IC
circuitry in a chip.
See Also: Integrated Circuit, Chip, Digital IC Testers, IC Test, IC Clips, IC Probes
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Product
PathWave IC-CAP BSIM3 Model Extraction Package
W7024E
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The W8553EP IC-CAP BSIM3 Model Extraction Package provides complete measurement and extraction procedures for DC, CV and RF model parameters. The intuitive, Windows-style user interface enables engineers to quickly produce an accurate model.
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Product
Passive Probe, 10:1, 200 MHz, 1.3 M
N2871A
Oscilloscope Probe
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Product
Electronics Failure Analysis System
Sentris
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Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.
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AMIDA 3001XP Tester
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AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Product
200A Digital Clamp Meter
7128A
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Peaceful Thriving Enterprise Co Ltd
This is a auto-ranging, high accuracy and stable hand held clamp meter to make electrical maintenance safe and easy. With special designed IC to support true RMS, the meter is available to measure AC/DC voltage to 600V, AC current to 200A and resistance to 20MΩ; also having the capability to test diode, continuity and non contact voltage sensing. Sub switch included Function Select, Max-Min Indication, Value Hold, Range Select, Relative Value Measurement, Illumination and Back-light.
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Product
Entry-Level Wi-Fi 6 Solution With Multiple OS And Certification Support.
EWM-W179
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IEEE 802.11 ax/ac/b/g/n + Bluetooth 5.2 HS standard2Tx/ 2Rx64/128 bit WEP, WPA, WPA2, WPA3, 802.1xOperating temperature: 0 to 70 °CCompatible with Nvidia & NXP solutionMultiple Certificates (FCC, CE, IC, TELEC, KC, NCC, RCM, SRRC)
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Product
PXIe-4136, 200 V, 1 A System PXIe Source Measure Unit
783760-01
Source Measure Unit
±200 V, 1 A System PXI Source Measure Unit—The PXIe‑4136 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4136 features 4-quadrant operation. The PXIe‑4136 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Product
Mixed signal LSI test system
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Multi-pin type model is now launched in WL27 Logic/Power mixed LSI test system.This system is suitable for multi-site test in A/D mixed device such as automotive・motor driver IC. It’s a high throughput and cost performance mixed signal LSI test system.
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Product
FMC L-Band RF Receiver
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Sundance Multiprocessor Technology Ltd.
The Creonic L-band RF receiver FMC card allows to receive RF signals between 925 and 2,250 MHz. It is ideally suited for satellite communication with standard satellite dishes since it includes a DiSEqC driver IC for LNB controlling. The board allows to build receivers with symbol rates of up to 100 Msymbols/s. Due to the low-pin-count (LPC) FMC connector it can be used with any FMC carrier board that supports VADJ=1.8V. The card will be available from Q2/2017.
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Product
PathWave IC-CAP Device Modeling Platform
W7300B
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The W8500BP IC-CAP Device Modeling Platform Bundle provides the basic tools you need to start modeling devices and circuits. It provides the necessary tools to:
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Product
AC-DC Converters
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With robust, advanced high-voltage converters, power factor correctors, a variety of controllers and supervisors/housekeeping ICs, together with innovative architectures and extended temperature ranges.
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Product
IC-RBP-XMCa, Active network redundancy XMC Switch Mezzanine Card
IC-RBP-XMCa
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IC-RBP-XMCa, Active network redundancy XMC Switch Mezzanine Card.
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Product
SparkFun Serial Basic Breakout
CH340C And USB-C
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This SparkFun Serial Basic Breakout is an easy-to-use USB-to-Serial adapter based on the CH340C and takes advantage of the handy USB-C connector. With USB-C you can get up to three times the power delivery over the previous USB generation at 1.5A and and also solves the universally frustrating dilemma of plugging a USB cable in correctly, because it’s reversible! The Serial Basic works with 5V and 3.3V systems and possesses the capability to auto install on most operating systems without the need for additional drivers. The Serial Basic uses the CH340C IC to quickly and easily convert serial signals to USB.
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Product
Reticle Manufacturing
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An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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Product
5G 256-Element Active Antenna Innovator’s Kit
AWA-0134
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The AWA-0134 is an active array for 5G wireless applications developed using planar antenna technology resulting in a very low profile, lightweight unit. The surface mount assembled antenna board is based on Anokiwave’s AWMF-0108 Silicon Quad Core IC and demonstrates the performance achievable using low power silicon integration and efficient antenna layout and design. Using the AWMF-0108, the antenna provides +60dBmi (1000 W) of EIRP. The electronic 2D beam steering is achieved using analog RF beam forming, with independent phase and gain control in both Tx and Rx operating modes. The AWA-0134 antenna leads the way in showing how 5G coverage can be rolled out by network operators using the mmW bands, with low power footprint and high energy efficiency, while meeting key operating specifications for data rate, latency, coverage, and reliability.
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Product
Supply Chain Management
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200 Customers100 Active SuppliersPurchasing for 60 material classifications including such materials as:a) IC, Resisters, Capacitors, Wire, Cable, Power Suppliesb) Connectors, Converters, Diodes, Fuses, Fabricated partsc) Inductors, Relays, Switches, Hardware
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Silicon Heavy-doped Pen Tester
HS-MPRT
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Heavy doped testing, especially good for purchase the material.■ Not only sound alarm, but also Led light alarm , to guarantee sorting work accurately.■ adaptable for sorting little granular material, little broken IC Wafer and other little silicon material.■ Can set alarm ranges from 0.0 to 1.0Ω﹡㎝.
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Product
Design-for-Test And Semiconductor Data Analytics
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Mentor’s comprehensive solution for IC test, including best-in-class design-for-test tools and test data analytics that help ensure the highest test coverage, accelerate yield ramp and improve the quality and reliability of manufactured parts.
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Product
PathWave IC-CAP HiSIM_HV Model Extraction Package
W7026E
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The W7026E PathWave IC-CAP HiSIM_HV Model Extraction Package provides measurement and extraction procedures for the HiSIM_HV industry-standard model for MOSFET devices.
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Environmental Testing
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D.L.S. Electronic Systems, Inc
D.L.S. Conformity Assessment provides testing services for environmental tests under its accredited ANAB/ACLASS ISO 17025 program. This globally accepted accreditation covers environmental and mechanical testing that include vibration and shock, temperature extremes , sand and dust, fluid and chemical resistance, altitude, humidity, salt spray, ingress protection, icing, flammability and other related testing services.
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Product
MAX31855 J-Type Thermocouple Sensor Breakout
SEN-30001-J
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Breakout board for the MAX31855J digital thermocouple interface IC. Measured temperature range is -210C-1200C with known thermal characteristics and output resolution of 0.25C. This sensor supports a larger operating range (specifically in the negative range) than its predecessors, the MAX6674 and MAX6675, though it is not pin-pin compatible. This board is interfaced with a 0.1" 1x5 pin header, has a vertical mini thermocouple connector and four mounting holes for standoffs and 4-40 screws.
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Product
Microelectronic Services
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Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
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Product
Near Zero Footprint SMT Spring Pin Sockets
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Ironwood Electronics socket is a device size or near device size footprint test socket incorporating industry standard high performance spring pins. Ironwood can design a socket to work with any type IC packages- BGA, LGA, QFN, DFN and even leaded devices where you need to fit a socket in place of your device to allow fast, easy testing and development.
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PXIe-4163, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit
784483-01
Analog Input Module
PXIe, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit—The PXIe-4163 is a high-density source measure unit (SMU). It features 4-quadrant operation with a current resolution of 100 pA and the ability to sample up to 100 kS/s. The module also offers the ability to maximize stability and measurement accuracy with SourceAdapt, which allows you to custom-tune the transient response to match the characteristics of any load. The PXI-4163 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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Product
X-Band Silicon Radar Quad Core IC
AWS-0101
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The AWS-0101 is a highly integrated silicon quad core IC intended for radar and 5G phased array applications. The device supports four radiating elements, single beam transmit, and dual beam receive and includes all requisite beam steering controls for 6 bit phase and gain control. The device provides 21 dB gain during transmit mode, +15 dBm output power during transmit, and 3.4 dB NF during receive. Additional features include gain compensation over temperature, temperature reporting, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8V supply, and is packaged in a 56 lead 7x7 QFN for easy installation in planar phased array antennas.
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Product
Switches And Latches
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With 30 years of leadership in digital position sensor ICs, we offer the broadest portfolio of magnetic switch, latch, and speed and direction solutions in the industry to serve almost any application need.
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Product
Universal High Speed Bench Test Automation Framework
KayaQ™ (GRL-KAYAQ-FW)
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GRL’s Universal High Speed Bench Test Automation Framework ‘KayaQ™ ’ is an enterprise-quality, Windows 7 PC-based, ready-to-use automation environment for labs overcoming the next generation challenges of bench testing. The world’s leading provider of high speed interface PVT characterization test services, GRL developed KayaQ™ to address the gaps in available tools for high speed interface characterization. KayaQ™ provides a ready-to-deploy automated test solution for testing of high speed interfaces, tailored for the needs of volume bench-level IC PVT characterization.
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Product
MAX31855 K-Type Thermocouple Sensor Breakout
SEN-30001-K
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Breakout board for the MAX31855K digital thermocouple interface IC. Measured temperature range is -270C-1372C with known thermal characteristics and output resolution of 0.25C. This sensor supports a larger operating range (specifically in the negative range) than its predecessors, the MAX6674 and MAX6675, though it is not pin-pin compatible. This board is interfaced with a 0.1" 1x5 pin header, has a vertical mini thermocouple connector and four mounting holes for standoffs and 4-40 screws.
