Memory Device
directly accessible computer's internal or main memory.
See Also: Memory, Memory Test, DDR, NAND, DRAM, RAM, ROM, Memory Testers, DUT
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Bridge Devices
USB
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*Royalty free Virtual Com Port (VCP) drivers*Simple GUI based Xpress configurator for configuring, programming and customizing applications*No USB expertise required*Seamless compatibility with most operating systems*UART, SPI, I2C/SMBus and I2S interface options available*Fastest way to add USB Turn key, no firmware development needed
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Certified Medical Devices
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ADLINK Healthcare offers medically-certified medical panel computers, medical monitors, tablets, and HDBaseT™ technology for healthcare digitalization. We support the medical visualization chain from image acquisition through to image analysis and processing, digital data exchange, and image display. Our medical devices are hygienically designed and satisfy safety regulations. We also provide comprehensive services, including customization, consultancy, and technical support.
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Power Device Analyzer
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bsw TestSystems & Consulting AG
Semiconductor manufacturers need accurate data on the exact electrical characteristics of their components as a basis for further optimization.
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Measurements On The Same Device
How Many Item Family
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Quanti - the functional measurement and electrical safety The tester of the product family is believed to be the first of its kind, as our devices allow users to perform electrical safety and functional measurements on the same device.
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Digital I/O Device
Digital I/O
The Digital I/O Device supports channel, current, and voltage options to help you automate applications. This module features programmable input filters to remove chatter, noise, glitches, and spikes on inputs, and these filters also provide debouncing for digital switches and relays. You can use the module to perform safe operation when connected to pumps, motors, and other industrial actuators or machinery using the included power-up states. The module also provides a fail-safe mechanism that monitors for computer or application crashes and place the system in a state to ensure safe recovery. Additionally, some models include high-voltage, high-current, and isolation options to ensure the product can work safely in many environments.The Digital I/O Device includes the NI-DAQmx driver and configuration utility that simplify configuration and measurements. NI-DAQmx supports NI programming environments as well as Python, ANSI C, C#.NET, and MathWorks MATLAB® software.
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Industrial Flash & Memory Solutions DDR4 Memory
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SQRAM DDR4 memory modules perform at superior speeds of up to 3200 MT/s, a 20% reduction in power consumption, and higher capacity than DDR3.
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Loading Devices
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Educated Design & Development, Inc.
Sometimes you may need additional loading for abnormal testing (i.e. overload test). Other times, you may need additional loading to simulate worst case normal operation conditions (i.e. input test, temperature test). No matter what your application, we have the loading device to fit your needs! TECH NOTE: Be sure to request our outline titled "Selecting Loads" for assistance in determining the proper rated device for your application.
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Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Industrial Flash & Memory Solutions
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Advantech provides a full range of industrial storage module, memory module, and embedded I/O module.
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Electricity Metering Device
Mk6E
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The Mk6E is an enhanced upgrade of the Mk6 meter, built with a higher class accuracy of 0.2S, catering to the high-end markets. The Mk6E is a high-precision meter created for generation and transmission applications, as well as for revenue metering at high-end consumer facilities.
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Magnetoelectric DC Devices
Type Ma And Mb
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Magnetoelectric DC devices type Ma and Mb and AMPETRAMETERS AND VOLTMETERS.
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Programmer AUTO300 Weilei Memory
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AUTO300 is the newest programmer from weilei company. That programmer is dedicated to automotive electronics. The main advantages are : reliability, speed, and the ratio of quality to price, the software in ten languages and 3-year warranty
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Optical Device
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Optical devices are products that use the optical characteristics (birefringence) of quartz crystals. Murata Manufacturing uses high-precision synthetic quartz crystals grown using our proprietary technology to manufacture high-grade products.
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Shared Memory Network PCI Express Interface
PCIe-SMN
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Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodesNetwork interrupts supported - PCIe 2.0 (x4) CompliantSoftware Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
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Metrology Device
XPLOR 100
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XPLOR 100 is a state of the art, fully automated metrology device designed for measurement and analysis of bubbles and inclusions for optical substrates in the Visible and NIR wave-bands.
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Dust Measuring Devices
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commonly known as particulate matter (PM) or aerosol monitors, quantify airborne dust, smoke, and mist to safeguard health and industrial safety. These instruments operate through distinct technologies tailored to residential, field, or regulatory needs.
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Electricity Metering Device Residential
NC30
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EDMI presents its single phase multi-tariff ANSI meter, the NC30. The ANSI compliant meter is designed to supply a comprehensive portfolio of revenue-grade features. NC30 has the ability to render an optional disconnect function and has the competency to offer multiple communications option. It has also the capability of storing meter data up to 12 months of its history.
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Keysight 4-Channel D/A Converter with Waveform Memory for 34980A
34951A
Digital / Analog Converter
The Keysight 34951A module for the 34980A Multifunction Switch/Measure Unit has four electronically calibrated analog channels that can output up to +/-16V DC or +/-20mA DC with 16 bits of resolution. Each channel can be updated individually with a 200 kHz update rate. You can use the standard waveforms provided or create your own with over 500,000 points. These points can be dynamically allocated among one or more channels and output as a point-to-point arb.
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Cross-Cut Test Devices
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ElektroPhysik Dr. Steingroever GmbH & Co. KG
To assess the adhesiveness of single or multiple coatings (lacquers, synthetic materials, etc.) on hard (steel) and soft (wood) substrates, the cross hatch cutter SecoTest from Elektrophysik is your first choice. As a cross-cut testing device, this product is ideal, allowing you to conduct cross-cut tests simply and conveniently – thanks to high quality, tool steel, multi-cutting blades in 4 different models, and a moveable cutter head.
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Test system for Electronic Device
PCB
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The main focus of the test system is validation and functional testing of electronic devices. The tests include electrical parameters and logical functions of the firmware. Device groups can be stimulated externally and output signals can be acquired by the test points on the board. Limits and ranges of the acquired signals can be monitored and stored for verification.
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Flash Memory In-System Programming File Generation
ScanExpress Flash Generator
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ScanExpress Flash Generator is a tool to quickly create Flash programming files for use with ScanExpress™ software. The application operates as a standalone utility or integrates into ScanExpress TPG for creation and reuse of boundary-scan test files for in-system programming (ISP).ScanExpress Flash Generator combines a board Netlist, scan chain description, and BSDL files to automatically create Flash Programming Information (FPI) files. These files include all information necessary for ScanExpress Runner™ or ScanExpress Programmer™ execution systems to perform read, write, erase, and verify operations—in-system using high performance Corelis hardware.
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Charge-Coupled Devices ("CCD") Cameras
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Improve limits of detection and quantification. The camera generates large amounts of data, but handles it smoothly via the new super speed USB 3.0 interface.
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Device Networking
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Offers complete control of how and when the application can discover, connect, disconnect, and get status from the USB device across the network.By integrating the SDK, you can create your own user interface and make it work seamlessly with your application.The SDK supports searching device servers on the network.Supports getting information and status from the USB device server.
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High-Voltage Test Device
PGK 110 / 5 HB
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Cable testing and diagnostics with the BAUR PGK HB. There are hardly any other longer-lasting, more robust and cost-effective testing devices than the two-piece high-voltage test devices from the PGK HB series. They generate continuous adjustable test voltages with mains frequency or optionally DC with positive or negative polarity. The display instruments for current and voltage, the safety control unit and the regulating transformer for the voltage are integrated in the operating unit.* Testing as DC or Dc testing device* Polarity of the DC voltage can easily be reversed* Robust and durable
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Memory Burn-In Test
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The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Multifunction Reconfigurable I/O Device
Multifunction Reconfigurable I/O
Multifunction Reconfigurable I/O Devices feature a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware-in-the-loop (HIL) testing, custom protocol communication, sensor simulation, and high-speed control.
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Smart Home Device Testing
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Helping you ensure that your smart home devices with integrated wireless modules meet requirements to demonstrate compliance to global wireless type approval requirements.
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Clock Distribution Devices
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Analog Devices offers ultralow jitter clock distribution products that fan out given signals for wireless infrastructure, instrumentation, broadband, ATE, and other applications demanding subpicosecond performance. Our clock products are ideal for clocking high performance analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). ADI clock ICs integrate PLL cores, dividers, phase offset, skew adjust, and clock drivers in small chip scale packages.
