Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
Embedded MXM GPU Module with NVIDIA RTX™ A2000
EGX-MXM-A2000
Graphics Card
- NVIDIA Ampere Architecture- Standard MXM 3.1 Type A (82x70mm)- PCIe Gen 4 x8 interface- 2560 CUDA® cores, 20 RT Cores, and 80 Tensor Cores- 8.25 TFLOPS peak FP32 performance
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Product
250 KS/s, 16-Bit, 64-Ch Analog Input Universal PCI Card
PCI-1747U
PCI Card
64-ch single-ended or 32-ch differential or a combination of analog input16-bit A/D converter, with up to 250 kHz sampling rateAuto calibrationOnboard FIFO memory (1,024 samples)Universal PCI Bus (support 3.3 V or 5 V PCI bus signal)BoardID™ switch
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Product
Embedded MXM GPU Module With NVIDIA RTX™ ADA 2000
EGX-MXM-AD2000
Graphics Card
- NVIDIA Ada Lovelace Architecture- Standard MXM 3.1 Type A (82x70 mm)- PCIe Gen 4 x8 Interface- 3072 CUDA® Cores, 24 RT Cores, and 96 Tensor Cores- 14.5 TFLOPS peak FP32 performance
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Product
Multi-Channel 1553 Interface for PCI Express 4 Lane Systems
PCIE4L-1553
Interface Card
Alta Data Technologies’ PCIE4L-1553 interface module is a multi-channel (1-4), ½ size, 4 Lane PCI Express 1553 card supported by the latest software technologies. The PCI Express card is based on the industry’s most advanced 32-bit 1553 FPGA protocol engine, AltaCore™, and by a feature-rich application programming interface, AltaAPI™, which is a multi-layer ANSI C and Windows .NET (MSVS 2005/08/10 C++, C#, VB .NET) architecture. This hardware and software package provides increased system performance and reduces integration time.
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Product
ARINC-708 Module
M4K708
Test Module
The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
PXI Test System Dev, Debug & Monitor Software
InstrumentStudio
Test System
InstrumentStudio is free application software that provides an integrated approach to interactive PXI measurements. InstrumentStudio helps you to unify your display, export instrument configurations to code, and monitor and debug your automated test system. You can view data on unified displays with large, high-resolution monitors, and then capture multi-instrument screenshots and measurement results.
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Product
Test Port Cable, 1 Mm
11500J
Test Port Cable
The Keysight 11500J test port connector has a length of 16 cm and a frequency range of DC to 110 GHz. The 11500J integrates with the Keysight N5250A network analyzer and Keysight 8510XF network analyzer systems.
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Product
Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
Test Fixture
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
High Density, 64-Channel Switch Card - 64 Channel, SPDT, High Isolation, Low Crosstalk Switch Module
1260-16A
Switch Card
The Astronics 1260-16A is a 64-channel, SPDT, high isolation; low crosstalk switch module designed for switching and routing sources such as AC and DC power supplies in automated test systems. The 1260-16A switches currents up to 6A, AC or DC, and voltages up to 110VDC or 250VAC.
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Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Multi-Channel 1553 Interface for Single Lane PCI Express Systems
PCIE1L-1553
Interface Card
Alta Data Technologies’ PCIE1L-1553 interface module is a multi-channel (1-2), ½ size, Low Profile, One Lane PCI Express 1553 card with the latest software technologies. The PCI Express card is based on the industry’s most advanced 32-bit 1553 FPGA protocol engine, AltaCore™, and by a feature-rich application programming interface, AltaAPI™, which is a multi-layer ANSI C and Windows .NET (MSVS 2005/08/10 C++, C#, VB .NET) architecture. This package provides increased system performance and reduces integration time.
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Product
PCI Express Graphics Card With NVIDIA RTX 4500 Ada
NVIDIA RTX 4500 Ada
Graphics Card
- NVIDIA Ada Lovelace Architecture- Full height, full length design- PCIe Gen4x16 interface- 24GB GDDR6 Memory, 192-bit Bandwidth- 7680 CUDA Cores, 39.6 TFLOPS SP Peak
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Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
Test Fixture
Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
Test Fixture
This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
Interface Card
XMC-WMUX
Interface Card
Alta Data Technologies’ XMC-WMUX interface module (PCI Express Mezzanine Card for Carriers and Single Board Computers or Carriers) is a single or dual-channel (A-B Redundant = 4 Busses per Channel/Wings) WMUX card supported by the latest software technologies.
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Product
250 KS/s, 16-Bit, 8-Ch Simultaneous Sampling, Multifunction PCI Card
PCI-1706U
PCI Card
8 differential analog inputs8 A/D converters simultaneously sampling16-bit A/D converter, with up to 250kHz sampling rate for each channelProgrammable gainMultiple A/D triggering modesOnboard FIFO memory up to 8K SampleProgrammable pacer/counterBoardID™ switchUniversal PCI Bus (supports 3.3V or 5V PCI bus signals)
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Product
Fixturing Kit
10744A
Test Fixture
The Keysight 10744A fixturing kit includes mounting hardware for a variety of Keysight measurement optics devices. A large base, multiple posts, and other accessories let you build structures -- such as tall, rigid towers -- that place optics in the center of a machine's work zone or wherever needed. The fixturing kit helps meet the physical requirements of a range of measurement applications.
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Product
2m BNC Test Cable
16048D
Test Port Cable
The 16048D test leads extend the measurement port with a 4-terminal pair configuration. It provides a BNC female connector board to allow attachment of user-fabricated test fixtures.
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Product
EV Power Components End of Line Test Platform
Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Product
LitePoint RF Test System
J750
Test System
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
Regenerative Battery Pack Test System
17020
Test System
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Product
Test Management Software
ActivATE™
test
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
NI HIL and Real-Time Test Software Suite
test
Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
VLSI Test Systems
Test System
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Asynchronous System Level Test Platform
Titan
Test Platform
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Regenerative Battery Pack Test System
17020E
Test System
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Product
Fast and Flexible WLAN Measurements up to 802.11ax
WLAN Test Toolkit
test
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
