Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
ARINC 429 Multichannel Interface Card for Mini PCI Systems
DAS-429mPCI/RTx
Interface Card
The DAS-429mPCI/RTx is an ARINC 429, multichannel interface card for Mini PCI systems. The card’s small size and suitability for Mini PCI notebook computers, make them a complete solution for developing and testing ARINC 429 interfaces and for performing system simulation of the ARINC-429 bus, both in the lab and in the field.The DAS-429mPCI/RTx is supplied with C drivers, including source code and Mystic application program.
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Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Product
ARINC429 PCI Express Mini Card
AMEE429-x
PCI Express Mini Card
The AMEE429-x is AIM’s new PCI Express Mini Card module targeted for embedded ARINC429 applications in an ultra-compact form factor.
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Product
Full DSP-Based 8-Axis Motion Control Universal PCI Card
PCI-1285
PCI Card
Encoder input is 10 MHz for 4xAB mode, 2.5 MHz for CW/CCW modePulse output up to 5 MppsMemory buffer (10K points) for trajectory planning which is designed in DSPSupports E-Gear, and helical interpolationSupports E-CAM providing 256 points to describe the CAM profiles which buffers located in DSPHardware emergency inputWatchdog timerPosition latchPosition compare triggering up to 100 KHz, and memory buffer is up to 100 K points in DSPProgrammable interruptSupports gantry mode by semi-closed loop pulse train controlRDY/LTC-dedicated input channels & SVON/CMP/CAM-DO/ERC-dedicated output channels are switchable for general input and output purposes
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
Test Port Adapter
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
Automotive Electronics Functional Test System
TS-5020
Functional Test
The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
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Product
ARINC PCI Interface Card
PCI-A429
Interface Card
Alta Data Technologies’ PCI-A429 interface module offers a variety of ARINC-419/429/575/573/717 channel configurations with software selectable RX/Tx channels, baud rates, bit encoding and word configurations (Start/Sync/Stop length, Parity, bits/word, MSB/LSB). Encode or decode almost any ARINC-429 physical layer signal.
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Product
NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Product
96-Ch Digital I/O PCI Card
PCI-1753
Isolated Digital I/O Card
Emulates mode 0 of 8255 PPIBuffered circuits for higher driving capacity than 8255Multiple-source interrupt handlingInterrupt output pin for simultaneously triggering external devices with the interruptOutput status read-back“Pattern match” and “Change of state” interrupt functions for critical I/O monitoringKeeps I/O setting and digital output values when hot system resetSupports dry contact and wet contactHigh-density 100-pin SCSI connector
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Product
Regenerative Battery Pack Test System
17040
Test System
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
PCI Express Interface Card
MPCIE2-1553
Interface Card
he MPCIE2-1553 is a mini PCI Express Full-Mini Type 2 Interface Card for 1 or 2 MIL-STD-1553 channels in an incredible small package. The MPCIE2-1553 implements the latest MIL-STD-1553 32-bit FPGA Protocol Engine Technology (AltaCore-1553) with the industry leading Multi-Layer Software development software package (AltaAPI).
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Product
20-Channel SPST Power Switch Card
1260-120
Switch Card
Each channel of the 1260-120 can switch up to 13A, 250VAC or 10A, 125VDC; its switching capability makes it the ideal solution for applications requiring high-current switching of AC power, DC power supplies, and AC or DC current sources.
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Product
EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Display Driver Test System
T6391
Test System
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
ARINC-429/717 PMC Interface For SBCs, VPX, VME, CPCI/PXI Systems
PMC-A429
Interface Card
The PMC-A429 card is based on the industry’s most advanced 32-bit ARINC FPGA protocol engine, AltaCore™, and a feature-rich application programming interface, AltaAPI™, which is a multi-layer ANSI C and Windows .NET 2.0 (MSVS 2005 C++, C#, VB .NET) architecture. This hardware and software package provides increased system performance and flexibility while reducing integration time.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
Audio and Acoustic Functional Test Solution
Functional Test
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
Test System
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Product
Embedded MXM GPU Modules with NVIDIA® Quadro® Embedded P2000
EGX-MXM-P2000
Graphics Card
The EGX-MXM-P2000 features advanced NVIDIA Quadro GPU with NVIDIA Pascal™ Architecture technology in MXM 3.1 Type A form factor. The EGX-MXM-P2000 has 768 NVIDIA CUDA cores and a peak single-precision floating-point performance of 2.3 TFLOPS. The EGX-MXM-P2000 has 4GB of GDDR5 memory and supports NVIDIA GPUDirect™ RDMA which helps increase data throughput by up to 80% and consequently system responsiveness by up to 60%*. Additionally, 4 UHD display outputs and an extended operating temperature range of -40°C to 85°C are supported. The embedded graphics product is suitable for mission-critical harshenvironment edge computing applications with size, weight, and power (SWaP) and network connectivity constraints.
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Product
SAS Protocol Test System
Sierra M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
Test Platform
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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Product
6TL22 Off-Line Testing Platform
H71002200
Test Platform
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Product
Test Port Cable, 1 Mm
11500L
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 24-cm cable featuring a return loss of 16 dB minimum.
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Product
FPGA PXI Card with 80 TTL Differential Channels Module
GX3609
FPGA PXI Card
The GX3609 is a 3U PXI FPGA card with 80 TTL differential channels. The GX3609 is comprised of a GX3500 FPGA card and the GX3509, 80 channel, differential TTL expansion card.
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Product
Build-to-Print for Test Systems
Test System
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Product
16-Bit Multi-Function With A/D, D/A And Digital I/O Channels CPCI Cards
GX3232 Series
cPCI Card
The GX3232 is a multi-channel 16-bit, analog input and output cPCI module, supporting 32 single-ended or 16 differential input channels and four analog output channels. The inputs can be software configured for differential or single-end operation and are sequentially scanned with a maximum aggregate scan rate of 300 kS/s. Three input ranges are software-selectable: ±10 V, ±5 V or ±2.5 V. Optionally, the GX3232 is available with a high voltage input configuration and supports three ranges: ±60 V, ±30 V and ±15 V. The high voltage configuration supports 16 single-ended or 8 differential input channels for high voltage and 16 single-ended or 8 differential inputs for low voltage measurement. Four analog output channels provide software-selectable output ranges of ±2.5 V, ±5 V or ±10 V. The outputs can be updated either synchronously or asynchronously and support waveform generation. Each output can be clocked at rates up to 300 kS/s. A 16-bit digital I/O port is also provided, which supports 16 bidirectional data lines. Note that when used with a TS-700 system only 8 of these digital I/O lines are available at the test system's receiver interface.
