Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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Product
12-Ch SPST 4A-250VAC 24VDC High Current Power Switching
YAV90PIN
Switch Module
The YAV90PIN board is designed to cover the need to control the available power supplies in a test system to the device under test. A VPC 90 series connector is used as interface with the fixture, guaranteeing more than 20.000 mating cycles. Two connector contacts per relay contact are used.
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Product
PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
Programmable Power Supply
±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as either a constant voltage source or a constant current source, with a settable compliance limit for either mode. In addition, you can enable remote sense on the SMU channel to maximize voltage output and measurement accuracy on your device under test (DUT) for high-precision applications.
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Product
CAN MiniModules
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Measurement points distributed throughout a device under test, whether in a vehicle or at a test bench place high demands on the measurement technology. Measurement modules must be compact, robust, reliable, and easy to use. CSM meets all these requirements with its long-term proven CAN MiniModule series.
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Product
Optical signal transmission
Digital
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The fibre optic cable are used to transmit digital signals from the device under test under EFT/burst interference.
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Product
Modular Power
RFP DC High Power
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AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Product
Leakage Current Testing
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Educated Design & Development, Inc.
Fast - All operator controls are located on the front panel to expedite testing. The entire test can be performed in a matter of seconds! Pays for itself in time and stress savings. Versatile - Measures Leakage Current in accordance with UL, CSA, EN, and IEC/ International Standards. Includes ability to perform open neutral, open ground, and line polarity forward/reverse test conditions. Adaptable - Universal rear panel receptacle allows for testing products with any plug configuration. Accurate - True RMS meter accurately measures both sinusoidal and non-sinusoidal waveshapes. This is important when testing products using a switch mode power supply which can generate non-sinusoidal leakage currents. Calibrated, traceable to NIST. Flexible - A front panel switch permits testing either through the power cord of the product under test, from surface/ patient connection-to-ground, or from surface/ patient connection-to-surface/ patient connection. Portable - Lightweight, with integral handle. Other Features - Product Ground Switching (grounding conductor maintained to device under test when not measuring leakage). Automatic front receptacle disconnect when configured in the 240V test mode (prevents inadvertent connection of 120V when configured for 240V operation). Proven - These are the only leakage current testers designed and supported by Product Safety experts. That is part of the reason why they have become the standard in the industry. Full technical support by experienced safety engineers.
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
Test Port Adapter
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit
782430-01
Source Measure Unit
PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Product
Bulk Current Monitoring Probe
MP-50
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The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading of the circuit and the technique permits normal operation of the device under test during measurements. The MP-50 can be used for the procedure for clamp injection when the common- mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MP-50 can also be used as current monitor for BCI testing as per ISO11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.
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Product
2 GHz Dual 1:4 RF Mux, 75 Ohm Module for 34970A/34972A
34906A
Multiplexer Module
The Keysight 34906A RF multiplexer module for the 34970A/34972A Data Acquisition/Switch Unit offers broadband switching capabilities for high-frequency and pulsed signals. Use it to route test signals between your device under test and your signal generator, oscilloscope, spectrum analyzer, or other instrumentation. The RF multiplexers are arranged as two independent 1 x 4 multiplexers, each with a common shield and a switched center conductor. Connections can be made directly to SMB inputs with 2 GHz usable bandwidth, or to the BNC-to-SMB adapters provided with 1 bandwidth. Multiple banks may be cascaded together for applications requiring even larger topologies--create a stubless 16:1 multiplexer in a single frame.
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Product
1kV, 120 MHz High Voltage Differential Probe Without Tip Accessories and with Auto Zero Disconnect
HVD3106A-NOACC
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The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Product
Test Fixture Kits
Test Fixture
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Product
EMC Test Systems
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The sum of EMC is not necessarily equal to its parts; any modular electronic device from a complete aircraft down to a mobile phone needs to meet EMC requirements for the device itself, even if all the individual modules are compliant. For the enormous range of types of modular device requiring EMC test, R&S offers extremely flexible and scalable EMC test systems; practically as modular as the devices under test.
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Product
PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
Source Measure Unit
PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Power Profiler, DC Energy Analyzer, Power Supply, Digital Multimeter, Source Measure Unit, Power Debugger
Otii Ace Pro
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Otii Ace Pro is the big brother to Otii Arc, and is an instrument that can precisely source voltage (up to 25 V) and current (up to 5A) and simultaneously measures voltage and/or current with a high sample rate (50ksps) and low step size. It computes power and energy and enables engineers and developers to easily see and optimize the energy consumption and battery life of their devices under test.
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Product
Scalar Network Analyzers
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An RF network analyzer used to measure amplitude properties like VSWR and Return loss of Device Under Test.
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Product
Regenerative Power System, 80 V, ±250 A, 10 KW, 400/480 VAC
RP7945A
DC Power Supply
The Keysight RP7945A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Product
Keysight Dual 4x8 Armature Matrix for 34980A
34931A
Matrix Switch Module
The Keysight 34931A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x8, 8x8, or 4x16 configurations 64 2-wire cross-points Connections to the internal DMM Expandable via four 2-wire analog buses Relay counter Latching armature relays 300 V, 1 A switch; 2 A carry current
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Product
Regenerative Power System, 500 V, 20 A, 5 kW, 200/208 VAC
RP7951A
DC Power Supply
The RP7951A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test. The regenerative capability enables the energy normally consumed to be returned to the grid cleanly, saving costs associated with energy consumption and cooling.
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Product
PXI Matrix Switch: 8x32, 1-Wire, 100Vrms/2A, Armature Relays
M9122A
Matrix Switch Module
The M9122A is an 8x32 full crosspoint switch matrix offering high-voltage switching in a high-density PXI module. This module allows for higher voltage switching of multiple channels in a single instance. Any row can be connected to any column, making it ideal for routing instrument signals to the device under test. This module is configured with a common ground. The durable armature switches are capable of switching up to 100Vrms, with up to 60W of power. The 8-wide bus can be used to route signals between your instruments and the device under test. Choose from the durable connector block or standard cable connections.
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Product
Modular Power
RFP DC Load
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AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Product
Source/measure Units
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Transcat offers source measure units in various categories, from precision to application specific. A source and measurement unit (SMU) is a device that supports testing applications, including those that demand high accuracy and high resolution capabilities. The units essentially combine the functionality of a DMM with a precise power supply, while also offering excellent low current operations. An SMU can precisely source voltage or current to a device under test or development, while simultaneously measuring voltage and/or current. These simultaneous capabilities often equate to faster testing processes. An SMU is the smart solution when low-level voltage, current, and resistance are needed for functional tests and electronics profiling. Unit applications range from design validation to manufacturing, and SMUs are frequently used within the semiconductor and electronics industries.
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
NI-9239 , ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
780181-01
Voltage Input Module
±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9239 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Designed for both speed and accuracy, the NI‑9239 is an effective general-purpose analog module because of its resolution, sample rate, and input range.
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Product
Automated Optical Inspection (AOI)
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Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method.
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Product
Pulse Function Arbitrary Noise Generator
81160A
Arbitrary Waveform Generator
Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution; Selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards; Glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test; and Arbitrary bit patterns show capacitive load of the channels using simple pattern settings. Complex measurement setups are no longer necessary to test designs to their limits. Pulses 330 MHz, 500 MHz sine waves, 660 Mbit pattern
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Product
RF Shielded Test Enclosure, Largest Rack Mountable Enclosure
JRE 1724
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Originally designed for testing wide screen laptops, the rack-mountable JRE1724 is ideal for large wireless devices such as; Mesh Network AP's, Cellular/LTE/4G Base Stations, and other large RF devices. Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth trouble free operation over its lifespan. Internal struts keep the lid open for easy internal access when connecting the device under test.
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Product
Test Fixtures-Assemblies
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Qmax Test Technologies Pvt. Ltd.
Test Clips are available for various types of DIP ICs like 8, 14, 16, 20, 24, 28, 40, 48 & 64. These can be supplied with or without connectors and cables for interfacing to Qmax Testers. Test Pins in the clips are gold plated and engineered for good contact with the Device Under Test. It is designed for long life and trouble free operation. For easy handling the clips are provided with metal covers.
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Product
PXIe-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
780587-15
Signal Module
PXIe, 35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXIe‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXIe‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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Product
Test Port Adapter Set, 3.5 Mm (Test Port) To Type-N
85130C
Test Port Adapter
The Keysight 85130C test port adapter is designed to protect the test set port when it would be directly connected to the device under test. These adapters have a special rugged female connector designed for connecting to the network analyzer test port. This special connector will not mate with a standard male connector, but converts the rugged test set port to a connection that can be mated with the device under test. The set contains a 3.5 mm to type-N male adapter and a 3.5 mm to type-N female adapter. The frequency range for these adapters is dc to 18 GHz with a return loss of 28 dB or better.
