-
Product
DUT Resistance Tester
-
AllWin Instrument Science and Technology Co., Ltd.
1. This test verfies the integrity of DUT2. The resistance is measured by measuring voltage3. Current is made by distribution
-
Product
DUT Boards
-
RTI designs and manufactures DUT boards for many types of special purpose test equipment including: ESD test systems, special purpose functional testers, automated curve trace equipment, as well as standard semiconductor test equipment. All designs are performed in-house using PCB design software (Mentor PADS, CAM350) and 3D mechanical design software (Solid Edge) if required. PCB fabrication is sub-contracted to one of our long-time fabrication partners.
-
Product
DUT Prototype Board
DPB8800
-
The DPB8800 is an 11? x 14? PC board used to interface the tester with the Device Under Test (DUT). This board contains generous area for custom circuitry and extra relays. The DPB8800 is also available with standard solutions to test families of components like Op-Amps, Regulators, ADC?s and DAC?s. +/-15 V and +5 V are available to support circuitry biasing.
-
Product
High Performance Autoranging DC Power Module, 50V, 5A, 50W
N6751A
Power Module
The Keysight N6751A is a 50 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
-
Product
Custom Pogo Pin Rings & Blocks
-
Reduce your cost-of-test with our pogo pin blocks and interfaces that transform complex DUT boards or breakout boards into universal motherboard-style interfaces. Eliminate the need to purchase or build a new board for every unique device, unit, or package.
-
Product
PXI/PXIe Source Measure Unit Family
PXS(e)840x
Source Measure Unit
The PXS840x PXI SMU family is a high-speed, 4-quadrant source measure unit. Carry out measurements directly on the DUT with the integrated CMU and VMU.
-
Product
Performance Board
-
The role of the performance board is accurate transmission of tester signals all the way to the device leads. Custom performance boards from ADVANTEST deliver support for DUTs (devices under test), as they become faster and smaller, with greater pin counts, and increasingly take the form of SMDs. ADVANTEST performance boards also support a host of test requirements, such as analog test, high-speed performance, and high-density, for testing state-of-the-art ICs.
-
Product
External Frontend
FE44S
-
The R&S®FE44S external frontend can extend the frequency range up to 44 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE44S enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. The R&S®FE44S uses a single RF connector to further reduce the number of antennas in over the air testing.
-
Product
High Voltage Optically Isolated Probes
-
High Voltage Optically Isolated Probes are designed to aid in device characterization measurements. Whether it is low or high voltage signals sitting on HV busses, high bandwidth, extreme precision, and optical isolation means floating measurements are easily made with minimal DUT loading.
-
Product
DC Power Module, 150V, 2A, 300W
N6777A
Power Module
The Keysight N6777A is a 300 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
-
Product
Functional Test
UTS
Functional Test
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
-
Product
Low-Leakage Cables For SMU
-
Low-Leakage Cable For SMU helps you connect the GND, LO, and LO SENSE terminals of a PXIe-4135 PXI Source Measure Unit (SMU) together, and the flying lead cable helps you daisy-chain multiple PXIe-4135 SMUs together. Daisy-chaining the PXIe-4135 SMUs allows the modules to share a common LO and reduces the number of SMU LO cables that need to be connected to the interface board or device under test (DUT).
-
Product
Power/Voltage Rail Probe. 4 GHz Bandwidth, 1.2x Attenuation, +/-30V Offset, +/-800mV
RP4030
-
The Teledyne LeCroy RP4030 Power Rail Probe meets the specific requirements of those who need to acquire a low-voltage DC signal as part of a:-Comprehensive power integrity, digital power management IC (PMIC), voltage regulator module (VMR), point-of-load (POL) switching regulator, or low-dropout regulator testing- Complete embedded power management system that includes PMICs, VRMs, POLs, and LDOsThe RP4030 will faithfully acquire a low-impedance, low-voltage DC power/voltage rail signal without unduly loading the device under test (DUT), while providing high offset to allow DC power/voltage rail signal display on an oscilloscope with high gain.
-
Product
Universal Function Test System for Industrial Electronics
Test System
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
-
Product
High Current SMU 600/1200/2400 A
AXC85xx
-
Generate extremely short, fully regulated current pulses in 4 ranges. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
-
Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
-
The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
-
Product
High-Performance Autoranging DC Power Module, 50V, 10A, 100W
N6752A
Power Module
The Keysight N6752A is a 100 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
-
Product
Active Probe, 1 GHz
N2795A
General Purpose Probe
The N2795A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±8 V), the probe can be used in a wide variety of applications.
-
Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
-
Product
Precision Low-Loss Multiplexers
-
Maury’s line of diplexers (DP-series) and triplexers (TP-series) are designed for applications which require combining/ splitting signals at or around harmonic frequencies (nFo) and are connectorized for design-in and test and measurement applications.DP-series diplexers are designed using low-pass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.TP-series triplexers are designed using low-pass, bandpass and high-pass filters and pass bias between the low-frequency (or Fo) port and the common (or DUT) port.Power handling is rated at 100W CW (average) and typical insertion loss is better than 0.5dB between the low-pass (Fo) and common ports.DP- and TP-series multiplexers are ideal accessories for passive, active and hybrid-active multi-harmonic load pull systems.
-
Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
-
Product
Memory Test Software
-
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
-
Product
DC Power Analyzers
-
DC Power Analyzer provides unrivaled productivity gains when sourcing and measuring DC voltage and current into a DUT. The Keysight N6705C DC Power Analyzer is a highly integrated instrument that combines up to four advanced DC power supplies, DMM, oscilloscope, arbitrary waveform generator and datalogger. It provides an easy-to-use interface, with all sourcing and measuring functions available from the front panel. The N6705C makes these tasks easy:
-
Product
High-Performance Autoranging DC Power Module, 60V, 17A, 500W
N6756A
Power Module
The Keysight N6756A is a 500 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
-
Product
Parallel Testing of Multiple DUTs with High RF Channel Count
Test Rack UTP 7033 RF for validation
-
Our basic test rack UTP 7033 (33 rack units) is intended for equipping with various products and therefore for various application areas.The rack shown here as an example is prepared with products and measurement instruments to test automotive devices with high channel count.
-
Product
Nonlinear Component Characterization 10 MHz - 110 GHz
S94510B
-
Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT
-
Product
SNS Series Noise Source 10 MHz to 26.5 GHz (ENR 15 dB)
N4002A
Noise Source
The SNS series N4002A noise source was designed to measure DUT noise figures reliably and accurately up to 30 dB from 10 MHz to 26.5 GHz.
-
Product
PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
Source Measure Unit
PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
-
Product
Testing of Power Steering Motors
-
Endurance test bench on which up to five drives can be tested at the same time. The drives / DUTs are electrically connected to resistors and driven by a servo drive according to a predefined driving profile. This exam can take up to several days. It detects currents, speeds and temperatures.
-
Product
Multi-DUT Mobile & IoT Test System
IQxstream-M
-
Its ultra-compact design and flexible architecture makes it highly suitable for high volume manufacturing of smartphones, tablets and cellular IoT modules.
