Near-field Scanning Optical Microscope
Near-field Scanning Optical Microscope
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Product
Scanning Kelvin Probe
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Our large range of Scanning Kelvin Probes gives the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350 mm. With work function resolution of 1 - 3 meV, and the spatial resolution of the Probe tip diameter (0.05 mm with the SKP5050 model), the Scanning Kelvin Probe gives reliable, repeatable measurements for work function, contact potential difference and Volta potential.
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Product
Scanning Acoustic Microscope
Pulse2
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This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Product
Scanning Probes
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Scanning probes can acquire several hundred surface points each second, enabling measurement of form as well as size and position.
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Product
Inverted Raman Microscope
XploRA INV
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The XploRA INV inverted Raman microscope combines the automation features and small footprint of the standard XploRA™ Raman microscope with the unique sampling capabilities of an inverted microscope, especially important for demanding biological applications.
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Product
Microscope Software
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Choosing the right software for your Vision Engineering microscope is just as important choosing the hardware. Whatever you need and however you like to work, you’ll find the right application software here.
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Product
Atomic Force Microscope
XE-PTR
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Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
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Product
Inspection Microscope
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This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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Product
Mini Fiber Optic, Patchcord, ITA, 36", Polymer Optic Fiber, Single Ended
7-413845000-036
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Mini Fiber Optic, Patchcord, ITA, 36", Polymer Optic Fiber, Single Ended.
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Product
Radiation Scanning Equipment
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The spectrometer is designed for radiation scanning of territories and objects. The functions of the spectrometer are measurement of the energy distribution of gamma radiation, measurement of the ambient dose equivalent rate of gamma radiation, search and identification of gamma-emitting radionuclides, detection of neutron radiation sources.
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Product
400x Bench-Top Optical Fiber Microscope
FTM-400X
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Shanghai Fibretool Technology Co.,Ltd.
With coaxial illumination optic magnify system, FTM-400X can easily find the slight defects and scratches on fiber endface. High resolution image sensor and 8"pure black and white digital TFT LCD can show the most real details of fiber endface.This is an integrated fiber endface inspector, it combines optical microscope and monitor in a body other than separate designs. It has clear images and long life time. it has series of adaptors for various kinds of connectors such as multi fiber connectors, optical components. It is an essential instrument for optical manufacturing.
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Product
Area Scan Sensors
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The ams family of pipelined global shutter sensors features high frame rates for a wide range of demanding professional and industrial applications. Their resolutions range from VGA up to 50Mpixels. Rolling shutter image sensors feature high 71Mpixel resolution for use in demanding industrial applications.
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Product
Boundary Scan Test
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Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
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Product
AFM Atomic Force Microscope
FM-Nanoview 6800
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Zhengzhou Nanbei Instrument Equipment Co. Ltd
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
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Product
OEM Scan Engines
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Zebra Technologies Corporation
When you choose Zebra as your OEM partner, you get a portfolio of scan engines and devices that deliver industry-leading features, durability and reliability — saving everyone time and money. You save on development time and cost. And, your customers get best-in-class, well-proven solutions that drive time and cost out of their everyday operations.
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Product
Electron Microscope Analyzer
QUANTAX Micro-XRF
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Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Product
Area Scan Cameras
ace Series
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Enjoy a new class of digital cameras that will help you to be even more successful and efficient at what you do. High quality and performance levels combined with a low starting list price of only 199 and a small 29 mm x 29 mm housing make Basler ace cameras one of the world's best-selling cameras with thousands of satisfied customers. It is available with several resolutions and speeds and with sensors from all leading manufacturers so that you can easily find the right ace camera model for your application. Choose from the most popular and standard proven data interfaces in the vision market: With the ace Gigabit Ethernet models, you benefit from our GigE market leadership, easy multi-camera setups and 100-meter cable length. Camera Link is the interface for high image data transfer. And with USB 3.0 there is an interface technology which is easy to use and real-time capable.
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Product
GO-NR1000 Near-Field Goniophotometer
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Hangzhou Everfine Photo-E-Info Co., LTD
Suitable for LED light source, LED chip, module and other small light source, the principal function includes: spatial light intensity distribution curve, spatial color distribution curve, iso-lux curve, total luminous flux, effective luminous flux, spatial luminance curve, etc.The test data can be saved as IESNA (*.ies), CIBSE (*.cib), EULUMDAT (*.ldt), CIE (*.cie), CEN (*.cen) and other formats, which can be directly used as the input data of international general lighting design software. Spatial luminance data can be imported into near-field lighting generation software to generate light data that can be imported into third parties (TracePro and LightTools).
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Product
Measuring Microscopes, Image Processing + Optics Test Equipment
Development And Production Services
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Optik Elektronik Gerätetechnik GmbH
Development and assembly of opto-mechanical building groups, including software development.
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Product
3D Laser Scanning Systems
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3D laser scanning is a construction, engineering, and architectural tool often used to document the existing conditions (as-builts) of any structure.
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Product
Electron Microscope Analyzer
QUANTAX FlatQUAD
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QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Product
Optics
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Welcome to Thorlabs; below you will find links to optical components and systems, a subset of our entire line of photonics products. All single element optical components can be found under the optical elements link with the exception of optical components that have polarization properties since they have a separate link. Multi-element systems like beam expanders and objective lenses as well as interferometers, fiber collimators, reference cells, modulators, and other optical devices can be found by choosing the optical systems link. Thorlabs also manufactures an extensive line of free-space and fiber optic isolators; stock items ship the same day that they are ordered while our custom orders benefit from our streamlined design and manufacturing process, which minimizes lead time.
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Product
Microscope Spectrophotometer
508 PV
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The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
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Product
Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Product
Fiber Optic Inspection Microscope
80760
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The Miller 200x Microscope helps inspect fiber optic connectors quickly and easily. Its ergonomic design and built-in features make it ideal for field and lab use. The microscope features a pressure-activated on/off switch, focusing wheel, eyepiece, auxiliary white LED light source rated for 100,000 hours, adapter tip for inserting ferrule and battery compartment.
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Product
Scanning Slit Beam Profilers
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DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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Product
Boundary Scan Tester and Programmer
JTAGMaster
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The JTAGMaster Tester and Programmer is designed to work with ABI's bespoke software - a multiple purpose platform which enables users to freely configure test procedures and instruments. Integrated functions are also available to the user to automatically learn the device status, provide pin-to-pin comparison and information as well as use some reporting facilities.
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Product
Microscope Platforms
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38 mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30 mm diameter coupling to the I.D. of the C60-TUBE, or with a 50 mm coupling on the O.D. of the lens tube.
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Product
Area Scan Camera
Genie Nano-1GigE
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Introducing Genie Nano, a CMOS GigE camera that redefines low cost performance. Genie Nano starts with industry leading CMOS sensors and adds proprietary camera technology for breakthrough speed, a robust build quality for wide operating temperature, a three-year warranty and an unmatched feature set—all at an incredible price.
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Product
X-ray Analytical Microscope (Micro-XRF)
XGT-9000
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- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
