Memory Device
directly accessible computer's internal or main memory.
See Also: Memory, Memory Test, DDR, NAND, DRAM, RAM, ROM, Memory Testers, DUT
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Product
USRP‑2930, 20 MHz Bandwidth, 50 MHz to 2.2 GHz, Included GPS-Disciplined OCXO, USRP Software Defined Radio Device
781910-01
Software Defined Radio Device
20 MHz Bandwidth, 50 MHz to 2.2 GHz, Included GPS-Disciplined OCXO, USRP Software Defined Radio Device - The USRP‑2930 is a tunable RF transceiver with a high-speed analog‑to‑digital converter and digital‑to‑analog converter for streaming baseband I and Q signals to a host PC over 1 Gigabit Ethernet. It also features a GPS-disciplined oscillator (GPSDO) with PPS accuracy of ±50 ns. You also can use the NI USRP‑2930 for the following communications applications: white space; broadcast FM; public safety; land-mobile, low-power unlicensed devices on industrial, scientific, and medical (ISM) bands; sensor networks; cell phone; amateur radio; or GPS.
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Product
Memory Tester
SP3000
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CST is proud to offer a portable stand alone and affordable memory tester, combining DIMM and SODIMM testing capability all on the same universal base unit with optional easy plug-on test adapters.
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Product
IP-Reflective Memory
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Each IP-ReflectiveMemory can be used as a standard node or as the Master Node. Clearly labled "DIP Switches" are provided to make the selection of Master or Standard Node, and the Node Address. The Network is based on using LVDS signaling over Ethernet cabling. Nodes automatically come up for pass through operation.
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Product
Memory Analyzers
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Market drivers in the memory sector have changed. Gone are the days of simply pushing Moore’s Law to ever faster data rates. The memory designs of today and tomorrow must also be smarter than ever before. Today, handheld and wearable computers must draw from a limited battery reserve while serving up fast, responsive, and compelling mobile experiences. Meanwhile the cloud of data centers and server farms that feed us these compelling experiences must continuously grow while simultaneously reducing overhead and environmental impact. These two different markets have the same goals: smarter memory, smarter control systems, and lower power usage.
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Product
Memory Burn-In Tester
H5620/H5620ES
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As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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Product
Memory Testing
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C.C.P. Contact Probes Co., LTD.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
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Product
Industrial Flash & Memory Solutions DDR4 Memory
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SQRAM DDR4 memory modules perform at superior speeds of up to 3200 MT/s, a 20% reduction in power consumption, and higher capacity than DDR3.
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Product
8GB DDR4-3200 1GbX8 1.2V Samsung Chip
AQD-D4U8GN32-SE
Memory Module
8GB, DDR 4 3200MHz, 30u" Gold Plating Thickness, Anti-sulfurization resistance, Unbuffered.
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Product
32GB R-DDR5 5600 R-Dimm 2GX8 1.1V SAM
AQD-D5V32GR56-SB
Memory Module
SAM Original Chip, Industrial Design for Improved Reliability, Compatible with server platform, 30u” golden finger, Operating Temperature: 0°C ~ 85°C.
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Product
16GB SO-DDR4-3200 1GbX8 1.2V Samsung Chip
AQD-SD4U16GN32-SE
Memory Module
16GB, Speed 3200MHz, 30u" Gold Plating Thickness, Anti-sulfurization resistance, Unbuffered.
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Product
Industrial Memory
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Advantech SQRAM Industrial Memory solutions offer an extensive portfolio of industrial grade DRAM solutions, such as UDIMM, SODIMM, ECC-DIMM, RDIMM, and LRDIMM designed according to the JEDEC standards and cover all technologies including DDR, DDR2, DDR3, DDR4 in wide temp ranges (-40 to 85°C).
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Product
Shared Memory Network
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Avionics Interface Technologies
AIT's Shared Memory Network (SMN) interface modules provide host systems with an interface to a high speed (2.125 Gbps) optical data network which can be used to share data, in real-time, between multiple distributed systems.
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Product
Test Devices
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qCf - quickCONNECT - efficient, accurate, safe!Measurements on internal components of the fuel cell and electrolysis
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Product
16GB SO-DDR4-3200 1GbX8 1.2V ECC Samsung Chip
AQD-SD4U16GE32-SE
Memory Module
16GB, Speed 3200MHz, 30u" Gold Plating Thickness, Anti-sulfurization resistance, ECC.
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Product
Input Devices
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Panasonic Automotive & Industrial Systems Europe GmbH
Panasonic's Electromechanical Components are used to convert mechanical movement into electrical signals. These products, including switches, encoders, and potentiometers, are used in everyday devices at the point of user interaction.
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Product
DRAM SO-DIMM DDR4 Memory
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Improve performance up to 50% (compared to SO-DDR3.) with Advantech! We offer industrial grade SO-DDR4 2666/2400/2133 memory with 30μ" gold plating connector (260 pin) featuring 1.2v low operating voltage with faster burst accesses.
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Product
Power Devices
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Our power portfolio provides a wide range of low-voltage to high-voltage components featuring our advanced process and packaging technologies. These solutions meet the demands of today's most complex power system designs across the infrastructure, mobile, industrial, automotive and aerospace markets.
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Collaboration Devices
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VIA family of True-Collaboration™ solutions: VIA Collage for more complex meeting spaces and VIA Connect PRO for huddle spaces and small to mid-sized meeting rooms.
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DRAM DDR4 Memory
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Improve performance up to 50% (compared to DDR3.) with Advantech! We offer industrial grade DDR4 2666/2400/2133 memory with 30μ" gold plating connector (288 pin), featuring 1.2v low operating voltage and faster burst accesses.
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Product
Performance Profiler / Memory Leak Detector
GlowCode
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GlowCode is a complete real-time performance and memory profiler for Windows and .NET programmers who develop applications with C++, C#, or any .NET Framework-compliant language. GlowCode helps programmers optimize application performance, with tools to detect memory leaks and resource flaws, isolate performance bottlenecks, profile and tune code, trace real-time program execution, ensure code coverage, isolate boxing errors, identify excessive memory usage, and find hyperactive and loitering objects.
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Memory Test Systems
T5503HS2
Test System
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Input Devices
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In fact, our in-house electronics production capabilities, incorporating the most advanced technological trends, streamline and ease our customers’ ability to bring their concepts and designs to fruition. From complete assembly through automated placement of components on foil, our automated production machinery brings precision and reliability to the production process, while skilled manufacturing staff oversee and control all aspects of manufacturing. Post-production inspection then ensures that our – and our customers’ – highest standards are met.
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Product
Memory Test System
T5830/T5830ES
Test System
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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Product
Memory Test System
T5801
Test System
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
BAW Devices
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Teledyne RF & Microwave has been producing Bulk Acoustic Wave (BAW) delay devices since the early 1960’s. Over the years,Teledyne has constantly improved BAW technology and is currently the world’s only supplier of microwave bulk acoustic wave delay devices. Markets for BAW devices include instrumentation and radar altimeters and are available in connectorized, pin and surface mount configurations.BAW devices operate as low as 300 MHz and as high as 17 GHz, usually in sub-bands of around 10%. Depending on the delay and frequency of operation the insertion loss is in the range 30 dB to 90 dB.
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Product
Electricity Metering Device
Mk7C
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Built on the advanced Atlas metering platform, the Mk7C is a single meter with an integrated 100A UC3 compliant relay which allows disconnection and reconnection of electrical services remotely.
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Product
Pull Out Device
BCL-1
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This Pull out device BCL-1 is designed and manufactured according to relevant standard requirements of IEC884-1/ GB2099.1-2008 and other electrical accessories standards, Mainly used to test the needed maximum force when the plug pull out from socket and the minimum force when single stage plug pull out from socket, and to inspect whether the socket can withstand the lateral stress imposed by electric plug into the socket. This device is applied to plugs and sockets which rated voltage no more than 250V and rated current no more than 16A.Specifications: • Weights: 36N*1, 5.4N*1, 5N*2, 4N*1, 2.6N*1; • Standard testing plug: each one for Dipolar 10A, tripolar 10A and 16A • Standard test bolt: Each one for 1.5N and 2N • 1 set of clamping device • 1 set of Weights tray • Lateral stress weights 5N*1 • 1 set of lateral stress bar
