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Product
Brute High Current Probe
P4301-1Z
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Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Product
Thermalert Monitoring Thermometer
TH-8
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The TH-8/AOP is one of our most economical precision thermometers in the Physitemp product line. The TH-8 offers the same high accuracy (0.1°C ±1 digit) and resolution as all our other thermometers, but with a narrow temperature range. The TH-8 has a temperature range 0f -10 to +60°C with 3 probe inputs. The TH-8 is also switchable from celsius to Fahrenheit. The TH-8 is ideally suited for either a laboratory or hospital setting where continuous temperature readings within the physiological range are sufficient.
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Product
DDR5 Logic Analyzer
FS2602
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The FS2602 is our the latest logic analyzer probe used to test DDR5 SO-DIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 SO-DIMMs running at ~4000MT/s.
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Product
UV Man Spectrometer
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UV Raman (with laser wavelengths below 400nm) can be used to probe specific sample properties, and benefit from experiment properties different from typical visible Raman measurements – for example, greatly increased Raman scattering efficiency, modified laser penetration within the sample, and resonance coupling to different chemical moeities. However, UV analyses come with a number of technical challenges, that require considered instrument design to allow UV Raman to be a truly useful tool for the researcher.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1B-4
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
SINGLE ENERGY IMPACT HAMMERS
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Shenzhen Chuangxin Instruments Co., Ltd.
It’s used to test the mechanical integrity of product enclosures and check the durability of enclosures for electrical appliances of other electrical appliances and other electronic products. If damage occurs from the Impact Hammer test, accessibility probes can be used to measure the extent or severity of the damage. The Impact Hammer simulates the mechanical impact to which electrical equipment maybe subjected.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1H-7-S
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2G40
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1B-7
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
MSP Switch Probes
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Switch point flexibilityDesigned for long life and reliable performanceVariety of tip options
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Product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T75
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
High Voltage Passive Probes
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The PPE6KV-A and HVP120 can handle up to 6000 Vpeak transient overvoltages and are designed for probing up to 2000 Vrms and 1000 Vrms respectively. Fast rise times, excellent frequency response, and a variety of standard accessories make these probes safe and ideal for high voltage measurement applications
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Product
Elevated 1.68 (4.00) - 7.00 (198.00) Bead Probe
BTP-1HC-7
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Passive Probe, 500 MHz, 10:1, 1 MOhm/10 MOhm
PP020-1
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Passive probes are the standard probe provided with most oscilloscopes. Typical passive probes provide a 10:1 attenuation and feature a high input resistance of 10 MΩ. This high input resistance means that passive probes are the ideal tool for low frequency signals since circuit loading at these frequencies is minimized. Passive probes are designed to handle voltages of at least 400V, some as high as 600V. Teledyne LeCroy passive probes feature an attenuation sense pin which tells the oscilloscope to scale the waveforms automatically requiring no user input.Each passive probe is recommended for a certain oscilloscope, using the right passive probe with the right oscilloscope means that the probe will be properly compensated across the entire bandwidth. Using probes with a different oscilloscope will only let you compensate for low frequencies.
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Product
SIP-90-4 Test System Interface Probe
SIP-90-4
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Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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Product
Conductivity Type Tester
HS-HCTT
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It is strictly designed according to the requirements of the hot-probe thermal EMF conductivity type test in standard ASTM F42: Standard Test Methods for Conductivity Type of Extrinsic Semiconductor Materials. A temperature controlling heating element is installed inside the hot probe so that the hot probe is heated automatically and its temperature is maintained in the range 40-60℃.
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Product
Probe Placement JIG
456 & 355
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The Elcometer Probe Placement Jig is the ideal accessory for measuring coatings on small or complex components when the highest levels of repeatability and accuracy are required.
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Product
Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25L18-12
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1H-10
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Light 0.60 (17.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-72I15-2
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Cantilever type Probe Card / C type
CE Series
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Japan Electronic Materials Corp.
*Standard Cantilever Probe Card*Low Contact force*Stable Contact*High accuracy of alignment*Suitable for variety of Devices
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Product
Accessory Kit for High Voltage Differential Probe
PK-HV-001
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Accessory kit for High Voltage Differential Probe
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Product
Rogowski AC Current Probe,30 MHz, 300 A
N7042A
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The Keysight N7042A Rogowski coil current probe measures AC currents up to 300 A, with bandwidth ranging from 9.2 Hz to 30 MHz. The probe has a thin, lightweight, flexible, and simple-to-use clip-around Rogowski coil that enables current measurement in the most difficult-to-reach parts and confined spaces of a circuit under test. It can also measure large AC current without an increase in transducer size.
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Product
Hot Wire Anemometer
CENTER 332
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Air Velocity Measurement: m/s, km/hr, ft/min, MPH, Knots & Build In Temperature ºC / ºF, Humidity %RH, Air Velocity Compensation In Atmospheric Pressure, Air Flow Measure: CMM, CFM, Telescoping Hot Wire Probe
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Product
P2665 General Purpose Probes
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Current Rating (Amps): 15Average DC Resistance lower than (mOhm): 10Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,290Overall Length (mm): 32.77Overall Length Remark: Tip 2W: 1270 mil (32.26 mm)
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Product
Ultra Fast Flexible Implantable Microprobe
IT-23
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IT-23 Flexible Implantable Microprobe - For ultra fast measurements and for use on micro-size specimens. Time constant 0.005 seconds. Tissue Implantable with a 23 gauge needle (supplied). Fairly fragile. Sensor wires are twisted TFE Teflon™ insulated. Maximum Temperature 150°C. Isolated. Probe diameter .011", 3 foot lead.
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Product
Test Fixtures & Jigs
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A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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Product
ITA, I1, With Protective Cover
410128101
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The i1 ITA's small width and inboard handle increase the side to side stackability. The U-shaped cable clamp allows modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 1.07 in. The removable cover allows easy access to wiring for maintenance and probing. Protective Cover included.
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Product
C-V Plotters
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Materials Development Corporation
MDC will tailor your CSM/Win Semiconductor Measurement System for your exact requirements. Choose the best capacitance meter, output device, and probe station for your needs. All CSM/Win C-V plotters feature the latest Dell Computers. The computer and capacitance meters are rackmounted in one compact enclosure. When ordered with a hot chuck or probe station, MDC can deliver a turnkey system of unparalleled performance.
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Product
DDR4 X4/x8 BGA Interposer For Logic Analyzer, Connects To 61-pin ZIF
W4643A
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The W4643A DDR4 2-wing BGA interposer for DDR4 x4/x8 BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A. The W4643A is the smallest BGA interposers for DDR4 x4/x8 DRAM capable of capturing simultaneous read and write traffic at data rates exceeding 3.2 Gb/s. U4208A and U4209A probe/cables connect any W4640A Series DDR4 BGA interposer directly into the U4164A logic analyzer module from 61-pin high density zero insertion force (ZIF) connectors that attach to the W4640A Series BGA interposer wings.
