System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Night Vision Test Sets
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HGH Infrared Systems NV-2500 is the new standard for digital night vision goggle testing. Designed for testing night vision monocular or binocular systems, the NV-2500 system provides automated testing of all standard NVD tests with unparalleled accuracy and operator ease of use.
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Product
Test Program Development
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Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.
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Product
PCI High Density Pecision Resistor Card, 6-Channel, 3.5Ω To 1.51MΩ
50-298-044
Programmable Resistor Module
The 50-298-044 is a high density programmable resistor card with 6 channels which can be set between 3.5Ω and 1.51MΩ with 2Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI High Density Precision Resistor Module, 6-Channel, 4Ω to 1.51MΩ
40-298-050
Programmable Resistor Module
The 40-298-150 is a high density programmable resistor module with 3 channels which can be set between 4Ω and 1.51MΩ with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
BNC To BNC Cable, 50 Ohm, 0.9 M
781887-01
Coax Patchcord
Connects measurement and signal generation devices. Model options include industry-standard coaxial connector types including BNC, SMA, SMB, and MCX. Long cables can act as antennae picking up extra noise that can affect measurements, so ensure you select only the length required for your test system. Also look at the impedance of your test system and consider buying a cable with the same impedance. Matched impedance can maximize the power transfer or minimize signal reflection from the load of your system.
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PXI Controller
Controller
The ADLINK PXI embedded controller, based on the Intel® processor family, is specifically suited for hybrid PXI-based testing systems, delivering a rugged and stable platform for a wide variety of testing and measurement applications. The PXI embedded controllers sport integrated CPU, HDD or SSD, and RAM, and provide ample interface flexibility, including one Gigabit Ethernet port for LAN connection and one for controlling LXI instruments, USB ports for peripheral devices and USB instrument control, and a Micro-D GPIB connector for GPIB instrument connection.
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Product
PXI Very High Density Versatile 2 Amp Multiplexer
40-612A-002
Multiplexer Module
The 40-612A Very High Density Versatile Multiplexer module features a wide range of software selectable switching configurations. It is especially useful where a number of high density multiplexers are required with the option of easily altering the channel count as a test system evolves. Typical applications include signal routing in ATE and data acquisition systems. The 40-612 module uses high quality electro-mechanical relays, connections are made via a front panel 160 pin DIN41612 connector. The module can be software configured into one of a large number of different multiplexer modes. Relays allow the multiplexer banks to be set in 1 or 2 pole mode and inter-bank switching enables the channel count to be increased up to a maximum of 128
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Product
Noise Sources
WGNS
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The system allows the user to extend the frequency range of the NFA to allow for accurate noise figure measurements to be performed on a device operating in the 26.5 – 170GHz range on wafer as well as in benchtop applications. Farran offers the WGNS series of noise sources to be used in conjunction with the FBC down converters for use as frequency extenders for noise figure measurement test system.
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Product
Calibration Test Benches
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Nagman Instruments & Electronics Pvt. Ltd
Nagman’s wide range of Calibration Systems – Test Benches, Workstations, Bench-tops & Mobile Units – are designed & executed to serve as Powerful tools for Total Quality Management & ISO Conformance with Accuracies Traceable to International Standards and Total Solution to all Calibration requirements.
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Product
Repeated Charge Discharge Test Set
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The IS 13341 : 1992 has laid down the requirements for Ageing Test, Self-Healing Test and Destruction Test on Shunt Capacitors of the self healing type for AC Power Systems. The Ageing Test is to be performed at a specified voltage of 1.25 times the rated voltage for 750 hours. The test is to be followed with a repeated discharge cycle test which involves charging of the capacitor to a DC voltage and discharge of the same through an Inductance. Sivananda Electronics has developed this equipment for the benefit of capacitor manufacturers, for the first time in India.
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Product
PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-02
Digital Waveform
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Product
SWB-2816, 8x46, 0.3 A, Row Access, Reed Relay Matrix Module for SwitchBlock
781420-16
Reed Relay
8x46, 0.3 A, Reed Matrix Module for SwitchBlock - The SWB‑2816 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, … individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Product
PCI High Density Pecision Resistor Card, 9-Channel, 2Ω To 31.5Ω
50-298-110
Programmable Resistor Module
The 50-298-110 is a high density programmable resistor card with 9 channels which can be set between 2Ω and 31.5Ω with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
PCI Precision Resistor Card 9-Channel, 2Ω To 13.6kΩ
50-297-031
Programmable Resistor Module
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Automated Test Systems
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Chroma Systems Solutions, Inc.
From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Modular Laser Diode Test System (PXI/PXIe)
LTS8620
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The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode.
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Product
Replacement Protective Cover, I1, Receiver
310113524
Protective Cover
The receiver protective cover is designed to protect your modules and contacts while the test system is not in use. A protective cover is included with the i1 Receiver.
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Product
Insulation & Multifunction Tester (LCD Display)
4167 MF
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Standard Electric Works Co., Ltd
● High Quality Taut Band movement.● Capable of measuring earth resistance and earth voltage.● 2mA measuring current permits the testing of earth resistance without tripping earth leakage current breakers in the circuit under test.● Test test leads are supplied as standard accessories for simplified two-wire measuring system.● Two insulation test voltages(DC) : 250V and 500V.● Alternation voltage measurement.● Battery life indicator.● Fuse protected.
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Product
High & Low Temperature Impact System for ATF Cooling Motor
EVTP-30
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Shanghai Dean Electrical Co., Ltd
This test system provides the most direct life evaluation of ATF cooling based EV motor by simulating the temperature impact from ultimate self- heating of the motor and severe cold condition from environment.
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
Modular Functional Testing Platform
OTP2
Test Platform
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Product
Cable Harness Test System
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Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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Chassis and Controllers Accessories
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Keysight offers high-performance chassis and controller accessories to synchronize multiple Keysight USB modular products to accelerate your test system integration and development.
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Microwave/RF Cable Test Assemblies, 110 GHz
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Gore offers a rugged, lightweight 110 GHz test assembly that optimizes the performance of test systems while reducing the total cost of test and ownership over time. Our assemblies provide reliable electrical performance with flexure and temperature in demanding environments.
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Smart Card Testers
CT1000
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The CT1000 testers are open and configurable to test any kind of communication protocols used on smart cards, and to be updated for new technologies. The systems can test devices that use common standard protocols (as ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARE™, DESFIRE™, FeliCa™, ISO 11784/85, ICode™, Hitag™, ISO 7816, ISO 7813), and are ready to test also the next generation of cards protocols, such as: USB-Keys, MMC, Micro-SD (with and without CPU inside), M-SIM, HD-SIM, SIM-WAVE, and I2C.
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Product
Bending Deflectometers For ISO 178, JIS K 7171, And ASTM D790 Compliant Testing
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After tensile testing, flexural tests are the most common strength tests for plastics and other resins. The main standards for plastic flexural (bend) tests are ISO 178, JIS K 7171, and ASTM D790, which require very accurate test systems. These standards include flexural strain measurements using a deflectometer, ranging from micro-strain measurements in the elastic region, the reversible elongation at the beginning of tests, to larger strain measurements in the plastic region. Shimadzu's deflectometers integrate easily into AG-X plus series, AGS-X series, and EZ-X test frames and Trapezium X testing software. Since these deflectometers push up against the specimen from below, the specimen color is not a limiting factor, as can be for laser type non-contact deflectometers. Furthermore, these deflectometers can partially absorb the shock during specimen failure, preventing specimen fragments from scattering.
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Product
PXI Precision Resistor Module 6-Channel, 3Ohm to 22.3M
40-297-054
Programmable Resistor Module
A simple solution for applications requiring accurate simulation of resistive sensors. The series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Climatic Temperature/humidity Chambers
PV-K Series
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The PV-K Series climatic temperature/humidity chambers (Espec Corporation - previously Tabai Espec) can be combined with G-0N & G-9 Series Vibration Test Systems for combined environmental tests of temperature/humidity and vibration for various parts, components and units.
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Electrical Creep and Rupture Testing Machine
ECR Series
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Jinan Testing Equipment IE Corporation
This series of computer control electronic creep and rupture testing machine is newly designed with full-digital measuring control system to meet the standards of GB/T2039, GB//T20120, EN ISO 204-2009 and ASTM E139 etc. The electronic creep and rupture testing system can perform not simply creep. stress-rupture test and stress relaxation test on metals under room or high temperatures, but also low cycling test & creep fatigue test. The electronic creep and rupture testing machine is widely used for quality control in factories, material research in R&D department and teaching in universities,
