Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Coordinate Measuring Machines
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Novacam's 3D Non-Contact Coordinate Measuring Machines are designed with versatility and superior performance in mind: Precision (better than 1um) Speed (1-30 thousand measurements per second) Simultaneous dimensional and surface inspection Smallest probes measuring 0.9mm in diameter Automation by teaching with joystick Portability
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Product
Radius Radiation Probe
Hawk Radius®
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The Hawk® Radius is a ruggedized solution for monitoring both ambient and elevated levels of ionizing radiation. Like a Hawk with its remarkable vision, the Hawk Radius Probe “sees” things that other probes cannot. The high sensitivity weatherized pancake sensor can provide early warning of changing ambient radiation conditions, while the energy compensated detector can accurately report penetrating gamma radiation dose rate at elevated levels. Radius probes are typically deployed as part of an environmental radiation monitoring program, or for safety and security systems. In its standard configuration the probe detects beta, low energy gamma and x-radiation with one channel and energy compensated penetrating gamma radiation levels with a second channel. It can be configured to detect alpha radiation as well. The Hawk® Radius has been deployed worldwide in demanding conditions for protecting communities and collecting environmental radiation data. It can be deployed easily and requires minimum maintenance. The Radius is compatible with Medcomʻs GeigerLink adapter and the IMI Gateway App for use with personal computers. It can also be used with most data loggers including popular Campbell Scientific models.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1I-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
In-Circuit Test (ICT)
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Analog components (resistance, capacitance, inductance, diodes, transistors, etc.) as well as complex digital components can be tested in the ICT. Compared to other test methods (e.g. flying probe), the in-circuit test enables very short test times (= high assembly throughput) combined with a very high test coverage.
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Product
Temperature and Humidity Transmitter
T3319-4
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Humidity, temperature probe on a cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.
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Product
SPL-03C-114 Step Probe
SPL-03C-114
Step Probe
Current Rating (Amps): 6Average DC Resistance lower than (mOhm): 50Test Center (mil): 125Full Travel (mil): 170Full Travel (mm): 4.32Recommended Travel (mil): 127Recommended Travel (mm): 3.23Overall Length (mil): 1,530Overall Length (mm): 38.86Rec. Mounting Hole Size (mil): 95Rec. Mounting Hole Size (mm): 2.40Rec. Mounting Hole Remark: 94 to 96 mil / 2.39 to 2.44 mmRecommended Wire Gauge: 22-26 AWGRecommended Drill Size: #41 or 2.40 mm
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Product
500A, 5 MHz CURRENT PROBE, BNC, AC/DC, 500A rms, 750A Peak Pulse
T3CP500-5
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500A, 5 MHz CURRENT PROBE, BNC, AC/DC, 500A rms, 750A Peak Pulse.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1Z1-6-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Probe Only Manipulator
LSP
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The LSP mounts to standard prober hinge mounts with easy access to service and engineering locations. This reduces the floor space per test cell, saving you significant capital expenses. And you’ll be able to quickly and easily set up your ATE to wafer probe.
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Product
Replacement Alligator Clips for High Voltage Differential Probe
PK-HVA-01
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Replacement Alligator Clips for High Voltage Differential Probe
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Product
2.5 GHz, 0.9 pF, 1 MOhm Active Voltage Probe
ZS2500
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Engineers must commonly probe high frequency signals with high signal fidelity. Typical passive probes with high input R and C provide good response at lower frequencies, but inappropriately load the circuit, and distort signals, at higher frequencies. The ZS Series features both high input R (1 MΩ) and low input C (0.9 pF) to reduce circuit Loading across the entire probe/oscilloscope bandwidth. The ZS2500 is ideal for 2.5 GHz and lower oscilloscopes.
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Product
Linear Testfixture (Cassette Not Included), UTT 105 x 170 mm
MG-01
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FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (1000N) 650 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 105 x 170 mm (wxd)• Outer dimensions: 254 x 400 x 50 x 140 mm (wxdxh1xh2)• Designed for changeable cassette
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Product
Rack Based Test Solutions
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Most equipment manufacturers and large enterprises prefer rack-based test tools as they are compact and higher density form factor solution for testing, monitoring, and troubleshooting network conditions. GL’s Multiple TDM Optical and Packet (mTOP™) rack enclosure can house any combination of USB based test equipment which are easily deployed and securely fixed to an equipment rack to provide extraordinary scalability to test switches, routers and end-to-end networks. These rack based platforms incorporates the basic test unit along with the necessary PC hardware, Windows® 10 64-bit operating system and remote accessibility via scripting and remote desktop. There are no moving parts with the unit, so reliability and longevity are integral. GL’s latest mTOP™ Probe stand-alone hardware variant is an all-in-one self-contained test instrument. The mTOP™ Probe can include any of the multiple TDM Optical and Packet interfaces USB device combined with the PC into one single box. The comprehensive mTOP™ Probe hardware unit is designed for easier portability and convenient for field testing which incorporates the testing features for multiple interfaces along with necessary PC hardware in a single box. GL’s USB based test equipment - PacketExpert™ (Ethernet), tProbe™ (T1/E1), USB T3/E3 (TDM), Dual UTAs (Analog/Wireless), and LightSpeed1000™ (SONET SDH) to support multiple interfaces in a compact rack space or included in a portable Probe unit.
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Product
Temperature And Humidity Data Loggers
EL WiFi
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The EL-WiFi-TC sensor measures the temperature of the environment in which the probe is situated. The accuracy of the K type probe supplied is ±1.5°C. Data is streamed wirelessly over any WiFi network and can be viewed on a PC using our free software package. Cloud subscription also available
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Product
Alternate 6.00 (17.00) - 2.50 (71.00) General Purpose Probe
P2662AG-2V2S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Product
WaveMaster Oscilloscope, 13 GHz Bandwidth, 4 Input Channels, 40 GS/s Max Sample Rate
WaveMaster 813Zi-B
Oscilloscope
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1T-6-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
S2 Spectra Sensors
ULP-S2 WBI/V
LED Sensor
The ULP S2 Spectra Sensor tests for LED intensity, and for any color in the visual spectrum, plus white. The S2 Spectra Sensor is well-suited for the test of “boundary” color LEDs, as it can unambiguously and repeatedly distinguish between not only adjacent visual colors such as green and yellow, but it can determine different hues of the same color such as yellow and amber, regardless of LED intensity. Implemented in a unique and customizable 2-Part solution, the S2 Spectra Sensor is assembled with your choice of Fiber-Optic Probe, including for the test of densely-spaced LEDs, bright LEDs, dim or misaligned LEDs, right-angle LEDs, and more, including the popular “Trident” Fiber-Optic Probes to sequentially test 3 LEDs with a single Sensor.Operating temperature range: 0oC to 70oCPower consumption: Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsOutput Pins: 4 gold-plated standard wire-wrap pins (0.025 in. sq.)Output Loads: ‘Int.’& ‘Color’- 2Kohms min., 100pF max.Sensor Size: 0.560 in. dia x 1.38 in. long.Typical response time: Typical response time: <10mS capture time; <100mS overall response timefor color and intensity simultaneouslyFiber-Optic Probes: Can be paired with any Universal LightProbe Fiber-Optic Probe
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Product
Laser Hunter - gas detection & gas measurement device
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Highly sensitive and selective gas detection & gas measurement device withlaser technology for the inspection of underground gas pipes using suitableprobes (e. g. carpet probe). The device can also be used for the vehicle-basedpipeline inspection.With built-in diaphragm pump, Bluetooth module and rechargeable Li-Ion battery.The following applications are possible:- Inspection of underground pipes- Inspection of accessible pipes in buildings- Inspection of accessible pipes on plants, etc.- Inspection of ground soil for pinpointing (optional)- Purging of gas pipelines (optional, only in combination with pinpointing)- Gas analysis (with dual laser module)
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Product
BIP-10 Battery Probes
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 30Resistance Remark: Probe Resistance Steel: 30 mOhms, Gold plated: 100 mOhmsTest Center (mil): 260Test Center (mm): 6.60Full Travel (mil): 157Full Travel (mm): 4.00Recommended Travel (mil): 126Recommended Travel (mm): 3.20Overall Length (mil): 591Overall Length (mm): 15.00
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Product
Combined Probe for IAQ
P37AB147
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Temperature, relative humidity, atmospheric pressure, CO2 (Carbon Dioxide) and CO (Carbon Monoxide) combined probe, complete with SICRAM module.
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Product
Adjustable Press Plate Bed of Nails Testers
Protector Adjustable Family
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Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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Product
Raman Spectrometer
S-RS
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Main features of this system are an adaptation a super stable single mode 500-picosecond pulsed Diode Pumped Solid State Lasers (DPSSL) with more than 8 kW peak power as a probe beam.
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Product
Heavy Duty Vibration Monitor
VUM-800
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Features • Heavy-duty sensing probe • DPDT 10 amp relay • Optional 230 VAC operation • Control unit remotely mounted • Failsafe operation
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Product
Test House Services
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Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Product
Advanced High Speed Test Probe
SQprobe
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SQprobe® is an advanced high speed probe designed for emerging software defined (SDN) and virtualized networks. It monitors IP based voice, video, audio and data streams at Gigabit rates, performing deep packet inspection (DPI) and providing accurate and detailed real time service quality metrics, usage and demographic data.
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Product
Stimulus Induced Fault Testing
SIFT
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SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Product
Scanning Near Field Optical Microscope
SNOM
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SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
