Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
Addon Cards
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Fit the IM6/Zennium electrochemical workstation to your application. Control external potentiostats, capture additional physical properties or enhance your system to a true parallel impedance analyzer.
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Product
FPGA Cards
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Curtiss-Wright Defense Solutions
Curtiss-Wright addresses the demands for increased data and signal processing performance, along with flexible interfaces for handling sensor I/O, through our full line of FPGA processor cards. Our rugged FPGA cards supporting Xilinx FPGA devices are designed to perform reliably in the harshest military environments.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
14-Bit, 12-Ch Analog Output Universal PCI Card With 32-Ch Digital I/O
PCI-1727U
Analog Output Card
12 independent analog output channelsFuse on each channelUniversal PCI for 5 V and 3.3 V supportBoardID™ switchSynchronized output function
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
250kS/s, 16-Bit, 16-Ch Multi-Function PCI Card
PCI-1716
PCI Card
16 single-ended or 8 differential or a combination of analog inputs16-bit A/D converter, with up to 250 kHz sampling rateFIFO memory (8,192 samples)2 analog output channels16-ch digital input and 16-ch digital outputAuto-calibrationBoardID™ switch
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Product
Express Card
DAS-429ExCARD/RT10
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Both cards contain 64 Kbytes of true dual-port RAM, for data blocks, control registers and Look-up table.The card's small size (54 millimeter wide) and suitability for Express Card compatible notebook computers make it a complete solution for developing and testing ARINC-429 interfaces and for performing system simulation of the ARINC-429 bus, both in the lab and in the field.The cards are supplied with C drivers, including source code, Mystic Windows software and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application.
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Product
FPGA PXI Card With 80 Channel LVDS Buffer Module
GX3611
FPGA PXI Card
The GX3611 is a 3U PXI FPGA card with 80, LVDS channels and is comprised of the GX3500 PXI FPGA card and the GX3511 expansion card.
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Product
FPGA Card
VP868
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The VP868 is a high performance 6U OpenVPX (VITA-65) compliant plug-in module with advanced digital signal processing capabilities. At the heart of the VP868 is a Zynq dual Arm-9 device for processing offload and board management.
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Product
Probe Cards
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PICOPROBE® PROBE CARDS by GGB Industries, Inc., allows for more chip design flexibility because each probe card is custom configured to your circuit for testing wafers on either manual or automatic probe stations. Probe cards with complex layouts consisting of numerous DC contacts and multiple microwave probes with operating frequencies of 40, 50, 67, or 110 GHz can be custom fabricated quickly and inexpensively.
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Product
Probe Card
VC20E Lab
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*20 millimeter ceramic probe card*Optimized for DC parametric test, modeling and characterization, and single site WLR*Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor*Effective operating temperature range from -65° to 200° C*Leakage as low as 5fA/V. If you require faster settling time, click here*Can be configured with up to 48 probes
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Product
CompactPCI Card
IIB-429-CPCI
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The IIB-429-CPCI provides from ARINC-429 compatible channels (2 receive and 2 transmit) at any rate between 12.5 and 100 kbps. Because the IIB-429-CPCI is built upon a flexible platform, user function can be implemented almost without restriction, making this product flexible and user-friendly. This CompactPCI card has a 3U form factor. This unit is also available in a 6U form factor (IIB-429-CPCI-4C) with four times the functionality
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Product
Probe Card
T40™ Series
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Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Probe Card Analyzers
PB3600
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The PB3600 provides the latest techniques in testing and maintaining probe cards. Designed through joint development with many of the world’s largest semiconductor and probe card manufacturers, ITC has produced an ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
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Product
Matrix Card
MATX4010
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The MATX4010 module is a general purpose-switching matrix, consisting of 40 relays arranged in 5 rows by 8 columns. Each row/column consists of independent Force/Sense lines that are switched simultaneously. Each relay is capable of handling 10 Amps and can isolate up to 5 KV. Each relay on the matrix is independently controlled with an On/Off command via software.
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Product
Routing Card
SET-2010
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With 64 single-ended or 32 differential channels, the SET-2010 provides exceptional signal routing capabilities in a small form factor. Unlike traditional routing matrix cards, the SET-2010 is designed specifically for the challenges of signal routing in HIL systems.
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Product
Carrier Card
PEX442
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The PEX442 Mezzanine Carrier Card allows designers the flexibility to extend and expand the IO capability of their systems by supporting high bandwidth links to combinations of XMC, PMC and AFIX (Additional Flexible Interface Xtensions) modules using PCI Express infrastructure.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
Smart Card Reader
UTC-510P-S01E
Card Reader
Memory card -Synchronous 2-line, 3-line and I2C interface. CPU card -Complies with ISO7816-1,2,3,T=1 and T=0 protocol. Reliability: 200,000 cycles.
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Product
Vertical Probe Cards
B3
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The patent-pending B3™ structure requires a minimum number of parts and can handle up to 300 probes. This vertical technology can provide: • Increased Uptime • Extended Probe Lifetime • Reduced Maintenance • Lower Cost of TestThe B3™ is an ideal solution for testing small pads and the low force probes minimize scrub. Planarity also remains stable over time increasing probe card life. Contact your sales representative to learn more about our B3™ probe cards.
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Product
PCI Express Graphics Card With NVIDIA RTX 6000 Ada
NVIDIA RTX 6000 Ada
Graphics Card
- NVIDIA Ada Lovelace Architecture- Full height, full length design- PCIe Gen4x16 interface- 48GB GDDR6 Memory, 384-bit Bandwidth- 18176 CUDA Cores, 91.1 TFLOPS SP Peak
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
CPE Design Verification System
Jupiter 310
Test System
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Product
Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Data Acquisition Card
TPCE
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The Elsys TPCE data acquisition (DAQ) cards are high-precision and high-resolution digitizers with sophisticated features such as advanced trigger mode, continuous data acquisition mode, differential inputs, digital input lines (Markers) and ICP coupling for powering piezo sensors.
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Product
ARINC PC/104-Plus Interface Card
PC104P-A429
Interface Card
Alta Data Technologies’ PC104P-A429 interface module offer a variety of ARINC-419/429/575/573/717 channel configurations with software selectable RX/Tx channels, baud rates, bit encoding and word configurations (Start/Sync/Stop length, Parity, bits/word, MSB/LSB). Encode or decode almost any ARINC-429 physical layer signal.
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Product
FPGA Card
VP780
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The VP780 is a high-performance Virtex-7 VPX card with advanced digital signal processing capabilities. The design has been optimized for the implementation of complex FPGA algorithms with high throughput requirements.
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Product
LVDT I/O Cards
CPE4000
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Computer Conversions Corporation
Computer Conversions’ CPe4000 Series are CompactPCI-Express (cPCIe) and PXI Express (PXIe) compliant: Synchro, Resolver, and LVDT/RVDT I/O Cards (predominantly output cards), with GEN1 and GEN 2 PCI Express interface, designed for accurate and reliable commercial, industrial and COTS-Mil. applications in test, simulation, motion control and shipboard data distribution. The CPe4000 Series drive up to 4 channels of Synchro, Resolver, 3-wire LVDT/RVDT outputs, or up to 8 channels of 2 wire LVDT/RVDT AC Sensor output sets.
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Product
6U Vertical Card
410
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VECTOR Electronics and Technology, Inc.
Chassis for vertical card installation
