Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Scanning Acoustic Microscope
Pulse2
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This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Digital Microscope Accessories
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Variety of extra accessories , such as macro lenses, remote control consoles, illuminations, image/video capture, software, stands and stages are available for Inspectis digital microscopes.
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Cleanliness Inspection System / Microscope
CIX90
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The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Universal Illumination System
NEW pE-4000
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NEW GENERATION LEDs The pE-4000 sets the standard as the universal illumination system for fluorescence microscopy. The system has 16 selectable LED wavelengths across 4 channels that can be matched to the filters and fluorophores of almost any microscope, making it the broadest spectrum of illumination available. The CoolLED pE-4000 now benefits from our award winning sustainable Green technologyand delivers enhanced intensity at your microscope sample plane with a significant reduction in energy consumption, and is supplied with a 3 year warranty after registration.
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Atomic Force Microscope
Flex-Mount
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Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
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Laser Raman Microscopy System
RAMANforce/RAMANtouch
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Nanophoton is the pioneer of confocal laser scanning microscopy and spectroscopic analysis. To celebrate, we relaunch our fastest and highest resolution confocal Raman microscope RAMANtouch/RAMANforce. With a newly designed spectrograph and the latest optical technologies, RAMANtouch/RAMANforce’s spatial resolution and sensitivity have been highly improved, making it the optimal solution for all applications.
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Inspection Microscope
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This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Crystallographic Imaging Software
GrainMapper3D™
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The GrainMapper3D software provides non-destructive 3D crystallographic imaging through LabDCT™ on the ZEISS Xradia 520 Versa X-ray Microscope made for laboratory use.
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Stereo Microscopes
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Here are a few examples from our 40 years of microscopy experience in the development of special stereo microscope solutions and accessories for and with Leica , Zeiss , Nikon and Olympus .
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Digitize, Quantify, Collaborate With Your Unique Automated Petrographic Microscope
ZEISS Axioscan 7 for Geology
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Digitize your thin sections with Axioscan 7 – the reliable, reproducible way to create high quality, digitized petrography data in transmitted and reflected light. Uniquely designed for petrographic analysis, the Axioscan 7 Geo combines unique motorized polarization acquisition modes with unprecedented speed and a rich software ecosystem for visualization, analysis, and collaboration.
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Spectroscopic Platform
Allalin
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The Allalin is a nanometer resolution spectroscopy instrument, based on a disruptive technology known as quantitative cathodoluminescence that integrates a light microscope and a scanning electron microscope (SEM) into one tool.
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Nanolattice Standards for Analytical Instruments
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The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of Electron and Atomic Force Microscopes (AFM). Make the grade, with the highest quality pitch standard of its kind available.
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Fiber Optic Inspection Microscope
80761
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The Miller 400x Microscope helps inspect fiber optic connectors quickly and easily. Its ergonomic design and built-in features make it ideal for field and lab use. The microscope features a pressure-activated on/off switch, focusing wheel, eyepiece, auxiliary white LED light source rated for 100,000 hours, adapter tip for inserting ferrule and battery compartment. Includes 2.5mm universal adapter cap and zipper case.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Measuring Microscopes, Image Processing + Optics Test Equipment
Development And Production Services
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Optik Elektronik Gerätetechnik GmbH
Development and assembly of opto-mechanical building groups, including software development.
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Image Analysis Software
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Olympus image analysis software turns an Olympus microscope into an effective, high-performance analysis station. Its intuitive operation enables smooth image acquisition, filtering, measurement, documentation and archiving.
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Ultrasonic Hardness Tester
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Sinowon Innovation Metrology Manufacture Ltd.
◆ Perfect Accuracy——±3% HV, ±1.5HR, ±3%HB.◆ Microscopic Indentation—— Only high-power microscope can observe the indentation.◆ Quick Measurement——Result in 2 seconds.◆ Large LCD Display——Directly display measurement result, times count, maximum, minimal, average and deviation.◆ Friendly Operation——Operate well after short training.◆ Promised Warranty——2-Year warranty for main unit (Excludes Probe).◆ Mass Storage——Save 1000 groups measurement data.◆ Simple Calibration——Save 20 groups calibration data for invoking, improve calibration efficiency.
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Production Wafer Level Burn-in
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TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
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Acoustic Microscope
AMI P300
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The FastLine P300 Acoustic Microscope is specifically designed for accelerated throughput, semiautomated screening of microelectronic devices on the manufacturing floor.
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Atomic Force Microscope
NX10
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Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.
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Airy Beam Light Sheet Imaging System
Aurora
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Aurora is an award-winning Airy Beam Light Sheet imaging system designed for researchers working in fields such as neuroscience, developmental biology, cancer biology, regenerative medicine and other bioscience disciplines, including Plant Sciences and Marine Biology. Compact, affordable and customisable, Aurora is available as a single and multiphoton light sheet fluorescence microscope for rapid, large 3D volumetric imaging, high resolution, multicolour, time-lapse imaging and live cell imaging. Aurora uses ground-breaking Airy Beam Light Sheet imaging techniques to achieve outstanding results in the field. It is currently in use by many leading organisations delivering results previously not possible.
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Single Mode Multimode Test Inspect Kit
KI-TK072A
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1310/1550/1625 nm & 850/1300 nm source & Autotest power meter + acceptance reporting software, inspection microscope, cleaning materials. Interchangeable SC/APC & LC/APC connectors
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Optical Fiber Microscope
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Connector-end face contamination is a problem that shouldn’t be ignored when it comes to fiber optic cables and patch cords. Allowing contamination to take place or fester will lead to network issues and down-time which you don’t need. For any fiber optic cable network, a high quality fiber microscope is a necessary tool to identify where contamination may be presenting.
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Metrology/SEM
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Our SEM products use scanning electron microscope technology to measure and review tiny surface structures such as photomask etching and circuitry on wafers with high precision and stability.
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Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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AFM-Raman for Physical and Chemical Imaging
XploRA Nano
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Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.
