Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Product
IEC60068-2-75 Spring Hammer Test
CX-T03
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Shenzhen Chuangxin Instruments Co., Ltd.
*Impact hammers are used to check the durability of enclosures for electrical appliances of other electronic products.If damage occurs from the Impact Hammer test .Accessibility probes can be used to measure the extent or severity of the damage.The Impact Hammer simulates the mechanical impact to which electrical equipment may be subjected. *This hammer is mainly used to test household and similar electrical appliances shell, lever, handle, knobs, lights and other shell to withstand mechanical shocks.* The impact tester made of stainless steel or alloy.
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Product
Ultrasonic Angle Beam Probes For Weld Seam Testing
SONOSCAN W
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The ergonomic angle beam probes for Non-destructive Testing (NDT) from the SONOSCAN series inspect metals for cracks and inclusions. In the metal industry they are mainly used for weld seam testing. Our SONOSCAN probes are powerful, robust ultrasonic transducers which can be connected to all standard ultrasonic testing gauges.
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Product
Test Thorn Probe
CX-41
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Thorn Probe For testing accessibility in appliances with visibly glowing heating elements.
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Product
Board Test Fixture Probes
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Offering a wide range of standard spring contact probes to meet your testing requirements and has long been recognized as the world’s largest probe manufacturer. With over 60 different probe series ranging from 0.02" (0.51 mm) to 0.187" (4.75 mm) pitch with multiple length, travel, ICT, lead free and rotator options, we provide a full portfolio designed for general purpose test on bare boards, loaded printed circuit boards and surface mount assemblies.
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Product
Benchtop with Drop-In Test System
600 Series Compact ATE Platform
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The Circuit Check 600 Series Compact ATE Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 600 Series Compact ATE, test procedures can become automatic, with test steps and go/no-go limits easily programmable. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Product
IEC61032 Test Probe 32
CX-32
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Probe 32 is intended to verify the protection provided by fan guards against access to hazardous mechanical parts.
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Product
CAM/GATE Test Kits
Series 45
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The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components
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Product
Test Service Offerings
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ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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Product
LED Probe Clip Light
U1176A
Accessory Kit
Clip this 3-in flashlight on your test probes for great visibility when using your handheld DMMs in dark places
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Product
Gaussmeter
DX-105
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DX-105 Gaussmeter is a desktop gaussmeter. Which is based on the latest progress of the Hall Effect magnetic field measuring instrument.Adapt the high stability constant current source circuit technology to design and manufacture. Test probe adapts imported GaAs linear Hall-chip, the difference between any two probes is small, which can be replaced directly when it is damaged. DX-105 Gaussmeter is an ideal DC magnetic field test instrument.
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Product
IEC61032 Long Test Pin Probe
CX-A12
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Shenzhen Chuangxin Instruments Co., Ltd.
Long Test Pin Probe This pin is used on appliances for verifying that there is no access to hazardous live parts of heating elements which could be touched accidentally by a tool (i.e. screwdriver).
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Product
Exchangeable Test Fixture
MA 2111/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Product
CAM/TRAC Test Kits
Series 47
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The VP Series 47 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 47 provides interface compatibility using the Virginia Panel ITA G12 interface. The ITA frame is offered as an option for those wanting to provide their own ITA Interface.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR2270/71
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,13 kg
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Product
Multimeter Electronic Test Leads Kit
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VERSATILE KIT includes 2 alligator clips with removable insulation, 2 extended range plunger mini-hooks with pass-through banana plugs, 2 heavy duty test probes, 2 42” lead extensionsUNIVERSALLY COMPATIBLE with either 0.16” banana plugs or shrouded banana plugs on all ends
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Product
Robotic Probing of Circuit Cards
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System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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Product
Automotive Test Lead Kit
143
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Test Lead Kit includes our basic set of interchangeable specialty test probes designed for automotive use. The flexible back probing pins are great for sliding into automotive connectors like those on fuel injectors and MAP sensors. The large Crocodile Clips are good for clipping to grounds and battery terminals. Roll up storage pouch keeps your leads organized.
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Product
Test Contactor/Probe HEad
cRacer
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The cRacer™ test contactor and probe head portfolio offer solutions for 5G mmWave FR2 up to 54+ GHz.cRacer utilizes robust spring probe technology for testing singulated packages or probe heads for wafer probe (bumped/pad) applications with fine pitch and WLCSP compatibility – ranging from 100 µm to 650 µm, covering the majority of 5G devices.cRacer features a stainless-steel spring for tri-temp testing and performance in operating temperatures -55°C to +155°C.
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Product
Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
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Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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Product
MANIA TEST PROBE
SERIES 76
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ElectricalMAXIMUM CURRENT: 3 amps continuousat working travel, non - inductiveRESISTANCE: At 35 mA test current,50 mOHMS meanMaterial and FinishesPLUNGER: Heat treated berylliumcopper, FINISH: -2E / -2P Hard nickel plated-2D / -2E138 24 Kt gold plated,BARREL: Phosphor bronze, nickel platedSPRING: Stainless steel, silver platedPIN: Music wire, hard nickel plated
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Product
Plug Solutions
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Operation based on the insertion of a plug or test probes which isolate field equipment from the relay, and provide secondary connection points for secondary injections.
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Photonics Test Solutions
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Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Product
Test Contactor/Probe Head
xWave
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Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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Product
Products for High-Frequency Measurement
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This product range includes passive high-frequency test probes and accessories as well as touch-protected BNC plug connectors, insulated BNC panel-mount sockets, leads with RG58 or RG59 cable, adapters and converters. Our test probes are suitable for use in CAT III- and CAT IV environments (Measurement Categories), such as the analysis of house and building installations with mains analysis/mains monitoring devices. Our high-frequency accessories are designed with clearance and creepage distances in accordance with IEC/EN 61010-031.
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Product
IEC61032 Test Probe Pin
CX-112
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Shenzhen Chuangxin Instruments Co., Ltd.
1. Jointed test finger probe (Figure 2 / Test Probe B / IEC 61032)This is a precision probe made in accordance with all IEC standards. Examples are IEC 61032, 60950, 61010 and 60601; and it is also used for Canadian and USA standards. It features a palm simulator and a restricted joint movement, which simulates the characteristics of the human hand. The finger is made of stainless steel and the rest of the instrument is Delrin®. Handle is designed to accept either a banana jack or a force gauge.It is no longer necessary to have a separate probe for the medical safety standard. This one probe will meet all the different requirements that are in the IEC standards.
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Product
Stand-Alone Test Fixture
MA 2011/D/H
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1000Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 12,00 kg
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Product
Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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Product
Single Ended Test Probes
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Single ended probes ranging from 0.4mm to 1.27mm pitchWide selection of plating options to optimize contact challenges and maximize probe lifeVarious length option to provide drop-in replacement capabilityTri-temp applications – 55°C to 155°C
