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Product
Temperature Measurement click board
Thermo J click
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Thermo J click is a temperature measurement click board™, which uses a thermocouple type-J probe, connected to a PPC-SMP-J onboard connector. The active part of the Thermo J click is MCP9600 by Microchip - a thermocouple EMF to temperature converter, with 1.5°C of maximum accuracy. The onboard PCC-SMP-J connector ensures the secure connection and accurate readings for the connected thermocouple.
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Product
Temperature and Humidity Bar Type Probe
T3117
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Relative humidity, temperature sensors at 700mm stem. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.
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Product
HPA-1 General Purpose Probes
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
AC Current Probe 20 mV/A, 300A, 9.2 Hz LF Bandwidth, 30MHz HF Bandwidth, 1m cable
T3RC0300-UM
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AC Current Probe 20 mV/A, 300A, 9.2 Hz LF Bandwidth, 30MHz HF Bandwidth, 1m cable.
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Product
Ultrasonic Angle Beam Probes For Weld Seam Testing
SONOSCAN W
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The ergonomic angle beam probes for Non-destructive Testing (NDT) from the SONOSCAN series inspect metals for cracks and inclusions. In the metal industry they are mainly used for weld seam testing. Our SONOSCAN probes are powerful, robust ultrasonic transducers which can be connected to all standard ultrasonic testing gauges.
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Product
Linear Polarization Resistance Probes
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Linear polarization resistance (rosion probes are commonly used in the water treating industry and other environments where instantaneous, on-line corrosion rate readings are required. Linear polarization probes are ideally suited to monitor fluctuations that may occur within a system; for example, these probes can be used to monitor corrosion inhibitor effects on a regular basis.
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Product
Alternate 3.50 (99.00) - 6.85 (194.00) General Purpose Probe
P2757G-1W2S
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Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
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Product
Standard 2.20 (62.00) - 4.80 (136.00) General Purpose Probe
EPA-4F
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Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
PORTABLE OIL TEST
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PORTABLE OIL TEST. Test voltage rises up with 3 different speeds. Interchangeable oil cups sit in cradle contacts inside a test chamber with safety high-voltage interlock and hinged grounded metal lid with 2 windows to see the arc across the probes.
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Product
Wireless In-Circuit Test Fixtures
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Higher density more complex circuit boards complicate testing requirements while smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in standard long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board or T-Board®. Circuit Check’s wireless fixture technologies reduce test program debug and maintenance times while easing the ECO process. Thus allowing for the higher level of test performance, the ability to probe smaller denser targets and achieve ultra-high node counts.
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Product
High Voltage Fiber Optic Probe, 150 MHz Bandwidth
HVFO108
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- Ideal for GaN and SiC devices- Highest system accuracy- Fastest rise time- High CMRR - 160 dB
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Product
External Temperature for 3-wire PT1000 Probe
TGP-4204
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PT1000 probes are available with this logger that will record down to -200C, making them suitable for cryogenic applications. The probes are of 3-wire construction and use class A elements, making them more accurate than their 2-wire predecessors.
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Product
Active Air Speed Transmitters
HD2903T / HD29V3T
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Active air speed transmitters for ducts. Air speed, air speed and temperature, air speed, temperature and relative humidity. Analog output 4…20mA or 0…10VDC. Several Probes type lenghts available.
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Product
Robotic Probing of Circuit Cards
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System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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Product
Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe
K-50B-QG-75
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Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,575Overall Length (mm): 40.00
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Product
PROBE CARD
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the electrical characteristics of the individual CHIPs in WAFER that have been completed through the FAB stage during the semiconductor fabrication process
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Product
Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe
LFRE-25I35-12
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High Voltage Probe
HVP-40
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*MAX. Voltage : DC : 40KV, AC : 28KV, (50/60Hz only) CAT II.*1000MΩ Input Impedance.*Accuracy **DC: ± 1% to 20KV. ± 2% to 40KV. **AC: -5% to -10% (50/60Hz)*Division Ration : 1000:1*CE, TUV GS, UL, CUL, IEC1010
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Product
Passive Probe, 10:1, 500 MHz, 1.3 M
N2873A
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The N2873A passive probe offers DC to 500 MHz and 10:1 attenuation factor to address a wide range of measurement needs.
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Product
Standard 1.08 (31.00) - 3.50 (99.00) General Purpose Probe
EPA-2P
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74B-1
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
4 Moving Probe Tester
L Series E4L6151
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This is the latest EMMA series affordable model that offers low damage, high-speed and high-accuracy test. Max. Test Area24 x 20" (610x510mm). Number of Probes2 Front, 2 Rear. Min. Pad Pitch *10.007087" (180µm). Min. Pad Size *20.00314" (80µm).
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Product
In-Circuit Test (ICT)
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Analog components (resistance, capacitance, inductance, diodes, transistors, etc.) as well as complex digital components can be tested in the ICT. Compared to other test methods (e.g. flying probe), the in-circuit test enables very short test times (= high assembly throughput) combined with a very high test coverage.
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Product
Contact Resistance Measurement Kit
LRM-10
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The LRM-10 is a 10A micro-ohmmeter kit designed to measure low resistance for electrical interconnections integrity testing. The LRM-10 has a range from 0.01µΩ to 200Ω. It comes with heavy duty four points probes and it is compatible with a great variety of optional accessories.
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Product
Nanotek Brush
Nanotek Series
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Nanotek Brush is fine stainless wire brush for removing solders or dirt stuck on the tip of spring probe. It has its range of wire diameter from 30µ to 50µ and its fine wire is effective for removing solder or dirt on complicated tip type. We also have Nanotek vacuum, which is nanotech brush combined with vacuum cleaner powered by your compressor or vacuum pump.
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Product
Analyzer Probes
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The following probes are available for the MA51x0 and MA41x0 series analyzers. These probes are designed for low-voltage and high-speed midbus probing or probing with an interposer. The following JEDEC memory standards are widely used by these probes: DDR5 (JESD79-5), DDR4 (JESD79-4), DDR3 (JESD79-3), LPDDR5 & LPDDR5X (JESD209-5), LPDDR4 & LPDDR4X (JESD209-4), and LPDDR3 (JESD209-3).
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Product
Web Sensor
T3511P-4
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Humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.
