Wafer Failure Analysis
Defines the failure mode and then through additional testing determine it's cause.
See Also: Wafer, Wafer Thickness, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Inspection
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Chemical Analysis
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Chemical analysis involves determining the elemental constituents of a material. This information can then be used to determine if the material matches a required specification. At Keighley Laboratories analysis of a wide range of products covering many material types is undertaken although these are mainly metal or metal related products.
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Wafer Manufacturing
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Scientific Computing International
A procedure composed of many repeated sequential processes to produce complete electrical or photonic circuits on semiconductor wafers in semiconductor device fabrication process.
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Gas Analysis
HPR-20 S1000
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The Hiden HPR-20 S1000 gas analysis system configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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Modal Analysis
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The Modal Analysis package is part of m+p Analyzer, m+p international's dynamic signal analyzer for noise & vibration measurements and analysis. It provides a complete set of tools for observing, analysing and documenting the vibrational behaviour of machines and mechanical structures. Software modules are available for classical and operational modal analysis, shaker measurements (SIMO and MIMO) as well as for ODS, SDOF and MDOF analysis. A modal model validation module is also provided.
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Failure Analyziz and Quality Assurance
NX20
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There's no room for error in the data provided by your instruments. Park NX20, with its reputation as the world's most accurate large sample AFM, is rated so highly in the semiconductor and hard disk industry for its data accuracy.
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Chemical Analysis + Surface Analysis
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Rocky Mountain Laboratories, Inc.
An independent surface chemistry and microanalysis laboratory to serve the needs of industrial, academic, and governmental clients. Our objective – to provide real-world solutions for industries with materials and process development needs – is as fundamental to our organization today as when we began. Over the years we have strived to adapt our services to the specific needs of these clients.
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Wafer Thickness Measurement System
MPT1000
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Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
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Static Analysis
SAST
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Coverity® is a fast, accurate, and highly scalable static analysis (SAST) solution that helps development and security teams address security and quality defects early in the software development life cycle (SDLC), track and manage risks across the application portfolio, and ensure compliance with security and coding standards.
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Spectral Analysis
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Quality Engineering Associates Inc.
QEA’s PSpec series of products is a new generation of hand-held, wireless, high-performance digital spectrometers that make spectral analysis easier and more convenient than ever before. With our PSpec devices the lab goes with you, enabling collection on the fly of objective, unambiguous data, whenever and wherever it’s needed. Built-in wireless connectivity via Bluetooth enables two-way communication with your smart, tablet or PC. PSpec devices include PC-based Excel application software for data logging, analysis and reporting. With PSpec you’ll enjoy a whole new world of state-of-the-art, mobile analysis tools at an affordable price. The PSpec series offers the perfect tool, whatever your application.
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N/Protein Analysis
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Elementar Analysensysteme GmbH
The determination of the total protein content is an essential tool for quality control and protein declaration according to international labeling laws in the food & feed industry and research facilities. Since the protein content can directly correspond to product properties, highly precise, matrix-independent protein analyses are required in all application areas.Our N/protein analyzers use the high-temperature combustion method according to Dumas, which has clear advantages over Kjeldahl regarding laboratory safety, sample throughput, labor time, amount of chemical waste and thus cost-per-analysis. Our analyzers for the determination of nitrogen and protein are dedicated instruments serving today’s customer needs in regards to price-per-sample, throughput and sensitivity.
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Die-To-Wafer Bonding Systems
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Several different D2W bonding methods are available and selected depending upon the application and customer requirements. In direct placement D2W (DP-D2W) bonding, the singulated dies are bonded to the target wafer one by one using a pick-and-place flip-chip bonder. Plasma activation and cleaning of the surfaces of the dies on the handler wafer are essential steps for establishing a high-yielding bond and electrical interface between the dies and target wafer. This is where the EVG320 D2W activation system comes in.
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Image Analysis
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In today's demanding environment where quality assurance is an everyday requirement Aprotec have sought to find present day retrofit solutions that compliment fully functional older machinery.
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Particle Size Analysis
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Particle size analysis is a technical procedure to characterize the size distribution of particles in a powder or liquid sample. It is widely used in R&D and quality control in industries involved with nanotechnology, pharmaceuticals, cosmetics, food, electronic materials, sintering materials, Li-ion battery electrodes, etc.
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Wafer Back Side Cooling System
GR-300 Series
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The GR-300 Series can control gases used to cool the back side of wafers that are fixed in position by an electrostatic chuck system.The stability and accuracy of the GR-300 makes it ideal for controlling the flow of Helium and Argon in wafer cooling systems.
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Wafer Sorter and Inspection
SolarWIS Platform
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Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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Wafer and Cells PL System
HS-PL
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Photoluminescence (PL) Imaging is a unique non-invasive inspection tool as it can be used in-line at many different steps of the cell manufacturing process. This facilitates the direct comparison of data obtained at one process step to data obtained at another. Additionally, PL imaging can be compared to electroluminescence (EL) imaging on finished cells using comparable equipment.
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Mainframe Debugging and Analysis
Xpediter
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Xpediter is Compuware's mainframe application interactive debugging and code coverage solution. When an application experiences a problem, developers need to get into an interactive test session to solve the issue. However, complex setup procedures make this a time-consuming step and delay the resolution process.Compuware's mainframe debugging and analysis tool Xpediter enables developers to get into an interactive test session with minimal effort and quickly move applications into production with greater confidence.
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Seismic Analysis and Monitoring
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Seismic analysis and monitoring have been designed on the base of the contemporary seismic studies. We can offer you a wide range of tools for geophysical surveys, seismic tomography, automated monitoring of bearing structures (structural health monitoring), seismic monitoring of oil piping systems.
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Analysis Application for E84
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GCI's industry leading E84 diagnostic software is a powerful, Windows-based graphical analysis application that can upload and analyze data from GCI's E84 Handheld Tester, E84 DLD, and RJ-11 Optical Transceiver products. The E84 Analysis Application can also display the signals of a live material handoff in real-time when connected to GCI's E84 DLD or RJ-11 Optical Transceiver.
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Sensing Analysis Software
ENLIGHT
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A single suite of tools for data acquisition, computation, and analysis of optical sensor networks based on the HYPERION system.
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Impedance Analysis
S96041B
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Make impedance analysis measurements of Surface Mount Device (SMD) components on the E5080B vector network analyzer with 16198A-010 10 GHz SMD test fixture.
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Gas Analysis
QIC MultiStream
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The Hiden QIC MultiStream is a complete, multi-stream gas composition monitoring system. Capable of analysing gas streams at flow rates from 4 ml/min up to 10 L/min. The system is suited to a range of applications where multi-component, multi-stream gas analysis is required, environmental monitoring for example.
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Sample Analysis
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With the wide range of particle characterization methods, having the right measuring device readily available and fully utilized can be challenging. At Particle Metrix, we offer professional sample analysis in our application laboratories, ensuring precise and reliable results. Our comprehensive consulting services complete our offering.
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Cell Isolation & Analysis
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Life's complexity originates in cells, spanning cellular structure, genetic diversity, gene expression, and complex tissue formation. Serving as the fundamental unit, cells form the foundation of all biology. Characterization of cells, their processes and interactions can provide insights into areas like medicine, symbiosis, and biological diversity. Bio-Rad supports these inquiries, offering innovative technologies for your cell biology research.
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CS/ONH-Analysis
G4 PHOENIX DH
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The highly sensitive thermal conductivity detector allows analysis down to a sub-ppm range, while the optional mass spectrometer allows detection limits in the low ng/g range.
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Modal Analysis Shaker
KD-9363EM-Analysis shaker
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King Design Industrial Co., Ltd.
This machine can test the structural properties of materials, manual fine-tuning vibration frequency can perform single-point resonance search and presence; after shaking, capture resonance excitation modal analysis data for future use.
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Wafer Level Test
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Double sided wafer inspection system is an automatic inspection system for afterdicing wafer chip. It can do double side inspection simultaneously. The appearance defects of wafer chip are clearly conspicuous by using advanced illumination technology. Illumination and camera acquisition mode can be adjusted for various wafer process, like vertical chip or flip chip.
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Operation Support System for Wafer Prober
N-PAF
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N-PAF (Network-Based Prober Advanced Function) is a networking system developed for more effective operation and maintenance of multiple wafer probers. Remote operation helps save on labor on the factory floor. An E10-compliant RAM Analyzer can be used for operation management of the system
