Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Mixed Signal Battery Test System
Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Tracer Gas Leak Test Systems
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Tracer gas leak testing is a simple and highly-efficient method of leak detection that provides high sensitivity as well as increased accuracy and repeatability. This method is used for testing parts with very low leak rates that are outside the range for conventional air-flow pressure decay and mass flow, or to replace bubble test methods. Tracer gas testing uses escaping tracer gas to identify micro-leaks in the range of 1x10-4 to 10-9 scc/s.
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Wiring Tester
WIZE
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The testers can be used both in production and maintenance, as WIZE® is suitable for simple wiring tests and complex interconnect tests for full systems. WIZE®’s specifications make it compatible with the standard requirements used for testing in the aeronautics, space, rail and defence sectors or any other industry using wiring.
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Product
PXI Precision Resistor Module 6-Channel, 3 to 11.4M
40-297-053
Programmable Resistor Modules
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI 2.5W Programmable Resistor Module, 1-Channel, 3Ω to 11.4MΩ
40-251-153
Programmable Resistor Module
The 40-251-153 is a programmable resistor module with 1 channel which can be set between 3Ω and 11.4MΩ with 1Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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High Voltage Surge Testers
10000HVST
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The most important features of the surge tester are its ability to test the entire winding insulation system. A high voltage surge generates turn to turn, coil to coil, and phase to phase voltage stress, as well as ground insulation stress. When used as a dielectric test, accurate voltage readings are essential. The HV Surge Tester monitors the voltage directly across the winding under test. This voltage is displayed on an oscilloscope and recorded on the Pass/ Fail LED latch monitor. This voltage will be accurate despite the impedance of the winding being tested. The insulation system can be tested way above the operating voltage because of the brief duration of the applied voltage test pulse. This allows faults to be detected long before they become apparent at operating conditions.
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Fixtures FMMA11
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The FMMA11 fixture series is designed for high-performance mechanical applications, integrating advanced technical capabilities with user-friendly features. Built with a standard chassis to ensure reliability and ease of use, the FMMA11 model takes full advantage of customizable testing systems with manually generated contact interfaces capable of handling up to 850 signals. This model is particularly suitable for mechanical exchangeable cassettes, providing precise measurements and a maximum contact force of 600 N over a linear stroke of 20 mm, making it ideal for various testing environments.
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Product
PXI 5W Programmable Resistor Module, 2-Channel, 1Ω to 470Ω
40-252-114
Programmable Resistor Module
The 40-252-114 is a programmable resistor module with 2 channels which can be set between 1Ω and 470Ω with 2Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
SWB-2813, 4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock
781420-13
Matrix Switch Module
4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2813 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
PXI High Density Precision Resistor Module, 9-Channel, 2.5Ω to 472Ω
40-298-020
Programmable Resistor Modules
The 40-298-020 is a high density programmable resistor module with 9 channels which can be set between 2.5Ω and 472Ω with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PXI High Density Precision Resistor Module, 9-Channel, 2Ω to 31.5Ω
40-298-110
Programmable Resistor Modules
The 40-298-110 is a high density programmable resistor module with 9 channels which can be set between 2Ω and 31.5Ω with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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RF Generators
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RF signal generators are equipment’s used to generate high frequency signals at a particular frequency for testing systems in the lab. RF Signal Generators from the leading manufacturers are listed here. Find signal generators based on the required frequency range, power level, modulation and other parameters. View product specifications, download datasheets and get quotes on parts that meet your requirement.
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JTAG External Modules for Cluster Test
JEMIO
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The JTAG External Modules JEMIO™ for Cluster test are intended to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, Boundary-Scan has adequate access to on-board signals, but signals that go off the board often cannot be tested by a JTAG tester. By adding JTAG access to these off-board signals, JEMIO™ modules can increase the board's JTAG test coverage, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.
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Dayton Audio Test System
DATS V2
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Highly accurate measurement of loudspeaker impedance and T/S parametersEasy-to-use, fully-featured measurement software with intuitive interfaceCompact USB measurement module with molded test leads and alligator clipsSoftware includes signal generator, scope, and measurement of inductors and capacitorsData can be saved to create a driver parameter library or exported to popular box design programsNew V2 hardware and software simplify setup and eliminate warm-up/cool-down times
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Product
Basic Contact Probes (100 Mil) F10012B150G060
1021247
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The Basic Contact Probes (100 mil) F10012B150G060, with MPN 1021247, are designed to deliver high precision and reliability for various testing applications. Operating within a temperature range of -45°C to +80°C, these probes facilitate consistent performance in a wide array of environmental conditions. Their innovative design incorporates a 100 mil pitch, ensuring compatibility with standard test systems while providing high accuracy for critical measurements. The robust construction, featuring materials such as beryllium copper for the plunger and bronze for the barrel, enhances durability and longevity under repeated use.
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MEMS Handler
4664-IH
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The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
Test System
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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Multi-Purpose RF Test System
SPA1241
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The S - Series multi-purpose RF test system can be used in many applications such as R&D lab, ATE factory testing, EMC testing, field testing, and general purpose RF design. The S - Series is a flexible alternative to expensive and bulky RF test equipment. As shown in the setup in the upper right the S-Series system can be utilized to simultaneously provide all RF functions using its 7 inch front panel display or can be connected to a larger monitor for ease of viewing multiple windows at the same time
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Static Load Cells (5 N to 300 kN)
2530 Series
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The Instron 2530 Series static load cells are precision force transducers engineered for versatile use in tension, compression, cyclic, and reverse stress testing, delivering accurate measurements down to 1/500th of their capacity. Individually temperature-compensated and calibrated, they support automatic recognition and electronic calibration, and are built to international force-measurement standards (ASTM E4, ISO 7500-1 class 0.5, and JIS B7721, B7733). With overload protection (150 % of rating without damage, 300 % without mechanical failure), the 2530 family offers consistent, repeatable performance across a wide force range (5 N to 300 kN).2530 Series load cells with capacities of 5 N to 100 N are for use with 3300, 3400, 5900, and 6800 Series testing systems.2530 Series Load cells with capacities of 500 N to 300 kN are for use with 3300 and 3400 Series testing systems.
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LT-300A Aging-Life Test System For LED Luminaires
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Hangzhou Everfine Photo-E-Info Co., LTD
LT-300A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
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Comprehensive Simulation of Master, Slave and End Nodes in A 2 B ® Networks
Infotainment Test Device ITD 1024
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The complexity, cost and weight of audio systems are significantly reduced with the Automotive Audio Bus (A 2 B ® ) from Analog Devices Inc. Regardless of their hierarchical structure or use as master or slave, all A 2 B ® products must be adequately tested before use. This applies, for example, to HiFi amplifiers/loudspeakers, head units, eCall systems, microphones, vibration/noise suppression units, actuators or sensors.Our small and very compact infotainment test system ITD 1024 takes on this task for you: It comprehensively and extremely reliably tests all A 2 B ® signals and communication in all phases of the product development process - during development, for validation and in production.
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Product
NI-9213, 16-Channel, 75 S/s Aggregate, ±78 mV C Series Temperature Input Module
785185-02
Temperature Input Module
16-Channel, 75 S/s Aggregate, ±78 mV C Series Temperature Input Module - The NI‑9213 is a high-density thermocouple input module that is designed for higher channel count systems. With this module, you can add thermocouples to mixed-signal test systems without taking up too many slots. The NI‑9213 includes anti-aliasing filters, open-thermocouple detection, and cold-junction compensation for high-accuracy thermocouple measurements. The NI‑9213 features NIST‑traceable calibration and a channel‑to‑earth ground double isolation barrier for safety, noise immunity, and high common-mode voltage range.
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Stationary Circuit Breaker Testing
ACTAS L260
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High-precision test system for function tests on various types of switchgear device, including circuit breakers, disconnectors or earthing switches, regardless of the type of drive unit.The inputs and outputs are connected flexibly via a terminal strip, making the test system particularly suitable for use in development and laboratory environments as well as in production environments.
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High Voltage Battery Test System
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The increasing use of electric drive systems both in the automotive industry and in transportation requires the development of new high-performance energy storage systems. In order to support you in the development and production of these systems, S.E.A. develops individually configurable test systems which are scalable and can be used flexibly for the respective requirements.
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CATR Benchtop Antenna Test System
ATS800B
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique benchtop CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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The Language of Technical Computing
MATLAB
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MATLAB is a high-level language and interactive environment for numerical computation, visualization, and programming. Using MATLAB, you can analyze data, develop algorithms, and create models and applications. The language, tools, and built-in math functions enable you to explore multiple approaches and reach a solution faster than with spreadsheets or traditional programming languages, such as C/C++ or Java. You can use MATLAB for a range of applications, including signal processing and communications, image and video processing, control systems, test and measurement, computational finance, and computational biology. More than a million engineers and scientists in industry and academia use MATLAB, the language of technical computing.
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GPIB-ENET/1000, Ethernet GPIB Instrument Control Device
781630-07
GPIB Controller
Ethernet GPIB Instrument Control Device - The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB devices from several network hosts, and you can control up to 100 GPIB‑ENET/1000 interfaces with a single computer. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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Modulation Distortion Up To 53 GHz
S95070B
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S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
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Product
OLED Life Time Test System
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A system for measuring measurement items (brightness and so forth through Voltage, Current, and Photodiode) and their lifetime in intervals of set time, while supplying power to multiple (32 Channel) OLED panel stably.
