Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Scanning Acoustic Microscope
Echo
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The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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Microscopes
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A scientific instrument designed to produce magnified, high-resolution images of objects.
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Acoustic Micro Imaging.
AMI Gen7
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The New Generation of C-SAM Technology. The most sophisticated and fully featured C-SAM acoustic microscope for laboratory analysis and specialized high resolution applications.
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Crack Width Ruler
143
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Elcometer 143 Crack Width Ruler is a simple gauge that has been designed to provide inspectors with a low cost alternative to a graduated microscope for determining the width of a crack in concrete or other building materials.
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Imaging Mass Microscope
iMScope QT
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Inheriting the concept of a mass spectrometer equipped with an optical microscope from the iMScope series, the iMScope QT is also Shimadzu's flagship model for MS imaging with a Q-TOF MS(LCMS-9030).
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Microscopic Melting Point Meter
DRK8029
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Shandong Drick Instruments Co., Ltd.
Determination of the melting point of the substance. Mainly used for the determination of drugs, chemicals, textiles, dyes, perfumes and other organic crystal, the microscope. Measured either by capillary method, and the slides are available - coverslip (hot stage method).
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Confocal Microscopes
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Our confocal microscopes for top-class biomedical research provide imaging precision for subcellular structures and dynamic processes.
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Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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3D Microscope
BVM-5006
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BVM-5006 Electric 3D Microscope features the quality optical system, high resolution, large field of view, high zoom ratio, novel design and one-up technology, easy and automatic operations. Includes: Motorized zooming, motorized observation angle for changing and optional motorized focusing. The speed can be adjusted while changing observation angle. With the angle attachment, the microscope can realize 3D image effects for observing the components and deep holes. The LED lights can generate high brightness. Theoretically the service life of LED lights can reach 20,000 hours. The LED lights with area control function can illuminate from different angles for convenient multi-angle inspections. The M-N3D Microscope can be widely used in micro-electronics, automated monitoring and testing industries. By selecting the appropriate objectives and video couplers, different magnification, field of view and depth of field can be acquired. Digital and Analog video systems can meet the different users' demands.
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Digital Microscope
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A variation of a traditional optical microscope in which a digital/microscope camera is connected, and image output is displayed on a screen and/or monitor. Most models include software and a computer for use.
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Nano Particle Size Analyzer
SALD-7500nano
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Delivering 10 times the sensitivity of previous models, this innovative analyzer is capable of continuously measuring changes in particle size and particle size distribution at one-second intervals, within a range spanning 7 nm to 800 μm. In addition, unique options that accommodate the measurement of even high-concentration samples (up to 20 wt%) and trace quantity samples (down to 15 μL) are available. Due to its leading-edge measurement capabilities, the analyzer will likely be used for many applications in new areas, including nanotechnology, the life sciences, and fine bubbles (microscopic bubbles).
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Brinell Hardness Tester
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Using a carbide ball penetrator, and applying loads of up to 3,000 kgf, Brinell hardness tester following ASTM E-10 are widely used on castings and forgings. This method requires optical reading of the diameter of ball indentation, and using a chart to convert the average measurement to Brinell hardness value. We offer low cost handheld Brinell scopes as well as a popular line of Automatic Brinell Microscopes for high frequency of testing. . Qualitest also offers Automatic In-line hardness testers for high volume testing.
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Failure Analysis
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A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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Turn-Up & Maintenance Test Kit
KI-TK083
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1310/1490/1550 nm PON power meter, VFL pen, inspection microscope, cleaning materials & accessories, SC/APC connectors
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Polariser Analyser
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*includes analyzer to fit in microscope head and polarizer that fits over light source
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Portabl Digital Microscopes
MiScopes
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MiScope handheld digital microscope are portable digital microscopes which can be held in the palm of your hand. Connect it to a USB port of your laptop, desktop, tablet*, or phone* and take still and moving images, label, draw-on, measurement. all on the live image.
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Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Neurosurgery Microscopy Solutions
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Leica Microsystems offers a range of surgical microscope solutions to support neurosurgeons in the most complex microsurgery applications. Our cutting-edge neurosurgery microscopes provide optimal and reliable visualization, including built-in fluorescence filters and innovative GLOW 800 augmented reality fluorescence.
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Atomic Force Microscope
AFM
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Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Stereo Microscopes
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From affordable, high quality, stereo zoom microscopes for exceptional value and performance, though to powerful, high resolution stereo microscopes capable of 320x magnification – all supported with a range of productivity options – there’s a solution in our range of stereo microscopes for every application.
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Digital Color Camera for Microscopy
LC30
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The LC30 is a 3.1 megapixel digital color camera for microscopy that combines versatility with performance. The LC30 is the ideal entry-level microscope camera for quality bright-field imaging － suitable for material science applications. The Olympus LC30 color camera for microscopy combines versatility with performance. With up to 37 frames per second (fps), faithful color reproduction, full integration into Olympus imaging platforms, and an excellent cost-performance ratio, the LC30 is the ideal entry-level microscope camera for quality bright-field imaging － suitable for material science applications.. The sensitivity and frame rate of the 3.1-megapixel CMOS chip can be increased using various binning modes, resulting in easy observation and focusing. The LC30 camera can be quickly and easily mounted on all microscopes equipped with a standard C-mount adaptor, and requires only a single USB 2.0 cable for high-speed data transfer and power supply. Its complete integration into the OLYMPUS Stream imaging platforms helps ensure the seamless interaction of microscope, camera, and additional devices, delivering intuitive and efficient operation.
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Image Analysis Software
Metallurgy Plus
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International Biological Laboratories
his software can be used in Steel plants, Metal forging industry, Oil & gas industry ,Material Science, Mineralogy - metal and metal strength analysis Cement (Klincker) quality control and where ever Metallurgical microscope are used in .This Package is very useful Educational Institutions and ALL MATERIAL SCIENCE TECHNOCRATS AND METALLURGISTS.
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Testing, Inspecting & Cleaning Kit
KI-TK033
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850/1300 nm source & power meter, inspection microscope, cleaning materials. Interchangeable MPO, SC, LC connectors
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FIBER OPTIC MICROSCOPES
SpecVision
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SpecVision is a video probe that engages directly with Krell polishing machines. This permits the viewing of polished optical surfaces while connectors or bare fibers are still loaded in the polisher. This in-line video inspection technique minimizes material handling and potential damage/contamination that may occur when transferring components from the polisher to a traditional microscope. SpecVision can interface with Scepter, SpecPro and Rev Polishers.
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Metallurgical Microscope
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Offering you a complete choice of products which include dg classic trinocular metallurgical microscope, dg victory trinocular metallurgical microscope, dmi classic trinocular metallurgical microscope, dmi excel binocular metallurgical microscope, dmi optima trinocular metallurgical microscope and dmi prime trinocular metallurgical microscope.
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Modular Infinity Microscope
MIM
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
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Optical Test And Measurement
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Any type of fiber optic interconnection requires its interfaces to be free of dust and scratches in order to reach the lowest transmission loss. Small, handheld and battery powered inspection tools are available from AMS Technologies for inspection of fiber optic connectors in the field as well as high resolution type microscopes suitable for use in a production environment for qualifying the endface preparation. Additional S/W tools can support the user in making a quick decision if a certain defect is acceptable or if the surface fault disqualifies it for further use. Small and lightweight test equipment for measurement of the transmitted power in an optical fiber is needed wherever technicians handle optical fibers. Our product portfolio comprises light sources for various wavelengths, power meters for the visible and infrared and integrated solutions for sources and meters as well as optical time domain reflectometers (OTDR) coupled with visible wavelength light sources for easy fault detection within a fiber optic link.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Incoherent Sources
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Our Incoherent Sources include unmounted LEDs, mounted LEDs, collimated LEDs, LED light sources, superluminescent diodes, and broadband light sources. Our collimated LEDs are particularly popular and are compatible with many microscopes. Versions are available with center wavelengths from the UV into the NIR or that emit white light.
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Automated DC Parametric Curve Tracer
MegaTrace
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MegaTrace supports pin counts greater than 625 up to 2160 pins, with 1080 pins being popular. Comprised of a cart that contains the test chassis, PC monitor, drive bus box, and a test interface, MegaTrace is easy to move around and use with other instruments like emission microscopes, probe stations, and other remote testing requirements.
