Applied Image, Inc.

Product

Optical Slits

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Applied Image, Inc.

Applied Image, Inc.

The APPLIED IMAGE Optical Slit reticles are available in sizes from 10μm (0.01mm) to 1,000μm (1.0mm) widths, on either Chrome on Glass or Chrome on Opal material, with an overall size of 25.4mm (1.0 inch) diameter.

Product

SINE M-13-60 Sinusoidal Array

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Applied Image, Inc.

Applied Image, Inc.

The Sinusoidal Array SINE M-13-60 is designed to be used for evaluating systems that work in the reflective mode such as scanners, machine vision systems and cameras. It is imaged on Photo Paper in four different sizes getting larger from 1X – 8X. The ½X and 1X slides incorporate the same spatial frequencies. Spatial frequencies for the 2X, 4X and 8X versions are 1/2, 1/4 and 1/8 respectively.

Product

Reticles, Optical Slits, Optical Apertures

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Applied Image, Inc.

Applied Image, Inc.

With over 30 years of experience in the manufacturing of high precision Reticles, Slits, Apertures, and Pinholes, APPLIED IMAGE has gained a reputation for delivering precise and accurate parts. We have supplied thousands of these parts to be used in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.

Product

SINE Sinusoidal Vision Demonstration Array

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Applied Image, Inc.

Applied Image, Inc.

The Sinusoidal Visual Demonstration Array is designed to demonstrate the Modulation Transfer Function (MTF) of the human eye. Its transmittance varies sinusoidally and increases in spatial frequency from 0.2 to 20 c/mm, following a logrithmic scale. The modulation increases linearly from top to bottom. One can see, in the image, where the visual contrast contour disappears which is the MTF of the eye. Ideally suited for teaching and demonstration, the Array is available on film mounted in glass (-G), or mounted in a 2″x 2″ projection slide.(-SL)

Product

Stage Micrometer Measuring Scales

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Applied Image, Inc.

Applied Image, Inc.

The SM Series of Stage Micrometer Calibration Standards is ideally suited for calibrating optical, imaging, video as well as reticle based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Our SM series covers a range of low to high power systems, and can always be custom manufactured to perfectly fit your needs.

Product

Conformance Calibration Standard Test Card for UPC/EAN Symbol Verifiers

AI-CCS-UPC/EAN-E Rev S

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Applied Image, Inc.

AI-CCS-UPC/EAN-E Rev S - Applied Image, Inc.

For those who prefer a traditional vertical format calibration test card, APPLIED IMAGE offers our new Conformance Calibration Standard Enhanced for UPC/EAN Bar Code Symbol Verifiers. The new standard complies with both the ANSI X3.182 and ISO 15416 standards and is ideal for testing of verifiers, scanners, and other UPC bar reading equipment as well as a tool for training new operators to assure proper “methodology' in the use of verifiers.

Product

Image Analysis Micrometers

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Applied Image, Inc.

Applied Image, Inc.

For calibrating and analyzing microscopy measurement systems, the IAM line of Image Analysis Micrometers are perfectly suited. Calibrated to NIST Standards, and imaged with the best line edge quality in the industry, the IAM series is a diversified line of slides that function in areas of color calibration (IAM-9C), Optical Magnification, Frame Distortion, and other applications. Custom features, substrates, sizes and designs are available as custom solutions.

Product

ACCUplace Position Grid

AP-P Series

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Applied Image, Inc.

AP-P Series - Applied Image, Inc.

The AP-P is a unique calibration target that is designed to test the position and/or recognition ability of a vision system. The matrix of small scales, precisely positioned in a grid matrix format, makes testing for subject recognition and system positioning simple.The overall target is comprised of a matrix consisting of 6.0mm x 6.0mm square individual components each having a 5.0mm x 5.0mm X & Y Scale with 0.100 divisions. The scale has pitch accuracy of 1μm. The AP-P is available on two standard materials; Chrome on Glass (CG) and Chrome on Opal (OP).

Product

Conformance Calibration Standard Test Card for GS1-128 Symbol Verifiers

AI-CCS-128-E Rev B

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Applied Image, Inc.

AI-CCS-128-E Rev B - Applied Image, Inc.

This test card is ideal for testing of verifiers, scanners, and other GS1-128 barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.

Product

Standard Step Tablets, Gray Scales & Density Reference Charts

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Applied Image, Inc.

Applied Image, Inc.

Standard Step Tablets, Gray Scales & Density Reference Charts are available in a wide variety of patterns, designs and sizes to fit a multitude of today’s application needs. Our gray scales and density patches are measured on a variety of NIST traceable instrumentation, including some of the most sophisticated microdensitometers available to the industry. They are imaged on either Photo Paper (RM) or Film (TM) to function for reflective or transmissive applications.

Product

USAF Targets

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Applied Image, Inc.

Applied Image, Inc.

These targets conform to MIL-STD-150A. Frequencies change by the 6th root of 2. This target is also available in custom sizes and contrasts. This test target meets requirements as specified in MIL-STD-150A for resolving power tests. The target consists of a series of Elements having two sets of lines at right angles. Each set of lines consists of three lines separated by spaces equal to the line width. Each bar has a length to width ratio of 5:1. (Line width is equal to one half of line pitch, which is the inverse of line frequency.) Elements are arranged in groups of six each and Groups are arranged in pairs. Even numbered Groups occupy the left side and bottom right corner and contain a square feature having and edge length equal to the line length of Element 2 in that group. Odd numbered Groups occupy the top right corner and side. Groups and Elements are labeled and differentiated by numbering adjacent to their features. Frequencies in cycles/mm (c/mm) increase between each Element by the sixth root of two (approximately 12.25% per step). The general formula for the line frequency of any target Element can be expressed as 2Group+(Element-1)/6.

Product

SINE M-19 Sinusoidal Array

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Applied Image, Inc.

Applied Image, Inc.

The Sinusoidal Array SINE M-19 is a remarkable new test array that achieves 256 cycles per mm while maintaining a significant modulation. It is designed for testing high resolution optical systems such as microscopes. Because its maximum width is 7.5mm, the SINE M-19 is small enough to fit easily onto a standard microscope slide (the TM-G variation is mounted in glass).

Product

Test Targets & Charts

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Applied Image, Inc.

Applied Image, Inc.

APPLIED IMAGE is a world leader in the field of IMAGE EVALUATION Test Targets and Test Charts. Some of the specialized test charts include camera image evaluation ISO, NIST, ANSI, and MIL standard image evaluation applications; photonic and optophotonic applications; test charts for copiers and scanner; DATAcapture and BARcode Scanning testing; Security & Identification Image Capture; and all other type of imaging industries that require quality evaluation of thier image capture systems.

Product

ACCUplace BullsEye /Recognition Grid

AP-B Series

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Applied Image, Inc.

AP-B Series - Applied Image, Inc.

A unique concept in imaging calibration technology, The ACCUplace Bulls Eye / Recognition Grid allows the end user to calibrate magnification at multiple power levels, as well as test the system’s ability to recognize and locate distinctive shapes within shapes by focusing on the concentric circles.Each Bulls Eye / Recognition Grid target has individual patterns consisting of 5 concentric circles with 0.50mm line width and 0.50mm spacing between circles (10mm Pitch) with a 0.100mm center dot. In addition, each row and column is labeled with X & Y coordinates. The AP-B series is offered on four standard substrates; Chrome on Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).

Product

SINE FBI Charts

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Applied Image, Inc.

Applied Image, Inc.

There are two SINE Sinusoidal arrays designed for FBI applications: the SINE M-13-60-S-RM and the SINE M-13-60-FBI Kit.The SINE M-13-60-S-RM was designed jointly by the Federal Bureau of Investigation, of Washington DC, and MITRE, of Bedford MA. The primary function of this Target is for computing Modulation Transfer Function (MTF) evaluation in live scanner fingerprint systems for conformance to Integrated Automated Fingerprint Identification Systems (AFIS) image quality requirements. The array is on reflective material measuring 16mm x 16mm with sinusoidal arrays ranging in frequency from 1.0 to 10.0 cycles per mm; with nominal modulation of the sinusoidal areas at 60%. The top and bottom rows are density scales, from 0.20 to 1.20 densities.The SINE M-13-60-FBI Kit consist of two individual components, the SINE M-13-60-1X-RM and the RR1-N-RM Ronchi Ruling grating.