Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Product
Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
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The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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Product
Fiber Optic Inspection Microscope
80760
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The Miller 200x Microscope helps inspect fiber optic connectors quickly and easily. Its ergonomic design and built-in features make it ideal for field and lab use. The microscope features a pressure-activated on/off switch, focusing wheel, eyepiece, auxiliary white LED light source rated for 100,000 hours, adapter tip for inserting ferrule and battery compartment.
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Product
Temperature Controlled Microscope Stage
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Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Product
Piezo-Z Top Plate
PZMU-2000
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Applied Scientific Instrumentation
The PZMU-2000 is a precise piezo Z-axis stage that can be attached to the top of a microscope's existing XY stage or be used in stand-alone applications. On select models of microscopes, ASI can mount a PZMU-2000 to an OEM stage. We can procure a manual OEM stage for you if necessary.
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Microscopy and Automation Solutions
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Opto already offers automated multifluorescence microscopes for cell analysis, inverted autofocus microscopes for motion analysis of growth processes, and high- throughput fluorescence microscopes for DNA and RNA sequencing.
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Stereo Microscope
Stemi 508
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Thanks to apochromatic optics you acquire high contrast images with color accuracy. With the 8:1 zoom you bring up smallest details. Stemi 508 offers an ergonomic viewing angle of 35° - stay relaxed even after hours of work.
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Measuring Microscopes, Image Processing
Milling & Drilling
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Optik Elektronik Gerätetechnik GmbH
OEG manaufactures all mechanical parts in house and offers these services to other companies.
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Product
Osmometer
LD-LOSM-A10
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OsmometerLD-LOSM-A10is colorful LCD touch display with sample size 50 μl to 100 μl and measuring range up to 0 to 3000 mOsmol /kg H2O at ambient temperature 10 to 30°C. Features with on-screen display of molar concentration, freezing point, and osmolarity. At very low testing time it provides fast and accurate osmolality test results. Applicable in General medicine, Routine and research, Forensic medicine, Electron microscope.
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Product
OTDR
OT700 series
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Shanghai Tarluz Telecom Tech Co., LTD
SM OTDR, MM OTDR, visual fault locato), PON online test, Optical Power Meter, Optical Laser Source, Fiber Microscope, Ready for all kinds of environment.
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Microscope Software
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Only with the right microscope software you can unleash all features of your imaging station. Our modular software platforms are easy to learn and enable you to acquire, process and analyze images in multiple dimensions and over various timepoints. Non-destructive image handling and file formats developed specially for microscopy are just two benefits that guarantee reproducible results for your experiments.
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Microscopy
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Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.
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Time-Lapse
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The Time-Lapse app enables you to use an Android Device to record a sequence of images from your ioLight microscope automatically. The app records images at regular intervals of a few minutes to days.Time-Lapse is great to use with the Inverted Microscope to monitor the growth of cells and cultures in incubators.
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Transmission Electron Microscope
TEM
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Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Reticles, Optical Slits, Optical Apertures
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With over 30 years of experience in the manufacturing of high precision Reticles, Slits, Apertures, and Pinholes, APPLIED IMAGE has gained a reputation for delivering precise and accurate parts. We have supplied thousands of these parts to be used in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
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Atomic Force Microscope
FlexAFM
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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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Photoluminescence Microspectrometer
MicOS
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MicOS, the latest in microscope spectrometers is a fully integrated, versatile and cost effective microscope spectrometer that combines a microscope head with a high-performance, triple grating, imaging spectrometer that can accommodate up to 3 different detectors.
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Microscope Photoluminescence Spectrometer
Flex One
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Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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UV-Visible/NIR Microspectrophotometers
MSV-5000 Series
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Microscopes that use a high resolution double-beam scanning spectrophotometer for precise and accurate measurement in the wavelength region 200-2700 nm.
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Life Science Microscope
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Our product range includes a wide range of smart life science microscope, excel life science microscope, select binocular microscope, crown trinocular life science microscope, classic life science trinocular microscope and premium trinocular microscope.
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Electron Microscope Analyzer
QUANTAX EBSD
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QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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Digital Microscope
VHX-6000 Series
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Next-generation optical microscope with a large depth-of-field and advanced measurement capabilities for inspection and failure analysis.
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Product
Rapid Automated Modular Microscope
RAMM
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Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
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SAM Auto Line
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PVA TePla Analytical Systems GmbH
The fully automated acoustic microscopes from the SAM Auto Line enable simple detection of cavities, voids, bubbles, inclusions, and delamination and are ideally suitable for wafer inspection, bond checking, and MEMS inspection. An automatic defect-review software package performs a fully automated evaluation of the entire wafer. The results can be issued as klarf files and VEGA MAP. A GEM/SECS connection is also possible.
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Material Identification Spectroscopy
ChipCHECK
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Gastops specializes in advanced fluid sensing and analysis systems specifically designed and developed for critical equipment condition monitoring applications. ChipCHECK offers the fastest way of making on-site equipment maintenance decisions. It is a field deployable analyzer designed for rapid on-site identification of equipment lube oil. This automated maintenance decision-support tool employs innovative laser spectroscopic technology, which enables on-site analysis of microscopic chip debris. ChipCHECK provides the maintainers with quick, reliable, and conclusive information, including the total number of particles, and the size, shape, and specific alloy classification for each individual particle on the sample.
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Vision Metrology System
NGS 3500Z
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This bench top lower cost, yet high performance system is designed for applications where defect detection and precisionmeasurements on wafers and other parts (up to 200 mm) are required. It is well suited for use as a dedicated productiontool or as a versatile process development system. It features a powerful set of automated as well as semi-automaticoptical/ video tools optimized for high accuracy, production throughput, and ease of use.This automated and versatile platform features a standard Nikon/ Olympus bright/ dark field microscope with optionalNomarski, and precise part staging. This system offers significant and unique advantages for dual production/ engineeringuse, and provides the perfect solution when both defect detection and dimensional metrology are required.
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Life Sciences Applications
LS-AFM
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The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.
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Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
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Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
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Portable Measuring Microscope
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Opto's portable microscope is designed to handle even the most demanding on-site inspections. With its ergonomic design, robust construction and perfectly matched optics configuration, it is a precise and reliable tool.
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Stimulus Induced Fault Testing
SIFT
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SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Photoluminescence Microspectrometers
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Photoluminescence Microspectrometer: an instrument designed to measure the fluorescence, photoluminescence, and emission spectra of microscopic samples with excitation in the UV, visible and NIR regions. our revolutionary technologies that include a range of microspectrophotometer, UV-Vis-NIR microscope, Raman microspectrometer, NIST traceable standards, accessories and software solutions.
