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Machine Tool Probes and Software
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Probing is an established best practice for maximising the efficiency, quality, capability and accuracy of machine tools. Standard routines built into modern CNC controls simplify the integration of probing cycles into machining operations and offline tools. These routines, combined with a CAD interface, make the simulation of measurement functions easy.
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Product
Ultrasonic Dual Element Probes
SONOSCAN T
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The ergonomic dual element probes for Non-Destructive Testing from the SONOSCAN Series comply with the DIN EN 12668-2 Standard and can be used to test metals, plastics and ceramics for imperfections such as cracks, inclusions, blowholes and other discontinuities. The transmitter-receiver probes manufactured in Germany are powerful, robust ultrasonic transducers which are compatible with the ultrasonic flaw detector SONOSCREEN ST10 or the thickness gauge SONOWALL 70.
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Product
Spring Probes
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Spring probes are designed to optimize performance in high reliability, multicycle applications. Smiths Interconnect's spring probes, featuring IDI contact technology, are compliant which makes them ideal for blind mate applications as they self correct for x, y, z, rotational and angular misalignment of the target. Offered in compressed heights less than 2 mm and utilized on pitches as tight as 0.4 mm, they are well suited for high density, board-to-board, battery contact and high frequency applications.
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Spring Contact Probes
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Spring Contact Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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Product
Near-Field Probes 100 kHz up to 50 MHz
LF1 set
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The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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Product
BIP-1 Battery Probes
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 16Test Center (mil): 150Test Center (mm): 3.81Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 250,000Overall Length (mil): 323Overall Length (mm): 8.20
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Ingun Spring Probes
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MicroContact AG offers the assortment of test probes and test adapters from Ingun as a Swiss representative.
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Non-Magnetic Spring Probes
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We have spring probes, which are composed of nonmagnetic material to use for test environment that requires to remove the effect of magnetism.
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Product
Gaussmeter Probes
2100
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Magnetic Instrumentation manufactures Hall Effect Probes in a wide range of styles and sizes. Probes are supplied with magnetic, electrical, temperature stability and calibration data for each measurement range. Probe are supplied with flash memory and a temperature sensor that allow the 2100 Gaussmeter to correct for Hall Element inaccuracies due to temperature change. Probes are supplied with a NIST traceable Certificate of Calibration and test data.
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Product
General Purpose Probes
PIT-12
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PIT-12 General Purpose Probe for Pressurized Systems - 12'' #304 stainless steel shaft. Diameter is 1/16''. Immersible. Maximum temperature 350°C, Time constant 0.5 Seconds. Shaft Terminated in a sub-miniature Type T Thermocouple plug. 10 foot Sub Miniature Type T extension lead supplied. Not isolated.
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Product
CP-2XX-4 Battery Probes
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 39Full Travel (mm): 1.00Recommended Travel (mil): 30Recommended Travel (mm): 0.75Overall Length (mil): 158Overall Length (mm): 4.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
P2663 General Purpose Probes
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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Product
CP-059-026 Battery Probes
Battery Probe
Current Rating (Amps): 10Average Probe Resistance (mOhm): 25Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 57Full Travel (mm): 1.45Recommended Travel (mil): 40Recommended Travel (mm): 1.00Mechanical Life (no of cyles): 100,000Overall Length (mil): 221Overall Length (mm): 5.61
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Product
Microscopic Probes
M12PP
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CAPRES M12PP Microscopic Twelve-Point Probes are specialized versions of the CAPRES Micro Multi-Point Probes. By using a dedicated 12-by-4 multiplexer, a total of 495 different pin-configurations can be obtained, each with different probe pitch. This is utilized in e.g. the CIPTech, where 8 or more combinations are used to obtain a “depth profiling” of the measured structures.
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Product
Raman Probes
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As with Raman spectrometers, a Raman probe is used to measure the inelastic scattering of light from a sample. Raman scattering is produced when the energy levels of photons are shifted up or down as a result of excitation by a monochromatic source (usually a laser). The change in vibrational frequency is used to determine the composition of a target substance.
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Product
Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 230 x 175 mm (wxd)
CMK-06
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
ProBus Probe Adapter for TekProbe-BNC Probes
TPA10
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- Allows TekProbe interface level II probes to work with any ProBus-equipped Teledyne LeCroy oscilloscope- Automatic probe detection- Provides all necessary power and offset control to the attached probe- Supports probes up to 4 GHz- Easy firmware updates- Wide variety of probes supported including: Preamplifiers, Current Probes, Single-Ended Active Probes and Differential Active Probes
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Product
Threaded Switch Probes
Switch Probe
Product sensing - microswitch in a probe - plastic or metal cup - adjustable height.
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Product
ICT Probes
Merica Series-MPA75
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Minimum Center: 1.91 (75mil)Current Rating: 3amps, continuousCurrent Resistance: 40milliohmsMounting Holes Size: 1.35Full Stroke: 6.35mmRated Stroke: 4.30mmSpring Force: 198gf(7oz)
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Product
AC Current Probes
CWT
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Power Electronic Measurments Ltd
The CWT Rogowski current probe is suitable for measuring AC currents ranging from 300 milliamps to hundreds of kA from below 0.1Hz to >30MHz.
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Product
Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 580 x 250 mm (wxd)
CMCSK-03-01
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Product
Probes for Tube Inspection
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Probes for tube inspection are lightweight but solidly constructed eddy current, remote field, magnetic flux leakage, and IRIS ultrasound. These probes are used for ferromagnetic or non-ferromagnetic tube inspection applications.
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Interface Probes
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Low resistance used in: *ICT Testers *Functional Testers *Special Purpose Machines
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Smart Probes
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A wide selection of rugged smart probes for your sensing needs. From non-contact IR sensors to a full range of sensor types including Temperature, Humidity, Process, RTD, Thermocouple, pulse.
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Product
Battery Probes
Battery Probe
*Charging *Connecting *Docking Station for *Medical- IOT - Communication
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Product
ICT Probes
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ICT Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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Product
Low & High Voltage Differential Probes
T3
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Teledyne Test Tools Low & High Voltage Differential Probes offer end user versatility with all models powered by an external universal power supply and work with any Oscilloscope with a high-impedance BNC input. The range consists of one Low Voltage and three High Voltage models with varying bandwidths to satisfy a wide array of customer applications.
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Product
BIP-12 Battery Probes
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 30Resistance Remark: Probe Resistance Steel: 30 mOhms, Gold plated: 100 mOhmsTest Center (mil): 260Test Center (mm): 6.60Full Travel (mil): 394Full Travel (mm): 10.00Recommended Travel (mil): 315Recommended Travel (mm): 8.00Overall Length (mil): 1,220Overall Length (mm): 31.00
