion of materials. Equipped with Ultra-Sensitive Capacitance Load Cells this tester provides µN level resolution with forces up to 5N. The High-Resolution sensors allow characterization of large samples over macroscopic length scales to study the effect of texture and other surface modifications. Integrated with High Resolution Inverted Camera, it allows the researchers to measure Contact Area vs. Force making it extremely useful in measuring Adhesion of Soft Materials, Biomimetics and Hydrogels.
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Magnet Testing
Helmholtz Coils
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A coil arrangement consisting of two coils with the same radius or edge length is called a Helmholtz coil. At the correct distance, these coils are arranged in parallel on the same axis and current flows through them in the same direction. Their magnetic field is then characterized by a large homogeneous area in the center of the coil, which is freely accessible for experiments and measurement tasks. Helmholtz coils can have a circular or square geometric shape.
