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Product
DIELECTRIC and CONTINUITY TESTERS ( HI-POTS )
AV-25V-GC1-05
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This tester is designed for testing equipment wiht a line cord which can be plugged directly to the tester. The continuity test is to determine whether the ground wire of the line-cord is well connected to the metal frame of the unit under test.
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Product
Circuit Simulation Software
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Proteus Virtual System Modelling (VSM) blends mixed-mode SPICE simulation with world leading fast microcontroller simulation. It enables rapid prototyping of both hardware and firmware designs, in software! Design, Test and Debug your embedded projects in the Proteus electronic circuit simulator before a physical prototype is ordered. Agile development for the embedded systems workflow.
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Product
NI Real-Time Test Cell Reference System
780590-35
test
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Towing Dynamometer
RSL-5.4K
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RSL-5.4K Towing Dynamometer is designed for testing today’s compact cars. The RSL-5.4K is built with an all aluminum frame, sheet metal body and rides on an independent, coil spring suspension. The RSL 5.4K uses an eddy current absorber for power absorption. The power is provided by batteries and an alternator.
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Product
Midirack - 120 x 60 x 80 cm
OTP2-Modul-Nr002
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The rack serves as the basic framework for your individually designed test system. Various OTP² modules can be installed in the 120 x 60 x 80 cm rack in order to meet the most varied of test requirements.The modular architecture of the OTP (Open Test Platform) is based on a flexible instrumentation matrix, LXI-based sources and measuring devices, combined with a high-quality transfer interface for connecting the test adapters. The systems can easily be expanded with customer- and application-specific functions. We use standardization to build cost-effective systems that still fit your requirements exactly.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
TestBench & Planar Biaxial Test Instruments
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TestBench configurations were designed with component testing in mind, and thanks to their modular approach, a wide array of configurations and performance capabilities are possible. TestBench systems can be multi-channel and multi-axis, including planar biaxial testing.
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Product
Tester & Programmer
TP-TACT
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TP-TACT is designed to test the efficiency and program the operating range of electronic turbocharger controllers.
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Product
Calibration Test Pumps
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High-precision calibration & pressure testing is the key to success in the oil & gas, petrochemical, maritime, pharmaceutical and aerospace industries and the right calibration tools make all the difference. Ralston Instruments offers a wide array of intelligently designed, high-quality calibration test pumps that simplify complex calibration processes while providing fast, accurate results. All Ralston pressure test pumps are lightweight, extremely durable, and easy to disassemble and repair with standard hand tools. And for quick connectivity with the most effective results, they all come with Ralston Quick-test™ adapters for safe, stable, leak-free connections without the need for a wrench or thread tape.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Imperial Test Executive
ITE
test
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
Automatic Test Equipment for Electronic Systems
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BAE Systems has designed and manufactured comprehensive test solutions for both military and commercial applications for more than 40 years. During this time, we have kept pace with the rapidly evolving market to deliver integrated, commercial-off-the-shelf solutions to our customers. Our test equipment consists of an open architecture, adaptable core that can easily integrate with additional instrumentation. This enables the development of unique configurations that support the full spectrum of avionics and electronics in use today.
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Product
Scienlab Combined Battery Test Solution
SL1133A
test
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
Test Program Sets & Custom System Level Software
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WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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Product
IoT Dashboard for Data Streaming and Visualization
Initial State Software
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Stream data from your devices and services to beautiful interactive cloud-based data visualizations. Designed for monitoring, test, and data streaming applications, Initial State provides a scalable IoT streaming backbone with world-class anywhere-accessible data visualizations. Create real-time IoT dashboards using streaming data from any connected IoT device, PC, or via codeless integrations with instrumentation like the Keithley Datalogger/DAQ 6510.
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Product
Cable Test Van
ETL-35
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ETL-35 is a cable test van designed for testing electrical substation equipment.Apart from cable insulation withstand testing with DC (rectified) voltage up to 60 kV and ability to measure very small leakage currents, the system can be used for testing various objects with small electrical capacitance with AC voltage of up to 100 kV and measuring dielectric dissipation factor (Tan Delta) at industrial frequency.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
End of Line Test System for Automotive Seats
AS519
Test Platform
AS519 is specifically designed to perform ECU’s EOL tests in the automotive industry. It integrates a programmable power supply up to 20V 20A with high reading resolution. Interaction with the DUT is established through CAN bus by an interphase adapter in a USB port of the test managing computer.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Test Platform
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Product
6TL24 Combinational Base Test Platform
H71002400
Test Platform
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
EVSE Test Platform
Test Platform
To manage both the challenging high-power requirements of electric vehicle supply equipment and the market demand, it is crucial to rely on a test system that performs to your specs. The right system needs to combine the tools for reliable asset communication, microgrid management, effective protocol simulation and high-power testing. This EVSE platform combines the right energy regeneration equipment with 25+ years of test experience to deliver the results you need to meet conformance in the time you need it.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Eagle Test Systems
ETS-200T
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
