Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
04 With Soldering Eyelets | 2 Wafers | 24 Positions
04-2xx3-00/30-xx
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Very robust, multi wafer selector with 15° detent angle, switching torque up to 20 Ncm and a rotational life up to 25'000 cycles
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Product
Wi-Fi Spectrum Analysis
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The Spectrum Bundle is your ultimate tool for mastering spectrum analysis. Gain real-time visibility into your 2.4 GHz, 5 GHz, and 6 GHz (Wi-Fi 7) networks, pinpoint interference sources, monitor channel saturation, and detect even the most elusive intermittent issues. With professional-grade tools for analysis and reporting, you’ll have everything you need to optimize network performance and ensure reliable coverage.
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
Solution for Flight-Data Recording and Analysis
dataMARS104
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AMPOL's reliable and field-proven product, the dataMARS104, is a complete, state-of-the-art, flight qualified solution for recording, monitoring and analyzing flight data. Once the unit is installed on the aircraft, its solid-state recording media can be easily removed and taken directly into the lab for analysis and report generation. Its included unique and powerful post-analysis software has the ability to decode flight data on-the-fly, even while recording is in progress providing an accurate, up-to-date, realtime picture of the data as it happens.
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Product
01 With Soldering Eyelets | 12 Positions | M6 | 2 Wafers
01-2xxx-00/30xx-12-M
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Multi wafer compact selector with 30° detent angle, 3 mm shaft diameter, 25'000 switching cycles and with up to 6 Ncm switching torque
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Product
PXI Bluetooth Signal Generation and Analysis
Test Toolkit for Bluetooth™
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Start taking faster Bluetooth measurements with PXI, the most cost-effective, flexible, and capable platform for wireless device test. Keep up with the latest Bluetooth standard developments with free upgrades of the Test Toolkit for Bluetooth. Gain greater confidence in your Bluetooth design's performance and increase test coverage with a flexible toolkit that offers fine control of the generated Bluetooth waveforms and generates accurate measurement results.
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Product
Surface Analysis
Dimension AFP
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The Dimension AFP is the world's only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler tomonitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability.
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Product
Daqarta v5.10 Data AcQuisition And Real-Time Analysis
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New Fcal option allows any Windows sound card to measure DC values like temperature or pressure using simple external circuits you can build yourself. Or, measure MHz frequencies with a simple prescaler. DAQARTA v5.10 turns your Windows sound card into a precision laboratory instrument, loaded with advanced features. Put your sound card to work!
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Product
Gas Analysis
HPR-20 EPIC
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The Hiden HPR-20 EPIC gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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Product
Reservoir Analysis
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Reservoir Analysis Instruments determine the flow-related properties of the reservoir fluids and formation so that producers can optimize their production and recovery techniques.
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Product
Collaboration, Reporting, And Analysis Platform
Link-Live™
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Serving as a centralized site survey, test results, analysis, and tester management system, the free Link-Live™ Cloud Service transforms team workflows with the ability to quickly and easily log, document, and report test activity from all NetAlly hand-held network testers and analyzers. Once the instrument is connected to the Link-Live Cloud Service, your test results are automatically uploaded to the dashboard for project management, analysis, collaboration and reporting. You have the option of uploading additional files, screenshots, images, profiles, packet captures, location information, and comments anytime. Also, certain NetAlly instruments with AllyCare Support can receive firmware updates “over the network” from Link-Live as they become available.
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Product
System for the Analysis and Jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel
SierraNet M328
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The SierraNet M328™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with eight SFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328 includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.
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Product
CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
Test Instrument
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Vibration Analysis Software
VibroDesigner
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VibroDesigner software is used for data acquisition, storing and analyzing. Using this software with portable STD-500/510/3300 or stationary CTD3168/2160/2060 units helps to schedule machinery maintenance at a convenient time.
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Product
Spectrum Analysis
S95090B
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The S95090B spectrum analyzer (SA) measurement software adds high-performance microwave spectrum analysis to PXI VNAs. With fast stepped-FFT sweeps resulting from optimized data processing, the SA software application provides quick spurious searches over broad frequency ranges. The S95090B software uses the PXI network analyzer's test and reference receivers to complete simultaneous spectrum measurements. Multi-channel SA measurements leverage the PXI VNA's internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The S95090B spectrum analyzer software application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy. Optional external attenuators should be connected with the VNA’s test ports to avoid receiver compression when measuring large signals.
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Product
Gas Analysis
HPR-20 R&D
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The Hiden HPR-20 R&D specialist gas analysis system is a bench-top mass spectrometer for real time gas analysis of evolved gases and vapours.
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Product
Wafer Chip Inspection System
7940
System
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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Product
Gas Analysis
Si-CA 030
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The Si-CA 030 offers everything heating engineers need to inspect and maintain residential and commercial boilers, with wireless connection to our smartphone app and automatic generation of servicing reports and certificates.
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Product
PathWave Vector Signal Analysis Software
89600 VSA
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A comprehensive set of tools for demodulation and vector signal analysis.
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Product
Dynamic Imaging Particle Analysis Technology
FlowCam® 8100
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Yokogawa Fluid Imaging Technologies, Inc.
The new FlowCam 8100 particle imaging and analysis system from global laboratory instrumentation manufacturer Fluid Imaging Technologies, Scarborough, Maine, features the company''s most advanced camera with the fastest imaging speed and double the image capture area to increase throughput, increase detection rates, and reveal more images and data. Imaging at up to 120 frames per second, the new FlowCam 8100 automatically detects thousands of individual particles and microorganisms in seconds, takes a high-resolution, digital image of each one detected and measures them in real-time based on their actual size and shape, not by an inference of their size and shape. Sampling at up to 100% efficiency with limited sample volumes as small as 200L, the company said, the FlowCam 8100 measures more than 30 different parameters from basic particle size, count and concentration to color, grayscale and advanced morphological characteristics such as circularity, elongation and fiber curl.
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Product
Dynamic Signal Analysis Software
ObserVIEW
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Vibration Research Corporation
View, edit, and analyze waveforms from recorded or live data. This powerful and efficient vibration analysis software package includes specialized modules for waveform recording and test generation.
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Product
On-line Water Quality Analysis
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Shimadzu is one of the world’s leading manufacturers of high-quality continuous monitoring systems that meet the application requirements of a wide range of customers for environmental testing, pharmaceuticals, chemicals, and academic research, etc.
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Product
Wafer Chucks
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American Probe & Technologies, Inc.
High Performance Chuck for your needs Introducing the American Probe & Technologies’ HC-6000 series of thermal chucks,
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Product
2D Near-Field Analysis of VCSEL Arrays
VTC 4000
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Instrument Systems Optische Messtechnik GmbH
The VTC 4000 near-field camera from Instrument Systems was specially developed for the ultrafast, precise 2D analysis of VCSEL arrays. It enables polarization-controlled characterization of all relevant parameters simultaneously for the single emitters of the array.
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Product
Wafer Level Multi-Die Test System
ITC55WLMD
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The ITC55WLMD series of test systems has been developed by ITC to be stand-alone UIL test systems configured specifically to test on wafer. The systems include an ITC55series UIL tester and inductor box, a current limiter module and a system controller
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Product
Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
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Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
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Product
Surface Analysis
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A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
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Product
Image Analysis Micrometers
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For calibrating and analyzing microscopy measurement systems, the IAM line of Image Analysis Micrometers are perfectly suited. Calibrated to NIST Standards, and imaged with the best line edge quality in the industry, the IAM series is a diversified line of slides that function in areas of color calibration (IAM-9C), Optical Magnification, Frame Distortion, and other applications. Custom features, substrates, sizes and designs are available as custom solutions.
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Product
Multiphysics Computational Fluid Dynamics (CFD) Simulation & Analysis
STAR-CCM+
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Siemens Digital Industries Software
STAR-CCM+ is a stand-alone simulation solution for computational fluid dynamics (CFD), computational solid mechanics (CSM), heat transfer, particle dynamics, reacting flow, electrochemistry, electromagnetics, acoustics and rheology. STAR-CCM+ delivers accurate and efficient simulation technologies through a single integrated user interface and automated workflows. This facilitates the analysis and exploration of complex real-world problems.
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Product
Universal Partial Discharge Measurement and Analysis System
MPD 800
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Our MPD 800 universal partial discharge (PD) measurement and analysis system represents the next generation of our widely-used and innovative MPD PD testing technology. Enhanced and newly-added hardware and software features ensure highly-sensitive multi-channel PD measurements for reliable, industry-standard PD testing on a variety of electrical equipment and components.
