Near-field Scanning Optical Microscope
Near-field Scanning Optical Microscope
-
Product
Automated Optical Inspection
AOI
-
No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools. As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.
-
Product
Nanomechanical Test Instruments for Microscopes
-
Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
-
Product
Xineos Scanning
-
Teledyne DALSA's leadership in CMOS innovation lets our Xineos scanning products deliver three times more sensitivity and five times more signal-to-noise performance than other standard technologies at equal X-ray dose conditions. CMOS image detectors offer numerous advantages including the ability to record smaller image details with higher resolutions – allowing for the diagnostics of medical anomalies at earlier stages, and significantly increasing the probability of early intervention, patient recovery, and reduced treatment costs.
-
Product
Optical Transceivers
-
Based on Reflex Photonics technology, these rugged embedded transceivers offer bandwidth up to 300 Gbps in a chip-sized component. Designed for harsh environments including space, military, aerospace, and industrial applications, the transceivers provide high I/O density with low SWaP. Versions are available for mounting mid-board, front-panel, or on a VPX backplane (aligned with the SOSA™ technical standard).
-
Product
3D Scanning Coordinate Measurement Machine
CUBE-R™
-
CUBE-R™ is a fast, reliable, and efficient complete turnkey solution for automated quality control applications. This automated 3D measuring machine features MetraSCAN 3D-R, a powerful robot-mounted optical 3D scanner that can be integrated into factory automation systems without compromising on accuracy. It is the perfect alternative to solve any productivity issues caused by bottlenecks at the traditional coordinate measuring machine (CMM).
-
Product
Electron Microscope Analyzer
QUANTAX EDS for TEM
-
Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
-
-
Product
Optical tTansceiver Module
QSFP28
-
Eoptolink Technology Inc., Ltd.
Eoptolink’s EOLQ-851HG-02 QSFP28 SR4 100G Optical transceiver module are designed for use in 100 Gigabit Ethernet links over multimode fiber. They are compliant with the QSFP28 MSA and IEEE 802.3bm 100GBASE-SR4 and CAUI-4. Digital diagnostics functions are available via the I2C interface, as specified by the QSFP28 MSA.
-
Product
Optical Identification
-
Application areas of the 1D/2D code reader range from product tracking and product control to product identification.The sensor can read 1D and 2D codes regardless of their position. Even if up to 25% of the code information becomes damaged or soiled, it is still read correctly. The reader can also be used for optical character recognition (OCR), e.g. in order to identify products based on type labels or serial numbers.
-
Product
Optical Fiber Ranger
-
Optical fiber ranger is test equipment that functions similar to an optical time domain reflectometer. It is used in single mode fiber test applications. The fiber optic ranger is much smaller size and lighter weight compared to the fiber optic OTDR, and it is much more cost effective. They are used in optical fiber links troubleshooting, maintenance and test.
-
Product
3D Optical Profiler
7503
-
Chroma 7503 uses the technology of white light interfaces to measure and analyze the surface profile of micro-nano structures with sophisticated scanning system and innovative algorithms.
-
Product
Optical Profilers
-
Finally, measurements of surface roughness and topography can be made for a price that's less than that of a stylus profilometer. The Profilm3D has sub-nanometer vertical resolution, which surpasses optical profilometers that cost 3x as much. It does so by using the same state-of-the-art measurement technologies as the most sensitive optical profilers available: vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI).
-
Product
Optical & Vision Systems
-
Usually made up of every component that is needed to acquire and analyze an image in order to perform the intended task.
-
Product
Fiber Optic Amplifier
-
Shanghai Pubang Sensor Co.,Ltd.
1. High response frequency, detect with super high speed2. Suitable for detecting small objects3. Non-contact, non-destructive detection,can be used in harsh conditions4. Simple mounting by DIN connection
-
Product
Stereo Zoom Microscopes
-
Our product range includes a wide range of gemstar stereo zoom binocular microscope, gemstar stereomaster binocular stereo zoom microscopes, zoomstar iii trinocular stereo zoom microscopes, zoomstar ii trinocular stereo zoom microscopes, zoomstar vi trinocular stereo zoom microscopes and zoomstar v trinocular stereo zoom microscopes.
-
Product
VS Tool Suite for Virtual Scan Synthesis and ATPG
VirtualScan
-
VirtualScan is SynTest's solution to combat increase in test data volume and test cycle volume. With VirtualScan (VS) an extremely large number of short scan chains within the SOC can be virtually accessed from outside the chip with a limited number of pins assigned as scan pins.
-
Product
Modular Infinity Microscope
MIM
-
Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
-
Product
Reticles, Optical Slits, Optical Apertures
-
With over 30 years of experience in the manufacturing of high precision Reticles, Slits, Apertures, and Pinholes, APPLIED IMAGE has gained a reputation for delivering precise and accurate parts. We have supplied thousands of these parts to be used in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
-
Product
Industrial Microscope for Materials Science & Industrial Applications
BX53M
-
Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with OLYMPUS Stream software, the BX3M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.
-
Product
Line Scan Camera
Piranha4 Polarization
-
The Piranha4 Polarization™ camera is a breakthrough in the machine vision industry. This high-speed polarization camera features three native polarization states plus an unfiltered channel.The Piranha4 polarization camera extends detection capability in machine vision and is ideal for detecting stresses, surface roughness, film thickness, alloy composition, and 3D profiles.
-
Product
Cleanliness Inspection System / Microscope
CIX90
-
The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
-
Product
Optical Switches
-
Panasonic Industrial Devices Sales Company of America
Compact and reliable design with unique polarized actuator construction. Conforms to Telcordia GR-1221-core. Applications include: Optical ADM Equipment, Protection Switching (WDM, CATV, FTTH), Optical Measuring Equipment.
-
Product
Scanning Auger Nanoprobe
PHI 710
-
The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
-
Product
Atomic Force Microscope
NX-Hivac
-
Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
-
Product
64-Channel Boundary-Scan Digital I/O Scan Module
JT 2111/MPV DIOS IDC
Digital I/O Module
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
-
Product
Renishaw Scanning Probes
-
Advanced Industrial Measurement Systems
The REVO® is designed to maximize CMM throughput while maintaining high system accuracy and uses synchronized motion as well as Renscan5 measurement technology to minimize the dynamic effects of CMM motion at ultra high measurement speeds. This is achieved by letting the REVO® head do the fast demanding motion while the CMM moves in a slow linear fashion.
-
Product
Scanning Magnetic Microscope
Circuit ScanTM 1000
-
Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
-
Product
STM Microscope
NaioSTM
-
The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making individual atoms directly visible to a small group of specialists. They were awarded the Nobel Prize in physics in 1986. In 1997, Nanosurf went one step further and brought single atoms to the classroom!
-
Product
Inverted Metallurgical Microscope
GX53
-
Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
-
Product
Optical Spectrum Analyzer
ID OSA
-
This instrument is a versatile Optical Spectrum Analyzer (OSA) based on a coherent detection principle provides picometer class spectral resolution across the C-Band (1528.5 – 1567.5nm).
