Product

Radiometric Probe for Photons Flow

LPPAR03… Series

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Senseca

LPPAR03… Series - Senseca

The probe LPPAR03 measures the ratio between the number of photons that strike a surface in one second, in the 400 nm…700 nm spectral range and the surface area (m²). This quantity is defined as PAR: Photo-synthetically Active Radiation.

Product

30 AMP Fuse Buddy Testers

FB305M

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Matco Tools

FB305M - Matco Tools

Can test circuit current up to 30 Amps - an easy way to check fuel pump amperage. Clever design allows for easy connection into fuse sockets. Fuse Buddy ends are molded into the shape of the fuse itself. During testing the fuse is removed and replaced into the Fuse Buddy. This way, the circuit being tested maintains fuse protection. Fuse Buddy stays put & won't fall out of the socket, like test probes do.

Product

EMC Near Field Probes

TBPS01

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TekBox Singapore Pte. Ltd.

TBPS01 - TekBox Singapore Pte. Ltd.

The TBPS01 EMC near field probes H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.

Product

Water Cut Meter

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AMETEK Drexelbrook

AMETEK Drexelbrook

The Drexelbrook Universal IV Series products feature full compensation for both temperature and density as well as multiple mounting options which includes insertion and spool piece probes.

Product

Temperature Transmitter

H4331

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COMET SYSTEM, s.r.o.

H4331 - COMET SYSTEM, s.r.o.

For external Pt1000 temperature probe. Three two-state inputs.

Product

PROBE CARD

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UNIVANS Co., Ltd.

UNIVANS Co., Ltd.

the electrical characteristics of the individual CHIPs in WAFER that have been completed through the FAB stage during the semiconductor fabrication process

Product

Heavy Duty Circuit Tester / Jumper

32900

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Lisle Corp.

32900 - Lisle Corp.

Heavy-duty circuit tester for checking low voltage up to 12 volts. By depressing the red button the tester becomes a jumper for powering electrical components or a ground. The probe, handle, cord and clamp are reinforced for durability. Comes with a strain relief spring on the cord.

Product

Portable optical DO meter

ARO-PR

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JFE Advantech Co., Ltd.

ARO-PR - JFE Advantech Co., Ltd.

The Portable optical DO meter makes use of the fast-response optical DO sensor RINKO, maintaining its high-speed response performance (99% response < 7sec). The meter probe is equipped with a temperature sensor close to the sensing foil, and the measurements are made by simply inserting the probe into a DO sample bottle (the calibration is carried out using the National Metrology Institute of Japan (NMIJ) certified traceable gases standards). Differently from galvanic electrode sensors, the instrument does not require water sample stirring or fixing reagents, since there is no oxygen consumption. Thus, the required time to estimate dissolved oxygen is considerably reduced. The display unit shows the output instantaneously, and you can check the measured values in real time.

Product

Probe Series

VEGA Series

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MPI Photonics Automation

VEGA Series - MPI Photonics Automation

MPI VEGA Prober series is ready to meet the diverse test and material handling requirements of the Laser Diode (VCSEL, EEL) and optical module markets. MPI VEGA probers are based on a highly flexible and reliable platform, enabling the test of a wide variety of device types (Wafer, Package & Singulated Die) over temperatures with the ability to handle thin/warped wafers. Multiple probing schemes are also supported with the ability to probe small pads with well-controlled needle force.

Product

Clamp Meters

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Shenzhen UYIGAO Electronic Technology Co., Ltd

Shenzhen UYIGAO Electronic Technology Co., Ltd

Combine meter and current probe into integrated instrument.

Product

Changeable Cassette

230354/1 – CMK-05

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Columbia Elektronik AB

230354/1 – CMK-05 - Columbia Elektronik AB

Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.

Product

Probe Card

VS Series

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Japan Electronic Materials Corp.

VS Series - Japan Electronic Materials Corp.

*Vertical contact Probe Card with Spring*Suitable for Area array Bump Test

Product

Multitester Probe Set

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Giotto Co., Ltd.

Giotto Co., Ltd.

Probes for multitesters - could wire for grounding, red connecting wire. Multitesters not included.

Product

Automated Robot Test System

ATS-8000A

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High Power Pulse Instruments GmbH

ATS-8000A - High Power Pulse Instruments GmbH

The ATS-8000A test system is a fully automated 2-pin probing solution for HBM, TLP, HMM and CC-TLP on package- and wafer-level.Future extension for CDM is optional.

Product

Cryogenic Probe Station

TTPX

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Lake Shore Cryotronics, Inc.

TTPX - Lake Shore Cryotronics, Inc.

The TTPX probe station is an affordable, entry-level probe station capable of making a wide variety of non-destructive, standard electrical device measurements. The compact tabletop design is perfect for academic and laboratory research settings. The TTPX provides efficient cryogenic temperature operation and control with a continuous refrigeration system using either liquid helium or liquid nitrogen.

Product

Adjustable Press Plate Bed of Nails Testers

Protector Adjustable Family

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Test Electronics

Protector Adjustable Family - Test Electronics

Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.

Product

Manual Test Fixture (MA)

MA 2013/D/H/VPC-G12x-18

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INGUN Prüfmittelbau GmbH

MA 2013/D/H/VPC-G12x-18 - INGUN Prüfmittelbau GmbH

Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 25,00 kg

Product

Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 335 x 250 mm (wxd)

CMCSK-02-01

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Columbia Elektronik AB

CMCSK-02-01 - Columbia Elektronik AB

Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.