Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
3/4D Image Visualization and Analysis Software
Imaris
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Our latest release, Imaris 8.4, introduces a new and innovative approach to tracing neuron structures in 3D images. Torch™, a patent-pending tool which intuitively highlights structures in close proximity to the cursor while darkening the rest of the image, enables users to efficiently and accurately trace individual neurons within dense and thick samples. Improved depth visibility makes tracing in thick samples easier than ever before, allowing for the selection of a dynamic region of interest for tracing. All of this possible with terabyte-sized datasets.
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Product
Complete Power Analysis System
PK3564-PRO+
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PK3564-PRO+ complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, PSM-A Software, Mini Line-to-DC Converter, Bluetooth Adapter, USB Communications Cable, CASW Weather-Resistant Carrying/Operating Case, and 2-year deluxe warranty.
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Product
Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Product
MPI PA Wafer Probers
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MPI Photonics Automation is the industry-leading provider of turnkey wafer test and measurement solutions. We offer a complete line of high-performance wafer probers designed to address the diverse and complex needs of the Photonics, Optoelectronic, Semiconductor, and Laser industries.
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Product
Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
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Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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Product
Dynamic Image Analysis (DIA)
CAMSIZER
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Dynamic Image Analysis (DIA) is a modern high-performance method for the characterization of particle size and particle shape of powders, granules and suspensions. Retsch Technology's optical analyzers CAMSIZER P4 and CAMSIZER X2 are based on this technology, covering a measuring range from 0.8 m to 30 mm.
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Product
Real-Time Analysis, 160 MHz, Basic Detection, Multi-touch
N9030B-RT1
Signal Analyzer
See, capture, and understand elusive signals as short as 17.23 s with 100% POI and a complete set of advanced triggers View signal dynamics with integrated real-time displays Maximize your investment by adding RTSA at a fraction of the cost of a dedicated solution Easily integrate the 89600 software and thoroughly analyze complex signals Industry-leading 3 year warranty Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Water Fluoride Analysis
Aztec AFM631
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The Aztec 600 fluoride analyzer provides reliable and highly accurate measurement of fluoride concentrations to enable precise control of water fluoridation.
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Product
Time Domain Analysis
S93010A
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The time domain capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to the time domain or time domain data to the frequency domain.
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Product
Portable 4-channel Noise & Vibration Analysis System
WCAmini AD-3661
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* USB bus power unit * 24 bit, 4-channel measurement * A channel exclusively for tacho pulse measurements * WCAPRO (multi analysis software) * FFT analysis and real-time octave analysis * Tracking analysis and throughput recording/playback * Equipped with WCA Lite (easy-to-use analysis software)
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Product
MultiSite Test sockets and Wafer Level
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multi-site sockets include anything from strip test sockets to test sockets for wafer test to multi-position, singulated devices. The advantages of these sockets can be enormous as test time can be decreased by a factor of ten over conventional one up testing. In most cases, the throughput is only limited by tester capabilities and/or handling capacity.
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Product
Audio Spectral Analysis Freeware
PSELab
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Power Spectrum Estimation Laboratory
"PSE Lab" is a freeware Windows application useful to estimate power spectrum and time frequency distribution of signals. To estimate power spectrum, the application uses following methods: periodogram; using the simplex algorithm to estimation of complex exponential model optimal parameters; using the quasi-Newton algorithm to estimation of complex exponential model optimal parameters; least squares Prony method; modified least squares Prony method; Burg method; modified covariance method; MUSIC..
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Product
Time Domain Analysis
S97010B
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The S97010B time domain analysis capability allows you to measure the time domain response of a device. The analyzer can transform frequency domain data to the time domain or time domain data to the frequency domain.
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Product
Wafer Chucks
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American Probe & Technologies, Inc.
High Performance Chuck for your needs Introducing the American Probe & Technologies’ HC-6000 series of thermal chucks,
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Product
Data Collection and Analysis System
3002
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The Model 3002 SER System is a state of the art data collection and analysis system. It is suitable for application in an electrical utility substation or plant environment to produce Sequence of Event (SER) data in conformance with PRC-002-1 and PRC-018-1.
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Product
Wafer Auto Line Integration
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The line is used for semiconductor wafer grinding. It carries out material matching and distribution, automatic loading and unloading, auto focusing and positioning and many other functions. The grinding precision is 2μm(3-sigma). It is also capable of collecting and analyzing real-time production data and interfacing with MES system.
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Product
Liquid Analysis
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Comprehensive product range for all analytical parameters. Environmental protection, consistent product quality, process optimization and safety – just a few reasons why liquid analysis is becoming increasingly essential. Liquids such as water, beverages, dairy products, chemicals and pharmaceuticals have to be analyzed day in and day out.
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Product
Soil Analysis
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We offer a full spectrum of analytical technologies, and sample clean up and moisture extraction reagents, designed to provide reliable, accurate, and precise results that make compliance easier and help you reduce regulatory risks. Organic Elemental Analysis, Trace Elemental Analysis, X-Ray Fluorescence (XRF) Spectrometry, Automated Discrete Photometry, Gas Chromatography Mass Spectrometry (GC-MS), Accelerated Solvent Extraction (ASE).
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Protocol Trigger And Decode Analysis Software
I3C
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Tektronix I3C Software runs on Tektronix DPO/MSO5000, DPO7000 and DPO/DSA/MSO70000 oscilloscope series. I3C Software uses the hardware based real-time I3C protocol aware trigger, protocol analysis of long acquisition record length up to 125MB to provide superior I3C Protocol Analysis result at the press of button.
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Product
Automated Routine Analysis of Waters by Purge & Trap Concentration
AQUATek LVA
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The AQUATek LVA is a full automation solution for routine analysis of waters by purge and trap concentration. It utilizes a fixed volume loop that is filled with liquid sample, internal and/or surrogate standards are added, and then the sample is transferred to the Lumin or Stratum PTC. Upon completion of the purge step by the concentrator, the AQUATek LVA then initiates a clean up cycle where the sample loop and concentrator sparger are cleaned with 90o C water via the two-stage water heater.
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Product
Wafer Test
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Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
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Product
Materials And Chemical Analysis
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Anderson Materials Evaluation, Inc.
Materials characterization, failure analysis, quality control, and materials and process development services are offered. Our analytical techniques allow us to assess elemental and chemical material composition, thermal properties, coating thickness, electrochemical properties, surface chemistry, surface wetting, corrosion rates and pitting potentials, contamination and degradation problems, metallography, fractography, phase transitions, static coefficient of friction, adhesive bonding strength and causes of adhesive bonding failures, surface tension and surface energy, tensile and compressive strength, bend deflection, lapshear strength, elasticity properties, UV and visible light absorption and reflection, density and porosity, and many other material properties integral to improving your products.
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Product
X-ray Diffraction and Elemental Analysis
D8 ADVANCE
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The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug'n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users.
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Product
Software Composition Analysis
SCA
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Black Duck® software composition analysis (SCA) helps teams manage the security, quality, and license compliance risks that come from the use of open source and third-party code in applications and containers.
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Product
Thermal Analysis
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Thermal Analysis is important to a wide variety of industries, including polymers, composites, pharmaceuticals, foods, petroleum, inorganic and organic chemicals, and many others. These instruments typically measure heat flow, weight loss, dimension change, or mechanical properties as a function of temperature. Properties characterized include melting, crystallization, glass transitions, cross-linking, oxidation, decomposition, volatilization, coefficient of thermal expansion, and modulus. These experiments allow the user to examine end-use performance, composition, processing, stability, and molecular structure and mobility.
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Product
Beverage Analysis
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Analyze multiple quality control parameters of your beverages in parallel, within 3 to 5 minutes only. See all parameters on a bright, easily customized 10.4’’ touchscreen display. Anton Paar’s modular beverage analysis solutions are quickly adapted to your needs in a Plug and Play fashion. In any case, the sample filling and measurement process is completely transparent and traceable.
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Product
Marine Seismic Systems Analysis Software Suite
Testif-i Marine
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Testif-i Marine is a comprehensive software suite designed specifically to process test data from marine acquisition systems to ensure the integrity of your recorded data.
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Product
High Resolution Wafer Thickness & Thickness Variation Gauge
MX 10x series
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The MX10x series measure thickness and thickness variation on silicon wafers. It has a resolution of 10 nanometers and can be adapted to different thickness ranges within a few seconds.
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Product
Video Quality Analysis Systems
ClearView Shuttle 4K and IP Systems
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4K, HD, and SD Video and Audio Quality Analyzers Portable, Desktop, and 2RU Rackmountable





























