Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Product
Analysis System
Pegasus (EDS-EBSD)
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The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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Product
Telecommunication Analysis
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Software-Defined WAN for the Enterprise Securely connect users and applications while radically reducing hardware.
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Product
Thermal-Optical Analysis
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As with other current organic carbon and elemental carbon (OC/EC) procedures, Thermal-Optical analysis is method-defined. However, this unit has been designed to specifically address some of the problems observed in other methods in assigning carbon to either the organic or the elemental fraction.
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Product
Wafer Internal Inspection System
INSPECTRA® IR Series
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An infrared internal defect inspection system has been added to the INSPECTRA® series.It is now possible to inspection with both infrared and visual light in one system.
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Product
Corrosion Analysis
Resipod
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Resipod is a fully integrated 4-point Wenner probe, designed to measure the electrical resistivity of concrete in a completely non-destructive test. It is the most accurate instrument available, extremely fast and stable and packaged in a robust, waterproof housing designed to operate in a demanding site environment. The Resipod is the successor of the classic CNS Farnell Resistivity Meter.Surface resistivity measurement provides extremely useful information about the state of a concrete structure. Not only has it been proven to be directly linked to the likelihood of corrosion and the corrosion rate, recent studies have shown that there is a direct correlation between resistivity and chloride diffusion rate and even to determination of early compressive strength. This makes it one of the most versatile NDT methods for concrete.
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Product
Testability Analysis
TurboCheck
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TurboScan is an advanced full-scan and partial-scan test suite. It includes a Scan Synthesizer and an Automatic Test Pattern Generator (ATPG). TurboScan automatically repairs testability violations to make your design highly testable.
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Product
Contactless One-Point Wafer Thickness Gauge
MX 30x
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The MX30x series are manual one-point Thickness gauges for silicon wafers.
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Product
Wafer Test
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Automatic KLA wafer probers with tray-to-tray-wafer-handling are operated 24h a day and 7 days a week. Data retention bake/tests are done at wafer level
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Product
Surface Analysis
Dimension FastScan Bio
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The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
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Product
Gas Analysis
HPR-20 DLS
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The Hiden HPR-20 DLS gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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Protocol Analysis
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GL's protocol analyzer provides monitoring a communication link in accordance with industry protocol standards by non-intrusively tapping the network under test. The simple framework of the protocol analysis software helps you easily identify the improper sequence of protocol messages, and filter out frames causing the protocol violation.
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Surface Analysis
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A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
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Product
Construction Analysis
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Customers of MASER Engineering that are using electronic components and materials are interested in the manufacturing quality and used materials.
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Product
In-Line Wafer Surface Defect Inspection
ALTO-SD-150/200
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ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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Product
Gas Analysis
FLOW EVO
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SmartGAS NDIR sensors offer many advantages for successful gas analysis and are ideal for process control. They are convincing where extreme precision and reliability are required. Various versions can be combined easily, which thus allows complex measurement tasks. All smartGAS sensors are characterized by low detection limits, low drift, a wide temperature range and extremely low operating and maintenance costs.
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Product
CS/ONH-Analysis
G8 GALILEO
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All state-of-the-art detectors used in the G8 GALILEO are equipped with internal reference channels for utmost stability and allow detection limits in a sub-ppm range (based on 1g sample mass)
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Product
Bug Finder Analysis
Polyspace
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Polyspace Bug Finder checks compliance with coding rule standards such as MISRA C, MISRA C++, JSF++, and custom naming conventions. It generates reports consisting of bugs found, code-rule violations, and code quality metrics, including cyclomatic complexity. Polyspace Bug Finder can be used with the Eclipse IDE and integrated into build systems.
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*Structural Analysis
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Guangzhou Amittari Instruments Co.Ltd
With proven accuracy every time, Altair offers industry-leading engineering analysis and optimization tools from simulation-driven design concepts to detailed virtual product validation and simplified modeling workflows to advanced high-fidelity model building. Whether big or small, our customers trust their decision making to Altair, the pioneer of simulation-driven design.
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Software Composition Analysis
SCA
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*Test Immediately in Your Development EnvironmentLaunch scans right from the command line for fast feedback in the pipeline and IDE. See and fix code errors earlier in the Software Development Life Cycle.*Reduce Fix Time From Hours to MinutesAuto-remediation capabilities prescribe intelligent fixes, generate auto-pull requests, and minimize disruption for higher accuracy and faster fix rates. *Automate Open-Source Policy and GovernanceEasily manage your open-source usage with continuous monitoring, extensive analytics, and flexible policies.
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Communication Analysis System
ACQUA
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ACQUA is a dual channel analysis system for diagnosis of acoustic and/or electric transmission paths up to 24 kHz. By means of predefined modifiable measurement descriptors measurement data can be gathered and evaluated in a simple and quick manner. All telecom specific analyses comply with the international standards of ETSI, ITU, TIA, 3GPP, GCF, PTCRB, DECT Forum, GSMA, CTIA.
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Product
Wafer and Cells PL System
HS-PL
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Photoluminescence (PL) Imaging is a unique non-invasive inspection tool as it can be used in-line at many different steps of the cell manufacturing process. This facilitates the direct comparison of data obtained at one process step to data obtained at another. Additionally, PL imaging can be compared to electroluminescence (EL) imaging on finished cells using comparable equipment.
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Mainframe Debugging and Analysis
Xpediter
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Xpediter is Compuware's mainframe application interactive debugging and code coverage solution. When an application experiences a problem, developers need to get into an interactive test session to solve the issue. However, complex setup procedures make this a time-consuming step and delay the resolution process.Compuware's mainframe debugging and analysis tool Xpediter enables developers to get into an interactive test session with minimal effort and quickly move applications into production with greater confidence.
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Thermal Testing And Analysis
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Response Dynamics Vibration Engineering, Inc.
We have consulted on thermal issues ranging from conduction issues in TECs, thermal radiation modeling, and countless air cooled system issues relating to system performance, vibration, and acoustics noise. We use a wide array of thermocouple instrumentation, thermal imaging, flow measurements, as well as finite element analysis and analytic modeling to measure, design, and debug thermal and related issues. We often work on customer products in our Response Dynamics lab where we characterize the system, engineer solution options, and prototype solutions. We then work with the customer to work the winning solution into their quality control and manufacturing process.
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VUV PIONA+ Analysis
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This high-speed gasoline PIONA analyzer is compliant with ASTM D8071. It supports simultaneous analysis of PIONA compounds, specific oxygenated compounds, and BTEX in gasoline, and can quickly analyze samples within 30 minutes by classifying compounds based on VUV absorption spectra. The simple system configuration provides broad applicability, including analyzing other petroleum products.
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Data Acquisition & Analysis
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American Environments Co., Inc.
American Environments facilities are equipped with automated data acquisition systems.
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Product
DCME Analysis System
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DCME Analysis System (SCL-DAS) is a software based application, which is designed to classify, process and decompressed the compressed signals transmitted over the satellite links.DCME Analysis System supports most of the commercially available DCMEs including PCM, ADPCM, DX-3000, DX-7000, DTX-600, DTX-360, DTX-240 (D,E,F,T), CELTIC-3G, OKI TC-2000 etc. While processing the compressed/normal E1 carrier, the SCL-DAS provides the processed intelligible output in the form of Voice and Fax along with Originating Point Country, Destination Point Country, Outgoing Number, Incoming Number etc.
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PAM-4 Analysis
N19306B
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PLTS N19306B extends the N19301B base product to perform PAM4 eye diagram analysis beyond the default NRZ eye diagram analysis in the base N19301B.
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Product
Machine Tool Analysis
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HEIDENHAIN offers comparator encoders for the calibration and acceptance testing of machine tools. These modular sytems deliver very high measurement accuracies with optical scanning and a sturdy measuring standard. Robust and easy-to-use, they are well-equipped for frequent usage under shopfloor conditions.
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Product
ESPI Analysis Application
TP601010
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First released by Intel in June 2013, the Enhanced Serial Peripheral Interface (“eSPI”) is designed as a replacement for the Low Pin Count (“LPC”) bus. eSPI supports communication between Embedded Controller (EC), Baseboard Management Controller (BMC), Super-I/O (SIO) and Port-80 debug cards. eSPI was available in the Sky Lake chipset (2015) and is available in the Kaby Lake [current] chipset. Cannonlake will support eSPI and is slated for release the second half of 2017. Icelake is scheduled for release in 2019 and it will mark the first chipset when eSPI becomes mandatory.
