Test Probes
See Also: Probes, Microprobes, Probe Cards, RF Probes, Test Fixtures, Test Heads
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Product
Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2D
General Purpose Probe
Current Rating (Amps): 5Average Probe Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64Resistance (mOhm): 35
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Product
2.5mm Test Rod Test Probe Needle
CX-4C
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Shenzhen Chuangxin Instruments Co., Ltd.
2.5mm test rod test probe needle Used to verify the protection of persons against access to hazardous parts.
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Product
Environmental Test Probe, Temperature
72-8366
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Simple thermocouple junction at the end of a 1m wire provides effective low cost ambient temperature measurement. It is suitable for measuring air temperature and may be placed in direct contact with hard surfaces. Type K thermocouple temperature probes are commonly used with all types of industrial temperature controls and measurement equipment, and are compatible with Tenma handheld thermometers and digital multimeters that include temperature function. All are terminated with standard Type K plugs.
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General Purpose Test Probes
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Low profile, short travel test probes for restricted space applicationsApplications where long travel is not required such as thin film/hybrid circuits or bareboard PCB testingReplaceable test probe by use of a receptacle
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Short Test Pin Probe 13
CX-13
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Shenzhen Chuangxin Instruments Co., Ltd.
Short Test Pin Probe 13 Used to test accessibility through enclosure openings per IEC, EN, UL and CSA Standards.
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FEA and Strain Gauge Testing
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Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.
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Product
PCIe Carrier For PMC And PrPMC
PCI104
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The PCI104 is a PCIe carrier for PCI Mezzanine Cards (PMC) or Processor PCI Mezzanine Cards (PrPMC). The PCI104 carrier allows simplified testing of PMC/PrPMCs and their associated PMC I/O Modules (PIMs) by using a PC environment during board development or deployment. The PCI104 can also reduce the costs of manufacturing PMC/PrPMCs by allowing manufacturers to use off-the-shelf PCs for functional testing. The PCI104 converts the PCIe x4 edge connection to PCI-X via a PCIe to PCI-X bridge. The trace lengths to the PMC/PrPMCare kept to a minimum so the PMC/PrPMC can run with a133MHz PCI-X clock speed. The J4 connector of the installed PMC/PrPMC is routed to a 96-pin DIN connector per theVITA-35 specification. The PCIe to PCI-X bridge can run in either transparent or non-transparent mode and can also operate in forward or reverse mode. The PCI104 has a fan mounted on the board to cool the PMC/PrPMC. The fan can easily be removed for testing and probing of hosted card.
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6 Sided Bed of Nails Testers
BoxProber Family
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6 sided Bed of Nails circuit board test fixture. Probes top bottom and all 4 sides. Central camming mechanism pull plates inward. Mechanically or electrically actuated options. Designed primarily for testing products in plastics. Side access electrically probes outside panel connectors. The unit will also optically read LEDs and key segments off LCD displays. Solenoids will press buttons and servos will turn selector switches. DC motors are used to adjust multiple turn potentiometers. Microphone will detect audio output tones. Top and bottom of circuit boards can also be probed if removable access panels are available. This unit will also probe all 6 sides of a circuit board. This is typically utilized in applications where connector testing is required.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/GR228x-15/7
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,30 kg
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Product
CAT III Digital Multimeter
82600
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Measures AC/DC voltage/current up to 600V and 10A, capacitance, diode, duty cycle, frequency, resistance, temperature and transistor. Includes 13 Functions and an operating temperature range between -40° to 1000°C. Features manual or auto shutdown after 15 minutes of inactivity, protection against overload at all ranges, data hold, low battery indicator and warning alarm. Also includes a LED flashlight for low light situations. Rubber outer case adds protection against drops and a stand bracket to hold meter at viewing angle and test probe holding clips.
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IPTV Testing Probe
H & M-Probe
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*Stand alone low bandwidth IPTV monitoring probe*Rugged packaging and industrial reliability*Web based appliance generates automatically service quality alarms*Provides basic metrics for quality of MPEG2 TS video transport*Stores alarm history and provides graphical histograms*Accepts streams bandwidth
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CAM/TRAC Test Kits
Series 40
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The CT Series 40 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance.
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Product
Short Test Pin Probe
Probe 13
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Shenzhen Chuangxin Instruments Co., Ltd.
Short Test Pin Probe 13 The model CX-13 short Test Pin Probe is used to test for accessibility of small objects and meets IEC, CSA and UL requirements.
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BARE BOARD TEST PROBES
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Probe Technical DataMechanicalMINIMUM CENTERS: .100 (2.54)FULL TRAVEL: .160 (4.06)WORKING TRAVEL: .107 (2.72)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 5 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current60 18 mOHMS mean63 60 mOHMS meanMaterials and FinishesPLUNGER: Heat treated beryllium copper60 24 Kt gold plated over nickel63 24 Kt gold plated over nickelBARREL: Nickel silver60 24 Kt gold plated ID and OD over nickel63 No FinishSPRING: Music Wire, 24 Kt gold platedover nickel
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Terminal Test Kit (92 Pcs)
3601C
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Peaceful Thriving Enterprise Co Ltd
*Total: 92 pcs*Alligator clip x 2 pcs*Testing probe x 2 pcs*Flat terminal x 48 pcs*Testing needle x 4 pcs*1 to 2 connector x 2 pcs*Round terminal x 24 pcs*5K variable resistor x 2 pcs*Polarity tester/stroboscope x 2 pcs*SRS air bag replacement connector x 2 pcs*Male / Female to Male / Female Extension Wire x 4 pcs
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Kelvin Test Leads
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Kelvin Test Probes, Kelvin Test Leads, based on the Parrot™ Clip Invention provide reliable contacts and connections for the Sense and for the Current leads .
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Product
Probe Card Analyzers
PB3600
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The PB3600 provides the latest techniques in testing and maintaining probe cards. Designed through joint development with many of the world’s largest semiconductor and probe card manufacturers, ITC has produced an ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
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Product
Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Analyzer
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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µHELIX® Test Probes
Series S200, S300, S400, and S500
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Test Probes for fine-pitch applications: CSP, BGA, SiP, SoC, flex-circuits, micro pcb, sub-mm center-to-center spacing, half mm, quarter mm spacing. Excellent for use in sockets, fixtures, and contactors for semiconductor testing and in coaxial installations.
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Accessibility Test Probes
TF-24 Series
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Accessibility Test Probes are designed to perform tests specified in many standards to determine compliance with safety requirements.
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High Flexibility VNA Cables
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Our lines of high frequency VNA test cables display excellent electrical properties such as wonderful phase stability of +/- 6° at 50 GHz and +/- 8° at 67 GHz as well as VSWR of 1.3:1 at 50 GHz and 1.4:1 at 67 GHz. The 50 GHz assemblies are terminated with 2.4mm connectors while the 67 GHz versions utilize 1.85mm connectors. The braided stainless steel armoring surrounding the coax provides a rugged, but flexible cable with a flex life exceeding 100,000 cycles, making these test cables ideal for use in semiconductor probe testing, precise bench top testing as well as lab/production testing where the need for a highly flexible, yet durable cable solution is required. The VNA test cables are also equipped with rugged stainless steel connectors that provide up to 5,000 mating cycles when attached with proper care. Additionally, the flexibility of these cables makes it easier and safer to test a Device Under Test (DUT). A swept right angle 2.4mm and 1.855mm connector option allows these cables to fit in tight spaces and can reduce the length of cable required in many applications.
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SMD Test Probes
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The Parrot Clip, model PCM W1 or PCS-MB W1 invention can be connected to resistance’s, diodes, integrated circuits (SOIC, SO) etcThe advantage of the Parrot Clip is given by the double metal connection made between the new metal tip and the steel hooked rod, spring loaded. This connection, being made by metal parts is electrical and mechanical reliable, even if the contact point are small. Connections are resistant even at high temperatures.
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Product
SINGLE ENERGY IMPACT HAMMERS
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Shenzhen Chuangxin Instruments Co., Ltd.
It’s used to test the mechanical integrity of product enclosures and check the durability of enclosures for electrical appliances of other electrical appliances and other electronic products. If damage occurs from the Impact Hammer test, accessibility probes can be used to measure the extent or severity of the damage. The Impact Hammer simulates the mechanical impact to which electrical equipment maybe subjected.
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Test Probe
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INGUN, which has earned tremendous trust and achievements from customers all over the world in terms of quality and durability , has a network of distributors in about 50 countries around the world, and has a product lineup of more than 20,000 types.
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Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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LOADED BOARD TEST PROBES
SERIES-70
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ElectricalMAXIMUM CURRENT: 5 amps continuousat working travel, non-inductiveRESISTANCE: At 35mA test current70 18 mOhms mean73 60 mOhms mean74 40 mOhms meanMaterials and FinishesPLUNGER: Heat treated beryllium copperor steel hardened to 55-60RC70 24Kt gold plated over nickel73 24Kt gold plated over nickel74 Rhodium plated over nickelBARREL: Nickel silver70 24Kt gold plated ID and OD over nickel73 No Finish74 24Kt gold plated ID and OD over nickel
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Advanced High Speed Test Probe
SQprobe
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SQprobe® is an advanced high speed probe designed for emerging software defined (SDN) and virtualized networks. It monitors IP based voice, video, audio and data streams at Gigabit rates, performing deep packet inspection (DPI) and providing accurate and detailed real time service quality metrics, usage and demographic data.
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MPI SiPH Probe Systems
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MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
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