Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Probes, Cables & Detectors
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Probe has a mica window that has a thickness of 1.8 to 2.0 mg/cm2. This allows detection of alpha radiation as low as 3.0 MeV when in close proximity to the window. Beta radiation in excess of 35 keV and X-ray or gamma radiation greater than 6 keV can also be deteched. The detector is provided with a BNC connector. It can be used with most count rate and survey meters which accept Geiger Mueller (GM) detectors operating at 900V DC.
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Product
400 MHz High Voltage Differential Probe
DP0001A
High Current Probe
The DP0001A is a 400 MHz high voltage differential probe with 2 kV mains isolated or 1 kV CAT III rating designed for making accurate high-voltage power measurements required for testing today’s WBG power devices, power converters or motor drives.
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Battery Probes
Battery Probe
*Charging *Connecting *Docking Station for *Medical- IOT - Communication
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Vacuum Assist
1029
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TESCO’s Vacuum Assist actively generates a vacuum that attaches your TESCO optical pickup or probe to the meter and allows hands-free use for the meter tech. No more wasted time during testing or communication work when the pickup or probe falls off.
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Solder-In Lead for ZD Differential Probe Qty 2
PACC-ZD002
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Solder-in lead for ZD differential probeQty 2
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Stand-Alone Test Fixture
MA 2013/D/H/Pylon
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 24,00 kg
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Comparative Dissolution Tester
CD14 Comparative Dissolution Tester
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The Teledyne LABS 14-vessel CD14 Comparative Dissolution Tester runs two methods simultaneously or independently—ideal for bioequivalence studies of generic vs. innovator drug formulations. The 14 stirring positions allow for 6+1 or 12+2 configurations for improved workload efficiency in R&D, formulations, QC, and stability-test labs. With digital temperature probes at 12 positions the CD14 comparative dissolution tester is able to test two different formulations with separate settings for every parameter under the same temperature conditions.
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Near Field Micro Probe Sets
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The near field probe is designed for a high-resolution measurement of electrical near fields.
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High Volume / Double-Side Applications
APS 80D
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Simultaneous, double-sided probing of up to 8" wafersPowerful, user-friendly control and monitoring softwarePlanarization of needle sets and constant preset needle loadPattern recognition systemRobot handling systemConfigurable to voltages in excess of 5 kV for specialized applications
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Real-time and Direct Correlative Nanoscopy
LabRAM Soleil Nano
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Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
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Standard 1.10 (31.00) - 2.50 (71.00) General Purpose Probe
HPA-1E
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Linear Testfixture (Cassette Not Included), UTT 586 x 248 mm
MG-03
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FEATURES• Linear click system with ball bearings, using gas springs• 10 mm ESD-proof top cover with aluminium reinforcement bars• Steel base cabinet with detachable aluminium back and bottom panels• Detachable interchangeable case system with an 8 mm spring loaded probe protection cover• Base cabinet fitted with a telescopic guide rail and catchTECHNICAL SPECIFICATIONS• Max. number of probes (2000N) 1300 units• Max. PCB height: 60 mm• Linear travel: 12 mm• Max UUT: 586 x 248 mm (wxd• Outer dimensions: 750 x 490 x 100 x 170 mm (wxdxh1xh2)• Designed for changeable cassette
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Product
K Thermocouple Immersion Probe
TP742
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Immersion “K” Type thermocouple probe. Tolerance according to IEC 60584-2 standard.
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ITA, ICon, With Protective Cover
410123101
ITA
The iCon ITAs small width and inboard handle allow for easy side-to-side stackability. The u-shaped cable clamp allows modules to be pre-wired before assembly and offers a maximum cable bundle diameter of 1.21". The slide-off cover allows easy access to wiring for maintenance and probing.
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Alternate 3.50 (99.00) - 6.85 (194.00) General Purpose Probe
P2757G-1W2S
General Purpose Probe
Current Rating (Amps): 20Average DC Resistance lower than (mOhm): 10Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 230Full Travel (mm): 5.84Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,210Overall Length (mm): 30.73Overall Length Remark: Tip 2C: 1140 mil (28.96 mm) Tip 1W: 1205 mil (30.61 mm) Tip 2W: 1205 mil (30.61 mm)
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Logic Analyzer Probe
FS2521
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The FS2521 is a logic analyzer probe used to test DDR4 SO-DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4164A logic analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR4 SO-DIMMs. Now qualified at 3200MT/s
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EMC Near Field Probes
TBPS01
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The TBPS01 EMC near field probes H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.
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Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72T1-7
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Alternate 0.99 (28.00) - 6.00 (170.00) Long Travel Bead Probe
BPLT-25HL-6
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,460Overall Length (mm): 37.08Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, Alternate Spring 400 mil / 10,16 mm, High Spring: 400 mil / 10,16 mm, Ultra High Spring: 350 mil / 8,89 mm
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Web Sensor
P8552
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The devices are equipped with two connectors for connection of the temperature and humidity external probes and three binary inputs for two-states signals. The dry contact or two-state voltage signal can be connect to the binary input.
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Continuous LPR Corrosion Meter
MS2001L
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The MS2001L is a microprocessor-based, field-mountable corrosion rate meter. This versatile instrument measures the instantaneous corrosion rate and electrochemical current between the electrodes of any standard 2-electrode linear polarization resistance (LPR) probe. Corrosion rate is displayed on the LCD display.
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Temperature Probes
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Is a device, typically, a thermocouple or RTD, that provides for temperature measurement through an electrical signal. A thermocouple (T/C) is made from two dissimilar metals that generate electrical voltage in direct proportion to changes in temperature.
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NI-9230, 3-Channel, 12.8 kS/s/channel, ±30 V, C Series Sound and Vibration Input Module
783824-02
Sound and Vibration
3-Channel, 12.8 kS/s/channel, ±30 V, C Series Sound and Vibration Input Module - The NI‑9230 can measure signals from integrated electronic piezoelectric (IEPE) and non‑IEPE sensors such as accelerometers, tachometers, and proximity probes. The NI‑9230 is also compatible with smart TEDS sensors. The NI‑9230 incorporates software-selectable AC/DC coupling, IEPE open/short detection, and IEPE signal conditioning. The input channels simultaneously measure signals. Each channel also has built-in anti-aliasing filters that automatically adjust to your sample rate. When used with NI software, this module provides processing functionality for condition monitoring such as frequency analysis and order tracking.
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Semiconductor Test Equipment
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Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/
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Remote Test Unit (RTU) Expert
RTU Series
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VeEX’s Remote Test Units (RTU) are self-contained, scalable test and monitoring probes for communications networks. When used as part of the VeSion cloud-based monitoring system, these rackmount probes are optimized to work with a centralized server system. In addition, the probes can be operated in standalone mode via web browser.
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DDR3 X16 Non-Stacked DRAM BGA Interposer For Logic Analyzers
W3636A
Interposer
The W3636A DDR4 x16 BGA interposer allows you to gain signal access to the DDR3 signals critical to your debug and validation effort through a logic analyzer. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DDR3 x16 non-stacked DRAM or with an optional 3rd party socket (not provided) enabling operation and acquisition of high-speed DDR3 signals without impacting the performance of your design.
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Highpass Filter/SMA
WFIL-H2500-12750F
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Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Rectal Probe For Mice
RET-3
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• Smooth ball tip. Stainless steel shaft - 3/4'' long, .028'' diameter. Tip diameter .065'', 5 foot lead length. Time constant 0.5 seconds. Not Isolated
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InfiniiMode Active Differential Probe, 6 GHz
N2752A
Oscilloscope Probe
The N2752A InfiniiMode differential probe is a new generation of low-cost differential active probes compatible with Keysight InfiniiVision and Infiniium oscilloscopes’ AutoProbe interface. It comes with new operation modes and convenient measurements of differential, single-ended, and common mode signals with a single probe tip, without reconnecting the probe to change the connection. The N2752A probe’s InfiniiMode provides the following modes of operation.
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Spring Contact Probe
ICT
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LEENO provides a variety of choices, offering over 1,000 standard ICT probe types. The ICT probes can be customized to deliver optimum solutions to customers.





























