Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
EVSE Test Platform
Test Platform
To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
VR/AR/MR Calibration Platform
Test Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Product
Automated Compliance and Device Characterization Tests
N5990A
Test Platform
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
Testing Service
CloudTesting™ Service
test
CloudTesting™ Service is an Industry First, On-Demand Testing Service. CloudTesting™ Station is free rent. Fees for Testing IP are paid monthly.
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Product
6TL08 Benchtop Test Platform
H710008
Test Platform
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Network Interface Card
PMC-GBIT-DT2BP
Interface Card
The Ethernet network interface complies with the IEEE 802.3 specifications for 10BaseT, 100BaseTX, and 1000BaseT over category 5 twisted-pair cable. Full-duplex and half duplex modes are supported. The PMC-GBIT-DT2BP is compliant with standard singlewide PMC IEEE P1386.1, PCI 2.2, and PCI-X 1.0 specifications.
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Product
Build-to-Print for Test Systems
Test System
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Product
PCI Express Graphic Card with NVIDIA® Quadro® P4000
Quadro-E PEG P4000
Graphics Card
The Quadro-E PEG P4000 perfectly balances performance, features, and compact form factor to deliver exceptional creative experience and productivity across a variety of 3D applications. The Pascal GPU with 1792 CUDA cores, 8GB GDDR5 onboard memory and support for up to four 8K (7680×4320 @ 60 Hz) native displays accelerate product development and creation workflow demanding fluid interactivity for large, complex 3D workpieces.
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Product
Digital Test Instruments
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
Mini PCI Express Interface Card
MPCIE-1553
Interface Card
The MPCIE-1553 is a mini PCI Express Full-Mini Type 2 Interface Card for MIL-STD-1553 networks. Coupled with AltaAPI Represents the Latest MIL-STD-1553 32-bit FPGA Protocol Engine Technology with Multi-Layer Software - in an amazingly small package.
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Product
ARINC-429/717 PMC Interface For SBCs, VPX, VME, CPCI/PXI Systems
PMC-A429
Interface Card
The PMC-A429 card is based on the industry’s most advanced 32-bit ARINC FPGA protocol engine, AltaCore™, and a feature-rich application programming interface, AltaAPI™, which is a multi-layer ANSI C and Windows .NET 2.0 (MSVS 2005 C++, C#, VB .NET) architecture. This hardware and software package provides increased system performance and flexibility while reducing integration time.
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Product
In-Circuit Test (ICT) Fixtures
Test Fixture
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
Embedded MXM GPU Module with Embedded NVIDIA RTX™ A4500
EGX-MXM-A4500
Graphics Card
- NVIDIA Ampere Architecture- Standard MXM 3.1 Type B (82x105 mm)- PCIe Gen 4 x16 interface- 5888 CUDA® cores, 46 RT Cores, and 184 Tensor Cores- 17.66 TFLOPS peak FP32 performance
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Product
Embedded MXM GPU Module with NVIDIA® Quadro® Embedded RTX3000
EGX-MXM-RTX3000
Graphics Card
The EGX-MXM-RTX3000 module features advanced NVIDIA® Turing™ GPU technology in MXM 3.1 Type B form factor. It’s compact, slim and reliable design makes it suitable for mission critical environment. With Quadro® Turing™ TU106 processing cores, EGX-MXM-RTX3000 supports 4 DP1.4 displays offering a flexible and easy solution for medical and gaming applications.
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Product
Test Instruments
Test Instrument
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Product
ARINC-708 Module
M4K708
Test Module
The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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Product
Compact Functional Test System
E2230C / TS-5040
Functional Test
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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Product
Microwave SPDT Plug-In Switch Card
1260-160B/E
Switch Card
The Astronics 1260-160B/E is a 1 or 2-slot microwave switch plug-in for use in either the Astronics 1260-100 Adapt-a-Switch™ VXI carrier or the 1256, GPIB/RS-232 Switching Mainframe.
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
Embedded MXM GPU Module with NVIDIA® Quadro® Embedded P1000
EGX-MXM-P1000
Graphics Card
The EGX-MXM-P1000 features advanced NVIDIA Quadro GPU with NVIDIA Pascal™ Architecture technology in MXM 3.1 Type A form factor. The EGX-MXM-P1000 has 512 NVIDIA CUDA cores and a peak single-precision floating-point performance of 1.8 TFLOPS. The EGX-MXM-P1000 has 4GB of GDDR5 memory and supports NVIDIA GPUDirect™ RDMA which helps increase data throughput by up to 80% and consequently system responsiveness by up to 60%*. Additionally, 4 UHD display outputs and an extended operating temperature range of -40°C to 85°C are supported. The embedded graphics product is suitable for mission-critical harsh-environment edge computing applications with size, weight, and power (SWaP) and network connectivity constraints.
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Product
EBIRST 50-pin D-type To 9-pin D-type Adapter
93-005-238
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
4-Module ICT System, I307x Series 6
E9903G
In-Circuit Test System
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
OTP-Based Test System
Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Product
Multichannel Memory-Mapped ARINC 708/453 Interface Card
EXC-708mPCIe
Interface Card
The EXC-708mPCIe is a multichannel, memory-mapped ARINC 708/453 interface card that supports two ARINC 708/453 channels, each programmable as transmit or receive. Each channel implements a 64K x 16 FIFO and supports polling and/or interrupt driven operation. The card complies with the PCI ExpressTM Mini Card standard. It’s small size and suitability for Mini Card compatible computers make it a complete solution for developing, testing, integrating 708 interfaces and for performing system simulation of the ARINC 708/453 Weather Radar Display databuses, both in the lab and in the field. In Transmit mode, each ARINC 708 word is written to the FIFO as a block of 100 16-bit words. In Receive mode, each ARINC 708 word is stored in the FIFO as a block of 103 16-bit words. The first two words comprise the 32-bit Time Tag, indicating the word’s time stamp. The next 100 words comprise the 1600 bits of the ARINC 708 word, which are followed by the Status Word.The EXC-708mPCIe card comes complete with C drivers including source code.
