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Product
Dynamic Digital I/O With Per Channel Timing, Programmable Logic Levels And PMU PXI Card
GX5296
Digital I/O
The GX5296 offers advanced dynamic digital I/O performance and capabilities in a single slot, 3U PXI format. The 32-channel, GX5296 features timing per pin, multiple time sets, data formatting, and an advanced sequencer – providing users with the capability to emulate and test complex digital busses for system, board or device test applications. Offering sub-nanosecond edge placement resolution per pin and a PMU per pin, the GX5296 has the ability to perform both DC and AC parametric testing. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Product
AC Ground Bond Tester
446
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Our 446 model is a 4-in-1 tester with AC Hipot, DC Hipot, Insulation Resistance, and Ground Bond capabilities. This tester features a simple design and easy-to-use interface, reducing setup time and increasing production-line throughput for your application. The 446 is equipped with multiple memories and an optional USB port for remote BUS communication so you can quickly perform tests on a variety of DUTs from the front panel or with a PC. Add to user safety by equipping your tester with Personal Protective Equipment (PPE) via the built-in safety interlock.
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Product
ICT Software: Interactive Developmetn Encironment ICT ICE & ICT Sequencer
ICT IDE and Sequencer
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The ICT software consists of two parts, the interactive development environment ICT IDE and the ICT sequencer. The IDE provides a graphical user interface for convenient creation and testing of these test sequences and allows:- Convenient management of hardware resources via topology editor- Support of several independent embedded testers for parallel test execution- Editing sequences in a text or table editor- Error highlighting during sequencing- Sequence execution (also single step) directly on a selected DUT- Debugging (single step)- Loop execution via sequences, or single steps- Optimization function with regard to waiting time and integration with Shmoo plot- detailed results output within tables as well as various results diagrams- Pin-Finder function to support adapter wiring- Automatic test program generation is available via Aster Testway
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Product
Power Management & MMI Module
H73000700
Interface
This module, named “6TL-MMI”, is designed to be the interface between an operator and a SYSTEM as well as being a metered power distribution unit (PDU) for it. The module is providing also safety controls, data bus interfaces, temperature control and timers. The 6TL-MMI is suitable for any ATE, and specially for those based on CAN bus controlled devices, because in addition to the above functionalities, this module is also providing galvanic isolation up to 1500V for the CAN bus. This isolation will block potential disturbance towards the DUT.
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Product
Hardware Platform
SmartScan 3D
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SmartScan-3D is another hardware platform that allows 3D scan using a six axis robot and DUT holder. A DUT is placed on a 360 degree rotating DUT holding jig. Vertical scanning without rotating DUT holder is one variation of SmartScan-3D for any DUT that is standing up, rather than laying flat on X-Y plane. Any scan technology can be integrated to the SmartScan-3D.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
Test Fixture
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
±6 kV ANSI/ESDA/JEDEC 2-Pin HBM Tester
HBM-S1-B
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High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) 2-pin tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*Optionally available upgrade for all HPPI TLP-3010C, 4010C, 8010A, and 8010C hardware systems and software (upgrade on request)*Suppression of trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT voltage and DUT current sensor for real time voltage and current monitoring*Integrated DC test DUT switchIntegrated hardware 50 Ω trigger output for high speed digital oscilloscopesIntegrated overvoltage protection of voltage sense and DC test interfaces for oscilloscope and SMU protection during high voltage HBM testing*Fast and efficient HBM measurements including transient waveform data management using the HPPI TLP software*Compact size 145 mm x 82.5 mm x 44 mm
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Product
Nonlinear Component Characterization 10 MHz - 110 GHz
S94510B
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Measure and display the calibrated, vector corrected waveform of the incident, reflected, and transmitted waves of the DUT
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Product
Single connector for a HG cable, and two HM connectors
MVNA-8-350-2
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The lower part of the Central Unit model MP-8-350-2 has a single connector for a HG cable, and two HM connectors (Fig. 9). Two Harmonic Mixers can work simultaneously, for instance HM2 detecting transmission through the DUT, and HM1, at port 3 of a directional coupler, detecting reflection from the DUT.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
VPC Receiver Frame
ABex REC21-84TE-EXT
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Robust and flexible interconnect solution for test fixtures. Designed for the use with ABex PXIe Rack 18 it provides support to equip all 21 slots with VPC interconnect modules. In addition, it offers 6 more slots on the bottom, below the ABex rack to feed through signals from external measurement devices.The interface uses the well-known Virginia Panel connectors with more than 20.000 guaranteed mating cycles. To build DUT specific test fixture, we also provide the corresponding ITA mounting frame (ITA = Interchangable Test Adapter).
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Product
Shock Testing
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Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
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Product
DC Power Module, 8 V, 6.25 A, 50 W
N6732B
Power Module
The Keysight N6732B 50 W basic DC power module provides programmable voltage and current, as well as measurement and protection features at a very economical price. Use this module to power your DUT or ATE system resources, such as fixture control.
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Product
PXI RF Multiplexer Switch Module
RF Multiplexer
PXI RF Multiplexer Switch Modules are ideal for high-channel-count applications that need to connect measurement or signal generation instruments to various test points on devices or units under test(DUTs or UUTs). PXI RF Multiplexer Switch Modules use a variety of relay types, including electromechanical armature relays, reed relays, field-effect transistor(FET) relays, and solid-state relays, each with their own benefits, allowing you to choose a multiplexer that fits your requirements. To program the switches, you can use the IVI-compliant NI-SWITCH driver software, complete with help documentation, example programs, and a soft front panel application for interactive control of switches. For intelligent management of complex switch systems, NISwitch Executive provides additional software tools to help you design, build, and deploy your switching system.
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Product
DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
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Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
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Product
P-Series Single Channel Power Meter
N1911A
Power Meter
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
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Product
MIPI Receiver Test Solution
M8085A
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The M8085A is a software plug-in for M8070A Bit Error Ratio Test system software within the M8000 series of BER test solutions. The M8085A software plug-in controls either the M8190A or the M8195A Arbitrary Waveform Generators to create C-PHY or D-PHY standard compliant test signals. In addition it provides routines for calibration of all signal parameters and for all tests specified in the applicable Conformance Test Suite. Together with the additional available DUT control interface it is possible to read the BER of the receiver under test from the M8070A software and display the BER dependency from test parameters within the M8070A user interface.
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Product
PXIe-4147, 4-Channel, ±8 V, 3 A Precision PXIe Source Measure Unit
786888-01
Source Measure Unit
PXIe, 4-Channel, ±8 V, 3 A Precision PXI Source Measure Unit - The PXIe-4147 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote four-wire sensing for accurate measurements. The sample rate of the PXIe-4147 can reduce measurement times, capture transient device characteristics, and help you perform current-voltage (I-V) characterization of devices-under-test (DUTs). With a high-speed sequencing engine, you can synchronize SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4147 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
JESD22-A115 Machine-Model (MM) Pulse Emulator
MM-10A
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High Power Pulse Instruments GmbH
- Pulse unit to generate JESD22-A115 machine-model (MM) waveforms with TLP- Extremely stable and reproducible machine-model (MM) waveforms- Compatible with HPPI TLP-3010C/4010C/8010A/8010Csystems which have installed pulse width of 25 ns and rise time of 100 ps to 300 ps- Up to ±10 A machine-model peak current with TLP-3010C, which is equivalent to ±667 V (MM)- Up to ±15 A machine-model peak current with TLP-4010C, which is equivalent to ±1000 V (MM)- Up to ±30 A machine-model peak current with TLP-8010A and TLP-8010C, which is equivalent to ±2000 V (MM)- Same measurement procedure as TLP including DC test of the DUT- Compatible with HPPI TLP software and waveform data storage and management- 50 Ω SMA input and output connectors- Compact size: 61 mm x 25 mm x 17 mm
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Product
Electrical Safety Testers- Hipots
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Safety testers (also named hi-pot tester/hipot tester/hipot test) are designed to ensure safe operation of DUTs under various operating conditions and environment.GW Instek’s GPT-9900/GPT-9800/9600 series safety testers(hipot test) provide safe and quick measurement tools for AC/DC withstanding voltage tests, insulation resistance tests, and AC ground bond tests. Those tests are required by many international safety regulations such as CE, UL, VDE, and etc. We also have leakage current tester, GLC-9000, which supports all the major leakage current test standards for medical and general electronic equipment.
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Product
Hand-In Type Electromagnetic Anechoic Box (Shield Box)
MY3720
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Suitable for weak electric field resistance test, out-of-service test or digital forensics for smart phone, tablet terminal or mobile PC ! !DUT can be operated directly with bare hands while placing it in the box and looking at the inside from the shield window.
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Product
Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
Digital I/O
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Product
Performance Board
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The role of the performance board is accurate transmission of tester signals all the way to the device leads. Custom performance boards from ADVANTEST deliver support for DUTs (devices under test), as they become faster and smaller, with greater pin counts, and increasingly take the form of SMDs. ADVANTEST performance boards also support a host of test requirements, such as analog test, high-speed performance, and high-density, for testing state-of-the-art ICs.
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Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Nonlinear Pulse-Envelope Domain
S94518B
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The S94518B Nonlinear Pulse-Envelope Domain measures the vector corrected amplitude and phase of the fundamental and harmonic pulse envelopes of your DUT.
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Product
PXIe-4140, 4-Channel Source Measure Unit
781742-01
Source Measure Unit
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Product
Transformer Turns Ratio Meter
TTRM 102
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SCOPE introduces state of the art precision single phase Transformer Turns Ratio Meter (TTRM ) designed for field testing as well as factory testing of power transformers, instrument transformers and distribution transformers of all types. TTRM 102 along with turns ratio, measures ratio deviation, phase angle deviation, magnetizing current and detects tap-position of single phase transformer in charged switchyard condition. The range of AC voltage selection offers high accuracy in measurement.Both the instrument have in-built TFT display with touch screen and thermal printer. The user friendly, simple instrument makes the testing more easy. With the touch keypad it is possible to enter required DUT information.The ratio results are displayed with % error. Internal non-volatile memory gives the provision of storing test results.Further data can be downloaded to PC or copied to memory stick through USB port provided.
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Product
Multi-Channel Attenuation Control Unit (5-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7205B
Attenuator
The J7205B is a multi-channel (5-channels) attenuation solution for signal attenuation and conditioning of up to 5 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7205B reduces cost of ownership and provide the best measurement accuracy.
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Product
Vibration Testing
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Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Product
Automatic Fixture Removal
S95007B
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Many devices do not have coaxial connectors and so they are put in fixtures in order to measure them in a coaxial environment. You must accurately remove the effects of the fixture to get a good measurement of the device under test (DUT). This option adds a powerful application wizard to guide you through characterizing a fixture and removing it from the measurement. The S95007B software is compatible with M980xA PXI Vector Network Analyzers.
